Year |
Citation |
Score |
2016 |
Kahveci O, Overbye TJ, Putnam NH, Soylemezoglu A. Optimization framework for topology design challenges in tactical smart microgrid planning 2016 Ieee Power and Energy Conference At Illinois, Peci 2016. DOI: 10.1109/PECI.2016.7459262 |
0.312 |
|
2015 |
Nottage D, Corns S, Soylemezoglu A, Kinnevan K. A SysML framework for modeling contingency basing Systems Engineering. 18: 162-177. DOI: 10.1002/Sys.21297 |
0.356 |
|
2014 |
Zawodniok M, Jagannathan S, Saygin C, Soylemezoglu A. RFID-based asset management of time and temperature sensitive materials Lecture Notes in Mechanical Engineering. 9: 549-561. DOI: 10.1007/978-1-4471-4993-4_48 |
0.417 |
|
2011 |
Soylemezoglu A, Jagannathan S, Saygin C. Mahalanobis-Taguchi system as a multi-sensor based decision making prognostics tool for centrifugal pump failures Ieee Transactions On Reliability. 60: 864-878. DOI: 10.1109/Tr.2011.2170255 |
0.342 |
|
2010 |
Soylemezoglu A, Jagannathan S, Saygin C. Mahalanobis taguchi system (MTS) as a prognostics tool for rolling element bearing failures Journal of Manufacturing Science and Engineering, Transactions of the Asme. 132. DOI: 10.1115/1.4002545 |
0.351 |
|
2009 |
Soylemezoglu A, Zawodniok MJ, Jagannathan S. RFID-based smart freezer Ieee Transactions On Industrial Electronics. 56: 2347-2356. DOI: 10.1109/Tie.2009.2017553 |
0.413 |
|
2008 |
Meyyappan L, Soylemezoglu A, Saygin C, Dagli CH. A wasp-based control model for real-time routing of parts in a flexible manufacturing system International Journal of Computer Integrated Manufacturing. 21: 259-268. DOI: 10.1080/09511920701268874 |
0.425 |
|
2007 |
Mills-Harris MD, Soylemezoglu A, Saygin C. Erratum: Adaptive inventory management using RFID data (International Journal of Advanced Manufacturing Technology) The International Journal of Advanced Manufacturing Technology. 32. DOI: 10.1007/S00170-006-0616-1 |
0.403 |
|
2005 |
Mills-Harris MD, Soylemezoglu A, Saygin C. RFID data-based inventory management of time-sensitive materials Iecon Proceedings (Industrial Electronics Conference). 2005: 2302-2307. DOI: 10.1109/IECON.2005.1569262 |
0.44 |
|
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