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Pablo I. Rovira, Ph.D. - Publications

Affiliations: 
2000 Pennsylvania State University, State College, PA, United States 
Area:
Materials Science Engineering, Optics Physics, Energy
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24 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2004 Podraza NJ, Chen C, An I, Ferreira GM, Rovira PI, Messier R, Collins RW. Analysis of the optical properties and structure of sculptured thin films from spectroscopic Mueller matrix ellipsometry Thin Solid Films. 455: 571-575. DOI: 10.1016/J.Tsf.2003.11.219  0.396
2003 Ferreira GM, ChiChen A, Ferlauto S, Rovira PI, An I, Wronski CR, Collins RW, Ganguly G, Kwak JH, Lim KS. Microstructure and Optical Functions of Transparent Conductors and Their Impact on Collection in Amorphous Silicon Solar Cells Mrs Proceedings. 762: 515-520. DOI: 10.1557/Proc-762-A14.6  0.44
2002 Koval RJ, Chen C, Ferreira GM, Ferlauto AS, Pearce JM, Rovira PI, Wronski CR, Collins RW. Protocrystalline Si:H p-type Layers for Maximization of the Open Circuit Voltage in a-Si:H n-i-p Solar Cells Mrs Proceedings. 715. DOI: 10.1557/Proc-715-A6.1  0.778
2002 Koval RJ, Chen C, Ferreira GM, Ferlauto AS, Pearce JM, Rovira PI, Wronski CR, Collins RW. Maximization of the open circuit voltage for hydrogenated amorphous silicon n-i-p solar cells by incorporation of protocrystalline silicon p-type layers Applied Physics Letters. 81: 1258-1260. DOI: 10.1063/1.1499735  0.792
2001 Ferreira GM, Ferlauto AS, Rovira PI, Chen C, Nguyen HV, Wronski CR, Collins RW. Optical simulations of the effects of transparent conducting oxide interface layers on amorphous silicon solar cell performance Materials Research Society Symposium - Proceedings. 664. DOI: 10.1557/Proc-664-A24.6  0.766
2000 Ferlauto AS, Rovira PI, Koval RJ, Wronski CR, Collins RW. Study of the amorphous-to-microcrystalline transition during silicon film growth at increased rates: Extensions of the evolutionary phase diagram Materials Research Society Symposium - Proceedings. 609. DOI: 10.1557/Proc-609-A2.2  0.809
2000 Rovira PI, Ferlauto AS, Koval RJ, Wronski CR, Collins RW, Ganguly G. Real time optics of p-type microcrystalline silicon deposition on specular and textured ZnO-coated glass Materials Research Society Symposium - Proceedings. 609. DOI: 10.1557/Proc-609-A19.6  0.808
2000 Rovira PI, Ferlauto AS, Koval RJ, Wronski CR, Collins RW, Ganguly G. Real time optics of P-type silicon deposition on specular and textured ZnO surfaces Conference Record of the Ieee Photovoltaic Specialists Conference. 2000: 772-775. DOI: 10.1109/PVSC.2000.915997  0.813
2000 Ferlauto AS, Rovira PI, Koval RJ, Wronski CR, Collins RW. Effects of H2-dilution and plasma power in amorphous silicon deposition: Comparison of microstructural evolution and solar cell performance Conference Record of the Ieee Photovoltaic Specialists Conference. 2000: 713-716. DOI: 10.1109/PVSC.2000.915968  0.788
2000 Fujiwara H, Koh J, Rovira PI, Collins RW. Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films Physical Review B. 61: 10832-10844. DOI: 10.1103/Physrevb.61.10832  0.652
2000 Collins RW, Koh J, Fujiwara H, Rovira PI, Ferlauto AS, Zapien JA, Wronski CR, Messier R. Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometry Applied Surface Science. 154: 217-228. DOI: 10.1016/S0169-4332(99)00482-1  0.735
2000 Collins RW, Koh J, Ferlauto AS, Rovira PI, Lee Y, Koval RJ, Wronski CR. Real time analysis of amorphous and microcrystalline silicon film growth by multichannel ellipsometry Thin Solid Films. 364: 129-137. DOI: 10.1016/S0040-6090(99)00925-6  0.797
2000 Rovira PI, Ferlauto AS, Koh J, Wronski CR, Collins RW. Optics of textured amorphous silicon surfaces Journal of Non-Crystalline Solids. 279-283. DOI: 10.1016/S0022-3093(99)00836-4  0.721
2000 Ferlauto AS, Koh J, Rovira PI, Wronski CR, Collins RW, Ganguly G. Modeling the dielectric functions of silicon-based films in the amorphous, nanocrystalline and microcrystalline regimes Journal of Non-Crystalline Solids. 266: 269-273. DOI: 10.1016/S0022-3093(99)00834-0  0.76
2000 Koh J, Ferlauto AS, Rovira PI, Koval RJ, Wronski CR, Collins RW. Evolutionary phase diagrams for the deposition of silicon films from hydrogen-diluted silane Journal of Non-Crystalline Solids. 43-47. DOI: 10.1016/S0022-3093(99)00716-4  0.771
1999 Collins RW, Rovira PI, Ferlauto AS, Koh J, An I, Zapien JA, Messier R, Wronski CR. Real Time Characterization of Non-Ideal Surfaces and Thin Film Growth by Advanced Ellipsometric Spectroscopies Mrs Proceedings. 569: 43. DOI: 10.1557/Proc-569-43  0.646
1999 Rovira PI, Ferlauto AS, An I, Fujiwara H, Koh J, Koval RJ, Wronski CR, Collins RW. Real Time Optics of Amorphous Silicon Solar Cellfabrication on Textured Tin-Oxide-Coated Glass Mrs Proceedings. 557: 719. DOI: 10.1557/Proc-557-719  0.726
1999 Ferlauto AS, Koh J, Rovira PI, Wronski CR, Collins RW. Microcrystalline silicon tunnel junctions for amorphous silicon-based multijunction solar cells Mrs Proceedings. 557: 579. DOI: 10.1557/Proc-557-579  0.777
1999 Koh J, Ferlauto AS, Rovira PI, Wronski CR, Collins RW. Evolutionary Phase Diagrams For Plasma-Enhanced Chemical Vapor Deposition Of Silicon Thin Films From Hydrogen-Diluted Silane Applied Physics Letters. 75: 2286-2288. DOI: 10.1063/1.124992  0.759
1998 Lee J, Rovira PI, An I, Collins RW. Rotating-compensator multichannel ellipsometry for characterization of the evolution of nonuniformities in diamond thin-film growth Applied Physics Letters. 72: 900-902. DOI: 10.1063/1.120930  0.511
1998 Lee J, Rovira PI, An I, Collins RW. Rotating-compensator multichannel ellipsometry: Applications for real time Stokes vector spectroscopy of thin film growth Review of Scientific Instruments. 69: 1800-1810. DOI: 10.1063/1.1148844  0.38
1998 Rovira PI, Yarussi RA, Collins RW, Venugopal VC, Lakhtakia A, Messier R, Robbie K, Brett MJ. Rotating-compensator multichannel transmission ellipsometry of a thin-film helicoidal bianisotropic medium Thin Solid Films. 313: 373-378. DOI: 10.1016/S0040-6090(97)00849-3  0.307
1997 Collins RW, Lee J, Rovira PI, An I. Rotating-Compensator Multichannel Ellipsometry: Applications in Process Development for Nanocrystalline Diamond Thin Films Mrs Proceedings. 502: 23. DOI: 10.1557/Proc-502-23  0.393
1995 Rovira PI, Alvarez F. Study of RF Sputtered aSi: H and aGe: H by Photothermal Deflection Spectroscopy Physica Status Solidi (B). 192: 535-541. DOI: 10.1002/PSSB.2221920222  0.312
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