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Yufeng Lu, Ph.D.

Affiliations: 
2007 Illinois Institute of Technology, Chicago, IL, United States 
Area:
Electronics and Electrical Engineering
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"Yufeng Lu"
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Jafar Saniie grad student 2007 Illinois Institute of Technology
 (Chirplet signal decomposition: Analysis, algorithms and applications.)

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Publications

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Wang J, Ahn IS, Lu Y, et al. (2017) A distributed estimation algorithm for collective behaviors in multiagent systems with applications to unicycle agents International Journal of Control Automation and Systems. 15: 2829-2839
Lu Y, Saniie J. (2015) Singular spectrum analysis for trend extraction in ultrasonic backscattered echoes 2015 Ieee International Ultrasonics Symposium, Ius 2015
Lu Y, Saniie J. (2015) Model-based parameter estimation for defect characterization in ultrasonic NDE applications 2015 Ieee International Ultrasonics Symposium, Ius 2015
Lu Y, Saniie J. (2014) Adaptive filtering and Fractional Fourier transform for ultrasonic signal processsing and flaw detection Ieee International Ultrasonics Symposium, Ius. 1932-1935
Lu Y, Demirli R, Saniie J. (2014) NDE applications of compressed sensing, signal decomposition and echo estimation Ieee International Ultrasonics Symposium, Ius. 1928-1931
Lu Y, Oruklu E, Saniie J. (2013) Chirplet Signal and Empirical Mode Decompositions of Ultrasonic Signals for Echo Detection and Estimation Journal of Signal and Information Processing. 4: 149-157
Lu Y, Demirli R, Saniie J. (2013) Echo parameter estimation for ultrasonic NDE applications via a two-step compressed sensing Ieee International Ultrasonics Symposium, Ius. 966-969
Lu Y, Kasaeifard A, Oruklu E, et al. (2012) Fractional fourier transform for ultrasonic chirplet signal decomposition Advances in Acoustics and Vibration
Lu Y, Oruklu E, Saniie J. (2011) Analysis of fractional fourier transform for ultrasonic NDE applications Ieee International Ultrasonics Symposium, Ius. 512-515
Lu Y. (2011) The calibration apparatus of transformer calibrator based on digital standard source Proceedings - Ieee 2011 10th International Conference On Electronic Measurement and Instruments, Icemi 2011. 2: 263-265
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