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Raymond F. Egerton - Publications

Affiliations: 
University of Alberta, Edmonton, Alberta, Canada 
Area:
Condensed Matter Physics
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Year Citation  Score
2020 Egerton RF, Venkatraman K, March K, Crozier PA. Properties of Dipole-Mode Vibrational Energy Losses Recorded From a TEM Specimen. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-7. PMID 32867870 DOI: 10.1017/S1431927620024423  0.378
2020 Malac M, Cloutier M, Salomons M, Chen S, Yakubu S, Leeson M, Pitters J, Vick D, Price D, Homeniuk D, Hayashida M, Egerton R. NanoMi: An Open Source (Scanning) Transmission Electron Microscope. Microscopy and Microanalysis. 1-4. DOI: 10.1017/S1431927620019431  0.624
2020 Watanabe M, Egerton R. Evaluation of Confocal X-ray Analysis for Single-Atom Detection in a Thin Specimen by an Advanced Analytical Electron Microscope Microscopy and Microanalysis. 1-4. DOI: 10.1017/S143192762001836X  0.335
2019 Egerton RF. Radiation damage to organic and inorganic specimens in the TEM. Micron (Oxford, England : 1993). 119: 72-87. PMID 30684768 DOI: 10.1016/J.Micron.2019.01.005  0.324
2019 Malac M, Homeniuk D, Hayashida M, Fujii T, Yaguchi T, Egerton R. In-Situ Mass Thickness Calibrations Using MWCNTs Microscopy and Microanalysis. 25: 792-793. DOI: 10.1017/S1431927619004690  0.462
2018 Egerton RF, Watanabe M. Characterization of single-atom catalysts by EELS and EDX spectroscopy. Ultramicroscopy. 193: 111-117. PMID 29975874 DOI: 10.1016/J.Ultramic.2018.06.013  0.379
2018 Hayashida M, Cui K, Malac M, Egerton R. Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM. Ultramicroscopy. 188: 8-12. PMID 29499457 DOI: 10.1016/J.Ultramic.2018.02.003  0.598
2018 Egerton RF. Calculation, consequences and measurement of the point spread function for low-loss inelastic scattering. Microscopy (Oxford, England). 67: i52-i59. PMID 29136206 DOI: 10.1093/Jmicro/Dfx089  0.425
2018 Fujii T, Malac M, Kano E, Hayashida M, Yaguchi T, Egerton R. Toward Quantitative Bright Field TEM Imaging of Ultra Thin Samples Microscopy and Microanalysis. 24: 1612-1613. DOI: 10.1017/S1431927618008541  0.539
2017 Egerton RF. Scattering delocalization and radiation damage in STEM-EELS. Ultramicroscopy. 180: 115-124. PMID 28377217 DOI: 10.1016/J.Ultramic.2017.02.007  0.402
2017 Qian H, Egerton RF. Solid-state nanopores of controlled geometry fabricated in a transmission electron microscope Applied Physics Letters. 111: 193106. DOI: 10.1063/1.4990664  0.423
2017 Malac M, Kano E, Hayashida M, Kawasaki M, Motoki S, Egerton R, Ishikawa I, Okura Y, Beleggia M. Hole-Free Phase Plate Energy Filtering Imaging of Graphene: Toward Quantitative Hole-Free Phase Plate Imaging in a TEM Microscopy and Microanalysis. 23: 842-843. DOI: 10.1017/S1431927617004871  0.556
2016 Egerton R, Aoki T, Crozier P. Taking Advantage of Scattering Delocalization To Reduce Radiation Damage In Vibrational or Valence-Loss EELS and Energy-Filtered TEM Images Microscopy and Microanalysis. 22: 960-961. DOI: 10.1017/S143192761600564X  0.34
2016 Leontowich AFG, Hitchcock AP, Egerton RF. Radiation damage yields across the carbon 1s excitation edge Journal of Electron Spectroscopy and Related Phenomena. 206: 58-64. DOI: 10.1016/J.Elspec.2015.11.010  0.347
2015 Egerton RF. Vibrational-loss EELS and the avoidance of radiation damage. Ultramicroscopy. 95-100. PMID 26340606 DOI: 10.1016/J.Ultramic.2015.08.003  0.394
2015 Krivanek OL, Lovejoy TC, Dellby N, Aoki T, Carpenter RW, Rez P, Soignard E, Zhu J, Batson PE, Lagos MJ, Egerton RF, Crozier PA. Vibrational spectroscopy in the electron microscope Nature. 514: 209-212. PMID 25297434 DOI: 10.1038/Nature13870  0.45
2015 Egerton RF. Outrun radiation damage with electrons? Advanced Structural and Chemical Imaging. 1. DOI: 10.1186/S40679-014-0001-3  0.431
2015 Egerton RF. The Use of Color in Elemental Maps and Electron-Microscope Images Microscopy and Microanalysis. 21: 2241-2242. DOI: 10.1017/S1431927615011988  0.342
2015 Malac M, Beleggia M, Rowan T, Egerton R, Kawasaki M, Okura Y, McLeod RA. Electron Beam-Induced Charging and Modifications of Thin Films Microscopy and Microanalysis. 21: 1385-1388. DOI: 10.1017/S1431927615007710  0.595
2015 Egerton R, Rez P, Crozier P. Avoidance of Radiation Damage in Vibrational-Mode Energy-Loss Spectroscopy Microscopy and Microanalysis. 21: 659-660. DOI: 10.1017/S1431927615004092  0.305
2014 Hayashida M, Malac M, Bergen M, Egerton RF, Li P. Accurate measurement of relative tilt and azimuth angles in electron tomography: a comparison of fiducial marker method with electron diffraction. The Review of Scientific Instruments. 85: 083704. PMID 25173273 DOI: 10.1063/1.4892436  0.574
2014 Egerton RF, Mcleod RA, Malac M. Validity of the dipole approximation in TEM-EELS studies. Microscopy Research and Technique. 77: 773-8. PMID 25045082 DOI: 10.1002/Jemt.22398  0.598
2014 Egerton RF. Choice of operating voltage for a transmission electron microscope. Ultramicroscopy. 145: 85-93. PMID 24679438 DOI: 10.1016/J.Ultramic.2013.10.019  0.385
2014 Egerton RF. Prospects for vibrational-mode EELS with high spatial resolution. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 658-63. PMID 24548332 DOI: 10.1017/S1431927613014013  0.382
2014 Hayashida M, Malac M, Bergen M, Li P, Egerton R. Electron diffraction based tilt angle measurements in electron tomography Microscopy and Microanalysis. 20: 806-807. DOI: 10.1017/S1431927614005753  0.594
2014 Malac M, Kimoto K, Egerton R, Shekhar P, Jacob Z, Taniguchi Y, Gaind V. Angle-resolved valence EELS of a single crystal gold sample Microscopy and Microanalysis. 20: 628-629. DOI: 10.1017/S1431927614004863  0.519
2014 Malac M, Beleggia M, Egerton R, Kawasaki M, Berge M, Okura Y, Ishikawa I, Motoki K. Charging of thin film phase plates under electron beam irradiation Microscopy and Microanalysis. 20: 230-231. DOI: 10.1017/S1431927614002876  0.599
2014 Crozier PA, Zhu J, Aoki T, Rez P, Bowman WJ, Carpenter RW, Krivanek OL, Dellby N, Lovejoy TC, Egerton RF. Challenges and opportunities in materials science with next generation monochromated EELS Microscopy and Microanalysis. 20: 72-73. DOI: 10.1017/S1431927614002086  0.419
2014 Shekhar P, Gaind V, Malac M, Egerton R, Jacob Z. Momentum-resolved electron energy loss spectroscopy (q-EELS) for quantum plasmonics and metamaterials Optics Infobase Conference Papers.  0.579
2013 Egerton RF. Beam-induced motion of adatoms in the transmission electron microscope. Microscopy and Microanalysis. 19: 479-486. PMID 23425385 DOI: 10.1017/S1431927612014274  0.34
2013 Egerton RF. Control of radiation damage in the TEM. Ultramicroscopy. 127: 100-108. PMID 22910614 DOI: 10.1016/J.Ultramic.2012.07.006  0.437
2013 Egerton R. A Modest Proposal for the Propagation of Information Concerning Radiation Damage in the TEM, and as Fodder for Pasturized Professors Microscopy Today. 21: 70-72. DOI: 10.1017/S1551929513000941  0.335
2013 Zhang HR, Egerton R, Malac M. Electron irradiation damage and color centers of MgO nanocube Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 316: 137-143. DOI: 10.1016/J.Nimb.2013.08.042  0.647
2012 Wu L, Egerton RF, Zhu Y. Image simulation for atomic resolution secondary electron image. Ultramicroscopy. 123: 66-73. PMID 22940532 DOI: 10.1016/J.Ultramic.2012.06.008  0.391
2012 Egerton RF. Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV Microscopy Research and Technique. 75: 1550-1556. PMID 22807142 DOI: 10.1002/Jemt.22099  0.366
2012 Malac M, Beleggia M, Kawasaki M, Li P, Egerton RF. Convenient contrast enhancement by a hole-free phase plate. Ultramicroscopy. 118: 77-89. PMID 22743212 DOI: 10.1016/J.Ultramic.2012.02.004  0.611
2012 Egerton RF. TEM-EELS: a personal perspective. Ultramicroscopy. 119: 24-32. PMID 22221958 DOI: 10.1016/J.Ultramic.2011.11.008  0.383
2012 Zhang HR, Egerton RF, Malac M. Local thickness measurement through scattering contrast and electron energy-loss spectroscopy. Micron (Oxford, England : 1993). 43: 8-15. PMID 21803591 DOI: 10.1016/J.Micron.2011.07.003  0.585
2012 Malac M, Bergen M, Egerton R, Kawasaki M, Beleggia M, Furukawa H, Shimizu M. Practical hole-free phase plate imaging: principles, advantages and pitfalls Microscopy and Microanalysis. 18: 484-485. DOI: 10.1017/S1431927612004278  0.519
2012 Zhu Y, Wu L, Su D, Cheng C, Ciston J, Inada H, Suzuki Y, Tamura K, Konno M, Egerton R, Marks L. Simultaneous Imaging of Surface and Bulk at Atomic Resolution Microscopy and Microanalysis. 18: 306-307. DOI: 10.1017/S1431927612003388  0.306
2011 Egerton RF, Lazar S, Libera M. Delocalized radiation damage in polymers. Micron (Oxford, England : 1993). 43: 2-7. PMID 21689941 DOI: 10.1016/J.Micron.2011.05.007  0.434
2011 Malac M, Egerton R, Wang J. Radiation damage and electron energy loss spectroscopy of Au particles on amorphous Ge substrates Acta Crystallographica Section a Foundations of Crystallography. 67: C636-C637. DOI: 10.1107/S0108767311083899  0.595
2011 Zhang H, Egerton R, Malac M. EELS Investigation of the Formulas for Inelastic Mean Free Path Microscopy and Microanalysis. 17: 1466-1467. DOI: 10.1017/S1431927611008208  0.504
2011 Inada H, Tamura K, Nakamura K, Suzuki Y, Konno M, Su D, Wall J, Egerton R, Zhu Y. Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope Microscopy and Microanalysis. 17: 1298-1299. DOI: 10.1017/S1431927611007367  0.434
2010 Inada H, Su D, Egerton RF, Konno M, Wu L, Ciston J, Wall J, Zhu Y. Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms. Ultramicroscopy. 111: 865-76. PMID 21185651 DOI: 10.1016/J.Ultramic.2010.10.002  0.382
2010 Borzsonyi G, Beingessner RL, Yamazaki T, Cho JY, Myles AJ, Malac M, Egerton R, Kawasaki M, Ishizuka K, Kovalenko A, Fenniri H. Water-soluble J-type rosette nanotubes with giant molar ellipticity. Journal of the American Chemical Society. 132: 15136-9. PMID 20936820 DOI: 10.1021/Ja105028W  0.537
2010 Libera MR, Egerton RF. Advances in the Transmission Electron Microscopy of Polymers Polymer Reviews. 50: 321-339. DOI: 10.1080/15583724.2010.493256  0.341
2010 Inada H, Su D, Konno M, Nakamura K, Egerton R, Wall J, Zhu Y. Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope Microscopy and Microanalysis. 16: 610-611. DOI: 10.1017/S1431927610059349  0.424
2010 Zhang H, Egerton R, Malac M. Local Thickness Measurement in TEM Microscopy and Microanalysis. 16: 344-345. DOI: 10.1017/S1431927610058630  0.56
2010 Malac M, Kawasaki M, Beleggia M, Li P, Egerton R. Convenient Contrast Enhancement by Hole-Free Phase Plate in a TEM Microscopy and Microanalysis. 16: 526-527. DOI: 10.1017/S1431927610055807  0.566
2010 Egerton R, Su D, Wall J, Zhu Y. Physics of Atomic-Scale Secondary-Electron Imaging Microscopy and Microanalysis. 16: 620-621. DOI: 10.1017/S143192761005525X  0.362
2010 Egerton R. Mechanisms of Radiation Damage and Electron-Beam Fabrication Microscopy and Microanalysis. 16: 1658-1659. DOI: 10.1017/S1431927610055182  0.395
2010 Zhang H, Malac M, Egerton R. Electron Irradiation Damage of MgO Nanocube Microscopy and Microanalysis. 16: 1794-1795. DOI: 10.1017/S1431927610054735  0.625
2010 Egerton RF, McLeod R, Wang F, Malac M. Basic questions related to electron-induced sputtering in the TEM Ultramicroscopy. 110: 991-997. DOI: 10.1016/J.Ultramic.2009.11.003  0.616
2009 Sayed SY, Wang F, Malac M, Meldrum A, Egerton RF, Buriak JM. Heteroepitaxial growth of gold nanostructures on silicon by galvanic displacement. Acs Nano. 3: 2809-17. PMID 19719082 DOI: 10.1021/Nn900685A  0.575
2009 Wang F, Egerton R, Malac M. Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS). Ultramicroscopy. 109: 1245-9. PMID 19577847 DOI: 10.1016/J.Ultramic.2009.05.011  0.6
2009 Wang F, Sayed SY, Malac M, Wang D, Egerton R, Buriak J. TEM studies of Au/Si epilayer interfaces Microscopy and Microanalysis. 15: 1450-1451. DOI: 10.1017/S1431927609095658  0.523
2009 Moreno MS, Cadavid D, Santilĺn MJ, Egerton RF, Malac M. Electron radiation damage in TiOx nanobelts Microscopy and Microanalysis. 15: 1340-1341. DOI: 10.1017/S143192760909463X  0.61
2009 Kawasaki M, Malac M, Li P, Qian H, Egerton R. Convenient electron optics set up for zernike phase microscopy in TEM Microscopy and Microanalysis. 15: 1234-1235. DOI: 10.1017/S1431927609094598  0.549
2009 Li P, Wang X, Malac M, Egerton R, Meldrum A, Lenz F, Liang X, Wang J. 3D imaging of Si and Er Nanoclusters in Er Doped SiO1.5 films by STEM tomography Microscopy and Microanalysis. 15: 1256-1257. DOI: 10.1017/S1431927609093143  0.604
2009 Egerton R, Wang F, McLeod R, Malac M. Basic questions related to electron-induced sputtering Microscopy and Microanalysis. 15: 1356-1357. DOI: 10.1017/S1431927609092204  0.615
2008 Malac M, Beleggia M, Taniguchi Y, Egerton RF, Zhu Y. Low-dose performance of parallel-beam nanodiffraction. Ultramicroscopy. 109: 14-21. PMID 18768263 DOI: 10.1016/J.Ultramic.2008.07.004  0.619
2008 Egerton RF, Wang F, Malac M, Moreno MS, Hofer F. Fourier-ratio deconvolution and its Bayesian equivalent. Micron (Oxford, England : 1993). 39: 642-7. PMID 18036824 DOI: 10.1016/J.Micron.2007.10.004  0.604
2008 Malac M, Beleggia M, Egerton R, Zhu Y. Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates. Ultramicroscopy. 108: 126-40. PMID 17509765 DOI: 10.1016/J.Ultramic.2007.03.008  0.596
2008 Egerton RF. Electron energy-loss spectroscopy in the TEM Reports On Progress in Physics. 72: 016502. DOI: 10.1088/0034-4885/72/1/016502  0.487
2008 Wang F, Egerton RF, Malac M, McLeod RA, Moreno MS. The spatial resolution of electron energy loss and x-ray absorption fine structure Journal of Applied Physics. 104. DOI: 10.1063/1.2960582  0.657
2008 Sayed SY, Wang F, Malac M, Egerton R, Buriak J. Synthesis and interfacial characterization of Au nanoparticles on Si nanowires Microscopy and Microanalysis. 14: 302-303. DOI: 10.1017/S1431927608086881  0.482
2008 Egerton R, Wang F, Malac M. Spatial resolution and delocalization of the EELS core-loss fine structure Microscopy and Microanalysis. 14: 1344-1345. DOI: 10.1017/S1431927608082597  0.548
2008 Wang F, Egerton R, Malac M. Use of Fourier-ratio deconvolution for processing low-loss EELS spectra Microscopy and Microanalysis. 14: 1412-1413. DOI: 10.1017/S1431927608082573  0.495
2007 Egerton RF. Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy Ultramicroscopy. 107: 575-586. PMID 17257759 DOI: 10.1016/J.Ultramic.2006.11.005  0.476
2007 Wang F, Malac M, Egerton RF. Alternative methods of identifying the oxidation of metallic nanoparticles embedded in a matrix. Micron (Oxford, England : 1993). 38: 371-6. PMID 16959491 DOI: 10.1016/J.Micron.2006.06.006  0.553
2007 Chen KF, Lo SC, Chang L, Egerton R, Kai JJ, Lin JJ, Chen FR. Valence state map of iron oxide thin film obtained from electron spectroscopy imaging series. Micron (Oxford, England : 1993). 38: 354-61. PMID 16934475 DOI: 10.1016/J.Micron.2006.06.004  0.325
2007 Malac M, Beleggia M, Egerton R, Zhu Y. Bright-field TEM imaging of single molecules: dream or near future? Ultramicroscopy. 107: 40-9. PMID 16820263 DOI: 10.1016/J.Ultramic.2006.05.001  0.623
2007 Qian H, Malac M, Egerton RF. Microscopy of pentacene thin films Philosophical Magazine. 87: 253-266. DOI: 10.1080/14786430600953756  0.625
2007 Wang F, Malac M, Egerton RF, Meldrum A, Zhu X, Liu Z, MacDonald N, Li P, Freeman MR. Multilayer route to iron nanoparticle formation in an insulating matrix Journal of Applied Physics. 101. DOI: 10.1063/1.2434953  0.588
2007 Wang XF, Li Q, Egerton RF, Lee P, Dai J, Hou ZF, Gong XG. Effect of Al addition on the microstructure and electronic structure of HfO2 film Journal of Applied Physics. 101: 13514. DOI: 10.1063/1.2405741  0.355
2007 Wang F, Malac M, Egerton RF, Meldrum A, Li P, Freeman MR, Veinot JGC. Controlled growth of silicon oxide nanowires from a patterned reagent Journal of Physical Chemistry C. 111: 1865-1867. DOI: 10.1021/Jp0675476  0.54
2007 Wang F, Malac M, Qian H, Egerton R. Oxidation Mapping by Postpeak Technique Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607077513  0.592
2007 Malac M, Wang F, Egerton R, Taniguchi Y. Parallel Beam Nano-Diffraction Analysis of Individual Nanoparticles Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607072984  0.499
2006 Egerton RF, Wang F, Crozier PA. Beam-induced damage to thin specimens in an intense electron probe. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 12: 65-71. PMID 17481342 DOI: 10.1017/S1431927606060065  0.417
2006 Wang J, Li Q, Egerton RF. Probing the electronic structure of ZnO nanowires by valence electron energy loss spectroscopy. Micron (Oxford, England : 1993). 38: 346-53. PMID 16938457 DOI: 10.1016/J.Micron.2006.06.003  0.445
2006 Wang F, Egerton RF, Malac M. Interpretation of the postpeak in iron fluorides and oxides. Ultramicroscopy. 106: 925-32. PMID 16764991 DOI: 10.1016/J.Ultramic.2006.04.005  0.589
2006 Wang F, Malac M, Egerton RF. Energy-loss near-edge fine structures of iron nanoparticles. Micron (Oxford, England : 1993). 37: 316-23. PMID 16563777 DOI: 10.1016/J.Micron.2005.12.003  0.569
2006 Egerton RF, Qian H, Malac M. Improving the energy resolution of X-ray and electron energy-loss spectra. Micron (Oxford, England : 1993). 37: 310-5. PMID 16376551 DOI: 10.1016/J.Micron.2005.11.005  0.633
2006 Moreno, Lazar S, Zandbergen HW, Egerton RF. Accuracy of the calculated unoccupied states in GaN phases as tested by high-resolution electron energy-loss spectroscopy Physical Review B. 73: 73308. DOI: 10.1103/Physrevb.73.073308  0.434
2006 Chen F, Kai J, Lin J, Chang L, Egerton R. Property Map by Electron Spectroscopy Imaging Series Microscopy and Microanalysis. 12: 1158-1159. DOI: 10.1017/S1431927606068462  0.369
2006 Malac M, Beleggia M, Egerton R, Zhu Y. Optimized Cs-corrected imaging of radiation-sensitive high-resolution objects Microscopy and Microanalysis. 12: 1458-1459. DOI: 10.1017/S1431927606067341  0.546
2006 Wang F, Malac M, Egerton RF, Li P, Meldrum A, Freeman MR. An ELNES study of SiO2 nanowires grown from a patterned reagent Microscopy and Microanalysis. 12: 1172-1173. DOI: 10.1017/S1431927606064336  0.529
2006 Egerton R. Limitations of Electron Energy-Loss Spectroscopy Microscopy and Microanalysis. 12: 102-103. DOI: 10.1017/S1431927606061885  0.441
2005 Malac M, Egerton R, Freeman M, Lau J, Zhu Y, Wu L. Electron-beam patterning with sub-2 nm line edge roughness Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 271-273. DOI: 10.1116/1.1856466  0.59
2005 Moreno MS, Egerton RF, Rehr JJ, Midgley PA. Electronic structure of tin oxides by electron energy loss spectroscopy and real-space multiple scattering calculations Physical Review B - Condensed Matter and Materials Physics. 71. DOI: 10.1103/Physrevb.71.035103  0.397
2005 Ostroverkhova O, Shcherbyna S, Cooke DG, Egerton RF, Hegmann FA, Tykwinski RR, Parkin SR, Anthony JE. Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology Journal of Applied Physics. 98. DOI: 10.1063/1.1949711  0.311
2005 Wang J, An X, Li Q, Egerton RF. Size-dependent electronic structures of ZnO nanowires Applied Physics Letters. 86: 201911. DOI: 10.1063/1.1927711  0.412
2005 Hitchcock AP, Wang J, Botton GA, Egerton RF. Quantitative Dose-damage Relationships for Radiation Damage to Polymers and Molecular Compounds in X-ray and Electron Microscopes Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605508213  0.327
2005 Qian H, Egerton R, Malac M. Electron Radiation Damage of Pentacene Thin Films Measured in TEM Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605503817  0.62
2005 Malac M, Beleggia M, Egerton RF, Zhu Y. Cs Corrected Bright Field Imaging of Radiation Sensitive Materials Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605501053  0.544
2005 Egerton RF, Malac M. EELS in the TEM Journal of Electron Spectroscopy and Related Phenomena. 143: 43-50. DOI: 10.1016/J.Elspec.2003.12.009  0.647
2004 Li P, Egerton RF. Radiation damage in coronene, rubrene and p-terphenyl, measured for incident electrons of kinetic energy between 100 and 200 kev. Ultramicroscopy. 101: 161-72. PMID 15450662 DOI: 10.1016/J.Ultramic.2004.05.010  0.462
2004 Egerton RF, Li P, Malac M. Radiation damage in the TEM and SEM. Micron (Oxford, England : 1993). 35: 399-409. PMID 15120123 DOI: 10.1016/J.Micron.2004.02.003  0.627
2004 Egerton RF. New techniques in electron energy-loss spectroscopy and energy-filtered imaging. Micron (Oxford, England : 1993). 34: 127-39. PMID 12895484 DOI: 10.1016/S0968-4328(03)00023-4  0.459
2004 Moreno MS, Egerton RF, Midgley PA. Differentiation of tin oxides using electron energy-loss spectroscopy Physical Review B. 69: 233304. DOI: 10.1103/Physrevb.69.233304  0.404
2004 Egerton RF, Malac M. The lateral range and energy deposition of fast secondary electrons Microscopy and Microanalysis. 10: 1382-1383. DOI: 10.1017/S1431927604880541  0.636
2004 Egerton RF, Crozier PA. Erosion of TEM Specimens in an Intense Electron Beam Microscopy and Microanalysis. 10: 54-55. DOI: 10.1017/S143192760455568X  0.376
2004 Egerton R. High-energy electron diffraction and microscopy Micron. 35: 623. DOI: 10.1016/J.Micron.2004.03.001  0.447
2003 Egerton R. Electron Energy-Loss Spectroscopy Microscopy and Microanalysis. 9: 1562-1563. DOI: 10.1017/S1431927603447818  0.44
2003 Li P, Egerton R. Electron irradiation damage to aromatic compounds Microscopy and Microanalysis. 9: 986-987. DOI: 10.1017/S1431927603444930  0.348
2002 Egerton RF, Malac M. Improved background-fitting algorithms for ionization edges in electron energy-loss spectra. Ultramicroscopy. 92: 47-56. PMID 12138942 DOI: 10.1016/S0304-3991(01)00155-3  0.611
2002 Malac M, Schoefield M, Zhu Y, Egerton R. Exposure characteristics of cobalt fluoride (CoF 2) self-developing electron-beam resist on sub-100 nm scale Journal of Applied Physics. 92: 1112-1121. DOI: 10.1063/1.1487914  0.651
2002 Egerton R. Electron Energy Loss Spectroscopy Micron. 33: 693. DOI: 10.1016/S0968-4328(02)00019-7  0.44
2002 Egerton R. Transmission Electron Microscopy and Diffractometry of Materials Micron. 33: 511. DOI: 10.1016/S0968-4328(02)00002-1  0.389
2001 Zhu Y, Egerton RF, Malac M. Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging. Ultramicroscopy. 87: 135-45. PMID 11330500 DOI: 10.1016/S0304-3991(00)00094-2  0.653
2001 Malac M, Egerton RF. Thin-film regular-array structures with 10-100 nm repeat distance Nanotechnology. 12: 11-13. DOI: 10.1088/0957-4484/12/1/303  0.585
2001 Gilbert B, Margaritondo G, Douglas S, Nealson KH, Egerton RF, Rempfer GF, Stasio GD. XANES microspectroscopy of biominerals with photoconductive charge compensation Journal of Electron Spectroscopy and Related Phenomena. 114: 1005-1011. DOI: 10.1016/S0368-2048(00)00342-X  0.368
2001 Minami H, Manage D, Tsui YY, Fedosejevs R, Malac M, Egerton R. Diamond-like-carbon films produced by magnetically guided pulsed laser deposition Applied Physics a: Materials Science and Processing. 73: 531-534. DOI: 10.1007/S003390101009  0.507
2000 Dick B, Brett MJ, Smy TJ, Freeman MR, Malac M, Egerton RF. Periodic magnetic microstructures by glancing angle deposition Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 18: 1838-1844. DOI: 10.1116/1.582481  0.532
1999 Malac M, Egerton RF. Calibration Specimens for Determining Energy-Dispersive X-ray k-Factors of Boron, Nitrogen, Oxygen, and Fluorine. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 5: 29-38. PMID 10227824 DOI: 10.1017/S1431927699000021  0.64
1999 Malac M, Egerton RF, Brett MJ, Dick B. Fabrication of submicrometer regular arrays of pillars and helices Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 17: 2671-2674. DOI: 10.1116/1.591046  0.541
1999 Egerton RF. Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging Journal of Electron Microscopy. 48: 711-716. DOI: 10.1093/Oxfordjournals.Jmicro.A023739  0.397
1999 Egerton RF, Takeuchi M. Radiation damage to fullerite (C60) in the transmission electron microscope Applied Physics Letters. 75: 1884-1886. DOI: 10.1063/1.124860  0.429
1999 Egerton R, Rauf I. Dose-rate dependence of electron-induced mass loss from organic specimens Ultramicroscopy. 80: 247-254. DOI: 10.1016/S0304-3991(99)00114-X  0.413
1998 Egerton R, Malac M. K-Factor Standards for Low-Z Quantification Microscopy and Microanalysis. 4: 230-231. DOI: 10.1017/S1431927600021279  0.501
1997 Egerton RF, Crozier PA. The effect of lens aberrations on the spatial resolution of an energy-filtered TEM image Micron. 28: 117-124. DOI: 10.1016/S0968-4328(97)00007-3  0.421
1996 EGERTON RF, BENNETT JC. Micrometallurgy: a technique for examining the structure of binary-element thin films over a wide range of composition Journal of Microscopy. 183: 116-123. DOI: 10.1046/J.1365-2818.1996.850645.X  0.312
1996 Egerton R. Improvement of the hydrogenic model to give more accurate values of K-shell ionization cross sections Ultramicroscopy. 63: 11-13. DOI: 10.1016/0304-3991(96)00034-4  0.348
1995 WONG K, EGERTON RF. Correction for the effects of elastic scattering in core-loss quantification Journal of Microscopy. 178: 198-207. DOI: 10.1111/J.1365-2818.1995.Tb03598.X  0.307
1995 Bennett J, Egerton R. NiO Test Specimens for Analytical Electron Microscopy: Round-Robin Results Microscopy and Microanalysis. 1: 143-149. DOI: 10.1017/S1431927695111435  0.395
1995 Schenner M, Schattschneider P, Egerton R. Validity of Lorentzian angular distribution in image formation with inelastically scattered electrons Micron. 26: 391-394. DOI: 10.1016/0968-4328(95)00024-0  0.401
1995 Yang Y, Egerton R. Tests of two alternative methods for measuring specimen thickness in a transmission electron microscope Micron. 26: 1-5. DOI: 10.1016/0968-4328(94)00039-S  0.416
1995 Egerton R, Wong K. Some practical consequences of the Lorentzian angular distribution of inelastic scattering Ultramicroscopy. 59: 169-180. DOI: 10.1016/0304-3991(95)00026-W  0.329
1994 Egerton R, Cheng S. Characterization of an analytical electron microscope with a NiO test specimen Ultramicroscopy. 55: 43-54. DOI: 10.1016/0304-3991(94)90079-5  0.441
1993 Cheng S, Egerton R. Elemental analysis of thick amorphous specimens by EELS Micron. 24: 251-256. DOI: 10.1016/0968-4328(93)90050-B  0.314
1993 Egerton R, Yang Y, Cheng S. Characterization and use of the Gatan 666 parallel-recording electron energy-loss spectrometer Ultramicroscopy. 48: 239-250. DOI: 10.1016/0304-3991(93)90098-I  0.365
1993 Egerton R. Oscillator-strength parameterization of inner-shell cross sections Ultramicroscopy. 50: 13-28. DOI: 10.1016/0304-3991(93)90087-E  0.353
1993 Kezuka H, Egerton R, Masui M, Wada T, Ikehata T, Mase H, Takeuchi M. Electrical resistivity of RuOx thin films prepared by ion beam sputter deposition Applied Surface Science. 293-297. DOI: 10.1016/0169-4332(93)90674-Z  0.326
1992 Yang YY, Egerton RF. The influence of lens chromatic aberration on electron energy-loss spectroscopy quantitative measurements. Microscopy Research and Technique. 21: 361-7. PMID 1638055 DOI: 10.1002/Jemt.1070210412  0.442
1992 Yang Y, Egerton RF. Measurements of oscillator strength for use in elemental analysis Philosophical Magazine B. 66: 697-709. DOI: 10.1080/13642819208207668  0.4
1992 Egerton R. Electron energy loss spectrometers, by Harald Ibach. Springer Series in Optical Sciences Volume 63. Springer‐Verlag, 1991, 178 pp, $59 Microscopy Research and Technique. 20: 314-314. DOI: 10.1002/Jemt.1070200312  0.37
1991 Egerton R, Yang Y, Chen F. EELS of “thick” specimens Ultramicroscopy. 38: 349-352. DOI: 10.1016/0304-3991(91)90169-7  0.422
1989 Crozier PA, Egerton RF. Mass-thickness determination by Bethe-sum-rule normalization of the electron energy-loss spectrum Ultramicroscopy. 27: 9-18. DOI: 10.1016/0304-3991(89)90197-6  0.388
1988 Malis T, Cheng SC, Egerton RF. EELS Log-Ratio Technique for Specimen-Thickness Measurement in the TEM Journal of Electron Microscopy Technique. 8: 193-200. PMID 3246607 DOI: 10.1002/Jemt.1060080206  0.335
1988 Egerton R. Accuracy in microanalysis by electron energy-loss spectroscopy Journal of Research of the National Bureau of Standards. 93: 372. DOI: 10.6028/jres.093.082  0.328
1987 Cheng SC, Crozier PA, Egerton RF. Deadtime corrections for a pulse counting system in electron energy loss spectroscopy Journal of Microscopy. 148: 285-288. DOI: 10.1111/J.1365-2818.1987.Tb02874.X  0.306
1987 Egerton RF, Crozier PA. A compact parallel‐recording detector for EELS Journal of Microscopy. 148: 157-166. DOI: 10.1111/J.1365-2818.1987.Tb02863.X  0.426
1987 Egerton RF, Crozier PA, Rice P. Electron energy-loss spectroscopy and chemical change Ultramicroscopy. 23: 305-312. DOI: 10.1016/0304-3991(87)90240-3  0.438
1987 Egerton R, Cheng S. Measurement of local thickness by electron energy-loss spectroscopy Ultramicroscopy. 21: 231-244. DOI: 10.1016/0304-3991(87)90148-3  0.447
1985 Misra M, Egerton RF. Assessment of electron irradiation damage to biomolecules using the Patterson function Journal of Microscopy. 139. PMID 4046015 DOI: 10.1111/J.1365-2818.1985.Tb02636.X  0.387
1985 Cheng S, Egerton R. Signal/background ratio of ionization edges in EELS Ultramicroscopy. 16: 279-282. DOI: 10.1016/0304-3991(85)90084-1  0.327
1984 Misra M, Egerton RF. Assessment of electron irradiation damage to biomolecules by electron diffraction and electron energy-loss spectroscopy Ultramicroscopy. 15: 337-344. PMID 6528429 DOI: 10.1016/0304-3991(84)90128-1  0.433
1984 Egerton RF. Parallel-recording systems for electron energy loss spectroscopy (EELS) Journal of Electron Microscopy Technique. 1: 37-52. DOI: 10.1002/Jemt.1060010105  0.435
1983 Egerton RF, Sevely J. JUMP RATIO AS A MEASURE OF SPECTROMETER PERFORMANCE Journal of Microscopy. 129: RP1-RP2. DOI: 10.1111/J.1365-2818.1983.Tb04179.X  0.344
1982 Egerton R, Cheng SC. THE USE OF PHOTODIODE ARRAYS TO RECORD 100 keV ELECTRONS Journal of Microscopy. 127: RP3-RP4. DOI: 10.1111/J.1365-2818.1982.Tb00404.X  0.382
1982 Egerton RF. Organic mass loss at 100 K and 300 K Journal of Microscopy. 126: 95-100. DOI: 10.1111/J.1365-2818.1982.Tb00360.X  0.352
1981 Egerton RF. Values of K‐shell partial cross‐section for electron energy‐loss spectrometry Journal of Microscopy. 123: 333-337. DOI: 10.1111/J.1365-2818.1981.Tb02479.X  0.36
1981 Egerton R. Alignment and characterization of an electron spectrometer Ultramicroscopy. 6: 93-95. DOI: 10.1016/S0304-3991(81)80184-2  0.318
1980 Egerton RF. Measurement of radiation damage by electron energy-loss spectroscopy Journal of Microscopy. 118: 389-399. DOI: 10.1111/J.1365-2818.1980.Tb00288.X  0.43
1979 Egerton R, Kenway D. An acquisition, storage, display and processing system for electron energy-loss spectra Ultramicroscopy. 4: 221-225. DOI: 10.1016/S0304-3991(79)90247-X  0.429
1979 Egerton RF. K-shell ionization cross-sections for use in microanalysis Ultramicroscopy. 4: 169-179. DOI: 10.1016/S0304-3991(79)90157-8  0.367
1978 Egerton RF. Formulae for light-element microanalysis by electron energy-loss spectrometry. Ultramicroscopy. 3: 243-51. PMID 695137 DOI: 10.1016/S0304-3991(78)80031-X  0.396
1978 Egerton R. A simple electron spectrometer for energy analysis in the transmission microscope Ultramicroscopy. 3: 39-47. DOI: 10.1016/S0304-3991(78)80005-9  0.431
1977 Egerton RF. The threshold energy for electron irradiation damage in single-crystal graphite The Philosophical Magazine: a Journal of Theoretical Experimental and Applied Physics. 35: 1425-1428. DOI: 10.1080/14786437708232965  0.417
1975 Egerton RF, Philip JG, Turner PS, Whelan MJ. Modification of a transmission electron microscope to give energy-filtered images and diffraction patterns, and electron energy loss spectra Journal of Physics E: Scientific Instruments. 8: 1033-1037. DOI: 10.1088/0022-3735/8/12/017  0.328
1975 Egerton RF. Inelastic scattering of 80 keV electrons in amorphous carbon Philosophical Magazine. 31: 199-215. DOI: 10.1080/14786437508229296  0.423
1974 Egerton RF, Whelan MJ. The electron energy loss spectrum and band structure of diamond Philosophical Magazine. 30: 739-749. DOI: 10.1080/14786437408207231  0.437
1974 Egerton RF, Whelan MJ. Electron energy loss spectra of diamond, graphite and amorphous carbon Journal of Electron Spectroscopy and Related Phenomena. 3: 232-236. DOI: 10.1016/0368-2048(74)80015-0  0.397
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