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Haolu Xie, Ph.D. - Publications

Affiliations: 
2007 Illinois Institute of Technology, Chicago, IL, United States 
Area:
Electronics and Electrical Engineering
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Li X, Xie H, Zhan R, Chen D. Effect of Double Bond Position on 2-Phenyl-benzofuran Antioxidants: A Comparative Study of Moracin C and Iso-Moracin C. Molecules (Basel, Switzerland). 23. PMID 29587376 DOI: 10.3390/molecules23040754  0.433
2005 Wang AZH, Feng H, Zhan R, Xie H, Chen G, Wu Q, Guan X, Wang Z, Zhang C. A review on RF ESD protection design Ieee Transactions On Electron Devices. 52: 1304-1311. DOI: 10.1109/Ted.2005.850652  0.562
2005 Xie H, Feng H, Zhan R, Wang A, Rodriguez D, Rice D. A new low-parasitic polysilicon SCR ESD protection structure for RF ICs Ieee Electron Device Letters. 26: 121-123. DOI: 10.1109/Led.2004.841860  0.55
2004 Zhan R, Feng H, Wu Q, Xie H, Guan X, Chen G, Wang AZH. ESDInspector: a new layout-level ESD protection circuitry design verification tool using a smart-parametric checking mechanism Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 23: 1421-1428. DOI: 10.1109/Tcad.2004.833613  0.548
2004 Chen G, Feng H, Xie H, Zhan R, Wu Q, Guan X, Wang A, Takasuka K, Tamura S, Wang Z, Zhang C. Characterizing diodes for RF ESD protection Ieee Electron Device Letters. 25: 323-325. DOI: 10.1109/Led.2004.826531  0.55
2003 Zhan R, Feng H, Wu Q, Xie H, Guan X, Chen G, Wang AZH. ESDExtractor: A new technology-independent CAD tool for arbitrary ESD protection device extraction Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 22: 1362-1370. DOI: 10.1109/Tcad.2003.818140  0.53
2003 Feng H, Chen G, Zhan R, Wu Q, Guan X, Xie H, Wang AZH, Gafiteanu R. A mixed-mode ESD protection circuit simulation-design methodology Ieee Journal of Solid-State Circuits. 38: 995-1006. DOI: 10.1109/Jssc.2003.811978  0.557
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