Feng Xiao, Ph.D.
Affiliations: | 2006 | Stanford University, Palo Alto, CA |
Area:
VisionGoogle:
"Feng Xiao"Mean distance: 14.47 (cluster 29) | S | N | B | C | P |
Parents
Sign in to add mentor| Brian A. Wandell | grad student | 2006 | Stanford | |
| (A system study of high dynamic range imaging.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Lyu Z, Jiang H, Xiao F, et al. (2021) Simulations of fluorescence imaging in the oral cavity. Biomedical Optics Express. 12: 4276-4292 |
| Liu J, Goddard PA, Singleton J, et al. (2016) Antiferromagnetism in a Family of S = 1 Square Lattice Coordination Polymers NiX2(pyz)2 (X = Cl, Br, I, NCS; pyz = Pyrazine). Inorganic Chemistry |
| Liu X, Byczko A, Choi M, et al. (2011) CMOS digital intra-oral sensor for x-ray radiography Proceedings of Spie. 7961 |
| Xiao F, Farrell J, Catrysse P, et al. (2009) Mobile imaging: The big challenge of the small pixel Proceedings of Spie - the International Society For Optical Engineering. 7250 |
| Xiao F, Pincenti J, John G, et al. (2007) Camera motion and mobile imaging Electronic Imaging. 6502: 650204 |
| Farrell JE, Xiao F, Kavusi S. (2006) Resolution and light sensitivity tradeoff with pixel size Electronic Imaging. 6069: 211-218 |
| Xiao F, Zhang X, Fowler B. (2005) Color processing in camera phones: How good does it need to be? Electronic Imaging. 5678: 96-104 |
| Xiao F, Farrell JE, Wandell BA. (2005) Psychophysical thresholds and digital camera sensitivity: The thousand photon limit Proceedings of Spie - the International Society For Optical Engineering. 5678: 75-84 |
| Farrell JE, Xiao F, Catrysse PB, et al. (2004) A simulation tool for evaluating digital camera image quality Proceedings of Spie - the International Society For Optical Engineering. 5294: 124-131 |
| Xiao F, Farrell JE, DiCarlo JM, et al. (2003) Preferred color spaces for white balancing Proceedings of Spie - the International Society For Optical Engineering. 5017: 342-350 |