Alex De Lozanne
Affiliations: | physics | University of Texas at Austin, Austin, Texas, U.S.A. |
Area:
Condensed Matter Physics, Electricity and Magnetism PhysicsWebsite:
https://www.utexas.edu/research/eureka/faculty/view?faculty_id=724Google:
"Alex De Lozanne"Bio:
http://tmi.utexas.edu/tmi-people/alex-de-lozanne/
http://experts.utexas.edu/alex_de_lozanne
http://www.aps.org/units/fip/governance/elections/lozanne12.cfm
https://inis.iaea.org/search/search.aspx?orig_q=RN:14787890
http://web.stanford.edu/group/kgb/old_website/alumni/info.html
Mean distance: (not calculated yet)
Parents
Sign in to add mentorMalcolm Roy Beasley | grad student | 1982 | Stanford | |
(High critical temperature SNS Josephson microbridges.) |
Children
Sign in to add traineeDavid J. Derro | grad student | 2000 | UT Austin |
Qingyou Lu | grad student | 2000 | UT Austin |
Jinho Lee | grad student | 2002 | UT Austin |
Emil C. Israel | grad student | 2005 | UT Austin |
Tien-Ming Chuang | grad student | 2006 | UT Austin |
Junwei Huang | grad student | 2007 | UT Austin |
Changbae Hyun | grad student | 2007 | UT Austin |
Jeehoon Kim | grad student | 2007 | UT Austin |
Seongsoo Kweon | grad student | 2008 | UT Austin |
Xinzhou Tan | grad student | 2017 | UT Austin (Neurotree) |
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Publications
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Kim J, Huang J, Zhou JS, et al. (2013) Observation of electronic inhomogeneity and charge density waves in a bilayer La(2-2x)Sr(1+2x)Mn2O7 single crystal. Physical Review Letters. 110: 217203 |
Kim J, Huang J, Zhou JS, et al. (2013) Observation of electronic inhomogeneity and charge density waves in a bilayer La2-2xSr1+2xMn2O7 single crystal Physical Review Letters. 110 |
Patel RN, Heitsch AT, Hyun C, et al. (2009) Printed magnetic FePt nanocrystal films. Acs Applied Materials & Interfaces. 1: 1339-46 |
Kim S, Kim J, Berg M, et al. (2008) Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy. The Review of Scientific Instruments. 79: 103702 |
Chuang TM, de Lozanne A. (2007) Compact variable-temperature scanning force microscope. The Review of Scientific Instruments. 78: 053710 |
Deegan RD, Chheda S, Patel L, et al. (2003) Wavy and rough cracks in silicon. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 67: 066209 |