Andreas Kuehlmann
Affiliations: | Electrical Engineering and Computer Science | University of California, Berkeley, Berkeley, CA, United States |
Area:
Design, Modeling and Analysis (DMA)Google:
"Andreas Kuehlmann"Children
Sign in to add traineeDonald Chai | grad student | 2009 | UC Berkeley |
Nathan B. Kitchen | grad student | 2010 | UC Berkeley |
Tobias Welp | grad student | 2013 | UC Berkeley |
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Publications
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Welp T, Kuehlmann A. (2014) Property directed invariant refinement for program verification Proceedings -Design, Automation and Test in Europe, Date |
Welp T, Kuehlmann A. (2014) Property Directed Reachability for QF-BV with mixed type atomic reasoning units Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 738-743 |
Welp T, Kuehlmann A. (2013) QF-BV model checking with property directed reachability Proceedings -Design, Automation and Test in Europe, Date. 791-796 |
Welp T, Krishnaswamy S, Kuehlmann A. (2012) Generalized SAT-sweeping for post-mapping optimization Proceedings - Design Automation Conference. 814-819 |
Welp T, Kitchen N, Kuehlmann A. (2012) Hardware acceleration for constraint solving for random simulation Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 779-789 |
Zhu Q, Kitchen NB, Kuehlmann A, et al. (2011) SAT sweeping with local observability don't-cares Advanced Techniques in Logic Synthesis, Optimizations and Applications. 129-148 |
Puggelli A, Welp T, Kuehlmann A, et al. (2011) Are logic synthesis tools robust? Proceedings - Design Automation Conference. 633-638 |
Welp T, Kuehlmann A. (2011) An approach for dynamic selection of synthesis transformations based on Markov decision processes Proceedings -Design, Automation and Test in Europe, Date. 1533-1536 |
Wei Z, Chai D, Kuehlmann A, et al. (2006) Fast Boolean matching with don't cares Proceedings - International Symposium On Quality Electronic Design, Isqed. 346-351 |
Chai D, Kuehlmann A. (2006) Building a better boolean matcher and symmetry detector Proceedings -Design, Automation and Test in Europe, Date. 1 |