John F. Cochran
Affiliations: | 1989 | Physics | Simon Fraser University, Burnaby, British Columbia, Canada |
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"John Cochran"Mean distance: 14.45 | S | N | B | C | P |
Children
Sign in to add trainee| Robert Turner | grad student | 1972 | Simon Fraser (Neurotree) |
| John Dutcher | grad student | 1989 | Simon Fraser |
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| Cochran JF, Kambersky V. (2006) Ferromagnetic resonance in very thin films Journal of Magnetism and Magnetic Materials. 302: 348-361 |
| Urban R, Heinrich B, Woltersdorf G, et al. (2002) Nanosecond magnetic relaxation processes in ultrathin metallic films prepared by MBE Physical Review B - Condensed Matter and Materials Physics. 65: 204021-204024 |
| Cochran JF. (2001) Brillouin light scattering from periodic multilayers composed of very thin magnetic films Physical Review B - Condensed Matter and Materials Physics. 64: 1344061-13440613 |
| Cochran JF. (2000) Brillouin light scattering intensities for patterned magnetic thin films Journal of Magnetism and Magnetic Materials. 212: 40-52 |
| Cochran JF, Kurn A, Frait Z. (2000) Comparative study of FMR and Brillouin light scattering on amorphous Fe40Ni40B20 Journal of Magnetism and Magnetic Materials. 210: 42-48 |
| Cochran JF. (1997) Brillouin light scattering intensities for a thin film exchange coupled to a bulk magnetic substrate Journal of Magnetism and Magnetic Materials. 169: 1-24 |
| Cochran JF. (1995) Magnetization reversal in a thin ferromagnetic film weakly exchange coupled to a bulk ferromagnet Journal of Magnetism and Magnetic Materials. 147: 101-114 |
| Cochran JF, Totland K, Heinrich B, et al. (1995) BLS studies of exchange coupling in the iron whisker/Cr/Fe system Materials Research Society Symposium - Proceedings. 384: 131-143 |
| From M, Liao LX, Cochran JF, et al. (1994) Temperature dependence of the exchange coupling in the Fe(001) whisker/11 ML Cr/20 ML Fe structure Journal of Applied Physics. 75: 6181-6183 |
| Heinrich B, Cochran JF. (1993) Ultrathin metallic magnetic films: magnetic anisotropies and exchange interactions Advances in Physics. 42: 523-639 |