| Year |
Citation |
Score |
| 2020 |
Thompson GZ, Maitra R, Meeker WQ, Bastawros AF. Classification with the matrix-variate- distribution. Journal of Computational and Graphical Statistics : a Joint Publication of American Statistical Association, Institute of Mathematical Statistics, Interface Foundation of North America. 29: 668-674. PMID 33716477 DOI: 10.1080/10618600.2019.1696208 |
0.313 |
|
| 2020 |
Shan Q, Hong Y, Meeker WQ. Seasonal warranty prediction based on recurrent event data Annals of Applied Statistics. 14: 929-955. DOI: 10.1214/20-Aoas1333 |
0.631 |
|
| 2020 |
Weaver BP, Meeker WQ. Bayesian Methods for Planning Accelerated Repeated Measures Degradation Tests Technometrics. 1-10. DOI: 10.1080/00401706.2019.1695676 |
0.704 |
|
| 2020 |
Xu L, Gotwalt C, Hong Y, King CB, Meeker WQ. Applications of the Fractional-Random-Weight Bootstrap The American Statistician. 1-21. DOI: 10.1080/00031305.2020.1731599 |
0.639 |
|
| 2019 |
Sun Y, Wang C, Meeker WQ, Morris M, Rotolo ML, Zimmerman J. A latent spatial piecewise exponential model for interval-censored disease surveillance data with time-varying covariates and misclassification Statistics and Its Interface. 12: 11-19. DOI: 10.4310/Sii.2019.V12.N1.A2 |
0.324 |
|
| 2019 |
Hahn GJ, Doganaksoy N, Meeker WQ. Statistical intervals, not statistical significance Significance. 16: 20-22. DOI: 10.1111/J.1740-9713.2019.01298.X |
0.344 |
|
| 2019 |
Tian Q, Liu S, Meeker WQ. Using degradation models to assess pipeline life Applied Stochastic Models in Business and Industry. 35: 1411-1430. DOI: 10.1002/Asmb.2489 |
0.716 |
|
| 2018 |
Mittman E, Lewis-Beck C, Meeker WQ. A Hierarchical Model for Heterogenous Reliability Field Data Technometrics. 61: 354-368. DOI: 10.1080/00401706.2018.1518273 |
0.373 |
|
| 2018 |
Hong Y, Zhang M, Meeker WQ. Big data and reliability applications: The complexity dimension Journal of Quality Technology. 50: 135-149. DOI: 10.1080/00224065.2018.1438007 |
0.629 |
|
| 2017 |
Duan Y, Hong Y, Meeker WQ, Stanley DL, Gu X. Photodegradation modeling based on laboratory accelerated test data and predictions under outdoor weathering for polymeric materials The Annals of Applied Statistics. 11: 2052-2079. DOI: 10.1214/17-Aoas1060 |
0.66 |
|
| 2017 |
Koh Y, Meeker WQ. Quantile POD for nondestructive evaluation with hit--miss data Research in Nondestructive Evaluation. 30: 89-111. DOI: 10.1080/09349847.2017.1374493 |
0.4 |
|
| 2017 |
Xie Y, Hong Y, Escobar LA, Meeker WQ. A general algorithm for computing simultaneous prediction intervals for the (log)-location-scale family of distributions Journal of Statistical Computation and Simulation. 87: 1559-1576. DOI: 10.1080/00949655.2016.1277426 |
0.69 |
|
| 2017 |
Xu Z, Hong Y, Meeker WQ, Osborn BE, Illouz K. A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data Technometrics. 59: 225-236. DOI: 10.1080/00401706.2016.1164758 |
0.647 |
|
| 2016 |
Yuan M, Hong Y, Escobar LA, Meeker WQ. Two-sided tolerance intervals for members of the (log)-location-scale family of distributions Quality Technology and Quantitative Management. 1-19. DOI: 10.1080/16843703.2016.1226594 |
0.679 |
|
| 2016 |
Liu J, Nordman DJ, Meeker WQ. The Number of MCMC Draws Needed to Compute Bayesian Credible Bounds The American Statistician. 70: 275-284. DOI: 10.1080/00031305.2016.1158738 |
0.371 |
|
| 2016 |
King C, Hong Y, Meeker WQ. Product Component Genealogy Modeling and Field-failure Prediction Quality and Reliability Engineering International. DOI: 10.1002/Qre.1996 |
0.687 |
|
| 2015 |
Hong Y, Duan Y, Meeker WQ, Stanley DL, Gu X. Statistical methods for degradation data with dynamic covariates information and an application to outdoor weathering data Technometrics. 57: 180-193. DOI: 10.1080/00401706.2014.915891 |
0.702 |
|
| 2015 |
Liu S, Meeker WQ. Statistical methods for estimating the minimum thickness along a pipeline Technometrics. 57: 164-179. DOI: 10.1080/00401706.2014.915236 |
0.708 |
|
| 2015 |
Hong Y, King C, Zhang Y, Meeker WQ. Bayesian Life Test Planning for Log-Location-Scale Family of Distributions Journal of Quality Technology. 47: 336-350. DOI: 10.1080/00224065.2015.11918138 |
0.7 |
|
| 2015 |
Liu S, Wu H, Meeker WQ. Understanding and Addressing the Unbounded “Likelihood” Problem American Statistician. 69: 191-200. DOI: 10.1080/00031305.2014.1003968 |
0.694 |
|
| 2014 |
Hong Y, Meeker WQ. Confidence interval procedures for system reliability and applications to competing risks models. Lifetime Data Analysis. 20: 161-84. PMID 23381812 DOI: 10.1007/S10985-013-9245-9 |
0.681 |
|
| 2014 |
Xu Z, Hong Y, Meeker WQ. Assessing Risk of a Serious Failure Mode Based on Limited Field Data Ieee Transactions On Reliability. DOI: 10.1109/Tr.2014.2354893 |
0.676 |
|
| 2014 |
Meeker WQ, Hong Y. Reliability meets big data: Opportunities and challenges Quality Engineering. 26: 102-116. DOI: 10.1080/08982112.2014.846119 |
0.666 |
|
| 2014 |
Li M, Thompson RB, Meeker WQ. Physical model-assisted probability of detection of flaws in titanium forgings using ultrasonic nondestructive evaluation Technometrics. 56: 78-91. DOI: 10.1080/00401706.2013.818580 |
0.373 |
|
| 2014 |
Li M, Meeker WQ. Application of Bayesian methods in reliability data analyses Journal of Quality Technology. 46: 1-23. DOI: 10.1080/00224065.2014.11917951 |
0.461 |
|
| 2014 |
Koh YM, Meeker WQ. Bayesian planning of hit-miss inspection tests Aip Conference Proceedings. 1581: 2047-2054. DOI: 10.1063/1.4865075 |
0.308 |
|
| 2014 |
Koh YM, Meeker WQ. Quantile POD for hit-miss data Aip Conference Proceedings. 1581: 2023-2030. DOI: 10.1063/1.4865072 |
0.324 |
|
| 2014 |
Gao C, Meeker WQ, Mayton D. Detecting cracks in aircraft engine fan blades using vibrothermography nondestructive evaluation Reliability Engineering and System Safety. 131: 229-235. DOI: 10.1016/J.Ress.2014.05.009 |
0.46 |
|
| 2014 |
Weaver BP, Meeker WQ. Rejoinder: Methods for planning repeated measures accelerated degradation tests Applied Stochastic Models in Business and Industry. 30: 686-690. DOI: 10.1002/Asmb.2096 |
0.691 |
|
| 2014 |
Weaver BP, Meeker WQ. Methods for planning repeated measures accelerated degradation tests Applied Stochastic Models in Business and Industry. 30: 658-671. DOI: 10.1002/Asmb.2061 |
0.735 |
|
| 2013 |
Li M, Nakagawa N, Larson BF, Meeker WQ. Statistical assessment of probability of detection for automated eddy current nondestructive evaluation inspection Research in Nondestructive Evaluation. 24: 89-104. DOI: 10.1080/09349847.2012.735352 |
0.301 |
|
| 2013 |
Zuo J, Meeker WQ, Wu H. A simulation study on the confidence interval procedures of some mean cumulative function estimators Journal of Statistical Computation and Simulation. 83: 1868-1889. DOI: 10.1080/00949655.2012.673167 |
0.382 |
|
| 2013 |
Hong Y, Meeker WQ. Field-failure predictions based on failure-time data with dynamic covariate information Technometrics. 55: 135-149. DOI: 10.1080/00401706.2013.765324 |
0.686 |
|
| 2013 |
Weaver BP, Meeker WQ, Escobar LA, Wendelberger J. Methods for planning repeated measures degradation studies Technometrics. 55: 122-134. DOI: 10.1080/00401706.2012.715838 |
0.747 |
|
| 2013 |
Meeker WQ, Sarakakis G, Gerokostopoulos A. More pitfalls of accelerated tests Journal of Quality Technology. 45: 213-222. DOI: 10.1080/00224065.2013.11917927 |
0.427 |
|
| 2013 |
Shi Y, Meeker WQ. Planning Accelerated Destructive Degradation Tests with Competing Risks Statistical Models and Methods For Reliability and Survival Analysis. 335-356. DOI: 10.1002/9781118826805.ch22 |
0.358 |
|
| 2012 |
Shi Y, Meeker WQ. Bayesian methods for accelerated destructive degradation test planning Ieee Transactions On Reliability. 61: 245-253. DOI: 10.1109/Tr.2011.2170115 |
0.448 |
|
| 2012 |
Gao C, Meeker WQ. A statistical method for crack detection from vibrothermography inspection data Quality Technology and Quantitative Management. 9: 59-77. DOI: 10.1080/16843703.2012.11673278 |
0.451 |
|
| 2012 |
Li M, Meeker WQ, Hovey P. Joint estimation of NDE inspection capability and flaw-size distribution for in-service aircraft inspections Research in Nondestructive Evaluation. 23: 104-123. DOI: 10.1080/09349847.2011.654380 |
0.319 |
|
| 2012 |
Zuo J, Wu H, Meeker WQ. Asymptotic properties of mean cumulative function estimators from window-observation recurrence data Journal of Statistical Planning and Inference. 142: 2943-2952. DOI: 10.1016/J.Jspi.2012.04.010 |
0.356 |
|
| 2011 |
Jeng SL, Huang BY, Meeker WQ. Accelerated destructive degradation tests robust to distribution misspecification Ieee Transactions On Reliability. 60: 701-711. DOI: 10.1109/Tr.2011.2161051 |
0.421 |
|
| 2011 |
Li M, Holland SD, Meeker WQ. Quantitative multi-inspection-site comparison of probability of detection for vibrothermography nondestructive evaluation data Journal of Nondestructive Evaluation. 30: 172-178. DOI: 10.1007/S10921-011-0105-9 |
0.323 |
|
| 2011 |
Hong Y, Meeker WQ. The importance of identifying different components of a mixture distribution in the prediction of field returns Applied Stochastic Models in Business and Industry. 27: 280-289. DOI: 10.1002/Asmb.830 |
0.694 |
|
| 2010 |
Hong Y, Meeker WQ. Field-failure and warranty prediction based on auxiliary use-rate information Technometrics. 52: 148-159. DOI: 10.1198/Tech.2010.09097 |
0.685 |
|
| 2010 |
Hong Y, Ma H, Meeker WQ. A tool for evaluating time-varying-stress accelerated life test Plans with log-location-scale distributions Ieee Transactions On Reliability. 59: 620-627. DOI: 10.1109/Tr.2010.2083252 |
0.79 |
|
| 2010 |
Ma H, Meeker WQ. Strategy for planning accelerated life tests with small sample sizes Ieee Transactions On Reliability. 59: 610-619. DOI: 10.1109/Tr.2010.2083251 |
0.729 |
|
| 2010 |
Genschel U, Meeker WQ. A comparison of maximum likelihood and median-rank regression for Weibull estimation Quality Engineering. 22: 236-255. DOI: 10.1080/08982112.2010.503447 |
0.401 |
|
| 2010 |
Hong Y, Escobar LA, Meeker WQ. Coverage probabilities of simultaneous confidence bands and regions for log-location-scale distributions Statistics and Probability Letters. 80: 733-738. DOI: 10.1016/J.Spl.2010.01.003 |
0.664 |
|
| 2009 |
Hong Y, Meeker WQ, McCalley JD. Prediction of remaining life of power transformers based on left truncated and right censored lifetime data Annals of Applied Statistics. 3: 857-879. DOI: 10.1214/00-Aoas231 |
0.671 |
|
| 2009 |
Meeker WQ, Escobar LA, Hong Y. Using accelerated life tests results to predict product field reliability Technometrics. 51: 146-161. DOI: 10.1198/Tech.2009.0016 |
0.697 |
|
| 2009 |
Shi Y, Escobar LA, Meeker WQ. Accelerated destructive degradation test planning Technometrics. 51: 1-13. DOI: 10.1198/Tech.2009.0001 |
0.425 |
|
| 2009 |
Escobar LA, Hong Y, Meeker WQ. Simultaneous confidence bands and regions for log-location-scale distributions with censored data Journal of Statistical Planning and Inference. 139: 3231-3245. DOI: 10.1016/J.Jspi.2009.03.005 |
0.695 |
|
| 2009 |
Vaca-Trigo I, Meeker WQ. A statistical model for linking field and laboratory exposure results for a model coating Service Life Prediction of Polymeric Materials: Global Perspectives. 29-43. |
0.302 |
|
| 2008 |
Zuo J, Meeker WQ, Wu H. Analysis of window-observation recurrence data Technometrics. 50: 128-143. DOI: 10.1198/004017008000000091 |
0.389 |
|
| 2008 |
Hong Y, Meeker WQ, Escobar LA. Avoiding problems with normal approximation confidence intervals for probabilities Technometrics. 50: 64-68. DOI: 10.1198/004017007000000470 |
0.675 |
|
| 2008 |
Hong Y, Meeker WQ, Escobar LA. The relationship between confidence intervals for failure probabilities and life time quantiles Ieee Transactions On Reliability. 57: 260-266. DOI: 10.1109/Tr.2008.920352 |
0.639 |
|
| 2008 |
Chan V, Meeker WQ. Time series modeling of degradation due to outdoor weathering Communications in Statistics - Theory and Methods. 37: 408-424. DOI: 10.1080/03610920701653169 |
0.672 |
|
| 2008 |
Ma H, Meeker WQ. Optimum step-stress accelerated life test Plans for log-location-scale distributions Naval Research Logistics. 55: 551-562. DOI: 10.1002/Nav.20299 |
0.735 |
|
| 2006 |
Escobar LA, Meeker WQ. A review of accelerated test models Statistical Science. 21: 552-577. DOI: 10.1214/088342306000000321 |
0.465 |
|
| 2006 |
Zhang Y, Meeker WQ. Bayesian methods for planning accelerated life tests Technometrics. 48: 49-60. DOI: 10.1198/004017005000000373 |
0.459 |
|
| 2006 |
Wang Y, Meeker WQ. A bivariate regression model for assessment of multizone ultrasonic POD Aip Conference Proceedings. 820: 1870-1877. DOI: 10.1063/1.2184747 |
0.365 |
|
| 2006 |
Wang Y, Meeker WQ. A statistical model to adjust for flaw-size bias in the computation of probability of detection Aip Conference Proceedings. 820: 1854-1861. DOI: 10.1063/1.2184745 |
0.387 |
|
| 2005 |
McKane SW, Escobar LA, Meeker WQ. Sample size and number of failure requirements for demonstration tests with log-location-scale distributions and failure censoring Technometrics. 47: 182-190. DOI: 10.1198/004017005000000030 |
0.445 |
|
| 2005 |
Ryan TP, Meeker WQ. System Reliability Theory: Models, Statistical Methods, and Applications, Second Edition Journal of Quality Technology. 37: 84-87. DOI: 10.1080/00224065.2005.11980303 |
0.324 |
|
| 2005 |
Zhang Y, Meeker WQ. Bayesian life test planning for the Weibull distribution with given shape parameter Metrika. 61: 237-249. DOI: 10.1007/S001840400334 |
0.466 |
|
| 2005 |
Jeng SL, Lahiri SN, Meeker WQ. Asymptotic properties of bootstrapped likelihood ratio statistics for time censored data Statistica Sinica. 15: 35-57. |
0.346 |
|
| 2004 |
Chan V, Lahiri SN, Meeker WQ. Block bootstrap estimation of the distribution of cumulative outdoor degradation Technometrics. 46: 215-224. DOI: 10.1198/004017004000000266 |
0.657 |
|
| 2004 |
Meeker WQ, Escoba LA. Reliability: The Other Dimension of Quality Quality Technology & Quantitative Management. 1: 1-25. DOI: 10.1080/16843703.2004.11673062 |
0.306 |
|
| 2004 |
Thompson RB, Meeker WQ, Chiou C‐, Brasche L, Burkel D, Sturges DJ. Issues in the Determination of Default POD for Hard‐Alpha Inclusions in Titanium Rotating Components for Aircraft Engines Quantitative Nondestructive Evaluation. 700: 1587-1594. DOI: 10.1063/1.1711804 |
0.363 |
|
| 2002 |
Nordman DJ, Meeker WQ. Weibull prediction intervals for a future number of failures Technometrics. 44: 15-23. DOI: 10.1198/004017002753398191 |
0.415 |
|
| 2002 |
Wu H, Meeker WQ. Early detection of reliability problems using information from warranty databases Technometrics. 44: 120-133. DOI: 10.1198/004017002317375073 |
0.332 |
|
| 2001 |
Jeng SL, Meeker WQ. Parametric simultaneous confidence bands for cumulative distributions from censored data Technometrics. 43: 450-461. DOI: 10.1198/00401700152672546 |
0.437 |
|
| 2001 |
Escobar LA, Meeker WQ. The asymptotic equivalence of the fisher information matrices for type I and type II censored data from location-scale families Communications in Statistics - Theory and Methods. 30: 2211-2225. DOI: 10.1081/Sta-100106071 |
0.385 |
|
| 2000 |
Jeng SL, Meeker WQ. Comparisons of approximate confidence interval procedures for Type I censored data Technometrics. 42: 135-148. DOI: 10.1080/00401706.2000.10485992 |
0.388 |
|
| 1999 |
Pascual FG, Meeker WQ. Estimating fatigue curves with the random fatigue-limit model Technometrics. 41: 277-290. DOI: 10.2307/1271342 |
0.409 |
|
| 1999 |
Escobar LA, Meeker WQ. Statistical prediction based on censored life data Technometrics. 41: 113-124. DOI: 10.2307/1270727 |
0.398 |
|
| 1999 |
Meeker WQ, Escobar LA. Accelerated Life Tests: Concepts and Data Analysis Acs Symposium Series. 722: 149-169. |
0.336 |
|
| 1998 |
Meeker WQ, Escobar LA, Lu CJ. Accelerated degradation tests: Modeling and analysis Technometrics. 40: 89-99. DOI: 10.2307/1270643 |
0.456 |
|
| 1998 |
Pascual FG, Meeker WQ. The Modified Sudden Death Test: Planning Life Tests with a Limited Number of Test Positions Journal of Testing and Evaluation. 26: 434-443. DOI: 10.1520/Jte12692J |
0.372 |
|
| 1998 |
Meeker WQ, Escobar LA. Pitfalls of accelerated testing Ieee Transactions On Reliability. 47: 114-118. DOI: 10.1109/24.722271 |
0.413 |
|
| 1998 |
Escobar LA, Meeker WQ. Fisher information matrices with censoring, truncation, and explanatory variables Statistica Sinica. 8: 221-237. |
0.324 |
|
| 1997 |
Pascual FG, Meeker WQ. Analysis of Fatigue Data with Runouts Based on a Model with Nonconstant Standard Deviation and a Fatigue Limit Parameter Journal of Testing and Evaluation. 25: 292-301. DOI: 10.1520/Jte11341J |
0.413 |
|
| 1996 |
Olin BD, Meeker WQ. Applications of statistical methods to nondestructive evaluation Technometrics. 38: 95-112. DOI: 10.2307/1270399 |
0.337 |
|
| 1996 |
Cannon AR, Meeker WQ. Statistical Tests for Signals in Categorial Temporal Data Biometrical Journal. 38: 39-59. DOI: 10.1002/Bimj.4710380105 |
0.409 |
|
| 1996 |
Field D, Meeker WQ. An analysis of failure-time distributions for product design optimization Quality and Reliability Engineering International. 12: 429-438. DOI: 10.1002/(Sici)1099-1638(199611)12:6<429::Aid-Qre60>3.0.Co;2-6 |
0.362 |
|
| 1996 |
Lu CJ, Meeker WQ, Escobar LA. A comparison of degradation and failure-time analysis methods for estimating a time-to-failure distribution Statistica Sinica. 6: 531-546. |
0.333 |
|
| 1995 |
Escobar LA, Meeker WQ. Planning accelerated life tests with two or more experimental factors Technometrics. 37: 411-427. DOI: 10.2307/1269733 |
0.371 |
|
| 1995 |
Meeker WQ, Hamada M. Statistical Tools for the Rapid Development & Evaluation of High-Reliability Products Ieee Transactions On Reliability. 44: 187-198. DOI: 10.1109/24.387370 |
0.374 |
|
| 1995 |
Meeker WQ, LuValle MJ. An accelerated life test model based on reliability kinetics Technometrics. 37: 133-146. DOI: 10.1080/00401706.1995.10484298 |
0.465 |
|
| 1995 |
Meeker WQ, Escobar LA. Teaching about approximate confidence regions based on maximum likelihood estimation American Statistician. 49: 48-53. DOI: 10.1080/00031305.1995.10476112 |
0.407 |
|
| 1994 |
Escobar LA, Meeker WQ. Algorithm AS 292: Fisher Information Matrix for the Extreme Value, Normal and Logistic Distributions and Censored Data Applied Statistics. 43: 533. DOI: 10.2307/2986276 |
0.315 |
|
| 1994 |
Meeker WQ, Escobar LA. An algorithm to compute the CDF of the product of two normal random variables Communications in Statistics - Simulation and Computation. 23: 271-280. DOI: 10.1080/03610919408813168 |
0.322 |
|
| 1994 |
Meeter CA, Meeker WQ. Optimum accelerated life tests wth a nonconstant scale parameter Technometrics. 36: 71-83. DOI: 10.1080/00401706.1994.10485402 |
0.461 |
|
| 1994 |
Meeker WQ, Escobar LA. 8. Maximum Likelihood Methods for Fitting Parametric Statistical Models Methods in Experimental Physics. 28: 211-244. DOI: 10.1016/S0076-695X(08)60258-6 |
0.384 |
|
| 1993 |
Meeker WQ, Escobar LA. A Review of Recent Research and Current Issues in Accelerated Testing International Statistical Review / Revue Internationale De Statistique. 61: 147. DOI: 10.2307/1403600 |
0.429 |
|
| 1993 |
Hahn GJ, Meeker WQ. Assumptions for statistical inference American Statistician. 47: 1-11. DOI: 10.1080/00031305.1993.10475924 |
0.354 |
|
| 1993 |
Arnold BC, Beaver RJ, Groeneveld RA, Meeker WQ. The nontruncated marginal of a truncated bivariate normal distribution Psychometrika. 58: 471-488. DOI: 10.1007/Bf02294652 |
0.41 |
|
| 1992 |
Escobar LA, Meeker WQ. Assessing influence in regression analysis with censored data. Biometrics. 48: 507-28. PMID 1637975 DOI: 10.2307/2532306 |
0.393 |
|
| 1992 |
Meeker WQ, Escobar LA, Hill DA. Sample Sizes for Estimating the Weibull Hazard Function from Censored Samples Ieee Transactions On Reliability. 41: 133-138. DOI: 10.1109/24.126687 |
0.418 |
|
| 1991 |
Weston SA, Meeker WQ. Coverage probabilities of nonparametric simultaneous confidence bands for a survival function Journal of Statistical Computation and Simulation. 38: 83-97. DOI: 10.1080/00949659108811321 |
0.343 |
|
| 1991 |
Meeker WQ. Accelerated Testing: Statistical Models, Test Plans, and Data Analyses Technometrics. 33: 236-238. DOI: 10.1080/00401706.1991.10484811 |
0.394 |
|
| 1990 |
Wiel SAV, Meeker WQ. Accuracy of approx confidence bounds using censored Weibull regression data from accelerated life tests Ieee Transactions On Reliability. 39: 346-351. DOI: 10.1109/24.103016 |
0.393 |
|
| 1988 |
Ostrouchov G, Meeker WQ. Accuracy of Approximate Confidence Bounds Computed from Interval Censored Weibull and Lognormal Data Journal of Statistical Computation and Simulation. 29: 43-76. DOI: 10.1080/00949658808811050 |
0.473 |
|
| 1987 |
Meeker WQ. Limited failure population life tests: Application to integrated circuit reliability Technometrics. 29: 51-65. DOI: 10.1080/00401706.1987.10488183 |
0.302 |
|
| 1987 |
Agarwala P, Buswell GD, Fan SC, Gibson CL, Meeker WQ, Myers DH. STAR: SOFTWARE FOR THE ANALYSIS AND PRESENTATION OF RELIABILITY DATA Annual Quality Congress Transactions. 264-269. |
0.325 |
|
| 1986 |
Escobar LA, Meeker WQ. Elements of the Fisher Information Matrix for the Smallest Extreme Value Distribution and Censored Data Applied Statistics. 35: 80-86. DOI: 10.2307/2347873 |
0.317 |
|
| 1986 |
Meeker WQ. Planning Life Tests in Which Units Are Inspected for Failure Ieee Transactions On Reliability. 35: 571-578. DOI: 10.1109/Tr.1986.4335550 |
0.44 |
|
| 1986 |
Escobar LA, Meeker WQ. Planning Accelerated Life Tests with Type II Censored Data Journal of Statistical Computation and Simulation. 23: 273-297. DOI: 10.1080/00949658608810881 |
0.456 |
|
| 1984 |
Meeker WQ. A comparison of accelerated life test plans for weibull and lognormal distributions and type i censoring Technometrics. 26: 157-171. DOI: 10.1080/00401706.1984.10487941 |
0.408 |
|
| 1983 |
Meeker WQ. [Statistical Methods in Reliability]: Discussion Technometrics. 25: 316. DOI: 10.2307/1267847 |
0.34 |
|
| 1982 |
Hahn GJ, Meeker WQ. Pitfalls and Practical Considerations in Product Life Analysis—Part II: Mixtures of Product Populations and More General Models Journal of Quality Technology. 14: 177-185. DOI: 10.1080/00224065.1982.11978817 |
0.313 |
|
| 1982 |
Hahn GJ, Meeker WQ. Pitfalls and Practical Considerations in Product Life Analysis—Part I: Basic Concepts and Dangers of Extrapolation Journal of Quality Technology. 14: 144-152. DOI: 10.1080/00224065.1982.11978807 |
0.376 |
|
| 1981 |
Meeker WQ. A Conditional Sequential Test for the Equality of Two Binomial Proportions Applied Statistics. 30: 109-115. DOI: 10.2307/2346379 |
0.307 |
|
| 1980 |
Meeker WQ, Hahn GJ. Prediction intervals for the ratios of normal distribution sample variances and exponential distribution sample means Technometrics. 22: 357-366. DOI: 10.1080/00401706.1980.10486167 |
0.397 |
|
| 1978 |
Meeker WQ. Sequential tests of independence for 2 x 2 contingency tables Biometrika. 65: 85-90. DOI: 10.1093/Biomet/65.1.85 |
0.348 |
|
| 1978 |
Meeker WQ, Hahn GJ. A Comparison of Accelerated Test Plans to Estimate the Survival Probability at a Design Stress Technometrics. 20: 245-247. DOI: 10.1080/00401706.1978.10489668 |
0.355 |
|
| 1978 |
Nelson W, Meeker WQ. Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions Technometrics. 20: 171-177. DOI: 10.1080/00401706.1978.10489643 |
0.431 |
|
| 1978 |
Meeker WQ. Tseries-a user-oriented computer program for time series analysis American Statistician. 32: 111-112. DOI: 10.1080/00031305.1978.10479274 |
0.316 |
|
| 1977 |
Meeker WQ, Nelson W. Weibull Variances and Confidence Limits by Maximum Likelihood for Singly Censored Data Technometrics. 19: 473-476. DOI: 10.1080/00401706.1977.10489588 |
0.408 |
|
| 1977 |
Meeker WQ, Hahn GJ. Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability Technometrics. 19: 381-399. DOI: 10.1080/00401706.1977.10489577 |
0.389 |
|
| 1976 |
Meeker WQ, Nelson W. Weibull Percentile Estimates and Confidence Limits from Singly Censored Data by Maximum Likelihood Ieee Transactions On Reliability. 20-24. DOI: 10.1109/Tr.1976.5214945 |
0.435 |
|
| 1975 |
Meeker WQ, Nelson W. Optimum Accelerated Lifetests for the Weibull and Extreme Value Distributions Ieee Transactions On Reliability. 321-332. DOI: 10.1109/Tr.1975.5214922 |
0.427 |
|
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