Year |
Citation |
Score |
2016 |
Stowers J, Anderson J, Cardineau B, Clark B, De Schepper P, Edson J, Greer M, Jiang K, Kocsis M, Meyers S, Telecky A, Grenville A, De Simone D, Gillijns W, Vandenberghe G. Metal oxide EUV photoresist performance for N7 relevant patterns and processes Proceedings of Spie - the International Society For Optical Engineering. 9779. DOI: 10.1117/12.2219527 |
0.634 |
|
2015 |
Grenville A, Anderson JT, Clark BL, De Schepper P, Edson J, Greer M, Jiang K, Kocsis M, Meyers ST, Stowers JK, Telecky AJ, De Simone D, Vandenberghe G. Integrated fab process for metal oxide EUV photoresist Proceedings of Spie - the International Society For Optical Engineering. 9425. DOI: 10.1117/12.2086006 |
0.636 |
|
2014 |
Flynn B, Kim D, Clark BL, Telecky A, Arnadottir L, Szanyi J, Keszler DA, Herman GS. In-situ characterization of aqueous-based hafnium oxide hydroxide sulfate thin films Surface and Interface Analysis. 46: 210-215. DOI: 10.1002/Sia.5205 |
0.525 |
|
2011 |
Stowers JK, Telecky A, Kocsis M, Clark BL, Keszler DA, Grenville A, Anderson CN, Naulleau PP. Directly patterned inorganic hardmask for EUV lithography Proceedings of Spie - the International Society For Optical Engineering. 7969. DOI: 10.1117/12.879542 |
0.738 |
|
2010 |
Telecky A, Xie P, Stowers J, Grenville A, Smith B, Keszler DA. Photopatternable inorganic hardmask Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 28: C6S19-C6S22. DOI: 10.1116/1.3507889 |
0.708 |
|
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