| Year |
Citation |
Score |
| 2023 |
Şeren MH, Pagan DC, Noyan IC. Representative volume elements of strain/stress fields measured by diffraction techniques. Journal of Applied Crystallography. 56: 1144-1167. PMID 37555214 DOI: 10.1107/S1600576723004351 |
0.346 |
|
| 2020 |
Noyan IC, Bunn JR, Tippett MK, Payzant EA, Clausen B, Brown DW. Experimental determination of precision, resolution, accuracy and trueness of time-of-flight neutron diffraction strain measurements Journal of Applied Crystallography. 53: 494-511. DOI: 10.1107/S1600576720002150 |
0.403 |
|
| 2019 |
Xiong S, Lee S, Noyan IC. Average and local strain fields in nanocrystals Journal of Applied Crystallography. 52: 262-273. DOI: 10.1107/S1600576719000372 |
0.385 |
|
| 2018 |
Lee S, Coratella S, Brügger A, Clausen B, Brown D, Langer K, Fitzpatrick M, Noyan IC. Boundary Effects in the Eigenstrain Method Experimental Mechanics. 58: 799-814. DOI: 10.1007/S11340-018-0378-3 |
0.401 |
|
| 2017 |
Brügger A, Lee SY, Noyan İC, Betti R. Designing and Validating Parallel Wire Suspension Bridge Wire Strands for Neutron Diffraction Stress Mapping Materials Science Forum. 905: 123-130. DOI: 10.4028/Www.Scientific.Net/Msf.905.123 |
0.331 |
|
| 2017 |
Brügger A, Lee S, Mills JAA, Betti R, Noyan I. Partitioning of Clamping Strains in a Nineteen Parallel Wire Strand Experimental Mechanics. 57: 921-937. DOI: 10.1007/S11340-017-0276-0 |
0.394 |
|
| 2016 |
Noyan IC. X-ray scattering from semiconductors and other materials Crystallography Reviews. 22: 142-144. DOI: 10.1080/0889311X.2015.1094467 |
0.367 |
|
| 2016 |
Treger M, Witt C, Cabral C, Murray C, Jordan-Sweet J, Rosenberg R, Eisenbraun E, Noyan IC. Prediction of recrystallization times in electroplated copper thin films Thin Solid Films. 615: 107-115. DOI: 10.1016/J.Tsf.2016.06.056 |
0.366 |
|
| 2016 |
Ramirez-Rico J, Lee SY, Ling JJ, Noyan IC. Stress measurement using area detectors: a theoretical and experimental comparison of different methods in ferritic steel using a portable X-ray apparatus Journal of Materials Science. 51: 5343-5355. DOI: 10.1007/S10853-016-9837-3 |
0.396 |
|
| 2015 |
Dhomkar S, Vaxelaire N, Ji H, Shuvayev V, Tamargo MC, Kuskovsky IL, Noyan IC. Determination of shape anisotropy in embedded low contrast submonolayer quantum dot structures Applied Physics Letters. 107. DOI: 10.1063/1.4938399 |
0.313 |
|
| 2014 |
Lee SY, Skorpenske H, Stoica AD, An K, Wang XL, Noyan IC. Measurement of interface thermal resistance with neutron diffraction Journal of Heat Transfer. 136. DOI: 10.1115/1.4025500 |
0.321 |
|
| 2014 |
Öztürk H, Yan H, Hill JP, Noyan IC. Sampling statistics of diffraction from nanoparticle powder aggregates Journal of Applied Crystallography. 47: 1016-1025. DOI: 10.1107/S1600576714008528 |
0.344 |
|
| 2013 |
Murray CE, Rosenberg R, Witt C, Treger M, Noyan IC. Evolution of strain energy during recrystallization of plated Cu films Journal of Applied Physics. 113. DOI: 10.1109/Tdmr.2016.2547363 |
0.406 |
|
| 2013 |
Treger M, Witt C, Cabral C, Murray C, Jordan-Sweet J, Rosenberg R, Eisenbraun E, Noyan IC. Characterization of room temperature recrystallization kinetics in electroplated copper thin films with concurrent x-ray diffraction and electrical resistivity measurements Journal of Applied Physics. 113. DOI: 10.1063/1.4807899 |
0.378 |
|
| 2013 |
Murray CE, Polvino SM, Noyan IC, Cai Z, Maser J, Holt M. Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements Thin Solid Films. 530: 85-90. DOI: 10.1016/J.Tsf.2012.05.043 |
0.505 |
|
| 2013 |
Mei F, Noyan IC, Brügger A, Betti R, Clausen B, Brown D, Sisneros T. Neutron Diffraction Measurement of Stress Redistribution in Parallel Seven-Wire Strands after Local Fracture Experimental Mechanics. 53: 183-193. DOI: 10.1007/S11340-012-9621-5 |
0.335 |
|
| 2012 |
Manna U, Noyan IC, Zhang Q, Salakhutdinov IF, Dunn KA, Novak SW, Moug R, Tamargo MC, Neumark GF, Kuskovsky IL. Structural properties and spatial ordering in multilayered ZnMgTe/ZnSe type-II quantum dot structures Journal of Applied Physics. 111. DOI: 10.1063/1.3681812 |
0.314 |
|
| 2012 |
Clausen B, Brown DW, Noyan IC. Engineering applications of time-of-flight neutron diffraction Jom. 64: 117-126. DOI: 10.1007/S11837-011-0119-X |
0.377 |
|
| 2011 |
Murray CE, Ying A, Polvino SM, Noyan IC, Holt M, Maser J. Nanoscale silicon-on-insulator deformation induced by stressed liner structures Journal of Applied Physics. 109. DOI: 10.1063/1.3579421 |
0.757 |
|
| 2011 |
Ying A, Witt C, Jordan-Sweet J, Rosenberg R, Noyan IC. A quantitative analysis of room temperature recrystallization kinetics in electroplated copper films using high resolution x-ray diffraction Journal of Applied Physics. 109. DOI: 10.1063/1.3514096 |
0.393 |
|
| 2011 |
Vukelic S, Noyan IC, Kysar JW, Yao YL. Characterization of Heterogeneous Response of Al Bicrystal Subject to Micro Scale Laser Shock Peening Experimental Mechanics. 51: 793-796. DOI: 10.1007/S11340-010-9380-0 |
0.393 |
|
| 2010 |
Murray CE, Ying AJ, Polvino SM, Noyan IC, Cai Z. Nanoscale strain characterization in microelectronic materials using X-ray diffraction Powder Diffraction. 25: 108-113. DOI: 10.1154/1.3394205 |
0.479 |
|
| 2010 |
Ying A, Osting B, Noyan IC, Murray CE, Holt M, Maser J. Modeling of kinematic diffraction from a thin silicon film illuminated by a coherent, focused X-ray nanobeam Journal of Applied Crystallography. 43: 587-595. DOI: 10.1107/S0021889810008459 |
0.741 |
|
| 2010 |
Noyan IC, Brügger A, Betti R, Clausen B. Measurement of strain/load transfer in parallel seven-wire strands with neutron diffraction Proceedings of the Society For Experimental Mechanics, Inc.. 67: 265-272. DOI: 10.1007/S11340-009-9313-Y |
0.401 |
|
| 2009 |
Ying AJ, Murray CE, Noyan IC. A rigorous comparison of X-ray diffraction thickness measurement techniques using silicon-on-insulator thin films Journal of Applied Crystallography. 42: 401-410. DOI: 10.1107/S0021889809006888 |
0.461 |
|
| 2009 |
Murray CE, Ren Z, Ying A, Polvino SM, Noyan IC, Cai Z. Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions Applied Physics Letters. 94. DOI: 10.1063/1.3079656 |
0.732 |
|
| 2008 |
Murray CE, Polvino SM, Noyan IC, Lai B, Cai Z. Real-space strain mapping of SOI features using microbeam X-ray diffraction Powder Diffraction. 23: 106-108. DOI: 10.1154/1.2912329 |
0.477 |
|
| 2008 |
Kalenci Ö, Noyan IC. Applicability of real-space methods to diffraction strain measurements in single crystals Journal of Applied Crystallography. 41: 944-949. DOI: 10.1107/S0021889808026952 |
0.466 |
|
| 2008 |
Kalenci O, Murray CE, Noyan IC. Local strain distributions in silicon-on-insulator/stressor-film composites Journal of Applied Physics. 104. DOI: 10.1063/1.2975992 |
0.458 |
|
| 2008 |
Murray CE, Saenger KL, Kalenci O, Polvino SM, Noyan IC, Lai B, Cai Z. Submicron mapping of silicon-on-insulator strain distributions induced by stressed liner structures Journal of Applied Physics. 104. DOI: 10.1063/1.2952044 |
0.506 |
|
| 2008 |
Polvino SM, Murray CE, Kalenci O, Noyan IC, Lai B, Cai Z. Synchrotron microbeam x-ray radiation damage in semiconductor layers Applied Physics Letters. 92. DOI: 10.1063/1.2942380 |
0.402 |
|
| 2007 |
Yan H, Kang HC, Maser J, Macrander AT, Liu C, Conley R, Stephenson GB, Noyan IC, Kalenci O. D-61 Invited—Toward Nanometer Resolution For Strain Mapping In Single Crystals: New Focusing Optics And Dynamical Diffraction Artifacts Powder Diffraction. 22: 180. DOI: 10.1154/1.2754434 |
0.338 |
|
| 2007 |
Murray CE, Yan H, Noyan IC. Mechanics of microelectronics structures as revealed by X-ray diffraction Powder Diffraction. 22: 98-102. DOI: 10.1154/1.2737460 |
0.5 |
|
| 2007 |
Yan H, Kalenci O, Noyan IC. Diffraction profiles of elastically bent single crystals with constant strain gradients Journal of Applied Crystallography. 40: 322-331. DOI: 10.1107/S0021889807003160 |
0.468 |
|
| 2007 |
Murray CE, Sankarapandian M, Polvino SM, Noyan IC, Lai B, Cai Z. Submicron mapping of strained silicon-on-insulator features induced by shallow-trench-isolation structures Applied Physics Letters. 90. DOI: 10.1063/1.2732180 |
0.445 |
|
| 2007 |
Yan H, Murray CE, Noyan IC. Mapping local strain in thin film/substrate systems using x-ray microdiffraction topography Applied Physics Letters. 90. DOI: 10.1063/1.2711189 |
0.516 |
|
| 2006 |
Yan H, Noyan IC. Measurement of stress/strain in single-crystal samples using diffraction Journal of Applied Crystallography. 39: 320-325. DOI: 10.1107/S0021889806006662 |
0.463 |
|
| 2006 |
Kuskovsky IL, Gu Y, Gong Y, Yan HF, Lau J, Noyan IC, Neumark GF, Maksimov O, Zhou X, Tamargo MC, Volkov V, Zhu Y, Wang L. Mechanism for increasing dopant incorporation in semiconductors via doped nanostructures Physical Review B - Condensed Matter and Materials Physics. 73. DOI: 10.1103/Physrevb.73.195306 |
0.354 |
|
| 2006 |
Üstündag E, Karnesky RA, Daymond MR, Noyan IC. Dynamical diffraction peak splitting in time-of-flight neutron diffraction Applied Physics Letters. 89. DOI: 10.1063/1.2402220 |
0.397 |
|
| 2006 |
Murray CE, Goldsmith CC, Shaw TM, Doyle JP, Noyan IC. Thermal stress evolution in embedded Cu/low-k dielectric composite features Applied Physics Letters. 89. DOI: 10.1063/1.2219727 |
0.402 |
|
| 2006 |
Gong Y, Yan HF, Kuskovsky IL, Gu Y, Noyan IC, Neumark GF, Tamargo MC. Structure of Zn-Se-Te system with submonolayer insertion of ZnTe grown by migration enhanced epitaxy Journal of Applied Physics. 99. DOI: 10.1063/1.2184434 |
0.424 |
|
| 2005 |
Murray CE, Noyan IC. Mechanics of end effects in thin film and substrate stress distributions Materials Science Forum. 490: 13-18. DOI: 10.4028/Www.Scientific.Net/Msf.490-491.13 |
0.461 |
|
| 2005 |
Murray CE, Goldsmith CC, Noyan IC. Spatially transient stress effects in thin films by X-ray diffraction Powder Diffraction. 20: 112-116. DOI: 10.1154/1.1913716 |
0.487 |
|
| 2005 |
Yan H, Noyan IC. Dynamical diffraction artifacts in Laue microdiffraction images Journal of Applied Physics. 98. DOI: 10.1063/1.2071454 |
0.392 |
|
| 2005 |
Murray CE, Yan HF, Noyan IC, Cai Z, Lai B. High-resolution strain mapping in heteroepitaxial thin-film features Journal of Applied Physics. 98. DOI: 10.1063/1.1938277 |
0.469 |
|
| 2005 |
Kaldor SK, Noyan IC. Flexural loading of rectangular Si beams and plates Materials Science and Engineering A. 399: 64-71. DOI: 10.1016/J.Msea.2005.02.065 |
0.395 |
|
| 2004 |
Noyan IC, Kaldor SK. Measurement volume considerations in X-ray microdiffraction stress analysis Powder Diffraction. 19: 104-109. DOI: 10.1154/1.1757451 |
0.425 |
|
| 2004 |
Murray CE, Noyan IC, Lai B, Cai Z. Strain effects in thin film/Si substrates revealed by X-ray microdiffraction Powder Diffraction. 19: 56-59. DOI: 10.1154/1.1649323 |
0.486 |
|
| 2004 |
Zhang W, Yao YL, Noyan IC. Microscale laser shock peening of thin films, part 2: High spatial resolution material characterization Journal of Manufacturing Science and Engineering, Transactions of the Asme. 126: 18-24. DOI: 10.1115/1.1645879 |
0.493 |
|
| 2004 |
Zhang W, Yao YL, Noyan IC. Microscale laser shock peening of thin films, Part 1: Experiment, modeling and simulation Journal of Manufacturing Science and Engineering, Transactions of the Asme. 126: 10-17. DOI: 10.1115/1.1645878 |
0.404 |
|
| 2004 |
Noyan IC, Murray CE, Chey JS, Goldsmith CC. Finite size effects in stress analysis of interconnect structures Applied Physics Letters. 85: 724-726. DOI: 10.1063/1.1776331 |
0.384 |
|
| 2004 |
Levine ZH, Grantham S, Paterson DJ, McNulty I, Noyan IC, Levin TM. Imaging material components of an integrated circuit interconnect Journal of Applied Physics. 95: 405-407. DOI: 10.1063/1.1631067 |
0.335 |
|
| 2003 |
Murray CE, Noyan IC, Mooney PM, Lai B, Cai Z. Probing strain fields about thin film structures using x-ray microdiffraction Materials Research Society Symposium - Proceedings. 795: 289-294. DOI: 10.1557/Proc-795-U7.3 |
0.492 |
|
| 2003 |
Üstündag E, Karnesky RA, Noyan IC, Clausen B, Daymond MR, Richardson JW. D105 Effect Of Beam Divergence On Strain Data From Neutron Diffraction Powder Diffraction. 18: 178-178. DOI: 10.1154/1.1706990 |
0.391 |
|
| 2003 |
Murray CE, Noyan IC, Mooney PM, Lai B, Cai Z. Mapping of strain fields about thin film structures using x-ray microdiffraction Applied Physics Letters. 83: 4163-4165. DOI: 10.1063/1.1628399 |
0.477 |
|
| 2002 |
Murray CE, Noyan IC. Finite-size effects in thin-film composites Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 82: 3087-3117. DOI: 10.1080/01418610208239635 |
0.375 |
|
| 2002 |
Kaldor SK, Noyan IC. Differentiating between elastically bent rectangular beams and plates Applied Physics Letters. 80: 2284-2286. DOI: 10.1063/1.1459762 |
0.376 |
|
| 2002 |
Kaldor SK, Noyan IC. Effects of boundary conditions and anisotropy on elastically bent silicon Experimental Mechanics. 42: 353-358. DOI: 10.1007/Bf02410993 |
0.451 |
|
| 2001 |
Wang PC, Noyan IC, Kaldor SK, Jordan-Sweet JL, Liniger EG, Hu CK. Real-time x-ray microbeam characterization of electromigration effects in Al(Cu) wires Applied Physics Letters. 78: 2712-2714. DOI: 10.1063/1.1368189 |
0.398 |
|
| 2001 |
Saenger KL, Noyan IC. Determination of processing damage in thin polycrystalline Ir films using Bragg-peak fringe analysis Journal of Applied Physics. 89: 3125-3131. DOI: 10.1063/1.1346660 |
0.427 |
|
| 2000 |
Wang PC, Noyan IC, Kaldor SK, Jordan-Sweet JL, Liniger EG, Hu CK. Topographic measurement of electromigration-induced stress gradients in aluminum conductor lines Applied Physics Letters. 76: 3726-3728. DOI: 10.1063/1.126763 |
0.435 |
|
| 2000 |
Noyan IC, Wang PC, Kaldor SK, Jordan-Sweet JL, Liniger EG. Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics Review of Scientific Instruments. 71: 1991-2000. DOI: 10.1063/1.1150567 |
0.397 |
|
| 1999 |
Noyan IC, Wang P-, Kaldor SK, Jordan-Sweet J. Electromigration and Thermal Strains in Cu and Al Metallization Features Determined through x-ray Microdiffraction The Japan Society of Applied Physics. 1999: 168-169. DOI: 10.7567/Ssdm.1999.B-5-2 |
0.387 |
|
| 1999 |
Harper JME, Cabral C, Andricacos PC, Gignac L, Noyan IC, Rodbell KP, Hu CK. Mechanisms for microstructure evolution in electroplated copper thin films Materials Research Society Symposium - Proceedings. 564: 387-392. DOI: 10.1557/Proc-564-387 |
0.342 |
|
| 1999 |
Murray CE, Noyan IC. A modified Voigt method for calculation of the elastic constants of ensembles selected by diffraction methods Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 79: 371-389. DOI: 10.1080/01418619908210304 |
0.441 |
|
| 1999 |
Harper JME, Cabral C, Andricacos PC, Gignac L, Noyan IC, Rodbell KP, Hu CK. Mechanisms for microstructure evolution in electroplated copper thin films near room temperature Journal of Applied Physics. 86: 2516-2525. DOI: 10.1063/1.371086 |
0.339 |
|
| 1999 |
Noyan IC, Wang PC, Kaldor SK, Jordan-Sweet JL. Deformation field in single-crystal fields semiconductor substrates caused by metallization features Applied Physics Letters. 74: 2352-2354. DOI: 10.1063/1.123848 |
0.435 |
|
| 1999 |
Mooney PM, Jordan-Sweet JL, Noyan IC, Kaldor SK, Wang PC. Observation of local tilted regions in strain-relaxed SiGe/Si buffer layers using x-ray microdiffraction Applied Physics Letters. 74: 726-728. DOI: 10.1063/1.123104 |
0.498 |
|
| 1999 |
Noyan IC, Kaldor SK, Wang PC, Jordan-Sweet J. A cost-effective method for minimizing the sphere-of-confusion error of x-ray microdiffractometers Review of Scientific Instruments. 70: 1300-1304. DOI: 10.1063/1.1149588 |
0.376 |
|
| 1999 |
Mooney PM, Jordan-Sweet JL, Noyan IC, Kaldor SK, Wang PC. Images of local tilted regions in strain-relaxed SiGe layers Physica B: Condensed Matter. 273: 608-611. DOI: 10.1016/S0921-4526(99)00585-2 |
0.494 |
|
| 1998 |
Murray CE, Noyan IC. Comment on “An analysis technique for extraction of thin film stresses from x-ray data” [Appl. Phys. Lett. 71, 2949 (1997)] Applied Physics Letters. 73: 3165-3166. DOI: 10.1063/1.122707 |
0.421 |
|
| 1998 |
Noyan IC, Jordan-Sweet J, Liniger EG, Kaldor SK. Characterization of substrate/thin-film interfaces with x-ray microdiffraction Applied Physics Letters. 72: 3338-3340. DOI: 10.1063/1.121596 |
0.46 |
|
| 1998 |
Wang PC, Cargill GS, Noyan IC, Hu CK. Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction Applied Physics Letters. 72: 1296-1298. DOI: 10.1063/1.120604 |
0.404 |
|
| 1997 |
Chidambarrao D, Song YC, Noyan IC. Numerical simulation of the X-ray stress analysis technique in polycrystalline materials under elastic loading Metallurgical and Materials Transactions a: Physical Metallurgy and Materials Science. 28: 2515-2525. DOI: 10.1007/S11661-997-0009-6 |
0.463 |
|
| 1996 |
Noyan IC, Liniger EG, Hu CK, Wang PC, Cargill GS. Local and global stress distributions in BEOL metallization Materials Research Society Symposium - Proceedings. 428: 565-574. DOI: 10.1557/Proc-428-565 |
0.443 |
|
| 1996 |
Wang PC, Cargill GS, Noyan IC, Liniger EG, Hu CK, Lee KY. X-ray microdiffraction for VLSI Materials Research Society Symposium - Proceedings. 427: 35-46. DOI: 10.1557/Proc-427-35 |
0.477 |
|
| 1996 |
Wang PC, Cargill GS, Noyan IC, Liniger EG. Grain orientation mapping and spatially resolved strain measurements for polycrystalline films by x-ray microdiffraction Materials Research Society Symposium - Proceedings. 403: 213-218. DOI: 10.1557/Proc-403-213 |
0.441 |
|
| 1996 |
Murray CE, Noyan IC. The relationship between the golden section Φ and the elastic constants of ensembles selected by diffraction methods Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 73: 1313-1321. DOI: 10.1080/01418619608245134 |
0.372 |
|
| 1996 |
Song Y, Noyan IC. Variation of the effective elastic constants in the sample coordinate system with tilt angle (ψ) for X-ray strain-stress analysis Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 73: 1105-1112. DOI: 10.1080/01418619608243707 |
0.461 |
|
| 1995 |
Wang PC, Cargill GS, Noyan IC. Strain measurements and Laue diffraction with microbeams Materials Research Society Symposium - Proceedings. 375: 247-252. DOI: 10.1557/Proc-375-247 |
0.513 |
|
| 1995 |
Noyan IC, Huang IC, York BR. Residual Stress/Strain Analysis in Thin Films by X-ray Diffraction Critical Reviews in Solid State and Materials Sciences. 20: 125-177. DOI: 10.1080/10408439508243733 |
0.447 |
|
| 1993 |
Noyan IC, Sheikh G. X-ray tensile testing of thin films Journal of Materials Research. 8: 764-770. DOI: 10.1557/Jmr.1993.0764 |
0.525 |
|
| 1992 |
Bonda NR, Noyan IC. Deformation inhomogeneity and representative volume in Pb/Sn solder alloys Metallurgical Transactions A. 23: 479-484. DOI: 10.1007/Bf02801165 |
0.317 |
|
| 1991 |
Schadler LS, Noyan IC. Experimental Determination of the Strain Transfer Across a Flexible Intermediate Layer in Thin Film Structures as a Function of Flexible Layer Thickness Mrs Proceedings. 239: 151. DOI: 10.1557/Proc-239-151 |
0.484 |
|
| 1991 |
Noyan IC. Defining Residual Stresses in Thin Film Structures Advances in X-Ray Analysis. 35: 461-473. DOI: 10.1154/S0376030800009149 |
0.342 |
|
| 1990 |
Sheikh G, Berger A, Noyan IC. Evolution of Residual Stresses in Thin Films Deposited on Mechanically Strained Substrates Mrs Proceedings. 203: 153. DOI: 10.1557/Proc-203-153 |
0.407 |
|
| 1990 |
Noyan IC, Goldsmith CC. Thermal Stress Relaxation in Vapor Deposited Thin Films Advances in X-Ray Analysis. 34: 587-600. DOI: 10.1154/S0376030800014907 |
0.342 |
|
| 1989 |
Sheikh G, Noyan IC. Residual Stresses and Differential Deformation of Electroplated Structures Advances in X-Ray Analysis. 33: 161-169. DOI: 10.1154/S0376030800019558 |
0.33 |
|
| 1988 |
Noyan IC. Plastic deformation of solid spheres Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 57: 127-141. DOI: 10.1080/01418618808204503 |
0.363 |
|
| 1988 |
Nguyen LT, Noyan IC. X-ray determination of encapsulation stresses on silicon wafers Polymer Engineering and Science. 28: 1013-1025. DOI: 10.1002/Pen.760281602 |
0.455 |
|
| 1986 |
Zhong RM, Noyan IC, Cohen JB. X-RAY ELASTIC CONSTANTS AND THEIR MEANING FOR Al AND Fe Advances in X-Ray Analysis. 29: 17-20. DOI: 10.1154/S0376030800010065 |
0.496 |
|
| 1986 |
Noyan IC, Cohen JB. X-ray diffraction study of changes in stress-strain distributions during the fatigue of a two-phase alloy Materials Science and Engineering. 79: 149-155. DOI: 10.1016/0025-5416(86)90398-8 |
0.335 |
|
| 1985 |
Noyan IC, Cohen JB. An X-ray diffraction study of the residual stress-strain distributions in shot-peened two-phase brass Materials Science and Engineering. 75: 179-193. DOI: 10.1016/0025-5416(85)90188-0 |
0.445 |
|
| 1985 |
Noyan IC. Determination of the Elastic Constants of Inhomogeneous Materials with X-ray diffraction Materials Science and Engineering. 75: 95-103. DOI: 10.1016/0025-5416(85)90181-8 |
0.425 |
|
| 1983 |
Noyan IC. Effect of gradients in multi-axial stress states on residual stress measurements with x-rays Metallurgical Transactions A. 14: 249-258. DOI: 10.1007/Bf02651622 |
0.383 |
|
| 1983 |
Noyan IC. EQUILIBRIUM CONDITIONS FOR THE AVERAGE STRESSES MEASURED BY X-RAYS Metallurgical Transactions. a, Physical Metallurgy and Materials Science. 14: 1907-1914. DOI: 10.1007/Bf02645562 |
0.442 |
|
| 1981 |
Tsai SD, Mahulikar D, Marcus HL, Noyan IC, Cohen JB. Residual stress measurements on Al-graphite composites using X-ray diffraction Materials Science and Engineering. 47: 145-149. DOI: 10.1016/0025-5416(81)90220-2 |
0.378 |
|
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