Year |
Citation |
Score |
2014 |
Faraby H, DiBattista M, Bandaru PR. Reduced electrical impedance of SiO2, deposited through focused ion beam based systems, due to impurity percolation Journal of Applied Physics. 116. DOI: 10.1063/1.4902521 |
0.372 |
|
2014 |
Faraby H, Dibattista M, Bandaru PR. Percolation of gallium dominates the electrical resistance of focused ion beam deposited metals Applied Physics Letters. 104. DOI: 10.1063/1.4874342 |
0.309 |
|
2001 |
Korotcenkov G, Brinzari V, Schwank J, DiBattista M, Vasiliev A. Peculiarities of SnO2 thin film deposition by spray pyrolysis for gas sensor application Sensors and Actuators, B: Chemical. 77: 244-252. DOI: 10.1016/S0925-4005(01)00741-9 |
0.633 |
|
2000 |
Korotcenkov G, Dibattista M, Schwank J, Brinzari V. Structural characterization of SnO2 gas sensing films deposited by spray pyrolysis Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 77: 33-39. DOI: 10.1016/S0921-5107(00)00455-4 |
0.613 |
|
1999 |
Schwank JW, DiBattista M. Oxygen sensors: materials and applications Mrs Bulletin. 24: 44-48. DOI: 10.1557/S0883769400052507 |
0.486 |
|
1999 |
DiBattista M, Schwank JW. Determination of diffusion in polycrystalline platinum thin films Journal of Applied Physics. 86: 4902-4907. DOI: 10.1063/1.371458 |
0.497 |
|
1999 |
Dibattista M, Patel SV, Mansfield JF, Schwank JW. In-situ elevated temperature imaging of thin films with a microfabricated hot stage for scanning probe microscopes Applied Surface Science. 141: 119-128. DOI: 10.1016/S0169-4332(98)00603-5 |
0.593 |
|
1998 |
Marieb T, Mack A, Lee J, Dibattista M. The Stress Change in Passivated Al Lines Due to the Reaction Between Ti and Al Mrs Proceedings. 516. DOI: 10.1557/Proc-516-213 |
0.371 |
|
1996 |
Patel SV, DiBattista M, Gland JL, Schwank JW. Survivability of a silicon-based microelectronic gas-detector structure for high-temperature flow applications Sensors and Actuators, B: Chemical. 37: 27-35. DOI: 10.1016/S0925-4005(97)80069-X |
0.549 |
|
1995 |
Dibattista M, Patel SV, Wise KD, Gland JL, Mansfield JF, Schwank JW. Characterization of multilayer thin film structures for gas sensor applications Materials Research Society Symposium - Proceedings. 382: 477-482. DOI: 10.1557/Proc-382-477 |
0.62 |
|
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