Jagannathan Rajagopalan, Ph.D.
Affiliations: | 2009 | University of Illinois, Urbana-Champaign, Urbana-Champaign, IL |
Area:
Mechanical Engineering, Materials Science Engineering, Applied MechanicsGoogle:
"Jagannathan Rajagopalan"Mean distance: 23748
Parents
Sign in to add mentor| Muhammed Taher Abu Saif | grad student | 2009 | UIUC | |
| (Microstructural heterogeneity and the mechanical behavior of nanocrystalline metals.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Ebner C, Rajagopalan J, Lekka C, et al. (2019) Electron beam induced rejuvenation in a metallic glass film during in-situ TEM tensile straining Acta Materialia. 181: 148-159 |
| Izadi E, Opie S, Lim H, et al. (2018) Effect of plastic anisotropy on the deformation behavior of bicrystalline aluminum films – Experiments and modeling Acta Materialia. 142: 58-70 |
| Sarkar R, Ebner C, Izadi E, et al. (2017) Revealing anelasticity and structural rearrangements in nanoscale metallic glass films using in situ TEM diffraction. Materials Research Letters. 5: 135-143 |
| Izadi E, Peralta P, Rajagopalan J. (2017) In Situ TEM Investigation of the Deformation Mechanisms and Microstructural Changes in Ultrafine-grained Non-textured Aluminum Film Using Automated Crystal Orientation Mapping Microscopy and Microanalysis. 23: 768-769 |
| Sarkar R, Rajagopalan J, Ebner C, et al. (2017) In-situ Deformation of Various Micro/Nanoscaled Samples in the Transmission Electron Microscope: Experimental Results and Pitfalls Microscopy and Microanalysis. 23: 762-763 |
| Vallabhaneni R, Izadi E, Mayer CR, et al. (2017) In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM) Microelectronics Reliability. 79: 314-320 |
| Izadi E, Darbal A, Sarkar R, et al. (2017) Grain rotations in ultrafine-grained aluminum films studied using in situ TEM straining with automated crystal orientation mapping Materials & Design. 113: 186-194 |
| Ebner C, Sarkar R, Rajagopalan J, et al. (2016) Local, atomic-level elastic strain measurements of metallic glass thin films by electron diffraction. Ultramicroscopy. 165: 51-58 |
| Izadi E, Darbal A, Peralta P, et al. (2016) In Situ TEM Straining of Ultrafine-grained Aluminum Films of Different Textures Using Automated Crystal Orientation Mapping. Microscopy and Microanalysis. 22: 1950-1951 |
| Sarkar R, Rentenberger C, Rajagopalan J. (2016) Anomalous Beam Effects during in situ Transmission Electron Microscopy Deformation of Nanocrystalline and Ultrafine-grained Metals Microscopy and Microanalysis. 22: 1498-1499 |