Year |
Citation |
Score |
2020 |
Egerton RF, Venkatraman K, March K, Crozier PA. Properties of Dipole-Mode Vibrational Energy Losses Recorded From a TEM Specimen. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-7. PMID 32867870 DOI: 10.1017/S1431927620024423 |
0.378 |
|
2020 |
Malac M, Cloutier M, Salomons M, Chen S, Yakubu S, Leeson M, Pitters J, Vick D, Price D, Homeniuk D, Hayashida M, Egerton R. NanoMi: An Open Source (Scanning) Transmission Electron Microscope. Microscopy and Microanalysis. 1-4. DOI: 10.1017/S1431927620019431 |
0.624 |
|
2020 |
Watanabe M, Egerton R. Evaluation of Confocal X-ray Analysis for Single-Atom Detection in a Thin Specimen by an Advanced Analytical Electron Microscope Microscopy and Microanalysis. 1-4. DOI: 10.1017/S143192762001836X |
0.335 |
|
2019 |
Egerton RF. Radiation damage to organic and inorganic specimens in the TEM. Micron (Oxford, England : 1993). 119: 72-87. PMID 30684768 DOI: 10.1016/J.Micron.2019.01.005 |
0.324 |
|
2019 |
Malac M, Homeniuk D, Hayashida M, Fujii T, Yaguchi T, Egerton R. In-Situ Mass Thickness Calibrations Using MWCNTs Microscopy and Microanalysis. 25: 792-793. DOI: 10.1017/S1431927619004690 |
0.462 |
|
2018 |
Egerton RF, Watanabe M. Characterization of single-atom catalysts by EELS and EDX spectroscopy. Ultramicroscopy. 193: 111-117. PMID 29975874 DOI: 10.1016/J.Ultramic.2018.06.013 |
0.379 |
|
2018 |
Hayashida M, Cui K, Malac M, Egerton R. Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM. Ultramicroscopy. 188: 8-12. PMID 29499457 DOI: 10.1016/J.Ultramic.2018.02.003 |
0.598 |
|
2018 |
Egerton RF. Calculation, consequences and measurement of the point spread function for low-loss inelastic scattering. Microscopy (Oxford, England). 67: i52-i59. PMID 29136206 DOI: 10.1093/Jmicro/Dfx089 |
0.425 |
|
2018 |
Fujii T, Malac M, Kano E, Hayashida M, Yaguchi T, Egerton R. Toward Quantitative Bright Field TEM Imaging of Ultra Thin Samples Microscopy and Microanalysis. 24: 1612-1613. DOI: 10.1017/S1431927618008541 |
0.539 |
|
2017 |
Egerton RF. Scattering delocalization and radiation damage in STEM-EELS. Ultramicroscopy. 180: 115-124. PMID 28377217 DOI: 10.1016/J.Ultramic.2017.02.007 |
0.402 |
|
2017 |
Qian H, Egerton RF. Solid-state nanopores of controlled geometry fabricated in a transmission electron microscope Applied Physics Letters. 111: 193106. DOI: 10.1063/1.4990664 |
0.423 |
|
2017 |
Malac M, Kano E, Hayashida M, Kawasaki M, Motoki S, Egerton R, Ishikawa I, Okura Y, Beleggia M. Hole-Free Phase Plate Energy Filtering Imaging of Graphene: Toward Quantitative Hole-Free Phase Plate Imaging in a TEM Microscopy and Microanalysis. 23: 842-843. DOI: 10.1017/S1431927617004871 |
0.556 |
|
2016 |
Egerton R, Aoki T, Crozier P. Taking Advantage of Scattering Delocalization To Reduce Radiation Damage In Vibrational or Valence-Loss EELS and Energy-Filtered TEM Images Microscopy and Microanalysis. 22: 960-961. DOI: 10.1017/S143192761600564X |
0.34 |
|
2016 |
Leontowich AFG, Hitchcock AP, Egerton RF. Radiation damage yields across the carbon 1s excitation edge Journal of Electron Spectroscopy and Related Phenomena. 206: 58-64. DOI: 10.1016/J.Elspec.2015.11.010 |
0.347 |
|
2015 |
Egerton RF. Vibrational-loss EELS and the avoidance of radiation damage. Ultramicroscopy. 95-100. PMID 26340606 DOI: 10.1016/J.Ultramic.2015.08.003 |
0.394 |
|
2015 |
Krivanek OL, Lovejoy TC, Dellby N, Aoki T, Carpenter RW, Rez P, Soignard E, Zhu J, Batson PE, Lagos MJ, Egerton RF, Crozier PA. Vibrational spectroscopy in the electron microscope Nature. 514: 209-212. PMID 25297434 DOI: 10.1038/Nature13870 |
0.45 |
|
2015 |
Egerton RF. Outrun radiation damage with electrons? Advanced Structural and Chemical Imaging. 1. DOI: 10.1186/S40679-014-0001-3 |
0.431 |
|
2015 |
Egerton RF. The Use of Color in Elemental Maps and Electron-Microscope Images Microscopy and Microanalysis. 21: 2241-2242. DOI: 10.1017/S1431927615011988 |
0.342 |
|
2015 |
Malac M, Beleggia M, Rowan T, Egerton R, Kawasaki M, Okura Y, McLeod RA. Electron Beam-Induced Charging and Modifications of Thin Films Microscopy and Microanalysis. 21: 1385-1388. DOI: 10.1017/S1431927615007710 |
0.595 |
|
2015 |
Egerton R, Rez P, Crozier P. Avoidance of Radiation Damage in Vibrational-Mode Energy-Loss Spectroscopy Microscopy and Microanalysis. 21: 659-660. DOI: 10.1017/S1431927615004092 |
0.305 |
|
2014 |
Hayashida M, Malac M, Bergen M, Egerton RF, Li P. Accurate measurement of relative tilt and azimuth angles in electron tomography: a comparison of fiducial marker method with electron diffraction. The Review of Scientific Instruments. 85: 083704. PMID 25173273 DOI: 10.1063/1.4892436 |
0.574 |
|
2014 |
Egerton RF, Mcleod RA, Malac M. Validity of the dipole approximation in TEM-EELS studies. Microscopy Research and Technique. 77: 773-8. PMID 25045082 DOI: 10.1002/Jemt.22398 |
0.598 |
|
2014 |
Egerton RF. Choice of operating voltage for a transmission electron microscope. Ultramicroscopy. 145: 85-93. PMID 24679438 DOI: 10.1016/J.Ultramic.2013.10.019 |
0.385 |
|
2014 |
Egerton RF. Prospects for vibrational-mode EELS with high spatial resolution. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 658-63. PMID 24548332 DOI: 10.1017/S1431927613014013 |
0.382 |
|
2014 |
Hayashida M, Malac M, Bergen M, Li P, Egerton R. Electron diffraction based tilt angle measurements in electron tomography Microscopy and Microanalysis. 20: 806-807. DOI: 10.1017/S1431927614005753 |
0.594 |
|
2014 |
Malac M, Kimoto K, Egerton R, Shekhar P, Jacob Z, Taniguchi Y, Gaind V. Angle-resolved valence EELS of a single crystal gold sample Microscopy and Microanalysis. 20: 628-629. DOI: 10.1017/S1431927614004863 |
0.519 |
|
2014 |
Malac M, Beleggia M, Egerton R, Kawasaki M, Berge M, Okura Y, Ishikawa I, Motoki K. Charging of thin film phase plates under electron beam irradiation Microscopy and Microanalysis. 20: 230-231. DOI: 10.1017/S1431927614002876 |
0.599 |
|
2014 |
Crozier PA, Zhu J, Aoki T, Rez P, Bowman WJ, Carpenter RW, Krivanek OL, Dellby N, Lovejoy TC, Egerton RF. Challenges and opportunities in materials science with next generation monochromated EELS Microscopy and Microanalysis. 20: 72-73. DOI: 10.1017/S1431927614002086 |
0.419 |
|
2014 |
Shekhar P, Gaind V, Malac M, Egerton R, Jacob Z. Momentum-resolved electron energy loss spectroscopy (q-EELS) for quantum plasmonics and metamaterials Optics Infobase Conference Papers. |
0.579 |
|
2013 |
Egerton RF. Beam-induced motion of adatoms in the transmission electron microscope. Microscopy and Microanalysis. 19: 479-486. PMID 23425385 DOI: 10.1017/S1431927612014274 |
0.34 |
|
2013 |
Egerton RF. Control of radiation damage in the TEM. Ultramicroscopy. 127: 100-108. PMID 22910614 DOI: 10.1016/J.Ultramic.2012.07.006 |
0.437 |
|
2013 |
Egerton R. A Modest Proposal for the Propagation of Information Concerning Radiation Damage in the TEM, and as Fodder for Pasturized Professors Microscopy Today. 21: 70-72. DOI: 10.1017/S1551929513000941 |
0.335 |
|
2013 |
Zhang HR, Egerton R, Malac M. Electron irradiation damage and color centers of MgO nanocube Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 316: 137-143. DOI: 10.1016/J.Nimb.2013.08.042 |
0.647 |
|
2012 |
Wu L, Egerton RF, Zhu Y. Image simulation for atomic resolution secondary electron image. Ultramicroscopy. 123: 66-73. PMID 22940532 DOI: 10.1016/J.Ultramic.2012.06.008 |
0.391 |
|
2012 |
Egerton RF. Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV Microscopy Research and Technique. 75: 1550-1556. PMID 22807142 DOI: 10.1002/Jemt.22099 |
0.366 |
|
2012 |
Malac M, Beleggia M, Kawasaki M, Li P, Egerton RF. Convenient contrast enhancement by a hole-free phase plate. Ultramicroscopy. 118: 77-89. PMID 22743212 DOI: 10.1016/J.Ultramic.2012.02.004 |
0.611 |
|
2012 |
Egerton RF. TEM-EELS: a personal perspective. Ultramicroscopy. 119: 24-32. PMID 22221958 DOI: 10.1016/J.Ultramic.2011.11.008 |
0.383 |
|
2012 |
Zhang HR, Egerton RF, Malac M. Local thickness measurement through scattering contrast and electron energy-loss spectroscopy. Micron (Oxford, England : 1993). 43: 8-15. PMID 21803591 DOI: 10.1016/J.Micron.2011.07.003 |
0.585 |
|
2012 |
Malac M, Bergen M, Egerton R, Kawasaki M, Beleggia M, Furukawa H, Shimizu M. Practical hole-free phase plate imaging: principles, advantages and pitfalls Microscopy and Microanalysis. 18: 484-485. DOI: 10.1017/S1431927612004278 |
0.519 |
|
2012 |
Zhu Y, Wu L, Su D, Cheng C, Ciston J, Inada H, Suzuki Y, Tamura K, Konno M, Egerton R, Marks L. Simultaneous Imaging of Surface and Bulk at Atomic Resolution Microscopy and Microanalysis. 18: 306-307. DOI: 10.1017/S1431927612003388 |
0.306 |
|
2011 |
Egerton RF, Lazar S, Libera M. Delocalized radiation damage in polymers. Micron (Oxford, England : 1993). 43: 2-7. PMID 21689941 DOI: 10.1016/J.Micron.2011.05.007 |
0.434 |
|
2011 |
Malac M, Egerton R, Wang J. Radiation damage and electron energy loss spectroscopy of Au particles on amorphous Ge substrates Acta Crystallographica Section a Foundations of Crystallography. 67: C636-C637. DOI: 10.1107/S0108767311083899 |
0.595 |
|
2011 |
Zhang H, Egerton R, Malac M. EELS Investigation of the Formulas for Inelastic Mean Free Path Microscopy and Microanalysis. 17: 1466-1467. DOI: 10.1017/S1431927611008208 |
0.504 |
|
2011 |
Inada H, Tamura K, Nakamura K, Suzuki Y, Konno M, Su D, Wall J, Egerton R, Zhu Y. Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope Microscopy and Microanalysis. 17: 1298-1299. DOI: 10.1017/S1431927611007367 |
0.434 |
|
2010 |
Inada H, Su D, Egerton RF, Konno M, Wu L, Ciston J, Wall J, Zhu Y. Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms. Ultramicroscopy. 111: 865-76. PMID 21185651 DOI: 10.1016/J.Ultramic.2010.10.002 |
0.382 |
|
2010 |
Borzsonyi G, Beingessner RL, Yamazaki T, Cho JY, Myles AJ, Malac M, Egerton R, Kawasaki M, Ishizuka K, Kovalenko A, Fenniri H. Water-soluble J-type rosette nanotubes with giant molar ellipticity. Journal of the American Chemical Society. 132: 15136-9. PMID 20936820 DOI: 10.1021/Ja105028W |
0.537 |
|
2010 |
Libera MR, Egerton RF. Advances in the Transmission Electron Microscopy of Polymers Polymer Reviews. 50: 321-339. DOI: 10.1080/15583724.2010.493256 |
0.341 |
|
2010 |
Inada H, Su D, Konno M, Nakamura K, Egerton R, Wall J, Zhu Y. Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope Microscopy and Microanalysis. 16: 610-611. DOI: 10.1017/S1431927610059349 |
0.424 |
|
2010 |
Zhang H, Egerton R, Malac M. Local Thickness Measurement in TEM Microscopy and Microanalysis. 16: 344-345. DOI: 10.1017/S1431927610058630 |
0.56 |
|
2010 |
Malac M, Kawasaki M, Beleggia M, Li P, Egerton R. Convenient Contrast Enhancement by Hole-Free Phase Plate in a TEM Microscopy and Microanalysis. 16: 526-527. DOI: 10.1017/S1431927610055807 |
0.566 |
|
2010 |
Egerton R, Su D, Wall J, Zhu Y. Physics of Atomic-Scale Secondary-Electron Imaging Microscopy and Microanalysis. 16: 620-621. DOI: 10.1017/S143192761005525X |
0.362 |
|
2010 |
Egerton R. Mechanisms of Radiation Damage and Electron-Beam Fabrication Microscopy and Microanalysis. 16: 1658-1659. DOI: 10.1017/S1431927610055182 |
0.395 |
|
2010 |
Zhang H, Malac M, Egerton R. Electron Irradiation Damage of MgO Nanocube Microscopy and Microanalysis. 16: 1794-1795. DOI: 10.1017/S1431927610054735 |
0.625 |
|
2010 |
Egerton RF, McLeod R, Wang F, Malac M. Basic questions related to electron-induced sputtering in the TEM Ultramicroscopy. 110: 991-997. DOI: 10.1016/J.Ultramic.2009.11.003 |
0.616 |
|
2009 |
Sayed SY, Wang F, Malac M, Meldrum A, Egerton RF, Buriak JM. Heteroepitaxial growth of gold nanostructures on silicon by galvanic displacement. Acs Nano. 3: 2809-17. PMID 19719082 DOI: 10.1021/Nn900685A |
0.575 |
|
2009 |
Wang F, Egerton R, Malac M. Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS). Ultramicroscopy. 109: 1245-9. PMID 19577847 DOI: 10.1016/J.Ultramic.2009.05.011 |
0.6 |
|
2009 |
Wang F, Sayed SY, Malac M, Wang D, Egerton R, Buriak J. TEM studies of Au/Si epilayer interfaces Microscopy and Microanalysis. 15: 1450-1451. DOI: 10.1017/S1431927609095658 |
0.523 |
|
2009 |
Moreno MS, Cadavid D, Santilĺn MJ, Egerton RF, Malac M. Electron radiation damage in TiOx nanobelts Microscopy and Microanalysis. 15: 1340-1341. DOI: 10.1017/S143192760909463X |
0.61 |
|
2009 |
Kawasaki M, Malac M, Li P, Qian H, Egerton R. Convenient electron optics set up for zernike phase microscopy in TEM Microscopy and Microanalysis. 15: 1234-1235. DOI: 10.1017/S1431927609094598 |
0.549 |
|
2009 |
Li P, Wang X, Malac M, Egerton R, Meldrum A, Lenz F, Liang X, Wang J. 3D imaging of Si and Er Nanoclusters in Er Doped SiO1.5 films by STEM tomography Microscopy and Microanalysis. 15: 1256-1257. DOI: 10.1017/S1431927609093143 |
0.604 |
|
2009 |
Egerton R, Wang F, McLeod R, Malac M. Basic questions related to electron-induced sputtering Microscopy and Microanalysis. 15: 1356-1357. DOI: 10.1017/S1431927609092204 |
0.615 |
|
2008 |
Malac M, Beleggia M, Taniguchi Y, Egerton RF, Zhu Y. Low-dose performance of parallel-beam nanodiffraction. Ultramicroscopy. 109: 14-21. PMID 18768263 DOI: 10.1016/J.Ultramic.2008.07.004 |
0.619 |
|
2008 |
Egerton RF, Wang F, Malac M, Moreno MS, Hofer F. Fourier-ratio deconvolution and its Bayesian equivalent. Micron (Oxford, England : 1993). 39: 642-7. PMID 18036824 DOI: 10.1016/J.Micron.2007.10.004 |
0.604 |
|
2008 |
Malac M, Beleggia M, Egerton R, Zhu Y. Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates. Ultramicroscopy. 108: 126-40. PMID 17509765 DOI: 10.1016/J.Ultramic.2007.03.008 |
0.596 |
|
2008 |
Egerton RF. Electron energy-loss spectroscopy in the TEM Reports On Progress in Physics. 72: 016502. DOI: 10.1088/0034-4885/72/1/016502 |
0.487 |
|
2008 |
Wang F, Egerton RF, Malac M, McLeod RA, Moreno MS. The spatial resolution of electron energy loss and x-ray absorption fine structure Journal of Applied Physics. 104. DOI: 10.1063/1.2960582 |
0.657 |
|
2008 |
Sayed SY, Wang F, Malac M, Egerton R, Buriak J. Synthesis and interfacial characterization of Au nanoparticles on Si nanowires Microscopy and Microanalysis. 14: 302-303. DOI: 10.1017/S1431927608086881 |
0.482 |
|
2008 |
Egerton R, Wang F, Malac M. Spatial resolution and delocalization of the EELS core-loss fine structure Microscopy and Microanalysis. 14: 1344-1345. DOI: 10.1017/S1431927608082597 |
0.548 |
|
2008 |
Wang F, Egerton R, Malac M. Use of Fourier-ratio deconvolution for processing low-loss EELS spectra Microscopy and Microanalysis. 14: 1412-1413. DOI: 10.1017/S1431927608082573 |
0.495 |
|
2007 |
Egerton RF. Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy Ultramicroscopy. 107: 575-586. PMID 17257759 DOI: 10.1016/J.Ultramic.2006.11.005 |
0.476 |
|
2007 |
Wang F, Malac M, Egerton RF. Alternative methods of identifying the oxidation of metallic nanoparticles embedded in a matrix. Micron (Oxford, England : 1993). 38: 371-6. PMID 16959491 DOI: 10.1016/J.Micron.2006.06.006 |
0.553 |
|
2007 |
Chen KF, Lo SC, Chang L, Egerton R, Kai JJ, Lin JJ, Chen FR. Valence state map of iron oxide thin film obtained from electron spectroscopy imaging series. Micron (Oxford, England : 1993). 38: 354-61. PMID 16934475 DOI: 10.1016/J.Micron.2006.06.004 |
0.325 |
|
2007 |
Malac M, Beleggia M, Egerton R, Zhu Y. Bright-field TEM imaging of single molecules: dream or near future? Ultramicroscopy. 107: 40-9. PMID 16820263 DOI: 10.1016/J.Ultramic.2006.05.001 |
0.623 |
|
2007 |
Qian H, Malac M, Egerton RF. Microscopy of pentacene thin films Philosophical Magazine. 87: 253-266. DOI: 10.1080/14786430600953756 |
0.625 |
|
2007 |
Wang F, Malac M, Egerton RF, Meldrum A, Zhu X, Liu Z, MacDonald N, Li P, Freeman MR. Multilayer route to iron nanoparticle formation in an insulating matrix Journal of Applied Physics. 101. DOI: 10.1063/1.2434953 |
0.588 |
|
2007 |
Wang XF, Li Q, Egerton RF, Lee P, Dai J, Hou ZF, Gong XG. Effect of Al addition on the microstructure and electronic structure of HfO2 film Journal of Applied Physics. 101: 13514. DOI: 10.1063/1.2405741 |
0.355 |
|
2007 |
Wang F, Malac M, Egerton RF, Meldrum A, Li P, Freeman MR, Veinot JGC. Controlled growth of silicon oxide nanowires from a patterned reagent Journal of Physical Chemistry C. 111: 1865-1867. DOI: 10.1021/Jp0675476 |
0.54 |
|
2007 |
Wang F, Malac M, Qian H, Egerton R. Oxidation Mapping by Postpeak Technique Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607077513 |
0.592 |
|
2007 |
Malac M, Wang F, Egerton R, Taniguchi Y. Parallel Beam Nano-Diffraction Analysis of Individual Nanoparticles Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607072984 |
0.499 |
|
2006 |
Egerton RF, Wang F, Crozier PA. Beam-induced damage to thin specimens in an intense electron probe. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 12: 65-71. PMID 17481342 DOI: 10.1017/S1431927606060065 |
0.417 |
|
2006 |
Wang J, Li Q, Egerton RF. Probing the electronic structure of ZnO nanowires by valence electron energy loss spectroscopy. Micron (Oxford, England : 1993). 38: 346-53. PMID 16938457 DOI: 10.1016/J.Micron.2006.06.003 |
0.445 |
|
2006 |
Wang F, Egerton RF, Malac M. Interpretation of the postpeak in iron fluorides and oxides. Ultramicroscopy. 106: 925-32. PMID 16764991 DOI: 10.1016/J.Ultramic.2006.04.005 |
0.589 |
|
2006 |
Wang F, Malac M, Egerton RF. Energy-loss near-edge fine structures of iron nanoparticles. Micron (Oxford, England : 1993). 37: 316-23. PMID 16563777 DOI: 10.1016/J.Micron.2005.12.003 |
0.569 |
|
2006 |
Egerton RF, Qian H, Malac M. Improving the energy resolution of X-ray and electron energy-loss spectra. Micron (Oxford, England : 1993). 37: 310-5. PMID 16376551 DOI: 10.1016/J.Micron.2005.11.005 |
0.633 |
|
2006 |
Moreno, Lazar S, Zandbergen HW, Egerton RF. Accuracy of the calculated unoccupied states in GaN phases as tested by high-resolution electron energy-loss spectroscopy Physical Review B. 73: 73308. DOI: 10.1103/Physrevb.73.073308 |
0.434 |
|
2006 |
Chen F, Kai J, Lin J, Chang L, Egerton R. Property Map by Electron Spectroscopy Imaging Series Microscopy and Microanalysis. 12: 1158-1159. DOI: 10.1017/S1431927606068462 |
0.369 |
|
2006 |
Malac M, Beleggia M, Egerton R, Zhu Y. Optimized Cs-corrected imaging of radiation-sensitive high-resolution objects Microscopy and Microanalysis. 12: 1458-1459. DOI: 10.1017/S1431927606067341 |
0.546 |
|
2006 |
Wang F, Malac M, Egerton RF, Li P, Meldrum A, Freeman MR. An ELNES study of SiO2 nanowires grown from a patterned reagent Microscopy and Microanalysis. 12: 1172-1173. DOI: 10.1017/S1431927606064336 |
0.529 |
|
2006 |
Egerton R. Limitations of Electron Energy-Loss Spectroscopy Microscopy and Microanalysis. 12: 102-103. DOI: 10.1017/S1431927606061885 |
0.441 |
|
2005 |
Malac M, Egerton R, Freeman M, Lau J, Zhu Y, Wu L. Electron-beam patterning with sub-2 nm line edge roughness Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 271-273. DOI: 10.1116/1.1856466 |
0.59 |
|
2005 |
Moreno MS, Egerton RF, Rehr JJ, Midgley PA. Electronic structure of tin oxides by electron energy loss spectroscopy and real-space multiple scattering calculations Physical Review B - Condensed Matter and Materials Physics. 71. DOI: 10.1103/Physrevb.71.035103 |
0.397 |
|
2005 |
Ostroverkhova O, Shcherbyna S, Cooke DG, Egerton RF, Hegmann FA, Tykwinski RR, Parkin SR, Anthony JE. Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology Journal of Applied Physics. 98. DOI: 10.1063/1.1949711 |
0.311 |
|
2005 |
Wang J, An X, Li Q, Egerton RF. Size-dependent electronic structures of ZnO nanowires Applied Physics Letters. 86: 201911. DOI: 10.1063/1.1927711 |
0.412 |
|
2005 |
Hitchcock AP, Wang J, Botton GA, Egerton RF. Quantitative Dose-damage Relationships for Radiation Damage to Polymers and Molecular Compounds in X-ray and Electron Microscopes Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605508213 |
0.327 |
|
2005 |
Qian H, Egerton R, Malac M. Electron Radiation Damage of Pentacene Thin Films Measured in TEM Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605503817 |
0.62 |
|
2005 |
Malac M, Beleggia M, Egerton RF, Zhu Y. Cs Corrected Bright Field Imaging of Radiation Sensitive Materials Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605501053 |
0.544 |
|
2005 |
Egerton RF, Malac M. EELS in the TEM Journal of Electron Spectroscopy and Related Phenomena. 143: 43-50. DOI: 10.1016/J.Elspec.2003.12.009 |
0.647 |
|
2004 |
Li P, Egerton RF. Radiation damage in coronene, rubrene and p-terphenyl, measured for incident electrons of kinetic energy between 100 and 200 kev. Ultramicroscopy. 101: 161-72. PMID 15450662 DOI: 10.1016/J.Ultramic.2004.05.010 |
0.462 |
|
2004 |
Egerton RF, Li P, Malac M. Radiation damage in the TEM and SEM. Micron (Oxford, England : 1993). 35: 399-409. PMID 15120123 DOI: 10.1016/J.Micron.2004.02.003 |
0.627 |
|
2004 |
Egerton RF. New techniques in electron energy-loss spectroscopy and energy-filtered imaging. Micron (Oxford, England : 1993). 34: 127-39. PMID 12895484 DOI: 10.1016/S0968-4328(03)00023-4 |
0.459 |
|
2004 |
Moreno MS, Egerton RF, Midgley PA. Differentiation of tin oxides using electron energy-loss spectroscopy Physical Review B. 69: 233304. DOI: 10.1103/Physrevb.69.233304 |
0.404 |
|
2004 |
Egerton RF, Malac M. The lateral range and energy deposition of fast secondary electrons Microscopy and Microanalysis. 10: 1382-1383. DOI: 10.1017/S1431927604880541 |
0.636 |
|
2004 |
Egerton RF, Crozier PA. Erosion of TEM Specimens in an Intense Electron Beam Microscopy and Microanalysis. 10: 54-55. DOI: 10.1017/S143192760455568X |
0.376 |
|
2004 |
Egerton R. High-energy electron diffraction and microscopy Micron. 35: 623. DOI: 10.1016/J.Micron.2004.03.001 |
0.447 |
|
2003 |
Egerton R. Electron Energy-Loss Spectroscopy Microscopy and Microanalysis. 9: 1562-1563. DOI: 10.1017/S1431927603447818 |
0.44 |
|
2003 |
Li P, Egerton R. Electron irradiation damage to aromatic compounds Microscopy and Microanalysis. 9: 986-987. DOI: 10.1017/S1431927603444930 |
0.348 |
|
2002 |
Egerton RF, Malac M. Improved background-fitting algorithms for ionization edges in electron energy-loss spectra. Ultramicroscopy. 92: 47-56. PMID 12138942 DOI: 10.1016/S0304-3991(01)00155-3 |
0.611 |
|
2002 |
Malac M, Schoefield M, Zhu Y, Egerton R. Exposure characteristics of cobalt fluoride (CoF 2) self-developing electron-beam resist on sub-100 nm scale Journal of Applied Physics. 92: 1112-1121. DOI: 10.1063/1.1487914 |
0.651 |
|
2002 |
Egerton R. Electron Energy Loss Spectroscopy Micron. 33: 693. DOI: 10.1016/S0968-4328(02)00019-7 |
0.44 |
|
2002 |
Egerton R. Transmission Electron Microscopy and Diffractometry of Materials Micron. 33: 511. DOI: 10.1016/S0968-4328(02)00002-1 |
0.389 |
|
2001 |
Zhu Y, Egerton RF, Malac M. Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging. Ultramicroscopy. 87: 135-45. PMID 11330500 DOI: 10.1016/S0304-3991(00)00094-2 |
0.653 |
|
2001 |
Malac M, Egerton RF. Thin-film regular-array structures with 10-100 nm repeat distance Nanotechnology. 12: 11-13. DOI: 10.1088/0957-4484/12/1/303 |
0.585 |
|
2001 |
Gilbert B, Margaritondo G, Douglas S, Nealson KH, Egerton RF, Rempfer GF, Stasio GD. XANES microspectroscopy of biominerals with photoconductive charge compensation Journal of Electron Spectroscopy and Related Phenomena. 114: 1005-1011. DOI: 10.1016/S0368-2048(00)00342-X |
0.368 |
|
2001 |
Minami H, Manage D, Tsui YY, Fedosejevs R, Malac M, Egerton R. Diamond-like-carbon films produced by magnetically guided pulsed laser deposition Applied Physics a: Materials Science and Processing. 73: 531-534. DOI: 10.1007/S003390101009 |
0.507 |
|
2000 |
Dick B, Brett MJ, Smy TJ, Freeman MR, Malac M, Egerton RF. Periodic magnetic microstructures by glancing angle deposition Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 18: 1838-1844. DOI: 10.1116/1.582481 |
0.532 |
|
1999 |
Malac M, Egerton RF. Calibration Specimens for Determining Energy-Dispersive X-ray k-Factors of Boron, Nitrogen, Oxygen, and Fluorine. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 5: 29-38. PMID 10227824 DOI: 10.1017/S1431927699000021 |
0.64 |
|
1999 |
Malac M, Egerton RF, Brett MJ, Dick B. Fabrication of submicrometer regular arrays of pillars and helices Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 17: 2671-2674. DOI: 10.1116/1.591046 |
0.541 |
|
1999 |
Egerton RF. Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging Journal of Electron Microscopy. 48: 711-716. DOI: 10.1093/Oxfordjournals.Jmicro.A023739 |
0.397 |
|
1999 |
Egerton RF, Takeuchi M. Radiation damage to fullerite (C60) in the transmission electron microscope Applied Physics Letters. 75: 1884-1886. DOI: 10.1063/1.124860 |
0.429 |
|
1999 |
Egerton R, Rauf I. Dose-rate dependence of electron-induced mass loss from organic specimens Ultramicroscopy. 80: 247-254. DOI: 10.1016/S0304-3991(99)00114-X |
0.413 |
|
1998 |
Egerton R, Malac M. K-Factor Standards for Low-Z Quantification Microscopy and Microanalysis. 4: 230-231. DOI: 10.1017/S1431927600021279 |
0.501 |
|
1997 |
Egerton RF, Crozier PA. The effect of lens aberrations on the spatial resolution of an energy-filtered TEM image Micron. 28: 117-124. DOI: 10.1016/S0968-4328(97)00007-3 |
0.421 |
|
1996 |
EGERTON RF, BENNETT JC. Micrometallurgy: a technique for examining the structure of binary-element thin films over a wide range of composition Journal of Microscopy. 183: 116-123. DOI: 10.1046/J.1365-2818.1996.850645.X |
0.312 |
|
1996 |
Egerton R. Improvement of the hydrogenic model to give more accurate values of K-shell ionization cross sections Ultramicroscopy. 63: 11-13. DOI: 10.1016/0304-3991(96)00034-4 |
0.348 |
|
1995 |
WONG K, EGERTON RF. Correction for the effects of elastic scattering in core-loss quantification Journal of Microscopy. 178: 198-207. DOI: 10.1111/J.1365-2818.1995.Tb03598.X |
0.307 |
|
1995 |
Bennett J, Egerton R. NiO Test Specimens for Analytical Electron Microscopy:
Round-Robin Results Microscopy and Microanalysis. 1: 143-149. DOI: 10.1017/S1431927695111435 |
0.395 |
|
1995 |
Schenner M, Schattschneider P, Egerton R. Validity of Lorentzian angular distribution in image formation with inelastically scattered electrons Micron. 26: 391-394. DOI: 10.1016/0968-4328(95)00024-0 |
0.401 |
|
1995 |
Yang Y, Egerton R. Tests of two alternative methods for measuring specimen thickness in a transmission electron microscope Micron. 26: 1-5. DOI: 10.1016/0968-4328(94)00039-S |
0.416 |
|
1995 |
Egerton R, Wong K. Some practical consequences of the Lorentzian angular distribution of inelastic scattering Ultramicroscopy. 59: 169-180. DOI: 10.1016/0304-3991(95)00026-W |
0.329 |
|
1994 |
Egerton R, Cheng S. Characterization of an analytical electron microscope with a NiO test specimen Ultramicroscopy. 55: 43-54. DOI: 10.1016/0304-3991(94)90079-5 |
0.441 |
|
1993 |
Cheng S, Egerton R. Elemental analysis of thick amorphous specimens by EELS Micron. 24: 251-256. DOI: 10.1016/0968-4328(93)90050-B |
0.314 |
|
1993 |
Egerton R, Yang Y, Cheng S. Characterization and use of the Gatan 666 parallel-recording electron energy-loss spectrometer Ultramicroscopy. 48: 239-250. DOI: 10.1016/0304-3991(93)90098-I |
0.365 |
|
1993 |
Egerton R. Oscillator-strength parameterization of inner-shell cross sections Ultramicroscopy. 50: 13-28. DOI: 10.1016/0304-3991(93)90087-E |
0.353 |
|
1993 |
Kezuka H, Egerton R, Masui M, Wada T, Ikehata T, Mase H, Takeuchi M. Electrical resistivity of RuOx thin films prepared by ion beam sputter deposition Applied Surface Science. 293-297. DOI: 10.1016/0169-4332(93)90674-Z |
0.326 |
|
1992 |
Yang YY, Egerton RF. The influence of lens chromatic aberration on electron energy-loss spectroscopy quantitative measurements. Microscopy Research and Technique. 21: 361-7. PMID 1638055 DOI: 10.1002/Jemt.1070210412 |
0.442 |
|
1992 |
Yang Y, Egerton RF. Measurements of oscillator strength for use in elemental analysis Philosophical Magazine B. 66: 697-709. DOI: 10.1080/13642819208207668 |
0.4 |
|
1992 |
Egerton R. Electron energy loss spectrometers, by Harald Ibach. Springer Series in Optical Sciences Volume 63. Springer‐Verlag, 1991, 178 pp, $59 Microscopy Research and Technique. 20: 314-314. DOI: 10.1002/Jemt.1070200312 |
0.37 |
|
1991 |
Egerton R, Yang Y, Chen F. EELS of “thick” specimens Ultramicroscopy. 38: 349-352. DOI: 10.1016/0304-3991(91)90169-7 |
0.422 |
|
1989 |
Crozier PA, Egerton RF. Mass-thickness determination by Bethe-sum-rule normalization of the electron energy-loss spectrum Ultramicroscopy. 27: 9-18. DOI: 10.1016/0304-3991(89)90197-6 |
0.388 |
|
1988 |
Malis T, Cheng SC, Egerton RF. EELS Log-Ratio Technique for Specimen-Thickness Measurement in the TEM Journal of Electron Microscopy Technique. 8: 193-200. PMID 3246607 DOI: 10.1002/Jemt.1060080206 |
0.335 |
|
1988 |
Egerton R. Accuracy in microanalysis by electron energy-loss spectroscopy Journal of Research of the National Bureau of Standards. 93: 372. DOI: 10.6028/jres.093.082 |
0.328 |
|
1987 |
Cheng SC, Crozier PA, Egerton RF. Deadtime corrections for a pulse counting system in electron energy loss spectroscopy Journal of Microscopy. 148: 285-288. DOI: 10.1111/J.1365-2818.1987.Tb02874.X |
0.306 |
|
1987 |
Egerton RF, Crozier PA. A compact parallel‐recording detector for EELS Journal of Microscopy. 148: 157-166. DOI: 10.1111/J.1365-2818.1987.Tb02863.X |
0.426 |
|
1987 |
Egerton RF, Crozier PA, Rice P. Electron energy-loss spectroscopy and chemical change Ultramicroscopy. 23: 305-312. DOI: 10.1016/0304-3991(87)90240-3 |
0.438 |
|
1987 |
Egerton R, Cheng S. Measurement of local thickness by electron energy-loss spectroscopy Ultramicroscopy. 21: 231-244. DOI: 10.1016/0304-3991(87)90148-3 |
0.447 |
|
1985 |
Misra M, Egerton RF. Assessment of electron irradiation damage to biomolecules using the Patterson function Journal of Microscopy. 139. PMID 4046015 DOI: 10.1111/J.1365-2818.1985.Tb02636.X |
0.387 |
|
1985 |
Cheng S, Egerton R. Signal/background ratio of ionization edges in EELS Ultramicroscopy. 16: 279-282. DOI: 10.1016/0304-3991(85)90084-1 |
0.327 |
|
1984 |
Misra M, Egerton RF. Assessment of electron irradiation damage to biomolecules by electron diffraction and electron energy-loss spectroscopy Ultramicroscopy. 15: 337-344. PMID 6528429 DOI: 10.1016/0304-3991(84)90128-1 |
0.433 |
|
1984 |
Egerton RF. Parallel-recording systems for electron energy loss spectroscopy (EELS) Journal of Electron Microscopy Technique. 1: 37-52. DOI: 10.1002/Jemt.1060010105 |
0.435 |
|
1983 |
Egerton RF, Sevely J. JUMP RATIO AS A MEASURE OF SPECTROMETER PERFORMANCE Journal of Microscopy. 129: RP1-RP2. DOI: 10.1111/J.1365-2818.1983.Tb04179.X |
0.344 |
|
1982 |
Egerton R, Cheng SC. THE USE OF PHOTODIODE ARRAYS TO RECORD 100 keV ELECTRONS Journal of Microscopy. 127: RP3-RP4. DOI: 10.1111/J.1365-2818.1982.Tb00404.X |
0.382 |
|
1982 |
Egerton RF. Organic mass loss at 100 K and 300 K Journal of Microscopy. 126: 95-100. DOI: 10.1111/J.1365-2818.1982.Tb00360.X |
0.352 |
|
1981 |
Egerton RF. Values of K‐shell partial cross‐section for electron energy‐loss spectrometry Journal of Microscopy. 123: 333-337. DOI: 10.1111/J.1365-2818.1981.Tb02479.X |
0.36 |
|
1981 |
Egerton R. Alignment and characterization of an electron spectrometer Ultramicroscopy. 6: 93-95. DOI: 10.1016/S0304-3991(81)80184-2 |
0.318 |
|
1980 |
Egerton RF. Measurement of radiation damage by electron energy-loss spectroscopy Journal of Microscopy. 118: 389-399. DOI: 10.1111/J.1365-2818.1980.Tb00288.X |
0.43 |
|
1979 |
Egerton R, Kenway D. An acquisition, storage, display and processing system for electron energy-loss spectra Ultramicroscopy. 4: 221-225. DOI: 10.1016/S0304-3991(79)90247-X |
0.429 |
|
1979 |
Egerton RF. K-shell ionization cross-sections for use in microanalysis Ultramicroscopy. 4: 169-179. DOI: 10.1016/S0304-3991(79)90157-8 |
0.367 |
|
1978 |
Egerton RF. Formulae for light-element microanalysis by electron energy-loss spectrometry. Ultramicroscopy. 3: 243-51. PMID 695137 DOI: 10.1016/S0304-3991(78)80031-X |
0.396 |
|
1978 |
Egerton R. A simple electron spectrometer for energy analysis in the transmission microscope Ultramicroscopy. 3: 39-47. DOI: 10.1016/S0304-3991(78)80005-9 |
0.431 |
|
1977 |
Egerton RF. The threshold energy for electron irradiation damage in single-crystal graphite The Philosophical Magazine: a Journal of Theoretical Experimental and Applied Physics. 35: 1425-1428. DOI: 10.1080/14786437708232965 |
0.417 |
|
1975 |
Egerton RF, Philip JG, Turner PS, Whelan MJ. Modification of a transmission electron microscope to give energy-filtered images and diffraction patterns, and electron energy loss spectra Journal of Physics E: Scientific Instruments. 8: 1033-1037. DOI: 10.1088/0022-3735/8/12/017 |
0.328 |
|
1975 |
Egerton RF. Inelastic scattering of 80 keV electrons in amorphous carbon Philosophical Magazine. 31: 199-215. DOI: 10.1080/14786437508229296 |
0.423 |
|
1974 |
Egerton RF, Whelan MJ. The electron energy loss spectrum and band structure of diamond Philosophical Magazine. 30: 739-749. DOI: 10.1080/14786437408207231 |
0.437 |
|
1974 |
Egerton RF, Whelan MJ. Electron energy loss spectra of diamond, graphite and amorphous carbon Journal of Electron Spectroscopy and Related Phenomena. 3: 232-236. DOI: 10.1016/0368-2048(74)80015-0 |
0.397 |
|
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