Year |
Citation |
Score |
2023 |
King SN, Kaissieh N, Haxton C, Shojaei M, Malott L, Devara L, Thompson R, Osman KL, Millward J, Blackburn M, Lever TE. Radiation induced changes in profibrotic markers in the submental muscles and their correlation with tongue movement. Plos One. 18: e0287044. PMID 37352202 DOI: 10.1371/journal.pone.0287044 |
0.372 |
|
2020 |
Brann MR, Thompson RS, Sibener SJ. Reaction Kinetics and Influence of Film Morphology on the Oxidation of Propene Thin Films by O(3P) Atomic Oxygen The Journal of Physical Chemistry C. 124: 7205-7215. DOI: 10.1021/Acs.Jpcc.9B11439 |
0.528 |
|
2020 |
Thompson RS, Langlois GG, Li W, Brann MR, Sibener S. Reverse water-gas shift chemistry inside a supersonic molecular beam nozzle Applied Surface Science. 515: 145985. DOI: 10.1016/J.Apsusc.2020.145985 |
0.453 |
|
2019 |
Thompson RS, Brann MR, Purdy EH, Graham JD, McMillan AA, Sibener SJ. Rapid Laser-Induced Temperature Jump Decomposition of the Nerve Agent Simulant Diisopropyl Methylphosphonate under Atmospheric Conditions The Journal of Physical Chemistry C. 123: 21564-21570. DOI: 10.1021/Acs.Jpcc.9B05381 |
0.454 |
|
2019 |
Thompson RS, Brann MR, Sibener SJ. Sticking Probability of High-Energy Methane on Crystalline, Amorphous, and Porous Amorphous Ice Films The Journal of Physical Chemistry C. 123: 17855-17863. DOI: 10.1021/Acs.Jpcc.9B03900 |
0.486 |
|
2017 |
Thompson RS, Langlois GG, Sibener SJ. Oxidative Destruction of Multilayer Diisopropyl Methylphosphonate Films by O((3)P) Atomic Oxygen. The Journal of Physical Chemistry. B. PMID 28459150 DOI: 10.1021/Acs.Jpcb.7B02589 |
0.558 |
|
2016 |
Langlois GG, Thompson RS, Li W, Sibener SJ. Oxidation, destruction, and persistence of multilayer dimethyl methylphosphonate films during exposure to O(3P) atomic oxygen Journal of Physical Chemistry C. 120: 16863-16870. DOI: 10.1021/Acs.Jpcc.6B05880 |
0.554 |
|
2011 |
Thompson RS, Schroeder DJ, López CM, Neuhold S, Vaughey JT. Stabilization of lithium metal anodes using silane-based coatings Electrochemistry Communications. 13: 1369-1372. DOI: 10.1016/J.Elecom.2011.08.012 |
0.44 |
|
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