Guirong Pan, Ph.D. - Publications

Affiliations: 
2006 University of Cincinnati, Cincinnati, OH 
Area:
Materials Science Engineering

7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2016 Yang JM, Wang FX, Pan GB. Highly sensitive broadband flexible photodetectors based on a blend film with zinc octaethylporphyrin long nanowires embedded in an insulating polymer. Nanoscale. PMID 26763660 DOI: 10.1039/c5nr08565a  0.429
2007 Pan G, Watkins E, Majewski J, Schaefer DW. Effect of Thickness on the Water-Barrier Properties of Silane Films The Journal of Physical Chemistry C. 111: 15325-15330. DOI: 10.1021/Jp075023F  0.664
2006 Pan G, Schaefer DW, Ilavsky J. Morphology and water barrier properties of organosilane films: the effect of curing temperature. Journal of Colloid and Interface Science. 302: 287-93. PMID 16860812 DOI: 10.1016/J.Jcis.2006.06.031  0.656
2006 Pan G, Schaefer DW, van Ooij WJ, Kent MS, Majewski J, Yim H. Morphology and water resistance of mixed silane films of bis[3-(triethoxysilyl) propyl]tetrasulfide and bis-[trimethoxysilylpropyl]amine Thin Solid Films. 515: 2771-2780. DOI: 10.1016/J.Tsf.2006.05.034  0.66
2006 Pan G, Schaefer DW. Morphology and water-barrier properties of silane films on aluminum and silicon Thin Solid Films. 503: 259-267. DOI: 10.1016/J.Tsf.2005.11.061  0.617
2003 Pan G, Yim H, Kent MS, Majewski J, Schaefer DW. Neutron reflectivity investigation of bis-amino silane films Journal of Adhesion Science and Technology. 17: 2175-2189. DOI: 10.1163/156856103772150779  0.659
2003 Pan G, Mark JE, Schaefer DW. Synthesis and characterization of fillers of controlled structure based on polyhedral oligomeric silsesquioxane cages and their use in reinforcing siloxane elastomers Journal of Polymer Science Part B: Polymer Physics. 41: 3314-3323. DOI: 10.1002/Polb.10695  0.467
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