Bethany M Hudak
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Materials science, electron microscopyGoogle:
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Cross-listing: Materials Tree
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Publications
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| Ovchinnikov OS, O’Hara A, Jesse S, et al. (2020) Detection of defects in atomic-resolution images of materials using cycle analysis Advanced Structural and Chemical Imaging. 6: 1-9 |
| Dyck O, Ziatdinov M, Lingerfelt DB, et al. (2020) Author Correction: Atom-by-atom fabrication with electron beams Nature Reviews Materials. 1-1 |
| Yu L, Hudak BM, Ullah A, et al. (2020) Unveiling the Microscopic Origins of Phase Transformations: An in Situ TEM Perspective† Chemistry of Materials. 32: 639-650 |
| Markevich A, Hudak B, Lupini A, et al. (2020) Uncovering the Mechanism for Electron-Beam Manipulation of Dopants in Silicon Microscopy and Microanalysis. 1-3 |
| Song J, Hudak BM, Lupini AR. (2020) Evolution of lattice defects upon Bi-doping of epitaxial Si overlayers on Si(1 0 0) Applied Surface Science. 502: 144284 |
| Dyck O, Ziatdinov M, Lingerfelt DB, et al. (2019) Atom-by-atom fabrication with electron beams Nature Reviews Materials. 4: 497-507 |
| Hudak BM, Sun W, Mackey J, et al. (2019) Observation of Square-Planar Distortion in Lanthanide-DopedSkutterudite Crystals Journal of Physical Chemistry C. 123: 14632-14638 |
| Lupini AR, Hudak BM, Jesse S, et al. (2019) From Control of the Electron Beam to Control of Single Atoms Microscopy and Microanalysis. 25: 1678-1679 |
| Yu L, Han R, Sang X, et al. (2018) Shell-Induced Ostwald Ripening: Simultaneous Structure, Composition, and Morphology Transformations during the Creation of Hollow Iron Oxide Nanocapsules. Acs Nano |
| Hudak BM, Song J, Sims H, et al. (2018) Directed Atom-by-Atom Assembly of Dopants in Silicon. Acs Nano |