Adam C. Petschke, Ph.D. - Publications

Affiliations: 
2009 University of Illinois, Urbana-Champaign, Urbana-Champaign, IL 
Area:
Electronics and Electrical Engineering

6 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2011 Huang Y, Ryou JH, Dupuis RD, D'costa VR, Steenbergen EH, Fan J, Zhang YH, Petschke A, Mandl M, Chuang SL. Epitaxial growth and characterization of InAs/GaSb and InAs/InAsSb type-II superlattices on GaSb substrates by metalorganic chemical vapor deposition for long wavelength infrared photodetectors Journal of Crystal Growth. 314: 92-96. DOI: 10.1016/J.Jcrysgro.2010.11.003  0.58
2010 Huang Y, Ryou JH, Dupuis RD, Petschke A, Mandl M, Chuang SL. InAs/GaSb type-II superlattice structures and photodiodes grown by metalorganic chemical vapor deposition Applied Physics Letters. 96. DOI: 10.1063/1.3456386  0.644
2010 Petschke A, Mandl M, Chuang SL, Huang Y, Ryou JH, Dupuis RD. Metal-organic chemical vapour deposition growth of InAs/GaSb type-II superlattice photodiodes Electronics Letters. 46: 1151-1152. DOI: 10.1049/El.2010.1308  0.555
2008 Mou S, Petschke A, Lou Q, Chuang SL, Li JV, Hill CJ. Midinfrared InAsGaSb type-II superlattice interband tunneling photodetectors Applied Physics Letters. 92. DOI: 10.1063/1.2909538  0.523
2007 Zhang XB, Ryou JH, Dupuis RD, Xu C, Mou S, Petschke A, Hsieh KC, Chuang SL. Improved surface and structural properties of InAs/GaSb superlattices on (001) GaSb substrate by introducing an InAsSb layer at interfaces Applied Physics Letters. 90. DOI: 10.1063/1.2717524  0.586
2006 Zhang XB, Ryou JH, Dupuis RD, Petschke A, Mou S, Chuang SL, Xu C, Hsieh KC. Metalorganic chemical vapor deposition growth of high-quality InAsGaSb type II superlattices on (001) GaAs substrates Applied Physics Letters. 88. DOI: 10.1063/1.2168668  0.593
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