Year |
Citation |
Score |
2023 |
Qi J, Oberdorfer C, Marquis EA, Windl W. Ab-Initio Simulation of Field Evaporation in Atom Probe Tomography: Enhanced Zone Lines and Mixed-Layer Reconstructed Structures. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 607-608. PMID 37613140 DOI: 10.1093/micmic/ozad067.294 |
0.635 |
|
2021 |
Nyby C, Guo X, Saal JE, Chien SC, Gerard AY, Ke H, Li T, Lu P, Oberdorfer C, Sahu S, Li S, Taylor CD, Windl W, Scully JR, Frankel GS. Electrochemical metrics for corrosion resistant alloys. Scientific Data. 8: 58. PMID 33574339 DOI: 10.1038/s41597-021-00840-y |
0.454 |
|
2020 |
Qi J, Oberdorfer C, Marquis E, Windl W. Full “Ab-Initio” Simulation of Field Evaporation of Samples with Grain Boundaries Microscopy and Microanalysis. 26: 2878-2879. DOI: 10.1017/S1431927620023077 |
0.545 |
|
2019 |
He Y, Perea DE, Mao SX, Wang C, Withrow T, Oberdorfer C, Windl W. In situ HR-TEM and Simulation of Si Field Emitter Tips under Field Evaporation Microscopy and Microanalysis. 25: 308-309. DOI: 10.1017/S1431927619002277 |
0.695 |
|
2019 |
Oberdorfer C, Withrow T, Marquis EA, Windl W. Atomistic-Simulation Based Modeling of Atom Probe Tomography Microscopy and Microanalysis. 25: 284-285. DOI: 10.1017/S1431927619002150 |
0.723 |
|
2019 |
Oberdorfer C, Windl W. Bond-order bond energy model for alloys Acta Materialia. 179: 406-413. DOI: 10.1016/J.Actamat.2019.08.048 |
0.499 |
|
2018 |
Oberdorfer C, Withrow T, Yu L, Fisher K, Marquis E, Windl W. Influence of surface relaxation on solute atoms positioning within atom probe tomography reconstructions Materials Characterization. 146: 324-335. DOI: 10.1016/J.Matchar.2018.05.014 |
0.72 |
|
2017 |
Withrow T, Oberdorfer C, Windl W, Marquis EA. Coupling Molecular Dynamics and Finite Element Simulations to Investigate the Nearest Neighbor Dependence of Field Evaporation Microscopy and Microanalysis. 23: 646-647. DOI: 10.1017/S1431927617003890 |
0.688 |
|
2016 |
Beinke D, Oberdorfer C, Schmitz G. Towards an accurate volume reconstruction in atom probe tomography. Ultramicroscopy. 165: 34-41. PMID 27062338 DOI: 10.1016/J.Ultramic.2016.03.008 |
0.562 |
|
2016 |
Beinke D, Oberdorfer C, Schmitz G. Towards an accurate volume reconstruction in atom probe tomography Ultramicroscopy. 165: 34-41. DOI: 10.1016/j.ultramic.2016.03.008 |
0.561 |
|
2015 |
Oberdorfer C, Eich SM, Lütkemeyer M, Schmitz G. Applications of a versatile modelling approach to 3D atom probe simulations. Ultramicroscopy. 159: 184-94. PMID 25736966 DOI: 10.1016/J.Ultramic.2015.02.008 |
0.628 |
|
2015 |
Vurpillot F, Oberdorfer C. Modeling Atom Probe Tomography: A review. Ultramicroscopy. 159: 202-16. PMID 25720335 DOI: 10.1016/j.ultramic.2014.12.013 |
0.317 |
|
2015 |
Oberdorfer C, Eich SM, Lütkemeyer M, Schmitz G. Applications of a versatile modelling approach to 3D atom probe simulations Ultramicroscopy. 159: 184-194. DOI: 10.1016/j.ultramic.2015.02.008 |
0.627 |
|
2013 |
Oberdorfer C, Eich SM, Schmitz G. A full-scale simulation approach for atom probe tomography. Ultramicroscopy. 128: 55-67. PMID 23500891 DOI: 10.1016/J.Ultramic.2013.01.005 |
0.63 |
|
2013 |
Balogh Z, Oberdorfer C, Chellali MR, Stender P, Nowak S, Schmitz G. Defect analysis by statistical fitting to 3D atomic maps. Ultramicroscopy. 132: 86-91. PMID 23398964 DOI: 10.1016/J.Ultramic.2012.12.020 |
0.545 |
|
2013 |
Oberdorfer C, Eich S, Schmitz G. Application of a Generalized Approach for APT Simulation: Investigations on Disordered and Complex Sample Structures Microscopy and Microanalysis. 19: 928-929. DOI: 10.1017/S1431927613006636 |
0.49 |
|
2012 |
Stoffers A, Oberdorfer C, Schmitz G. Controlled field evaporation of fluorinated self-assembled monolayers. Langmuir : the Acs Journal of Surfaces and Colloids. 28: 56-9. PMID 22136132 DOI: 10.1021/La204126X |
0.54 |
|
2012 |
Schmitz G, Baither D, Balogh Z, Chellali MR, Greiwe GH, Kasprzak M, Oberdorfer C, Schlesiger R, Stender P. Physics on the top of the tip: Atomic transport and reaction in nano-structured materials Defect and Diffusion Forum. 323: 3-10. DOI: 10.4028/Www.Scientific.Net/Ddf.323-325.3 |
0.583 |
|
2011 |
Oberdorfer C, Schmitz G. On the field evaporation behavior of dielectric materials in three-dimensional atom probe: a numeric simulation. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 17: 15-25. PMID 20883599 DOI: 10.1017/S1431927610093888 |
0.613 |
|
2010 |
Schlesiger R, Oberdorfer C, Würz R, Greiwe G, Stender P, Artmeier M, Pelka P, Spaleck F, Schmitz G. Design of a laser-assisted tomographic atom probe at Münster University. The Review of Scientific Instruments. 81: 043703. PMID 20441341 DOI: 10.1063/1.3378674 |
0.542 |
|
2010 |
Görlich J, Oberdorfer C, Baither D, Schmitz G, Reinke C, Wilke U. The role of oxide layers in solder joints Journal of Alloys and Compounds. 490: 336-341. DOI: 10.1016/J.Jallcom.2009.10.005 |
0.473 |
|
2009 |
Gruber M, Oberdorfer C, Stender P, Schmitz G. Laser-assisted atom probe analysis of sol-gel silica layers. Ultramicroscopy. 109: 654-9. PMID 19179011 DOI: 10.1016/J.Ultramic.2008.12.005 |
0.519 |
|
2009 |
Ene C, Nowak C, Oberdorfer C, Schmitz G. Reactive diffusion under Laplace tension. Ultramicroscopy. 109: 660-6. PMID 19171431 DOI: 10.1016/J.Ultramic.2008.12.001 |
0.523 |
|
2007 |
Oberdorfer C, Stender P, Reinke C, Schmitz G. Laser-assisted atom probe tomography of oxide materials. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 13: 342-6. PMID 17900384 DOI: 10.1017/S1431927607070274 |
0.55 |
|
2007 |
Stender P, Oberdorfer C, Artmeier M, Pelka P, Spaleck F, Schmitz G. New tomographic atom probe at University of Muenster, Germany. Ultramicroscopy. 107: 726-33. PMID 17445985 DOI: 10.1016/J.Ultramic.2007.02.032 |
0.582 |
|
2007 |
Schmitz G, Ene C, Galinski H, Oberdorfer C. Thermal Stability and Reaction of Magnetic Sensor Materials Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607072169 |
0.437 |
|
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