| Year |
Citation |
Score |
| 2013 |
Forgues JC, Sane FB, Blanchard S, Spietz L, Lupien C, Reulet B. Noise intensity-intensity correlations and the fourth cumulant of photo-assisted shot noise. Scientific Reports. 3: 2869. PMID 24100407 DOI: 10.1038/Srep02869 |
0.53 |
|
| 2013 |
Ranzani L, Spietz L, Popovic Z, Aumentado J. Two-port microwave calibration at millikelvin temperatures. The Review of Scientific Instruments. 84: 034704. PMID 23556834 DOI: 10.1063/1.4794910 |
0.363 |
|
| 2013 |
Gasse G, Spietz L, Lupien C, Reulet B. Observation of quantum oscillations in the photoassisted shot noise of a tunnel junction Physical Review B - Condensed Matter and Materials Physics. 88. DOI: 10.1103/Physrevb.88.241402 |
0.553 |
|
| 2013 |
Gabelli J, Spietz L, Aumentado J, Reulet B. Electron-photon correlations and the third moment of quantum noise New Journal of Physics. 15. DOI: 10.1088/1367-2630/15/11/113045 |
0.516 |
|
| 2013 |
Ranzani L, Spietz L, Aumentado J. Broadband calibrated scattering parameters characterization of a superconducting quantum interference device amplifier Applied Physics Letters. 103. DOI: 10.1063/1.4813549 |
0.396 |
|
| 2012 |
Ranzani L, Spietz L, Popovic Z, Aumentado J. A 4:1 transmission-line impedance transformer for broadband superconducting circuits Ieee Transactions On Applied Superconductivity. 22. DOI: 10.1109/Tasc.2012.2202116 |
0.376 |
|
| 2011 |
Hoffman AJ, Srinivasan SJ, Schmidt S, Spietz L, Aumentado J, Türeci HE, Houck AA. Dispersive photon blockade in a superconducting circuit. Physical Review Letters. 107: 053602. PMID 21867068 DOI: 10.1103/Physrevlett.107.053602 |
0.355 |
|
| 2010 |
Spietz L, Irwin K, Lee M, Aumentado J. Noise performance of lumped element direct current superconducting quantum interference device amplifiers in the 4-8 GHz range Applied Physics Letters. 97. DOI: 10.1063/1.3497008 |
0.562 |
|
| 2009 |
Spietz L, Irwin K, Aumentado J. Superconducting quantum interference device amplifiers with over 27 GHz of gain-bandwidth product operated in the 4-8 GHz frequency range Applied Physics Letters. 95. DOI: 10.1063/1.3220061 |
0.383 |
|
| 2008 |
Spietz L, Tew W, Schoelkopf RJ. Systematic errors in shot noise thermometer measurements Cpem Digest (Conference On Precision Electromagnetic Measurements). 702-703. DOI: 10.1109/CPEM.2008.4574973 |
0.617 |
|
| 2008 |
Spietz L, Irwin K, Aumentado J. Input impedance and gain of a gigahertz amplifier using a dc superconducting quantum interference device in a quarter wave resonator Applied Physics Letters. 93. DOI: 10.1063/1.2970967 |
0.548 |
|
| 2006 |
Spietz L, Schoelkopf RJ, Pari P. Shot noise thermometry down to 10 mK Applied Physics Letters. 89. DOI: 10.1063/1.2382736 |
0.665 |
|
| 2004 |
Reulet B, Spietz L, Wilson CM, Senzier J, Prober DE. Measurement of non-Gaussian shot noise: Influence of the environment Proceedings of Spie - the International Society For Optical Engineering. 5469: 244-256. DOI: 10.1117/12.543529 |
0.528 |
|
| 2004 |
Spietz L, Lehnert KW, Siddiqi I, Schoelkopf RJ. The shot noise thermometer: Primary electronic thermometry using the noise from a tunnel junction Cpem Digest (Conference On Precision Electromagnetic Measurements). 638-639. DOI: 10.1109/CPEM.2004.305436 |
0.663 |
|
| 2004 |
Roschier L, Hakonen P, Bladh K, Delsing P, Lehnert KW, Spietz L, Schoelkopf RJ. Noise performance of the radio-frequency single-electron transistor Journal of Applied Physics. 95: 1274-1286. DOI: 10.1063/1.1635972 |
0.651 |
|
| 2003 |
Lehnert KW, Turek BA, Bladh K, Spietz LF, Gunnarsson D, Delsing P, Schoelkopf RJ. Quantum charge fluctuations and the polarizability of the single-electron box. Physical Review Letters. 91: 106801. PMID 14525496 DOI: 10.1103/Physrevlett.91.106801 |
0.6 |
|
| 2003 |
Spietz L, Lehnert KW, Siddiqi I, Schoelkopf RJ. Primary electronic thermometry using the shot noise of a tunnel junction. Science (New York, N.Y.). 300: 1929-32. PMID 12817144 DOI: 10.1126/Science.1084647 |
0.672 |
|
| 2003 |
Lehnert KW, Bladh K, Spietz LF, Gunnarsson D, Schuster DI, Delsing P, Schoelkopf RJ. Measurement of the excited-state lifetime of a microelectronic circuit. Physical Review Letters. 90: 027002. PMID 12570573 DOI: 10.1103/Physrevlett.90.027002 |
0.597 |
|
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