| Year |
Citation |
Score |
| 2019 |
Balzar D. X-Ray Diffraction Line Broadening: Modeling and Applications to High-T Superconductors. Journal of Research of the National Institute of Standards and Technology. 98: 321-353. PMID 28053477 DOI: 10.6028/jres.098.026 |
0.332 |
|
| 2015 |
Balzar D. Characterization of strains and defects in nanomaterials by diffraction techniques Modeling, Characterization and Production of Nanomaterials: Electronics, Photonics and Energy Applications. 145-166. DOI: 10.1016/B978-1-78242-228-0.00005-3 |
0.314 |
|
| 2014 |
Genzel C, Apel D, Klaus M, Genzel M, Balzar D. Residual stress gradient analysis by multiple diffraction line methods Materials Science Forum. 768: 3-18. DOI: 10.4028/Www.Scientific.Net/Msf.768-769.3 |
0.378 |
|
| 2014 |
Popa NC, Balzar D, Vogel SC. Elastic macro strain and stress determination by powder diffraction: Spherical harmonics analysis starting from the Voigt model Journal of Applied Crystallography. 47: 154-159. DOI: 10.1107/S1600576713029208 |
0.391 |
|
| 2012 |
Juraić K, Gracin D, Djerdj I, Lausi A, Čeh M, Balzar D. Structural analysis of amorphous-nanocrystalline silicon thin films by grazing incidence X-ray diffraction Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 284: 78-82. DOI: 10.1016/J.Nimb.2011.07.018 |
0.356 |
|
| 2012 |
Balzar D. Coherency strain and dislocations in copper-rich-precipitate embrittled a710 ferritic steels Metallurgical and Materials Transactions a: Physical Metallurgy and Materials Science. 43: 1462-1467. DOI: 10.1007/S11661-011-0827-4 |
0.367 |
|
| 2011 |
Apel D, Klaus M, Genzel C, Balzar D. Rietveld refinement of energy-dispersive synchrotron measurements Zeitschrift Fur Kristallographie. 226: 934-943. DOI: 10.1524/Zkri.2011.1436 |
0.418 |
|
| 2010 |
Balzar D, Popa NC, Vogel S. Strain and stress tensors of rolled uranium plate by Rietveld refinement of TOF neutron-diffraction data Materials Science and Engineering A. 528: 122-126. DOI: 10.1016/J.Msea.2010.06.002 |
0.384 |
|
| 2008 |
Popa NC, Balzar D. Size-broadening anisotropy in whole powder pattern fitting. Application to zinc oxide and interpretation of the apparent crystallites in terms of physical models Journal of Applied Crystallography. 41: 615-627. DOI: 10.1107/S0021889808012223 |
0.308 |
|
| 2007 |
Loster M, Balzar D, Friedrich KA, Garche J. X-ray line profile analysis of nanoparticles in proton exchange membrane fuel cell electrodes Journal of Physical Chemistry C. 111: 9583-9591. DOI: 10.1021/Jp071874B |
0.301 |
|
| 2005 |
Lita AE, Rosenberg D, Nam S, Miller AJ, Balzar D, Kaatz LM, Schwall RE. Tuning of tungsten thin film superconducting transition temperature for fabrication of photon number resolving detectors Ieee Transactions On Applied Superconductivity. 15: 3528-3531. DOI: 10.1109/Tasc.2005.849033 |
0.304 |
|
| 2004 |
Balzar D, Audebrand N, Daymond MR, Fitch A, Hewat A, Langford JI, Le Bail A, Louër D, Masson O, McCowan CN, Popa NC, Stephens PW, Toby BH. Size-strain line-broadening analysis of the ceria round-robin sample Journal of Applied Crystallography. 37: 911-924. DOI: 10.1107/S0021889804022551 |
0.4 |
|
| 2004 |
Balzar D, Ramakrishnan PA, Hermann AM. Defect-related lattice strain and the transition temperature in ferroelectric thin films Physical Review B - Condensed Matter and Materials Physics. 70. DOI: 10.1103/Physrevb.70.092103 |
0.398 |
|
| 2004 |
Gall K, Dunn ML, Liu Y, Stefanic G, Balzar D. Internal stress storage in shape memory polymer nanocomposites Applied Physics Letters. 85: 290-292. DOI: 10.1063/1.1769087 |
0.342 |
|
| 2004 |
Balzar D, Popa NC. Elastic-strain tensor and inhomogeneous strain in thin films by X-ray diffraction Thin Solid Films. 450: 29-33. DOI: 10.1016/j.tsf.2003.10.043 |
0.32 |
|
| 2003 |
Balzar D, Stefanic G, Vogel S, Brown D, Bourke M, Clausen B, Popa NC. D045 Residual Strain Determination by Rietveld Refinement of TOF Neutron-Diffraction Measurements on Deformed Uranium Powder Diffraction. 18: 172-172. DOI: 10.1154/1.1706930 |
0.353 |
|
| 2002 |
Balzar D, Ramakrishnan PA, Spagnol P, Mani S, Hermann AM, Matin MA. Influence of strains and defects on ferroelectric and dielectric properties of thin-film barium-strontium titanates Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 41: 6628-6632. DOI: 10.1143/Jjap.41.6628 |
0.411 |
|
| 2002 |
Balzar D, Audebrand N, Daymond MR, Fitch A, Hewat A, Langford JI, Le Bail A, Louer D, Masson O, Popa NC, Stephens PW, Toby B. Size-strain round robin: first results and the comparative analysis of the measurements Acta Crystallographica Section a Foundations of Crystallography. 58: c24-c24. DOI: 10.1107/S010876730208604X |
0.374 |
|
| 2002 |
Popa NC, Balzar D. An analytical approximation for a size-broadened profile given by the lognormal and gamma distributions Journal of Applied Crystallography. 35: 338-346. DOI: 10.1107/S0021889802004156 |
0.307 |
|
| 2001 |
Perkins J, Readey D, Alleman J, Del Cueto J, Li X, Coutts T, Stauber R, Duncan C, Young D, Parilla P, Keyes B, Gedvilas L, Balzar D, Wang Q, Ginley D. A combinatorial approach to TCO synthesis and characterization Materials Research Society Symposium - Proceedings. 666. DOI: 10.1557/Proc-666-F1.6 |
0.306 |
|
| 2001 |
Popa NC, Balzar D. Elastic strain and stress determination by Rietveld refinement: Generalized treatment for textured polycrystals for all Laue classes Journal of Applied Crystallography. 34: 187-195. DOI: 10.1107/S1600576714022109 |
0.39 |
|
| 2000 |
Hurley DC, Balzar D, Purtscher PT. Nonlinear ultrasonic parameter in precipitate-hardened steels Materials Research Society Symposium - Proceedings. 591: 129-134. DOI: 10.1557/Proc-591-129 |
0.381 |
|
| 2000 |
Hurley DC, Balzar D, Purtscher PT. Nonlinear ultrasonic assessment of precipitation hardening in ASTM A710 steel Journal of Materials Research. 15: 2036-2042. DOI: 10.1557/Jmr.2000.0292 |
0.374 |
|
| 1999 |
Balzar D, Ledbetter H, Stephens PW, Park ET, Routbort JL. Dislocation-density changes upon poling of polycrystalline BaTiO3 Physical Review B - Condensed Matter and Materials Physics. 59: 3414-3420. DOI: 10.1103/Physrevb.59.3414 |
0.371 |
|
| 1998 |
Balzar D, Von Dreele RB, Bennett K, Ledbetter H. Elastic-strain tensor by Rietveld refinement of diffraction measurements Journal of Applied Physics. 84: 4822-4833. DOI: 10.1063/1.368724 |
0.384 |
|
| 1996 |
Balzar D, Stephens PW, Ledbetter H, Li J, Dunn ML. Synchrotron X-Ray Diffraction Study of the Surface Layer in Poled Ceramic BaTiO3# Mrs Proceedings. 453. DOI: 10.1557/Proc-453-715 |
0.396 |
|
| 1996 |
Balzar D, Popović S. Reliability of the Simplified Integral-Breadth Methods in Diffraction Line-Broadening Analysis Journal of Applied Crystallography. 29: 16-23. DOI: 10.1107/S0021889895008478 |
0.387 |
|
| 1993 |
Balzar D, Ledbetter H. Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks Journal of Applied Crystallography. 26: 97-103. DOI: 10.1107/S0021889892008987 |
0.409 |
|
| 1993 |
Balzar D, Roshko A, Ledbetter H. X-ray diffraction peak-broadening analysis of (La-M)2Cu04high-Tcsuperconductors Powder Diffraction. 8: 2-6. DOI: 10.1017/S0885715600017656 |
0.333 |
|
| 1992 |
Balzar D. Profile fitting of X‐ray diffraction lines and Fourier analysis of broadening Journal of Applied Crystallography. 25: 559-570. DOI: 10.1107/S0021889892004084 |
0.364 |
|
| 1992 |
Balzar D, Ledbetter H. Microstrains and domain sizes in Bi-Cu-O superconductors: an X-ray diffraction peak-broadening study Journal of Materials Science Letters. 11: 1419-1420. DOI: 10.1007/Bf00729647 |
0.376 |
|
| 1991 |
Balzar D, Ledbetter H, Roshko A. Stacking faults and microstrain in La1.85M0.15CuO4 (M = Ca, Ba, Sr) by analyzing X-ray diffraction line broadening Physica C: Superconductivity and Its Applications. 185: 871-872. DOI: 10.1016/0921-4534(91)91659-R |
0.302 |
|
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