Sang-Jun Cho, Ph.D. - Publications
Affiliations: | 2002 | The University of Nebraska - Lincoln, Lincoln, NE |
Area:
Electronics and Electrical EngineeringYear | Citation | Score | |||
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2006 | Fan Q, Chevtchenko S, Ni X, Cho S, Yun F, Morkoç H. Reactive ion etch damage on GaN and its recovery Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 24: 1197. DOI: 10.1116/1.2192542 | 0.32 | |||
2005 | Lee H, Kang YS, Cho S, Xiao B, Morkoç H, Kang TD, Lee GS, Li J, Wei S, Snyder PG, Evans JT. Dielectric functions and electronic band structure of lead zirconate titanate thin films Journal of Applied Physics. 98: 094108. DOI: 10.1063/1.2128043 | 0.346 | |||
2005 | Lee H, Kang YS, Cho S, Xiao B, Morkoç H, Kang TD. Visible-ultraviolet spectroscopic ellipsometry of lead zirconate titanate thin films Applied Physics Letters. 86: 262902. DOI: 10.1063/1.1968432 | 0.328 | |||
2004 | Ozgur U, Liu C, Cho S, Morkoç H, Foreman J, Everitt HO. Ultrafast carrier relaxation in bulk and epitaxial ZnO Frontiers in Optics. DOI: 10.1364/Fio.2004.Jwa15 | 0.361 | |||
2004 | Cho S, Doğan S, Sabuktagin S, Reshchikov MA, Johnstone DK, Morkoç H. Surface band bending in as-grown and plasma-treated n-type GaN films using surface potential electric force microscopy Applied Physics Letters. 84: 3070-3072. DOI: 10.1063/1.1703843 | 0.317 | |||
1998 | Cho S, Snyder PG. In Situ Control of Wet Etching Using Spectroscopic Ellipsometry Mrs Proceedings. 535: 201. DOI: 10.1557/Proc-535-201 | 0.421 | |||
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