Year |
Citation |
Score |
2008 |
Yu Z, Hahn MA, Maccagnano-Zacher SE, Calcines J, Krauss TD, Alldredge ES, Silcox J. Small-angle rotation in individual colloidal CdSe quantum rods. Acs Nano. 2: 1179-88. PMID 19206335 DOI: 10.1021/Nn700323V |
0.609 |
|
2008 |
Yu Z, Muller DA, Silcox J. Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces. Ultramicroscopy. 108: 494-501. PMID 17920197 DOI: 10.1016/J.Ultramic.2007.08.007 |
0.665 |
|
2005 |
Yu Z, Guo L, Du H, Krauss T, Silcox J. Shell distribution on colloidal CdSe/ZnS quantum dots. Nano Letters. 5: 565-70. PMID 15826088 DOI: 10.1021/Nl048245N |
0.599 |
|
2005 |
Yu Z, Hahn MA, Calcines J, Krauss TD, Silcox J. Study of the internal structure of individual CdSe quantum rods using electron nanodiffraction Applied Physics Letters. 86: 013101-1-013101-3. DOI: 10.1063/1.1843278 |
0.592 |
|
2005 |
Yu Z, Quo L, Du H, Krauss T, Silcox J. Shell distribution on colloidal CdSe/ZnS quantum dots Nano Letters. 5: 565-570. DOI: 10.1021/nl048245n |
0.523 |
|
2004 |
Krishnan R, Hahn MA, Yu Z, Silcox J, Fauchet PM, Krauss TD. Polarization surface-charge density of single semiconductor quantum rods. Physical Review Letters. 92: 216803. PMID 15245305 DOI: 10.1103/Physrevlett.92.216803 |
0.537 |
|
2004 |
Yu Z, Guo L, Du H, Krauss T, Silcox J. Characterization of shell material on colloidal CdSe/ZnS quantum dots Materials Research Society Symposium Proceedings. 818: 177-182. DOI: 10.1557/Proc-818-M6.8.1 |
0.558 |
|
2004 |
Yu Z, Muller DA, Silcox J. Study of strain fields at a-Si/c-Si interface Journal of Applied Physics. 95: 3362-3371. DOI: 10.1063/1.1649463 |
0.639 |
|
2004 |
Mkhoyan KA, Silcox J, Yu Z, Schaff WJ, Eastman LF. Formation of a quasi-two-dimensional electron gas in GaN/AlxGa1-xN heterostructures with diffuse interfaces Journal of Applied Physics. 95: 1843-1848. DOI: 10.1063/1.1641148 |
0.642 |
|
2004 |
Yu Z, Silcox J. Channeling of Sub–angstrom Probes Along Isolated Atomic Columns Microscopy and Microanalysis. 10: 570-571. DOI: 10.1017/S143192760488485X |
0.494 |
|
2003 |
Yu Z, Batson PE, Silcox J. Artifacts in aberration-corrected ADF-STEM imaging. Ultramicroscopy. 96: 275-84. PMID 12871794 DOI: 10.1016/S0304-3991(03)00093-7 |
0.687 |
|
2003 |
Yu Z, Muller DA, Silcox J. Relative contrast in a-Si and c-Si in ADF-STEM imaging Microscopy and Microanalysis. 9: 848-849. DOI: 10.1017/S1431927603444243 |
0.629 |
|
2003 |
Yu Z, Hahn M, Krauss T, Silcox J. STEM observations of twisting in colloidal CdSe quantum rods Microscopy and Microanalysis. 9: 362-363. DOI: 10.1017/S1431927603441810 |
0.59 |
|
2002 |
Yu Z, Silcox J. Observation of Non-uniformities in Calcium Aluminosilicate Glass using EELS Microscopy and Microanalysis. 8: 604-605. DOI: 10.1017/S1431927602105964 |
0.481 |
|
2002 |
Yu Z, Batson PE, Silcox J. Effects of Detector Black Level in ADF-STEM Imaging Microscopy and Microanalysis. 8: 472-473. DOI: 10.1017/S1431927602105307 |
0.386 |
|
2001 |
Yu Z, Muller DA, Baumann F, Silcox J. Contrast Effect of Strain Fields in ADF-STEM Imaging Microscopy and Microanalysis. 7: 186-187. DOI: 10.1017/S1431927600027008 |
0.496 |
|
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