| Year |
Citation |
Score |
| 2019 |
Franke JE, Zhang L, Niemczyk TM, Haaland DM, Linn JH. Quantitative Analysis of Infrared Reflection Spectra from Phosphosilicate Glass Films Journal of the Electrochemical Society. 140: 1425-1429. DOI: 10.1149/1.2221572 |
0.701 |
|
| 2019 |
Stallard BR, Espinoza LH, Rowe RK, Garcia MJ, Niemczyk TM. Trace Water Vapor Detection in Nitrogen and Corrosive Gases by FTIR Spectroscopy Journal of the Electrochemical Society. 142: 2777-2782. DOI: 10.1149/1.2050091 |
0.344 |
|
| 2005 |
Zhang A, Zeng W, Niemczyk TM, Keenan MR, Haaland DM. Multivariate analysis of infrared spectra for monitoring and understanding the kinetics and mechanisms of adsorption processes. Applied Spectroscopy. 59: 47-55. PMID 15720738 DOI: 10.1366/0003702052940495 |
0.729 |
|
| 2005 |
Dijiba YK, Zhang A, Niemczyk TM. Determinations of ephedrine in mixtures of ephedrine and pseudoephedrine using diffuse reflectance infrared spectroscopy. International Journal of Pharmaceutics. 289: 39-49. PMID 15652197 DOI: 10.1016/J.Ijpharm.2004.09.027 |
0.729 |
|
| 2005 |
Dijiba YK, Niemczyk TM. Determination of Ephedrine Hydrochloride in Mixtures of Ephedrine Hydrochloride and Pseudoephedrine Hydrochloride Using near Infrared Spectroscopy Journal of Near Infrared Spectroscopy. 13: 155-160. DOI: 10.1255/Jnirs.468 |
0.75 |
|
| 2002 |
Haibach FG, Sanchez A, Floro JA, Niemczyk TM. Extended Spectral Range Surface-Modified Sol-Gel Coated Infrared Waveguide Sensors Applied Spectroscopy. 56: 398-400. DOI: 10.1366/0003702021954782 |
0.712 |
|
| 2001 |
Niemczyk TM, Zhang S, Haaland DM. Monitoring Dielectric Thin-Film Production on Product Wafers Using Infrared Emission Spectroscopy Applied Spectroscopy. 55: 1053-1059. DOI: 10.1366/0003702011952956 |
0.676 |
|
| 1999 |
Niemczyk TM, Zhang S, Franke JE, Haaland DM. Quantitative Determination of Borophosphosilicate Glass Thin-Film Properties Using Infrared Emission Spectroscopy Applied Spectroscopy. 53: 822-828. DOI: 10.1366/0003702991947397 |
0.697 |
|
| 1999 |
Haaland DM, Han L, Niemczyk TM. Use of CLS to Understand PLS IR Calibration for Trace Detection of Organic Molecules in Water Applied Spectroscopy. 53: 390-395. DOI: 10.1366/0003702991946848 |
0.665 |
|
| 1999 |
Han L, Niemczyk TM, Haaland DM, Lopez GP. Enhancing IR Detection Limits for Trace Polar Organics in Aqueous Solutions with Surface-Modified Sol-Gel-Coated ATR Sensors Applied Spectroscopy. 53: 381-389. DOI: 10.1366/0003702991946839 |
0.661 |
|
| 1999 |
Alam MK, Rohrscheib MR, Franke JE, Niemczyk TM, Maynard JD, Robinson MR. Measurement of pH in Whole Blood by Near-Infrared Spectroscopy Applied Spectroscopy. 53: 316-324. DOI: 10.1366/0003702991946523 |
0.326 |
|
| 1998 |
Niemczyk TM, Delgado-Lopez MM, Allen FS. Quantitative determination of bucindolol concentration in intact gel capsules using Raman spectroscopy. Analytical Chemistry. 70: 2762-5. PMID 21644792 DOI: 10.1021/Ac971252U |
0.392 |
|
| 1998 |
Niemczyk TM, Delgado-Lopez M, Allen FS, Clay JT, Arneberg DL. Quantitative Assay of Bucindolol in Gel Capsules Using Infrared and Raman Spectroscopy Applied Spectroscopy. 52: 513-518. DOI: 10.1366/0003702981944049 |
0.385 |
|
| 1998 |
Alam MK, Franke JE, Niemczyk TM, Maynard JD, Rohrscheib MR, Robinson MR, Eaton RP. Characterization of pH Variation in Lysed Blood by Near-Infrared Spectroscopy Applied Spectroscopy. 52: 393-399. DOI: 10.1366/0003702981943572 |
0.32 |
|
| 1998 |
Espinoza LH, Niemczyk TM, Stallard BR. Generation of Synthetic Background Spectra by Filtering the Sample Interferogram in FT-IR Applied Spectroscopy. 52: 375-379. DOI: 10.1366/0003702981943554 |
0.366 |
|
| 1998 |
Han L, Niemczyk TM, Lu Y, Lopez GP. Chemical Sensors Based on Surface-Modified Sol-Gel-Coated Infrared Waveguides Applied Spectroscopy. 52: 119-122. DOI: 10.1366/0003702981942429 |
0.44 |
|
| 1998 |
Niemczyk TM, Zhang L, Haaland DM, Radigan KJ. Quantitative determination of dielectric thin-film properties on product wafers using infrared reflection-absorption spectroscopy Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 16: 3490-3494. DOI: 10.1116/1.581508 |
0.692 |
|
| 1997 |
Zhang L, Franke JE, Niemczyk TM, Haaland DM. Optimized External IR Reflection Spectroscopy for Quantitative Determination of Borophosphosilicate Glass Parameters Applied Spectroscopy. 51: 259-264. DOI: 10.1366/0003702971940161 |
0.683 |
|
| 1996 |
Lu Y, Han L, Brinker C, Niemczyk TM, Lopez GP. Chemical sensors based on hydrophobic porous sol-gel films and ATR-FTIR spectroscopy Sensors and Actuators B: Chemical. 36: 517-521. DOI: 10.1016/S0925-4005(97)80122-0 |
0.453 |
|
| 1995 |
Franke JE, Haaland DM, Radigan KJ, Zhang L, Niemczyk TM. Quantitative analysis of borophosphosilicate glass films on silicon using infrared external reflection—absorption spectroscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 13: 1959-1966. DOI: 10.1116/1.579636 |
0.707 |
|
| 1994 |
Niemczyk TM, Franke JE, Zhang S, Haaland DM. Infrared Sensor For CVD Deposition Of Dielectric Films Mrs Proceedings. 341. DOI: 10.1557/Proc-341-119 |
0.692 |
|
| 1994 |
Naqvi SSH, Franke JE, Haaland DM, Gottscho RA, Kornblit A, Niemczyk TM, Krukar RH, McNeil JR. Etch depth estimation of large-period silicon gratings with multivariate calibration of rigorously simulated diffraction profiles Journal of the Optical Society of America A. 11: 2485. DOI: 10.1364/Josaa.11.002485 |
0.623 |
|
| 1994 |
Niemczyk TM, Wangmaneerat B, Haaland DM. Precise property determinations of arsenosilicate glass thin films using infrared spectroscopy Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 12: 835-838. DOI: 10.1116/1.578832 |
0.685 |
|
| 1994 |
Franke JE, Niemczyk TM, Haaland DM. Infrared spectroscopic techniques for quantitative characterization of dielectric thin films on silicon wafers Spectrochimica Acta Part a: Molecular Spectroscopy. 50: 1687-1723. DOI: 10.1016/0584-8539(94)80177-0 |
0.69 |
|
| 1993 |
Niemczyk TM, Franke JE, Zhang L, Haaland DM, Radigan KJ. Determination of BPSG Thin-Film Properties using IR Reflection Spectroscopy of Product Wafers Mrs Proceedings. 324. DOI: 10.1557/Proc-324-93 |
0.688 |
|
| 1992 |
Wangmaneerat B, Niemczyk TM, Haaland DM. Determination of Temperature and Composition of Phosphosilicate Glass Thin Films from Infrared Emission Spectral Data Applied Spectroscopy. 46: 1447-1453. DOI: 10.1366/000370292789619133 |
0.693 |
|
| 1992 |
McGuire JA, Wangmaneerat B, Niemczyk TM, Haaland DM. Modifications to a Commercial Infrared Emission Apparatus to Permit Quantitative Applications Applied Spectroscopy. 46: 178-180. DOI: 10.1366/0003702924444263 |
0.642 |
|
| 1992 |
Wangmaneerat B, McGuire JA, Niemczyk TM, Haaland DM, Linn JH. Quantitative Infrared Emission Spectroscopy of Phosphosilicate Glass on Silicon Wafers Using Multivariate Calibration Applied Spectroscopy. 46: 340-344. DOI: 10.1366/0003702924125546 |
0.703 |
|
| 1991 |
Adhihetty IS, McGuire JA, Wangmaneerat B, Niemczyk TM, Haaland DM. Achieving transferable multivariate spectral calibration models: demonstration with infrared spectra of thin-film dielectrics on silicon Analytical Chemistry. 63: 2329-2338. DOI: 10.1021/Ac00020A024 |
0.679 |
|
| 1987 |
Niemczyk TM, Espinosa DC. Evaluation of a Glass Frit Nebulizer for Use in Atomic Absorption Spectrophotometry Applied Spectroscopy. 41: 26-31. DOI: 10.1366/0003702874867891 |
0.309 |
|
| 1985 |
Faires LM, Palmer BA, Engleman R, Niemczyk TM. ICP argon emission in the near infrared 1–2μm by high resolution Fourier transform spectrometry Spectrochimica Acta Part B: Atomic Spectroscopy. 40: 545-551. DOI: 10.1016/0584-8547(85)80104-X |
0.361 |
|
| 1983 |
Niemczyk TM, Na HC. Metastable Transfer Emission Spectroscopy Applied Spectroscopy Reviews. 19: 363-429. DOI: 10.1080/05704928308081495 |
0.326 |
|
| 1978 |
Niemczyk TM, Ettinger DG. A Computer-Controlled Photon Counting Spectrometer for Rapidly Scanning Low Light Level Spectra Applied Spectroscopy. 32: 450-453. DOI: 10.1366/000370278774330955 |
0.32 |
|
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