Keith Schaffner Champlin
Affiliations: | Electrical Engineering | University of Minnesota, Twin Cities, Minneapolis, MN |
Area:
Electrical engineeringWebsite:
https://ece.umn.edu/directory/champlin-keith-s/Google:
"Keith Schaffner Champlin"Bio:
http://www.ee.umn.edu/users/champlin/
https://www.researchgate.net/scientific-contributions/2339301_KS_Champlin
https://books.google.com/books?id=mCchAQAAMAAJ
http://conservancy.umn.edu/bitstream/handle/11299/108493/RegisterOfPhD_1966.pdf?sequence=1
Parents
Sign in to add mentor| Aldert van der Ziel | grad student | 1958 | UMN | |
| (The electrical noise of reverse bias breakdown in silicon p-n junctions.) | ||||
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Publications
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| Champlin KS, Glover GH, Holm JD. (1969) Bulk Microwave Conductivity of Semiconductors Determined from TEo01-Mode Reflectivity of Boule Surface Ieee Transactions On Instrumentation and Measurement. 18: 105-110 |
| Glover GH, Champlin KS. (1969) Microwave Permittivity of the InSb Lattice at 77°K Journal of Applied Physics. 40: 2315-2316 |
| Hauge PS, Champlin KS. (1968) The Microwave Magneto-Kerr Effect in Silicon and Germanium. II. Determination of Relaxation Time and Effective Mass Journal of Applied Physics. 39: 4099-4106 |
| Hauge PS, Champlin KS. (1968) The Microwave Magneto‐Kerr Effect in Silicon and Germanium. I. Measurement of Complex Hall Factor Journal of Applied Physics. 39: 2395-2400 |
| Holm JD, Champlin KS. (1968) Microwave Conductivity of Silicon and Germanium Journal of Applied Physics. 39: 275-284 |
| Lu T, Glover GH, Champlin KS. (1968) MICROWAVE PERMITTIVITY OF THE GaAs LATTICE AT TEMPERATURES BETWEEN 100°K AND 600°K Applied Physics Letters. 13: 404-404 |
| Champlin KS, Glover GH. (1968) TEMPERATURE DEPENDENCE OF THE MICROWAVE DIELECTRIC CONSTANT OF THE GaAs LATTICE Applied Physics Letters. 12: 231-232 |
| Champlin KS, Erlandson RJ, Glover GH, et al. (1967) Search for Resonance Behavior in the Microwave Dielectric Constant of GaAs Applied Physics Letters. 11: 348-349 |
| Patrin NA, Armstrong DB, Champlin KS. (1967) Determination of Effective Electron Mass in Lightly Doped Silicon from Microwave Reflectivity Journal of Applied Physics. 38: 2704-2705 |
| Champlin KS, Holm JD, Glover GH. (1967) Electrodeless Determination of Semiconductor Conductivity from TE01°‐Mode Reflectivity Journal of Applied Physics. 38: 96-98 |