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Jeffrey J. Siddiqui, Ph.D. - Publications

Affiliations: 
2012 University of Michigan, Ann Arbor, Ann Arbor, MI 
Area:
Electronics and Electrical Engineering
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5 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Siddiqui JJ, Phillips JD, Leedy K, Bayraktaroglu B. Illumination instabilities in ZnO/HfO 2 thin-film transistors and influence of grain boundary charge Journal of Materials Research. 27: 2199-2204. DOI: 10.1557/Jmr.2012.173  0.565
2012 Siddiqui JJ, Phillips JD, Leedy K, Bayraktaroglu B. Bias-temperature-stress characteristics of ZnO/HfO 2 thin-film transistors Ieee Transactions On Electron Devices. 59: 1488-1493. DOI: 10.1109/Ted.2012.2189048  0.513
2012 Siddiqui JJ, Phillips JD, Leedy K, Bayraktaroglu B. Illumination instability analysis of ZnO thin film transistors with HfO 2 gate dielectrics Device Research Conference - Conference Digest, Drc. 51-52. DOI: 10.1109/DRC.2012.6256994  0.36
2011 Siddiqui JJ, Phillips JD, Leedy K, Bayraktaroglu B. Admittance spectroscopy of interface states in ZnO/HfO2 thin-film electronics Ieee Electron Device Letters. 32: 1713-1715. DOI: 10.1109/Led.2011.2170399  0.532
2011 Siddiqui JJ, Phillips JD, Leedy K, Bayraktaroglu B. Bias temperature stress analysis of ZnO thin film transistors with HfO 2 gate dielectrics Device Research Conference - Conference Digest, Drc. 75-76. DOI: 10.1109/DRC.2011.5994419  0.41
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