Suk J. Bae, Ph.D.
Affiliations: | 2003 | Georgia Institute of Technology, Atlanta, GA |
Area:
Industrial EngineeringGoogle:
"Suk Bae"Parents
Sign in to add mentorPaul Kvam | grad student | 2003 | Georgia Tech | |
(Analysis of dynamic robust design experiment and modeling approach for degradation testing.) |
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Publications
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Yuan T, Bae SJ, Kuo Y. (2020) Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits Ieee Transactions On Reliability. 69: 510-521 |
Dong W, Liu S, Bae SJ, et al. (2020) A multi-stage imperfect maintenance strategy for multi-state systems with variable user demands Computers & Industrial Engineering. 145: 106508 |
Lin C, Cabrera J, Yang F, et al. (2020) Battery state of health modeling and remaining useful life prediction through time series model Applied Energy. 275: 115338 |
Kim S, Kwon D, Bae SJ. (2020) A drop-impact reliability assessment of mobile display modules using a statistical modeling approach Journal of Mechanical Science and Technology. 1-11 |
Lim H, Kim YS, Bae SJ, et al. (2019) Partial accelerated degradation test plans for Wiener degradation processes Quality Technology and Quantitative Management. 16: 67-81 |
Yuan T, Wu X, Bae SJ, et al. (2019) Reliability assessment of a continuous-state fuel cell stack system with multiple degrading components Reliability Engineering & System Safety. 189: 157-164 |
Kim SJ, Mun BM, Bae SJ. (2019) A cost-driven reliability demonstration plan based on accelerated degradation tests Reliability Engineering & System Safety. 183: 226-239 |
Mun BM, Choi YJ, Ji YM, et al. (2018) Modeling and Analysis of Accelerated Degradation Testing Data for a Solid State Drive (SSD) Journal of Automated Reasoning. 18: 33-39 |
Wang P, Tang Y, Bae SJ, et al. (2018) Bayesian Approach for Two-Phase Degradation Data Based on Change-Point Wiener Process With Measurement Errors Ieee Transactions On Reliability. 67: 688-700 |
Wang P, Tang Y, Bae SJ, et al. (2018) Bayesian analysis of two-phase degradation data based on change-point Wiener process Reliability Engineering & System Safety. 170: 244-256 |