San L. Lin, Ph.D. - Publications
Affiliations: | 2004 | Santa Clara University, Santa Clara, CA, United States |
Area:
Electronics and Electrical EngineeringYear | Citation | Score | |||
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2004 | Lin SL, Mourad S. On-chip rise-time measurement Ieee Transactions On Instrumentation and Measurement. 53: 1510-1516. DOI: 10.1109/TIM.2004.834060 | 0.533 | |||
2003 | Lin SL, Krishnan S, Mourad S. A self-binning BIST structure for data communications transceivers Ieee Transactions On Instrumentation and Measurement. 52: 1399-1407. DOI: 10.1109/Tim.2003.818549 | 0.527 | |||
2003 | Lin SL, Mourad S. On-chip rise time measurement Conference Record - Ieee Instrumentation and Measurement Technology Conference. 1: 688-692. | 0.529 | |||
2001 | Lin SL, Mourad S, Krishnan S. At-speed testing of data communications transceivers Materials Research Society Symposium - Proceedings. 626. | 0.354 | |||
2000 | Lin SL, Mourad S, Krishnan S. BIST methodology for at-speed testing of data communications transceivers Proceedings of the Asian Test Symposium. 216-221. | 0.517 | |||
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