Eunchul Yoon, Ph.D.
Affiliations: | 2006 | Stanford University, Palo Alto, CA |
Area:
Electronics and Electrical EngineeringGoogle:
"Eunchul Yoon"Parents
Sign in to add mentorArogyaswami J. Paulraj | grad student | 2006 | Stanford | |
(Exploiting correlation statistics in OFDM/OFDMA wireless communications.) |
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Publications
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Kim H, Yun U, Baek Y, et al. (2021) Efficient List based Mining of High Average Utility Patterns with Maximum Average Pruning Strategies Information Sciences. 543: 85-105 |
Baek Y, Yun U, Yoon E, et al. (2020) Uncertainty-Based Pattern Mining for Maximizing Profit of Manufacturing Plants With List Structure Ieee Transactions On Industrial Electronics. 67: 9914-9926 |
Nam H, Yun U, Yoon E, et al. (2020) Efficient approach of recent high utility stream pattern mining with indexed list structure and pruning strategy considering arrival times of transactions Information Sciences. 529: 1-27 |
Kim J, Yun U, Yoon E, et al. (2020) One scan based high average-utility pattern mining in static and dynamic databases Future Generation Computer Systems. 111: 143-158 |
Yun U, Nam H, Kim J, et al. (2020) Efficient transaction deleting approach of pre-large based high utility pattern mining in dynamic databases Future Generation Computer Systems. 103: 58-78 |
Nam H, Yun U, Yoon E, et al. (2020) Efficient approach for incremental weighted erasable pattern mining with list structure Expert Systems With Applications. 143: 113087 |
Baek Y, Yun U, Kim H, et al. (2020) Erasable pattern mining based on tree structures with damped window over data streams Engineering Applications of Artificial Intelligence. 94: 103735 |
Hwang D, Yang J, Yoon E, et al. (2019) Beamformer Optimization for the Full-Duplex AF Relay Wiretap Channels Ieee Wireless Communications Letters. 8: 129-132 |
Yoon E, Kim S, Kwon S, et al. (2019) An Efficient Index Mapping Algorithm for OFDM-Index Modulation Ieee Access. 7: 184194-184206 |
Yun U, Lee G, Yoon E. (2019) Advanced approach of sliding window based erasable pattern mining with list structure of industrial fields Information Sciences. 494: 37-59 |