Manisha Dixit, Ph.D.

Affiliations: 
2013 Materials Science and Engineering Ohio State University, Columbus, Columbus, OH 
Area:
Materials Science Engineering
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"Manisha Dixit"

Parents

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Hamish L. Fraser grad student 2013 Ohio State
 (Structure-Property Correlations in Double Perovskite Systems.)
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Publications

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Meyer TL, Dixit M, Williams REA, et al. (2014) Cation non-stoichiometry in pulsed laser deposited Sr2+yFe 1+xMo1-xO6 epitaxial films Journal of Applied Physics. 116
Esser BD, D'Alfonso AJ, Dixit M, et al. (2014) Understanding B-site disorder in HAADF-STEM images of double perovskite thin films using the quantum excitation of phonons model Microscopy and Microanalysis. 20: 184-185
Lucy JM, Hauser AJ, Wang HL, et al. (2013) Buffer-layer enhanced structural and electronic quality in ferrimagnetic Sr2CrReO6 epitaxial films Applied Physics Letters. 103
Esser B, Dixit M, Hauser A, et al. (2013) Viability of HAADF-STEM Imaging Contrast and Simulations as a Measure of B-site Ordering for Double Perovskites Microscopy and Microanalysis. 19: 610-611
Hauser AJ, Soliz JR, Dixit M, et al. (2012) Fully ordered Sr 2CrReO 6 epitaxial films: A high-temperature ferrimagnetic semiconductor Physical Review B - Condensed Matter and Materials Physics. 85
Williams R, Dixit M, Mishra R, et al. (2012) Comparative Study for Simulation of EELS Core Loss for Transition Metals in Double Perovskite Systems Microscopy and Microanalysis. 18: 308-309
Hauser AJ, Williams REA, Ricciardo RA, et al. (2011) Unlocking the potential of half-metallic Sr2FeMoO6 films through controlled stoichiometry and double-perovskite ordering Physical Review B - Condensed Matter and Materials Physics. 83
Williams R, Hauser A, Richiardo R, et al. (2011) HR-STEM Imaging and EELS Characterizing of Nano-Scale Defects in Sputter Deposited Thin Films of Double-Perovskite Sr2FeMoO6 (SFMO) and Sr2CrReO6 (SCRO) Microscopy and Microanalysis. 17: 1654-1655
Williams R, Dixit M, Mishra R, et al. (2010) Structural and Compositional Transitions at the Atomic Scale Across Interfaces, Faults and Phase Separations in Complex Oxides Microscopy and Microanalysis. 16: 1404-1405
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