Year |
Citation |
Score |
2011 |
Lu W, Wang L, Gu S, Aplin DPR, Estrada DM, Yu PKL, Asbeck PM. Analysis of Reverse Leakage Current and Breakdown Voltage in GaN and InGaN/GaN Schottky Barriers Ieee Transactions On Electron Devices. 58: 1986-1994. DOI: 10.1109/Ted.2011.2146254 |
0.536 |
|
2011 |
Yuan Y, Wang L, Yu B, Shin B, Ahn J, McIntyre PC, Asbeck PM, Rodwell MJW, Taur Y. A distributed model for border traps in Al2O3 - InGaAs MOS devices Ieee Electron Device Letters. 32: 485-487. DOI: 10.1109/Led.2011.2105241 |
0.498 |
|
2010 |
Lee KM, Wang L, Asbeck PM, Moon JS. Analysis of resistance asymmetry due to p-n junctions in graphene FETs Materials Research Society Symposium Proceedings. 1259: 23-28. DOI: 10.1557/Proc-1259-S08-04 |
0.461 |
|
2010 |
Asbeck PM, Wang L, Gu S, Taur Y, Yu ET. Tunneling MOSFETs based on III-V staggered heterojunctions Materials Research Society Symposium Proceedings. 1252: 3-9. DOI: 10.1557/Proc-1252-I02-04 |
0.542 |
|
2010 |
Lu W, Wang L, Gu S, Aplin DPR, Estrada DM, Yu PKL, Asbeck PM. InGaN/GaN Schottky Diodes With Enhanced Voltage Handling Capability for Varactor Applications Ieee Electron Device Letters. 31: 1119-1121. DOI: 10.1109/Led.2010.2058843 |
0.547 |
|
2010 |
Wang L, Yu E, Taur Y, Asbeck P. Design of Tunneling Field-Effect Transistors Based on Staggered Heterojunctions for Ultralow-Power Applications Ieee Electron Device Letters. 31: 431-433. DOI: 10.1109/Led.2010.2044012 |
0.516 |
|
2010 |
Kim EJ, Wang L, Asbeck PM, Saraswat KC, McIntyre PC. Border traps in Al2 O3 / In0.53 Ga 0.47 As (100) gate stacks and their passivation by hydrogen anneals Applied Physics Letters. 96. DOI: 10.1063/1.3281027 |
0.505 |
|
2010 |
Wang L, Asbeck PM, Taur Y. Self-consistent 1-D Schrödinger-Poisson solver for III-V heterostructures accounting for conduction band non-parabolicity Solid-State Electronics. 54: 1257-1262. DOI: 10.1016/J.Sse.2010.06.018 |
0.518 |
|
2009 |
Passlack M, Droopad R, Fejes P, Wang L. Electrical Properties of $\hbox{Ga}_{2}\hbox{O}_{3}/ \hbox{GaAs}$ Interfaces and GdGaO Dielectrics in GaAs-Based MOSFETs Ieee Electron Device Letters. 30: 2-4. DOI: 10.1109/Led.2008.2007579 |
0.377 |
|
2008 |
Yu B, Wang L, Yuan Y, Asbeck PM, Taur Y. Scaling of nanowire transistors Ieee Transactions On Electron Devices. 55: 2846-2858. DOI: 10.1109/Ted.2008.2005163 |
0.516 |
|
2006 |
Wang L, Wang D, Asbeck PM. A numerical Schrödinger-Poisson solver for radially symmetric nanowire core-shell structures Solid-State Electronics. 50: 1732-1739. DOI: 10.1016/J.Sse.2006.09.013 |
0.494 |
|
2004 |
Neugroschel A, Wang L, Bersuker G. Trapped charge induced gate oxide breakdown Journal of Applied Physics. 96: 3388-3398. DOI: 10.1063/1.1781766 |
0.343 |
|
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