John Henry J. Scott, Ph. D.

Affiliations: 
1985-1989 California Institute of Technology, Pasadena, CA 
 1992-1997 Physics Carnegie Mellon University, Pittsburgh, PA 
 1997- NIST 
Area:
electron microscopy, microanalysis, data science
Website:
https://www.nist.gov/people/john-henry-j-scott
Google:
"John Henry Scott"
Mean distance: (not calculated yet)
 

Parents

Sign in to add mentor
Sara A. Majetich grad student 1992-1996 Carnegie Mellon (Physics Tree)
Dale E. Newbury post-doc 1997-1999 NIST

Children

Sign in to add trainee
Konrad Rykaczewski post-doc (E-Tree)
Martin F. Hohmann-Marriott post-doc 2006- NIST (Chemistry Tree)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Vandecreme A, Majurski M, Chalfoun J, et al. (2015) From Image Tiles to Web-Based Interactive Measurements in One Stop. Microscopy Today. 21: 89-90
Rykaczewski K, Paxson AT, Staymates M, et al. (2014) Dropwise condensation of low surface tension fluids on omniphobic surfaces. Scientific Reports. 4: 4158
Vandecreme A, Bajcsy P, Ritchie NWM, et al. (2014) Interactive analysis of terabyte-sized SEM-EDS hyperspectral images Microscopy and Microanalysis. 20: 654-655
Rykaczewski K, Landin T, Walker ML, et al. (2012) Direct imaging of complex nano- to microscale interfaces involving solid, liquid, and gas phases. Acs Nano. 6: 9326-34
Rykaczewski K, Osborn WA, Chinn J, et al. (2012) How nanorough is rough enough to make a surface superhydrophobic during water condensation? Soft Matter. 8: 8786-8794
Rykaczewski K, Chinn J, Walker ML, et al. (2011) Dynamics of nanoparticle self-assembly into superhydrophobic liquid marbles during water condensation. Acs Nano. 5: 9746-54
Rykaczewski K, Scott JH. (2011) Methodology for imaging nano-to-microscale water condensation dynamics on complex nanostructures. Acs Nano. 5: 5962-8
Rykaczewski K, Hildreth OJ, Wong CP, et al. (2011) Guided three-dimensional catalyst folding during metal-assisted chemical etching of silicon. Nano Letters. 11: 2369-74
Rykaczewski K, Hildreth OJ, Wong CP, et al. (2011) Directed 2D-to-3D pattern transfer method for controlled fabrication of topologically complex 3D features in silicon. Advanced Materials (Deerfield Beach, Fla.). 23: 659-63
Rykaczewski K, Scott JHJ, Fedorov AG. (2011) Electron beam heating effects during environmental scanning electron microscopy imaging of water condensation on superhydrophobic surfaces Applied Physics Letters. 98
See more...