Rahul Mishra, Ph.D. - Publications
Affiliations: | 2008 | George Mason University, Washington, DC |
Area:
Electronics and Electrical EngineeringYear | Citation | Score | |||
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2011 | Yang Y, Gauthier RJ, Chatty K, Li J, Mishra R, Mitra S, Ioannou DE. Degradation of high-κ/metal gate nMOSFETs under ESD-like stress in a 32-nm technology Ieee Transactions On Device and Materials Reliability. 11: 118-125. DOI: 10.1109/Tdmr.2010.2098407 | 0.502 | |||
2010 | Mishra R, Ioannou DE, Mitra S, Gauthier R, Seguin C, Halbach R. ESD performance of 65 nm partially depleted n and p channel SOI MOSFETs Solid-State Electronics. 54: 357-361. DOI: 10.1016/J.Sse.2009.12.030 | 0.509 | |||
2010 | Cilento T, Schenkel M, Yun C, Mishra R, Li J, Chatty KV, Gauthier R. Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology Microelectronics Reliability. 50: 1367-1372. DOI: 10.1016/J.Microrel.2010.07.132 | 0.362 | |||
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