| Year |
Citation |
Score |
| 2019 |
Bogaerts A, Gijbels R. Mathematical description of a direct current glow discharge in argon. Analytical and Bioanalytical Chemistry. 355: 853-7. PMID 15045278 DOI: 10.1007/S0021663550853 |
0.349 |
|
| 2010 |
Vaeck Lv, Claereboudt J, Veldeman E, Vermeulen M, Gijbels R. Structural Analysis of Organic Compounds by Laser Microprobe Mass Spectrometry (LAMMA) Bulletin Des SociéTéS Chimiques Belges. 95: 351-372. DOI: 10.1002/Bscb.19860950510 |
0.344 |
|
| 2010 |
Nelen A, Tavernier S, Saelens R, Gijbels R. Secondary Ion Emission by Anionic Surfactants Bulletin Des SociéTéS Chimiques Belges. 90: 325-330. DOI: 10.1002/Bscb.19810900408 |
0.349 |
|
| 2010 |
Puymbroeck Jv, Gijbels R. The Determination of the Rare Earth Elements in Rocks by Spark Source Mass Spectrometry Bulletin Des SociéTéS Chimiques Belges. 87: 803-813. DOI: 10.1002/Bscb.19780871101 |
0.307 |
|
| 2010 |
Hoye Ev, Adams F, Gijbels R. Critical Evaluation of an Automatic Photoplate Processing System for Spark Source Mass Spectra Bulletin Des SociéTéS Chimiques Belges. 84: 595-615. DOI: 10.1002/Bscb.19750840608 |
0.311 |
|
| 2007 |
Bogaerts A, Temelkov KA, Vuchkov NK, Gijbels R. Calculation of rate constants for asymmetric charge transfer, and their effect on relative sensitivity factors in glow discharge mass spectrometry Spectrochimica Acta - Part B Atomic Spectroscopy. 62: 325-336. DOI: 10.1016/J.Sab.2007.03.010 |
0.345 |
|
| 2006 |
Adriaensen L, Vangaever F, Lenaerts J, Gijbels R. S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings Applied Surface Science. 252: 6628-6631. DOI: 10.1016/J.Apsusc.2006.02.275 |
0.347 |
|
| 2006 |
De Mondt R, Adriaensen L, Vangaever F, Lenaerts J, Van Vaeck L, Gijbels R. Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) Applied Surface Science. 252: 6652-6655. DOI: 10.1016/J.Apsusc.2006.02.110 |
0.301 |
|
| 2005 |
Kolev I, Bogaerts A, Gijbels R. Influence of electron recapture by the cathode upon the discharge characteristics in dc planar magnetrons. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 72: 056402. PMID 16383761 DOI: 10.1103/Physreve.72.056402 |
0.316 |
|
| 2005 |
Adriaensen L, Vangaever F, Lenaerts J, Gijbels R. Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques. Journal of Mass Spectrometry : Jms. 40: 615-27. PMID 15712231 DOI: 10.1002/Jms.832 |
0.365 |
|
| 2005 |
Cenian A, Chernukho A, Bogaerts A, Gijbels R, Leys C. Particle-in-cell Monte Carlo modeling of Langmuir probes in an Ar plasma Journal of Applied Physics. 97. DOI: 10.1063/1.1938275 |
0.335 |
|
| 2005 |
Baguer N, Bogaerts A, Donko Z, Gijbels R, Sadeghi N. Study of the Ar metastable atom population in a hollow cathode discharge by means of a hybrid model and spectrometric measurements Journal of Applied Physics. 97. DOI: 10.1063/1.1929857 |
0.364 |
|
| 2005 |
Ignatova VA, Möller W, Conard T, Vandervorst W, Gijbels R. Interpretation of TOF-SIMS∈depth∈profiles∈from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation Applied Physics a: Materials Science and Processing. 81: 71-77. DOI: 10.1007/S00339-005-3239-8 |
0.37 |
|
| 2005 |
Adriaensen L, Vangaever F, Lenaerts J, Gijbels R. Matrix-enhanced secondary ion mass spectrometry: The influence of MALDI matrices on molecular ion yields of thin organic films Rapid Communications in Mass Spectrometry. 19: 1017-1024. DOI: 10.1002/Rcm.1881 |
0.373 |
|
| 2004 |
De Bleecker K, Bogaerts A, Gijbels R, Goedheer W. Numerical investigation of particle formation mechanisms in silane discharges. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 69: 056409. PMID 15244953 DOI: 10.1103/Physreve.69.056409 |
0.35 |
|
| 2004 |
Georgieva V, Bogaerts A, Gijbels R. Numerical investigation of ion-energy-distribution functions in single and dual frequency capacitively coupled plasma reactors. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 69: 026406. PMID 14995565 DOI: 10.1103/Physreve.69.026406 |
0.366 |
|
| 2004 |
Lenaerts J, Van Vaeck L, Gijbels R, Van Luppen J. Comparison of mono- and polyatomic primary ions for the characterization of organic dye overlayers with static secondary ion mass spectrometry. Rapid Communications in Mass Spectrometry : Rcm. 18: 257-64. PMID 14755609 DOI: 10.1002/Rcm.1320 |
0.365 |
|
| 2004 |
Depla D, Chen ZY, Bogaerts A, Ignatova V, De Gryse R, Gijbels R. Modeling of the target surface modification by reactive ion implantation during magnetron sputtering Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 22: 1524-1529. DOI: 10.1116/1.1705641 |
0.318 |
|
| 2004 |
De Bleecker K, Bogaerts A, Goedheer W, Gijbels R. Investigation of growth mechanisms of clusters in a silane discharge with the use of a fluid model Ieee Transactions On Plasma Science. 32: 691-698. DOI: 10.1109/Tps.2004.826095 |
0.358 |
|
| 2004 |
Bogaerts A, Gijbels R. Calculation of cathode heating in analytical glow discharges Journal of Analytical Atomic Spectrometry. 19: 1206-1212. DOI: 10.1039/B400483C |
0.337 |
|
| 2004 |
Bogaerts A, Gijbels R, Gamez G, Hieftje GM. Fundamental studies on a planar-cathode direct current glow discharge. Part II: Numerical modeling and comparison with laser scattering experiments Spectrochimica Acta - Part B Atomic Spectroscopy. 59: 449-460. DOI: 10.1016/J.Sab.2003.12.001 |
0.341 |
|
| 2004 |
Ignatova VA, Conard T, Möller W, Vandervorst W, Gijbels R. Depth profiling of ZrO2/SiO2/Si stacks - A TOF-SIMS and computer simulation study Applied Surface Science. 231: 603-608. DOI: 10.1016/J.Apsusc.2004.03.121 |
0.322 |
|
| 2004 |
Adriaensen L, Vangaever F, Gijbels R. A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques Applied Surface Science. 231: 348-352. DOI: 10.1016/J.Apsusc.2004.03.091 |
0.374 |
|
| 2004 |
Adriaensen L, Vangaever F, Gijbels R. Organic SIMS: The influence of time on the ion yield enhancement by silver and gold deposition Applied Surface Science. 231: 256-260. DOI: 10.1016/J.Apsusc.2004.03.031 |
0.32 |
|
| 2003 |
Lenaerts J, Van Vaeck L, Gijbels R. Secondary ion formation of low molecular weight organic dyes in time-of-flight static secondary ion mass spectrometry. Rapid Communications in Mass Spectrometry : Rcm. 17: 2115-24. PMID 12955742 DOI: 10.1002/Rcm.1160 |
0.361 |
|
| 2003 |
Bogaerts A, Gijbels R, Grozeva M, Sabotinov N. Investigation of Laser Output Power Saturation in the He–Cu+ IR Hollow Cathode Discharge Laser by Experiments and Numerical Modeling Physica Scripta. 105: 90-97. DOI: 10.1238/Physica.Topical.105A00090 |
0.34 |
|
| 2003 |
Herrebout D, Bogaerts A, Gijbels R, Goedheer WJ, Vanhulsel A. A one-dimensional fluid model for an acetylene RF discharge: A study of the plasma chemistry Ieee Transactions On Plasma Science. 31: 659-664. DOI: 10.1109/Tps.2003.815249 |
0.317 |
|
| 2003 |
De Bleecker K, Herrebout D, Bogaerts A, Gijbels R, Descamps P. One-dimensional modelling of a capacitively coupled rf plasma in silane/helium, including small concentrations of O2 and N2 Journal of Physics D: Applied Physics. 36: 1826-1833. DOI: 10.1088/0022-3727/36/15/313 |
0.367 |
|
| 2003 |
Georgieva V, Bogaerts A, Gijbels R. Numerical study of Ar/CF4/N2 discharges in single- and dual-frequency capacitively coupled plasma reactors Journal of Applied Physics. 94: 3748-3756. DOI: 10.1063/1.1603348 |
0.313 |
|
| 2003 |
Baguer N, Bogaerts A, Gijbels R. Role of the fast Ar atoms, Ar+ ions, and metastable Ar atoms in a hollow cathode glow discharge: Study by a hybrid model Journal of Applied Physics. 94: 2212-2222. DOI: 10.1063/1.1594276 |
0.345 |
|
| 2003 |
Georgieva V, Bogaerts A, Gijbels R. Particle-in-cell/Monte Carlo simulation of a capacitively coupled radio frequency Ar/CF4 discharge: Effect of gas composition Journal of Applied Physics. 93: 2369-2379. DOI: 10.1063/1.1542920 |
0.355 |
|
| 2003 |
Baguer N, Bogaerts A, Gijbels R. Hollow cathode glow discharge in He: Monte Carlo-fluid model combined with a transport model for the metastable atoms Journal of Applied Physics. 93: 47-55. DOI: 10.1063/1.1518784 |
0.353 |
|
| 2003 |
Bogaerts A, Gijbels R, Jackson GP. Modeling of a millisecond pulsed glow discharge: Investigation of the afterpeak Journal of Analytical Atomic Spectrometry. 18: 533-548. DOI: 10.1039/B212606K |
0.37 |
|
| 2003 |
Ignatova V, Van Vaeck L, Gijbels R, Adams F. Molecular speciation of inorganic mixtures by Fourier transform laser microprobe mass spectrometry International Journal of Mass Spectrometry. 225: 213-224. DOI: 10.1016/S1387-3806(02)01116-8 |
0.349 |
|
| 2003 |
Lenaerts J, Gijbels R, Van Vaeck L, Verlinden G, Geuens I. Imaging TOF-SIMS for the surface analysis of silver halide microcrystals Applied Surface Science. 203: 614-619. DOI: 10.1016/S0169-4332(02)00777-8 |
0.341 |
|
| 2003 |
Neyts E, Yan M, Bogaerts A, Gijbels R. PIC-MC simulation of an RF capacitively coupled Ar/H2 discharge Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 202: 300-304. DOI: 10.1016/S0168-583X(02)01873-6 |
0.331 |
|
| 2003 |
Bogaerts A, Chen Z, Gijbels R, Vertes A. Laser ablation for analytical sampling: What can we learn from modeling? Spectrochimica Acta - Part B Atomic Spectroscopy. 58: 1867-1893. DOI: 10.1016/J.Sab.2003.08.004 |
0.337 |
|
| 2003 |
Bogaerts A, Chen Z, Gijbels R. Glow discharge modelling: From basic understanding towards applications Surface and Interface Analysis. 35: 593-603. DOI: 10.1002/Sia.1578 |
0.339 |
|
| 2002 |
Bogaerts A, Gijbels R. Effect of small amounts of hydrogen added to argon glow discharges: hybrid Monte Carlo-fluid model. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 65: 056402. PMID 12059710 DOI: 10.1103/Physreve.65.056402 |
0.337 |
|
| 2002 |
Yan M, Bogaerts A, Gijbels R, Goedheer WJ. Local and fast relaxation phenomena after laser-induced photodetachment in a strongly electronegative rf discharge. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 65: 016408. PMID 11800791 DOI: 10.1103/Physreve.65.016408 |
0.366 |
|
| 2002 |
Yan M, Bogaerts A, Gijbels R. Evolution of charged particle densities after laser-induced photodetachment in a strongly electronegative RF discharge Ieee Transactions On Plasma Science. 30: 132-133. DOI: 10.1109/Tps.2002.1003959 |
0.317 |
|
| 2002 |
Bogaerts A, Gijbels R. The ion- and atom-induced secondary electron emission yield: Numerical study for the effect of clean and dirty cathode surfaces Plasma Sources Science and Technology. 11: 27-36. DOI: 10.1088/0963-0252/11/1/303 |
0.386 |
|
| 2002 |
Bogaerts A, Gijbels R. Hybrid modeling network for a helium-argon-copper hollow cathode discharge used for laser applications Journal of Applied Physics. 92: 6408-6422. DOI: 10.1063/1.1517751 |
0.321 |
|
| 2002 |
Herrebout D, Bogaerts A, Yan M, Gijbels R, Goedheer W, Vanhulsel A. Modeling of a capacitively coupled radio-frequency methane plasma: Comparison between a one-dimensional and a two-dimensional fluid model Journal of Applied Physics. 92: 2290-2295. DOI: 10.1063/1.1500789 |
0.336 |
|
| 2002 |
Bogaerts A, Okhrimovskyy A, Gijbels R. Calculation of the gas flow and its effect on the plasma characteristics for a modified Grimm-type glow discharge cell Journal of Analytical Atomic Spectrometry. 17: 1076-1082. DOI: 10.1039/B200746K |
0.322 |
|
| 2002 |
Bogaerts A, Gijbels R. Hybrid Monte Carlo - Fluid modeling network for an argon/hydrogen direct current glow discharge Spectrochimica Acta - Part B Atomic Spectroscopy. 57: 1071-1099. DOI: 10.1016/S0584-8547(02)00047-2 |
0.344 |
|
| 2002 |
Baguer N, Bogaerts A, Gijbels R. Hybrid model for a cylindrical hollow cathode glow discharge and comparison with experiments Spectrochimica Acta - Part B Atomic Spectroscopy. 57: 311-326. DOI: 10.1016/S0584-8547(01)00385-8 |
0.345 |
|
| 2002 |
Bogaerts A, Wilken L, Hoffmann V, Gijbels R, Wetzig K. Comparison of modeling calculations with experimental results for rf glow discharge optical emission spectrometry Spectrochimica Acta - Part B Atomic Spectroscopy. 57: 109-119. DOI: 10.1016/S0584-8547(01)00357-3 |
0.314 |
|
| 2002 |
Ignatova VA, Van Vaeck L, Gijbels R, Adams F. Capabilities and limitations of Fourier transform laser microprobe mass spectrometry for molecular analysis of solids User Modeling and User-Adapted Interaction. 69: 307-313. DOI: 10.1016/S0042-207X(02)00350-0 |
0.351 |
|
| 2002 |
Ignatova VA, Lebedev OI, Wätjen U, Van Vaeck L, Van Landuyt J, Gijbels R, Adams F. Observation of Sb 2 O 3 Nanocrystals in SiO 2 after Sb Ion Implantation Microchimica Acta. 139: 77-81. DOI: 10.1007/S006040200043 |
0.32 |
|
| 2001 |
Lenaerts J, Verlinden G, Ignatova VA, Van Vaeck L, Gijbels R, Geuens I. Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS). Fresenius' Journal of Analytical Chemistry. 370: 654-62. PMID 11497001 DOI: 10.1007/S002160100880 |
0.387 |
|
| 2001 |
Yan M, Bogaerts A, Gijbels R, Goedheer WJ. Kinetic modeling of relaxation phenomena after photodetachment in a rf electronegative SiH4 discharge. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 63: 026405. PMID 11308583 DOI: 10.1103/Physreve.63.026405 |
0.398 |
|
| 2001 |
Herrebout D, Bogaerts A, Yan M, Gijbels R, Goedheer W, Dekempeneer E. One-dimensional fluid model for an rf methane plasma of interest in deposition of diamond-like carbon layers Journal of Applied Physics. 90: 570-579. DOI: 10.1063/1.1378059 |
0.341 |
|
| 2001 |
De Witte H, Vandervorst W, Gijbels R. Modeling of bombardment induced oxidation of silicon Journal of Applied Physics. 89: 3001-3011. DOI: 10.1063/1.1344581 |
0.351 |
|
| 2001 |
Bogaerts A, Gijbels R, Goedheer W. Improved hybrid Monte Carlo-fluid model for the electrical characteristics in an analytical radio-frequency glow discharge in argon Journal of Analytical Atomic Spectrometry. 16: 750-755. DOI: 10.1039/B103768B |
0.392 |
|
| 2001 |
Bogaerts A, Gijbels R. Modeling of a microsecond pulsed glow discharge: Behavior of the argon excited levels and of the sputtered copper atoms and ions Journal of Analytical Atomic Spectrometry. 16: 239-249. DOI: 10.1039/B009289O |
0.382 |
|
| 2001 |
Lenaerts J, Verlinden G, van Vaeck L, Gijbels R, Geuens I, Callant P. Exchange of fluorinated cyanine dyes between different types of silver halide microcrystals studied by imaging time-of-flight secondary ion mass spectrometry Langmuir. 17: 7332-7338. DOI: 10.1021/La010862T |
0.342 |
|
| 2001 |
Bogaerts A, Wilken L, Hoffmann V, Gijbels R, Wetzig K. Comparison of modeling calculations with experimental results for direct current glow discharge optical emission spectrometry Spectrochimica Acta - Part B Atomic Spectroscopy. 56: 551-564. DOI: 10.1016/S0584-8547(01)00220-8 |
0.306 |
|
| 2000 |
Kaganovich I, Misina M, Berezhnoi SV, Gijbels R. Electron boltzmann kinetic equation averaged over fast electron bouncing and pitch-angle scattering for fast modeling of electron cyclotron resonance discharge Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics. 61: 1875-89. PMID 11046473 DOI: 10.1103/Physreve.61.1875 |
0.342 |
|
| 2000 |
Vaeck LV, Espen PV, Gijbels R, Baykut G, Laukien FH. A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source European Journal of Mass Spectrometry. 6: 277-287. DOI: 10.1255/Ejms.342 |
0.363 |
|
| 2000 |
De Witte H, De Gendt S, Douglas M, Conard T, Kenis K, Mertens PW, Vandervorst W, Gijbels R. Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on Si wafer surfaces Journal of the Electrochemical Society. 147: 1915-1919. DOI: 10.1149/1.1393457 |
0.329 |
|
| 2000 |
Yan M, Bogaerts A, Goedheer WJ, Gijbels R. Electron energy distribution function in capacitively coupled RF discharges: Difference between electropositive Ar and electronegative SiH4 discharges Plasma Sources Science and Technology. 9: 583-591. DOI: 10.1088/0963-0252/9/4/314 |
0.327 |
|
| 2000 |
Bogaerts A, Gijbels R, Serikov VV. Calculation of gas heating in direct current argon glow discharges Journal of Applied Physics. 87: 8334-8344. DOI: 10.1063/1.373545 |
0.33 |
|
| 2000 |
Yan M, Bogaerts A, Gijbels R, Goedheer WJ. Spatial behavior of energy relaxation of electrons in capacitively coupled discharges: Comparison between Ar and SiH4 Journal of Applied Physics. 87: 3628-3636. DOI: 10.1063/1.372392 |
0.334 |
|
| 2000 |
Bogaerts A, Gijbels R. Hybrid monte carlo-fluid model for a microsecond pulsed glow discharge Journal of Analytical Atomic Spectrometry. 15: 895-905. DOI: 10.1039/B003398G |
0.392 |
|
| 2000 |
Bogaerts A, Gijbels R. Similarities and differences between direct current and radio-frequency glow discharges: A mathematical simulation Journal of Analytical Atomic Spectrometry. 15: 1191-1202. DOI: 10.1039/B000519N |
0.374 |
|
| 2000 |
Bogaerts A, Gijbels R. Effects of adding hydrogen to an argon glow discharge: overview of relevant processes and some qualitative explanations Journal of Analytical Atomic Spectrometry. 15: 441-449. DOI: 10.1039/A909779A |
0.352 |
|
| 2000 |
Bogaerts A, Gijbels R. Behavior of the sputtered copper atoms, ions and excited species in a radio-frequency and direct current glow discharge Spectrochimica Acta, Part B: Atomic Spectroscopy. 55: 279-297. DOI: 10.1016/S0584-8547(00)00142-7 |
0.345 |
|
| 2000 |
Van Ham R, Adriaens A, Van Vaeck L, Gijbels R, Adams F. Molecular information in static SIMS for the speciation of inorganic compounds Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 161: 245-249. DOI: 10.1016/S0168-583X(99)00750-8 |
0.352 |
|
| 2000 |
Witte HD, Conard T, Vandervorst W, Gijbels R. SIMS analysis of oxynitrides: evidence for nitrogen diffusion induced by oxygen flooding Surface and Interface Analysis. 29: 761-765. DOI: 10.1002/1096-9918(200011)29:11<761::Aid-Sia926>3.0.Co;2-F |
0.349 |
|
| 1999 |
Bogaerts A, Gijbels R, Goedheer W. Hybrid Modeling of a Capacitively Coupled Radio Frequency Glow Discharge in Argon: Combined Monte Carlo and Fluid Model Japanese Journal of Applied Physics. 38: 4404-4415. DOI: 10.1143/Jjap.38.4404 |
0.374 |
|
| 1999 |
Bogaerts A, Gijbels R. Monte carlo model for the argon ions and fast argon atoms in a radio-frequency discharge Ieee Transactions On Plasma Science. 27: 1406-1415. DOI: 10.1109/27.799819 |
0.406 |
|
| 1999 |
Berezhnoi SV, Kaganovich ID, Misina M, Bogaerts A, Gijbels R. Semianalytical description of nonlocal secondary electrons in a radio frequency capacitively coupled plasma at intermediate pressures Ieee Transactions On Plasma Science. 27: 1339-1347. DOI: 10.1109/27.799810 |
0.343 |
|
| 1999 |
Bogaerts A, Gijbels R. Role of Ar2+ and Ar2+ ions in a direct current argon glow discharge: A numerical description Journal of Applied Physics. 86: 4124-4133. DOI: 10.1063/1.371337 |
0.373 |
|
| 1999 |
Bogaerts A, Yan M, Gijbels R, Goedheer W. Modeling of ionization of argon in an analytical capacitively coupled radio-frequency glow discharge Journal of Applied Physics. 86: 2990-3001. DOI: 10.1063/1.371159 |
0.372 |
|
| 1999 |
Verlinden G, Gijbels R, Geuens I, De Keyzer R. Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) Journal of Analytical Atomic Spectrometry. 14: 429-434. DOI: 10.1039/A807276K |
0.344 |
|
| 1999 |
Verlinden G, Gijbels R, Geuens I. Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals Journal of the American Society For Mass Spectrometry. 10: 1016-1027. DOI: 10.1016/S1044-0305(99)00064-1 |
0.338 |
|
| 1999 |
Bogaerts A, Gijbels R, Goedheer W. Comparison between a radio-frequency and direct current glow discharge in argon by a hybrid Monte Carlo-fluid model for electrons, argon ions and fast argon atoms Spectrochimica Acta, Part B: Atomic Spectroscopy. 54: 1335-1350. DOI: 10.1016/S0584-8547(99)00080-4 |
0.383 |
|
| 1999 |
Vaeck LV, Adriaens A, Gijbels R. Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation Mass Spectrometry Reviews. 18: 1-47. DOI: 10.1002/(Sici)1098-2787(1999)18:1<1::Aid-Mas1>3.0.Co;2-W |
0.36 |
|
| 1998 |
Poels K, Vaeck LV, Gijbels R. Microprobe speciation analysis of inorganic solids by fourier transform laser mass spectrometry. Analytical Chemistry. 70: 504-512. PMID 21644749 DOI: 10.1021/Ac9709108 |
0.37 |
|
| 1998 |
Bogaerts A, Gijbels R, Vlcek J. Collisional-radiative model for an argon glow discharge Journal of Applied Physics. 84: 121-136. DOI: 10.1063/1.368009 |
0.358 |
|
| 1998 |
Bogaerts A, Gijbels R. Argon and copper optical emission spectra in a Grimm glow discharge source: mathematical simulations and comparison with experiment Journal of Analytical Atomic Spectrometry. 13: 721-726. DOI: 10.1039/A802894J |
0.367 |
|
| 1998 |
Bogaerts A, Gijbels R. Modeling of argon direct current glow discharges and comparison with experiment: how good is the agreement? Journal of Analytical Atomic Spectrometry. 13: 945-953. DOI: 10.1039/A800329G |
0.358 |
|
| 1998 |
Bogaerts A, Gijbels R, Carman RJ. Collisional–radiative model for the sputtered copper atoms and ions in a direct current argon glow discharge Spectrochimica Acta Part B: Atomic Spectroscopy. 53: 1679-1703. DOI: 10.1016/S0584-8547(98)00201-8 |
0.355 |
|
| 1998 |
Bogaerts A, Gijbels R, Vlcek J. Modeling of glow discharge optical emission spectrometry: Calculation of the argon atomic optical emission spectrum Spectrochimica Acta Part B: Atomic Spectroscopy. 53: 1517-1526. DOI: 10.1016/S0584-8547(98)00139-6 |
0.323 |
|
| 1998 |
Bogaerts A, Gijbels R. Comprehensive description of a Grimm-type glow discharge source used for optical emission spectrometry: A mathematical simulation Spectrochimica Acta - Part B Atomic Spectroscopy. 53: 437-462. DOI: 10.1016/S0584-8547(97)00148-1 |
0.363 |
|
| 1998 |
Bogaerts A, Gijbels R. Fundamental aspects and applications of glow discharge spectrometric techniques Spectrochimica Acta Part B: Atomic Spectroscopy. 53: 1-42. DOI: 10.1016/S0584-8547(97)00122-5 |
0.326 |
|
| 1997 |
Van Vaeck L, Poels K, De Nollin S, Hachimi A, Gijbels R. Laser microprobe mass spectrometry: principle and applications in biology and medicine. Cell Biology International. 21: 635-48. PMID 9693833 DOI: 10.1006/Cbir.1997.0198 |
0.365 |
|
| 1997 |
BOGAERTS A, GIJBELS R. Computer Simulation of an Analytical Direct Current Glow Discharge in Argon: Influence of the Cell Dimensions on the Plasma Quantities Journal of Analytical Atomic Spectrometry. 12: 751-759. DOI: 10.1039/A608262I |
0.351 |
|
| 1997 |
Bogaerts A, Gijbels R. Modeling of glow discharge sources with flat and pin cathodes and implications for mass spectrometric analysis Journal of the American Society For Mass Spectrometry. 8: 1021-1029. DOI: 10.1016/S1044-0305(97)00120-7 |
0.4 |
|
| 1997 |
Bogaerts A, Gijbels R. Comparison of argon and neon as discharge gases in a direct-current glow discharge a mathematical simulation Spectrochimica Acta Part B: Atomic Spectroscopy. 52: 553-565. DOI: 10.1016/S0584-8547(96)01658-8 |
0.358 |
|
| 1997 |
Bogaerts A, Gijbels R. Calculation of crater profiles on a flat cathode in a direct current glow discharge Spectrochimica Acta Part B: Atomic Spectroscopy. 52: 765-777. DOI: 10.1016/S0584-8547(96)01623-0 |
0.325 |
|
| 1997 |
Bogaerts A, Guenard RD, Smith BW, Winefordner JD, Harrison WW, Gijbels R. Three-dimensional density profiles of argon metastable atoms in a direct current glow discharge: Experimental study and comparison with calculations Spectrochimica Acta - Part B Atomic Spectroscopy. 52: 219-229. DOI: 10.1016/S0584-8547(96)01578-9 |
0.328 |
|
| 1997 |
Bogaerts A, Wagner E, Smith B, Winefordner J, Pollmann D, Harrison W, Gijbels R. Three-dimensional density profiles of sputtered atoms and ions in a direct current glow discharge: experimental study and comparison with calculations Spectrochimica Acta Part B: Atomic Spectroscopy. 52: 205-218. DOI: 10.1016/S0584-8547(96)01577-7 |
0.359 |
|
| 1997 |
Gijbels R, Bogaerts A. Recent trends in solid mass spectrometry: GDMS and other methods Fresenius' Journal of Analytical Chemistry. 359: 326-330. DOI: 10.1007/S002160050581 |
0.322 |
|
| 1996 |
Bogaerts A, Gijbels R. Role of sputtered Cu atoms and ions in a direct current glow discharge: Combined fluid and Monte Carlo model Journal of Applied Physics. 79: 1279-1286. DOI: 10.1063/1.361023 |
0.361 |
|
| 1996 |
Bogaerts A, Gijbels R. Relative sensitivity factors in glow discharge mass spectrometry: the role of charge transfer ionization Journal of Analytical Atomic Spectrometry. 11: 841. DOI: 10.1039/Ja9961100841 |
0.392 |
|
| 1996 |
Bogaerts A, Gijbels R, Goedheer WJ. Two-Dimensional Model of a Direct Current Glow Discharge: Description of the Electrons, Argon Ions, and Fast Argon Atoms Analytical Chemistry. 68: 2296-2303. DOI: 10.1021/Ac9510651 |
0.427 |
|
| 1996 |
Cleempoel AV, Gijbels R, Claeys M, Van den Heuvel H. Characterization of Ozonated C60 and C70 by High Performance Liquid Chromatography and Low- and High-Energy Collision-induced Dissociation Tandem Mass Spectrometry Rapid Communications in Mass Spectrometry. 10: 1579-1584. DOI: 10.1002/(Sici)1097-0231(199610)10:13<1579::Aid-Rcm666>3.0.Co;2-5 |
0.348 |
|
| 1995 |
Bogaerts A, Gijbels R. Modeling of metastable argon atoms in a direct-current glow discharge Physical Review A. 52: 3743-3751. DOI: 10.1103/Physreva.52.3743 |
0.331 |
|
| 1995 |
Bogaerts A, Gijbels R. The role of fast argon ions and atoms in the ionization of argon in a direct-current glow discharge: A mathematical simulation Journal of Applied Physics. 78: 6427-6431. DOI: 10.1063/1.360526 |
0.4 |
|
| 1995 |
Bogaerts A, Gijbels R, Goedheer WJ. Hybrid Monte Carlo-fluid model of a direct current glow discharge Journal of Applied Physics. 78: 2233-2241. DOI: 10.1063/1.360139 |
0.364 |
|
| 1995 |
Oleshko V, Gijbels R, Jacob W, Lakiere F, Dele AV, Silaev E, Kaplun L. Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis Microscopy Microanalysis Microstructures. 6: 79-88. DOI: 10.1051/Mmm:1995108 |
0.304 |
|
| 1995 |
Held A, Taylor P, Ingelbrecht C, Bièvre Pd, Broekaert JAC, Straaten Mv, Gijbels R. Determination of scandium in high-purity titanium using inductively coupled plasma mass spectrometry and glow discharge mass spectrometry as part of its certification as a reference material Journal of Analytical Atomic Spectrometry. 10: 849-852. DOI: 10.1039/Ja9951000849 |
0.343 |
|
| 1995 |
Bogaerts A, Quentmeier A, Jakubowski N, Gijbels R. Plasma diagnostics of an analytical Grimm-type glow discharge in argon and in neon: Langmuir probe and optical emission spectrometry measurements Spectrochimica Acta Part B: Atomic Spectroscopy. 50: 1337-1349. DOI: 10.1016/0584-8547(95)01356-5 |
0.342 |
|
| 1995 |
van Straaten M, Bogaerts A, Gijbels R. Experimental determination of the energy distribution of ions bombarding the cathode surface in a glow discharge Spectrochimica Acta Part B: Atomic Spectroscopy. 50: 583-605. DOI: 10.1016/0584-8547(94)00158-R |
0.379 |
|
| 1995 |
Bogaerts A, van Straaten M, Gijbels R. Monte Carlo simulation of an analytical glow discharge: motion of electrons, ions and fast neutrals in the cathode dark space Spectrochimica Acta Part B: Atomic Spectroscopy. 50: 179-196. DOI: 10.1016/0584-8547(94)00117-E |
0.386 |
|
| 1994 |
Straaten Mv, Swenters K, Gijbels R, Verlinden J, Adriaenssens E. Analysis of platinum powder by glow discharge mass spectrometry Journal of Analytical Atomic Spectrometry. 9: 1389-1397. DOI: 10.1039/Ja9940901389 |
0.311 |
|
| 1994 |
Martin JML, Taylor PR, Francois JP, Gijbels R. Ab initio study of the spectroscopy, kinetics, and thermochemistry of the BN2 molecule Chemical Physics Letters. 222: 517-523. DOI: 10.1016/0009-2614(94)00378-5 |
0.301 |
|
| 1994 |
Roy WV, Struyf H, Vaeck LV, Gijbels R, Caravatti P. Desorption—ionization of organic compounds studied by Fourier‐transform laser microprobe mass spectometry Rapid Communications in Mass Spectrometry. 8: 40-45. DOI: 10.1002/Rcm.1290080108 |
0.36 |
|
| 1993 |
Claereboudt J, Claeys M, Geise H, Gijbels R, Vertes A. Laser microprobe mass spectrometry of quaternary phosphonium salts: Direct versus matrix-assisted laser desorption. Journal of the American Society For Mass Spectrometry. 4: 798-812. PMID 24227465 DOI: 10.1016/1044-0305(93)80038-Z |
0.377 |
|
| 1993 |
Hellmuth K, Siitari-Kauppi M, Rauhala E, Johanson B, Zilliacus R, Gijbels R, Adriaens A. Reactions of High-Feo Olivine Rock with Groundwater and Redox-Sensitive Elements Studied by Surface-Analytical Methods and Autoradiography Mrs Proceedings. 333. DOI: 10.1557/Proc-333-947 |
0.324 |
|
| 1993 |
Vertes A, Irinyi G, Gijbels R. Hydrodynamic model of matrix-assisted laser desorption mass spectrometry Analytical Chemistry. 65: 2389-2393. DOI: 10.1021/Ac00065A036 |
0.313 |
|
| 1993 |
Slanina Z, Martin JML, François JP, Gijbels R. On the relative stabilities of the linear and triangular forms of B3N Chemical Physics. 178: 77-82. DOI: 10.1016/0301-0104(93)85052-A |
0.315 |
|
| 1993 |
Struyf H, Van Roy W, Van Vaeck L, Van Griecken R, Gijbels R, Caravatti P. Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis Analytica Chimica Acta. 283: 139-151. DOI: 10.1016/0003-2670(93)85216-7 |
0.389 |
|
| 1993 |
Luyten W, Volkov VV, Landuyt JV, Amelinckx S, Férauge C, Gijbels R, Vasilev MG, Shelyakin AA, Lazarev VB. Electron microscopy and mass-spectrometry study of In0.72Ga0.28As0.62P0.38 lasers grown by liquid phase epitaxy Physica Status Solidi (a). 140: 453-462. DOI: 10.1002/Pssa.2211400216 |
0.336 |
|
| 1993 |
Volkov VV, Luyten W, Landuyt JV, Férauge C, Oksenoid KG, Gijbels R, Vasilev MG, Shelyakin AA, Lazarev VB. Electron microscopy and mass-spectrometry study of InGaAsP/InP heterostructures (pin diodes) grown by liquid phase epitaxy Physica Status Solidi (a). 140: 73-85. DOI: 10.1002/Pssa.2211400105 |
0.331 |
|
| 1992 |
Van Straaten M, Gijbels R, Vertes A. Influence of axial and radial diffusion processes on the analytical performance of a glow discharge cell Analytical Chemistry. 64: 1855-1863. DOI: 10.1021/Ac00041A021 |
0.303 |
|
| 1992 |
Martin JML, François JP, Gijbels R. The structure, stability, and infrared spectrum of B2N, B2N+, B2N-, BO, B2O and B2N2 Chemical Physics Letters. 193: 243-250. DOI: 10.1016/0009-2614(92)85662-T |
0.312 |
|
| 1991 |
Balazs L, Gijbels R, Vertes A. Expansion of laser-generated plumes near the plasma ignition threshold Analytical Chemistry. 63: 314-320. DOI: 10.1021/Ac00004A004 |
0.343 |
|
| 1991 |
Van Straaten M, Vertes A, Gijbels R. Sample erosion studies and modeling in a glow discharge ionization cell Spectrochimica Acta Part B: Atomic Spectroscopy. 46: 283-290. DOI: 10.1016/0584-8547(91)80029-3 |
0.374 |
|
| 1991 |
Martin JML, François JP, Gijbels R. Ab initio spectroscopy and thermochemistry of the BN molecule Zeitschrift FüR Physik D Atoms, Molecules and Clusters. 21: 47-55. DOI: 10.1007/Bf01426617 |
0.301 |
|
| 1991 |
Jenett H, Grallath E, Riedel R, Strecker K, Gijbels R, Kennis P. Comparative bulk, surface and depth profile analyses on AlN and SiC-coated B4C powders Fresenius' Journal of Analytical Chemistry. 341: 265-271. DOI: 10.1007/Bf00321561 |
0.311 |
|
| 1990 |
Van Straaten M, Vertes A, Gijbels R. Dynamical behavior of ions in a radio frequency spark ion source Analytical Chemistry. 62: 1825-1827. DOI: 10.1021/Ac00216A018 |
0.351 |
|
| 1990 |
Yang Z, Geise HJ, Mehbod M, Debrue G, Visser JW, Sonneveld EJ, Van't dack L, Gijbels R. Conductivity and electron density of undoped model compounds of poly(phenylene vinylene) Synthetic Metals. 39: 137-151. DOI: 10.1016/0379-6779(90)90179-O |
0.31 |
|
| 1990 |
Van Vaeck L, Bennett J, Lauwers W, Vertes A, Gijbels R. Laser microprobe mass spectrometry: Possibilities and limitations Microchimica Acta. 102: 283-303. DOI: 10.1007/Bf01244770 |
0.332 |
|
| 1990 |
Vaeck LV, Gijbels R. Laser microprobe mass spectrometry: potential and limitations for inorganic and organic micro-analysis Fresenius Journal of Analytical Chemistry. 337: 755-765. DOI: 10.1007/Bf00322249 |
0.352 |
|
| 1990 |
Vertes A, Balazs L, Gijbels R. Matrix-assisted laser desorption of peptides in transmission geometry Rapid Communications in Mass Spectrometry. 4: 263-266. DOI: 10.1002/Rcm.1290040709 |
0.383 |
|
| 1990 |
Vertes A, Gijbels R, Levine RD. Homogeneous bottleneck model of matrix-assisted ultraviolet laser desorption of large molecules Rapid Communications in Mass Spectrometry. 4: 228-233. DOI: 10.1002/Rcm.1290040613 |
0.343 |
|
| 1990 |
Vertes A, Gijbels R, Adams F. Diagnostics and modeling of plasma processes in ion sources Mass Spectrometry Reviews. 9: 71-113. DOI: 10.1002/Mas.1280090104 |
0.398 |
|
| 1989 |
Van Vaeck L, Van Espen P, Adams F, Gijbels R, Lauwers W, Esmans E. On the use of laser microprobe mass spectrometry for the analysis of organic biomolecules. Biomedical & Environmental Mass Spectrometry. 18: 581-91. PMID 2529934 DOI: 10.1002/Bms.1200180813 |
0.341 |
|
| 1989 |
Claereboudt J, De Spiegeleer B, de Bruijn EA, Gijbels R, Claeys M. Structural characterization of cisplatin analogues by fast atom bombardment (FAB) and laser microprobe mass spectrometry (LAMMA). Journal of Pharmaceutical and Biomedical Analysis. 7: 1599-610. PMID 2490549 DOI: 10.1016/0731-7085(89)80171-2 |
0.388 |
|
| 1989 |
Adams F, Gijbels R, Grieken RV, Rose ME. Inorganic mass spectrometry Analytica Chimica Acta. 221: 365. DOI: 10.1016/S0003-2670(00)81978-9 |
0.339 |
|
| 1989 |
Vertes A, Juhasz P, De Wolf M, Gijbels R. Hydrodynamic modelling of laser plasma ionization processes International Journal of Mass Spectrometry and Ion Processes. 94: 63-85. DOI: 10.1016/0168-1176(89)80060-6 |
0.386 |
|
| 1989 |
Swenters K, Verlinden J, Gijbels R. Analysis of tellurium by spark source mass spectrometry Fresenius Journal of Analytical Chemistry. 335: 900-904. DOI: 10.1007/Bf00466378 |
0.328 |
|
| 1989 |
Van Vaeck L, Bennett J, van Espen P, Schweikert E, Gijbels R, Adams F, Lauwers W. Structural characterization of organic molecules by negative ions in laser microprobe mass spectrometry. Part 2—Salts Organic Mass Spectrometry. 24: 797-806. DOI: 10.1002/Oms.1210240913 |
0.37 |
|
| 1988 |
Vaeck LV, Espen PV, Gijbels R, Lauwers W. Structural characterization of drugs and oxygenated metabolites by laser microprobe mass spectrometry (LAMMA). Journal of Mass Spectrometry. 16: 121-129. PMID 3242660 DOI: 10.1002/Bms.1200160121 |
0.356 |
|
| 1988 |
Vaeck LV, Espen PV, Jacob W, Gijbels R, Cautreels W. In-depth limitation of the Lamma 500 for the in situ localization of organic compounds in biological embedded tissue samples. Journal of Mass Spectrometry. 16: 113-119. PMID 3242659 DOI: 10.1002/Bms.1200160120 |
0.352 |
|
| 1988 |
Vertes A, Juhasz P, Balazs L, De Wolf M, Gijbels R. Non-linear optimization of cylindrical electrostatic lenses International Journal of Mass Spectrometry and Ion Processes. 84: 255-269. DOI: 10.1016/0168-1176(88)80103-4 |
0.32 |
|
| 1987 |
Claereboudt J, Van Vaeck L, Baeten W, Geise H, Gijbels R, Claeys M. The use of laser microprobe mass spectrometry for monitoring the Wittig synthesis Analytica Chimica Acta. 195: 343-350. DOI: 10.1016/S0003-2670(00)85677-9 |
0.307 |
|
| 1987 |
Swenters K, Verlinden J, Gijbels R. Applications of spark-source mass spectrometry for localized microanalysis, film analysis and depth analysis Analytica Chimica Acta. 195: 173-179. DOI: 10.1016/S0003-2670(00)85659-7 |
0.329 |
|
| 1986 |
Swenters K, Verlinden J, Bernard P, Gijbels R. Electrode surface modifications and material transport into a high voltage vacuum spark discharge International Journal of Mass Spectrometry and Ion Processes. 71: 85-102. DOI: 10.1016/0168-1176(86)87014-8 |
0.346 |
|
| 1985 |
Van Vaeck L, Claereboudt J, De Waele J, Esmans E, Gijbels R. Approach for structural interpretation of laser microprobe mass spectra of organic compounds Analytical Chemistry. 57: 2944-2951. DOI: 10.1021/Ac00291A044 |
0.304 |
|
| 1984 |
Puymbroeck JV, Verlinden J, Swenters K, Gijbels R. Study of high-voltage breakdown and material consumption in spark-source mass spectrometry and their significance in analytical applications. Talanta. 31: 177-184. PMID 18963563 DOI: 10.1016/0039-9140(84)80046-6 |
0.304 |
|
| 1984 |
Michiels E, Gijbels R. Cluster ion distributions and correlation with fragment valence in laser-induced mass spectra of oxides Analytical Chemistry. 56: 1115-1121. DOI: 10.1021/Ac00271A014 |
0.363 |
|
| 1984 |
Michiels E, Mauney T, Adams F, Gijbels R. Ion kinetic energy measurements on laser-induced plasmas in laser microprobe mass analysis (LAMMA). Part 2. Titanium dioxide International Journal of Mass Spectrometry and Ion Processes. 61: 231-246. DOI: 10.1016/0168-1176(84)85131-9 |
0.369 |
|
| 1984 |
Puymbroeck JV, Gijbels R, Viczián M, Cornides I. Time-resolved measurements in spark source mass spectrometry. II. Detection of the ion current by a fast transient recorder International Journal of Mass Spectrometry and Ion Processes. 56: 269-280. DOI: 10.1016/0168-1176(84)85054-5 |
0.371 |
|
| 1984 |
Vaeck LV, Waele JD, Gijbels R. Analysis of organic quaternary ammonium salts by LAMMA Mikrochimica Acta. 84: 237-257. DOI: 10.1007/Bf01212389 |
0.366 |
|
| 1983 |
Beusen JM, Surkyn P, Gijbels R, Adams F. Quantiative analysis of silicate minerals by secondary ion mass spectrometry and laser microprobe mass analysis—A comparative study Spectrochimica Acta Part B: Atomic Spectroscopy. 38: 843-851. DOI: 10.1016/0584-8547(83)80183-9 |
0.396 |
|
| 1983 |
Michiels E, Gijbels R. Fingerprint spectra in Laser Microprobe Mass Analysis of titanium oxides of different stoichiometry Spectrochimica Acta Part B: Atomic Spectroscopy. 38: 1347-1354. DOI: 10.1016/0584-8547(83)80079-2 |
0.379 |
|
| 1983 |
Weinke HH, Michiels E, Gijbels R. Investigation of meteoritic troilite by laser microprobe mass analysis International Journal of Mass Spectrometry and Ion Physics. 47: 43-46. DOI: 10.1016/0020-7381(83)87132-0 |
0.391 |
|
| 1983 |
Viczián M, Cornides I, Puymbroeck JV, Gijbels R. Time-resolved measurements in spark source mass spectrometry. I. Deflection of the ion beam International Journal of Mass Spectrometry and Ion Physics. 51: 77-92. DOI: 10.1016/0020-7381(83)85030-X |
0.352 |
|
| 1983 |
Michiels E, Gijbels R. Cluster ions in laser induced mass spectra of fluoride salts Mikrochimica Acta. 81: 277-285. DOI: 10.1007/Bf01497619 |
0.354 |
|
| 1982 |
Craen MV, Verlinden J, Gijbels R, Adams F. A comparison between secondary-ion mass-spectrometry and spark-source mass-spectrometry for the quantitative analysis of steel wire. Talanta. 29: 773-778. PMID 18963232 DOI: 10.1016/0039-9140(82)80055-6 |
0.385 |
|
| 1981 |
Beske HE, Gijbels R, Hurrle A, Jochum KP. Part IV. Review and evaluation of spark source mass spectrometry as an analytical method Fresenius Journal of Analytical Chemistry. 309: 329-341. DOI: 10.1007/Bf00488613 |
0.31 |
|
| 1981 |
Puymbroeck JV, Gijbels R. Determination of rare-earth elements in rocks by spark source mass spectrometry and isotope dilution after ion-exchange separation in mixed solvents Fresenius Journal of Analytical Chemistry. 309: 312-315. DOI: 10.1007/Bf00488609 |
0.325 |
|
| 1980 |
Hoye EV, Gijbels R, Adams F. Comparison of sensitivity coefficients for spark-source mass spectrometry determined with photographic and electrical detection Analytica Chimica Acta. 115: 239-248. DOI: 10.1016/S0003-2670(01)93162-9 |
0.35 |
|
| 1979 |
Van Hoye E, Adams F, Gijbels R. Comparison of experimental and calculated relative sensitivity coefficients for spark-source mass-spectrometry of metals. Talanta. 26: 285-9. PMID 18962433 DOI: 10.1016/0039-9140(79)80068-5 |
0.306 |
|
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