Marc Dandin

Affiliations: 
2019- Electrical and Computer Engineering Carnegie Mellon University, Pittsburgh, PA 
Area:
bioengineering
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"Marc Dandin"
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Parents

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Pamela A. Abshire grad student 2012 University of Maryland
 (CMOS single-photon avalanche diodes and micromachined optical filters for integrated fluorescence sensing.)
Elisabeth Smela grad student 2005-2012 University of Maryland
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Publications

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Senevirathna B, Lu S, Dandin M, et al. (2019) High resolution monitoring of chemotherapeutic agent potency in cancer cells using a CMOS capacitance biosensor. Biosensors & Bioelectronics. 142: 111501
Senevirathna BP, Lu S, Dandin M, et al. (2019) Correlation of Capacitance and Microscopy Measurements Using Image Processing for a Lab-on-CMOS Microsystem. Ieee Transactions On Biomedical Circuits and Systems
Senevirathna BP, Lu S, Dandin MP, et al. (2018) Real-Time Measurements of Cell Proliferation Using a Lab-on-CMOS Capacitance Sensor Array. Ieee Transactions On Biomedical Circuits and Systems. 12: 510-520
Dandin M, Habib MHU, Nouri B, et al. (2016) Characterization of Single-Photon Avalanche Diodes in a 0.5-μm Standard CMOS Process-Part 2: Equivalent Circuit Model and Geiger Mode Readout Ieee Sensors Journal. 16: 3075-3083
Akturk A, Dandin M, Vert A, et al. (2012) Silicon carbide ultraviolet photodetector modeling, design and experiments Materials Science Forum. 717: 1199-1202
Dandin M, Abshire P. (2012) High signal-to-noise ratio avalanche photodiodes with perimeter field gate and active readout Ieee Electron Device Letters. 33: 570-572
Nouri B, Dandin M, Abshire P. (2012) Large-area low-noise Single-Photon Avalanche Diodes in standard CMOS Proceedings of Ieee Sensors
Dandin M, Abshire P, Smela E. (2012) Polymer filters for ultraviolet-excited integrated fluorescence sensing Journal of Micromechanics and Microengineering. 22
Abshire P, Bermak A, Berner R, et al. (2011) Confession session: Learning from others mistakes Proceedings - Ieee International Symposium On Circuits and Systems. 1149-1162
Dandin M, Akturk A, Nouri B, et al. (2010) Characterization of single-photon avalanche diodes in a 0.5 μm standard CMOS process - Part 1: Perimeter breakdown suppression Ieee Sensors Journal. 10: 1682-1690
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