Sheng Tong, Ph.D.

Affiliations: 
2012 Materials Science University of Cincinnati, Cincinnati, OH 
Area:
Materials Science Engineering, Inorganic Chemistry
Google:
"Sheng Tong"
Mean distance: (not calculated yet)
 

Parents

Sign in to add mentor
Donglu Shi grad student 2012 University of Cincinnati
 (Dielectric and Ferroelectric Properties of Lead Lanthanum Zirconate Titanate Thin Films for Capacitive Energy Storage.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Tong S. (2021) Size and temperature effects on dielectric breakdown of ferroelectric films Journal of Advanced Ceramics. 10: 181-186
Tong SK, Chi PW, Kung SH, et al. (2018) Tuning bandgap and surface wettability of NiFe2O4 driven by phase transition. Scientific Reports. 8: 1338
Das S, Bera MK, Tong S, et al. (2016) A Self-Limiting Electro-Ablation Technique for the Top-Down Synthesis of Large-Area Monolayer Flakes of 2D Materials. Scientific Reports. 6: 28195
Choi YY, Tong S, Ducharme S, et al. (2016) Charge collection kinetics on ferroelectric polymer surface using charge gradient microscopy. Scientific Reports. 6: 25087
Tong S, Ma B, Narayanan M, et al. (2013) Lead lanthanum zirconate titanate ceramic thin films for energy storage. Acs Applied Materials & Interfaces. 5: 1474-80
Ma B, Liu S, Tong S, et al. (2013) Residual stress of (Pb0.92La0.08)(Zr 0.52Ti0.48)O3 films grown by a sol-gel process Smart Materials and Structures. 22
Ma B, Hu Z, Liu S, et al. (2013) Temperature-dependent dielectric nonlinearity of relaxor ferroelectric Pb0.92La0.08Zr0.52Ti0.48O 3 thin films Applied Physics Letters. 102
Liu S, Ma B, Narayanan M, et al. (2013) Dielectric properties of lead lanthanum zirconate titanate thin films with and without ZrO2 insertion layers Journal of Applied Physics. 113
Narayanan M, Tong S, Liu S, et al. (2013) Estimation of intrinsic contribution to dielectric response of Pb0.92La0.08Zr0.52Ti0.48O3 thin films at low frequencies using high bias fields Applied Physics Letters. 102: 62906
Tong S, Ma B, Narayanan M, et al. (2013) Dielectric behavior of lead lanthanum zirconate titanate thin films deposited on different electrodes/substrates Materials Letters. 106: 405-408
See more...