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Tsu-Jae King Liu - Publications

Affiliations: 
1996- Electrical Engineering and Computer Sciences University of California, Berkeley, Berkeley, CA, United States 
Area:
Nanofabrication
Website:
https://www.eecs.berkeley.edu/Faculty/Homepages/king.html
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13 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2015 Xu N, Takeuchi H, Hytha M, Cody NW, Stephenson RJ, Kwak B, Cha SY, Mears RJ, King Liu TJ. Electron mobility enhancement in (100) oxygen-inserted silicon channel Applied Physics Letters. 107. DOI: 10.1063/1.4931431  0.462
2013 Chen Y, Nathanael R, Yaung J, Hutin L, King Liu TJ. Reliability of MEM relays for zero leakage logic Proceedings of Spie - the International Society For Optical Engineering. 8614. DOI: 10.1117/12.2005719  0.718
2011 Damrongplasit N, Shin C, Kim SH, Vega RA, King Liu TJ. Study of random dopant fluctuation effects in Germanium-source tunnel FETs Ieee Transactions On Electron Devices. 58: 3541-3548. DOI: 10.1109/Ted.2011.2161990  0.555
2011 King Liu TJ, Matheu P, Jacobson Z, Kim SH. Steep-subthreshold-slope devices on SOI Proceedings - Ieee International Soi Conference. DOI: 10.1109/SOI.2011.6081702  0.712
2010 Lee D, Tran H, King Liu TJ. Characterization of nanometer-scale gap formation Journal of the Electrochemical Society. 157: H94-H98. DOI: 10.1149/1.3253546  0.697
2010 Pott V, Kam H, Nathanael R, Jeon J, Alon E, King Liu TJ. Mechanical computing redux: Relays for integrated circuit applications Proceedings of the Ieee. 98: 2076-2094. DOI: 10.1109/JPROC.2010.2063411  0.732
2010 Jeon J, Pott V, Kam H, Nathanael R, Alon E, King Liu TJ. Seesaw relay logic and memory circuits Journal of Microelectromechanical Systems. 19: 1012-1014. DOI: 10.1109/Jmems.2010.2049826  0.667
2010 Chen F, Spencer M, Nathanael R, Wang C, Fariborzi H, Gupta A, Kam H, Pott V, Jeon J, King Liu TJ, Markovic D, Stojanovic V, Alon E. Demonstration of integrated micro-electro-mechanical switch circuits for VLSI applications Digest of Technical Papers - Ieee International Solid-State Circuits Conference. 53: 150-151. DOI: 10.1109/ISSCC.2010.5434010  0.74
2010 Kam H, Alon E, King Liu TJ. A predictive contact reliability model for MEM logic switches Technical Digest - International Electron Devices Meeting, Iedm. 16.4.1-16.4.4. DOI: 10.1109/IEDM.2010.5703375  0.631
2008 Sun X, Lu Q, Moroz V, Takeuchi H, Gebara G, Wetzel J, Ikeda S, Shin C, King Liu TJ. Tri-gate bulk MOSFET design for CMOS scaling to the end of the roadmap Ieee Electron Device Letters. 29: 491-493. DOI: 10.1109/Led.2008.919795  0.644
2007 Lee D, Seidel T, Dalton J, King Liu TJ. ALD refill of vanometer-scale gaps with high- κ dielectric for advanced CMOS technologies Electrochemical and Solid-State Letters. 10: 257-259. DOI: 10.1149/1.2749331  0.7
2007 Sun X, Lu Q, Takeuchi H, Balasubramanian S, King Liu TJ. Selective enhancement of SiO2 etch rate by Ar-ion implantation for improved etch depth control Electrochemical and Solid-State Letters. 10: 89-91. DOI: 10.1149/1.2748634  0.55
2007 Padilla A, Shin K, King Liu TJ, Hyun JW, Yoo I, Park Y. Dual-bit gate-sidewall storage FinFET NVM and new method of charge detection Ieee Electron Device Letters. 28: 502-505. DOI: 10.1109/Led.2007.896786  0.495
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