Year |
Citation |
Score |
1999 |
Ghislain LP, Elings VB, Crozier KB, Manalis SR, Minne SC, Wilder K, Kino GS, Quate CF. Near-field photolithography with a solid immersion lens Applied Physics Letters. 74: 501-503. DOI: 10.1063/1.123168 |
0.338 |
|
1999 |
Anczykowski B, Gotsmann B, Fuchs H, Cleveland JP, Elings VB. How to measure energy dissipation in dynamic mode atomic force microscopy Applied Surface Science. 140: 376-382. DOI: 10.1016/S0169-4332(98)00558-3 |
0.363 |
|
1998 |
Wilder K, Quate CF, Adderton D, Bernstein R, Elings V. Noncontact nanolithography using the atomic force microscope Applied Physics Letters. 73: 2527-2529. DOI: 10.1063/1.122504 |
0.37 |
|
1998 |
Cleveland JP, Anczykowski B, Schmid AE, Elings VB. Energy dissipation in tapping-mode atomic force microscopy Applied Physics Letters. 72: 2613-2615. DOI: 10.1063/1.121434 |
0.372 |
|
1998 |
Taylor RS, Leopold KE, Wendman M, Gurley G, Elings V. Scanning probe optical microscopy of evanescent fields Review of Scientific Instruments. 69: 2981-2987. DOI: 10.1063/1.1149044 |
0.344 |
|
1998 |
Anczykowski B, Cleveland JP, Krüger D, Elings V, Fuchs H. Analysis of the interactionmechanisms in dynamicmode SFM by means of experimental data and computer simulation Applied Physics a: Materials Science and Processing. 66: S885-S889. DOI: 10.1007/S003390051261 |
0.353 |
|
1997 |
Magonov SN, Cleveland J, Elings V, Denley D, Whangbo MH. Tapping-mode atomic force microscopy study of the near-surface composition of a styrene-butadiene-styrene triblock copolymer film Surface Science. 389: 201-211. DOI: 10.1016/S0039-6028(97)00412-3 |
0.395 |
|
1997 |
Magonov SN, Elings V, Whangbo MH. Phase imaging and stiffness in tapping-mode atomic force microscopy Surface Science. 375: L385-L391. DOI: 10.1016/S0039-6028(96)01591-9 |
0.349 |
|
1996 |
Walters DA, Cleveland JP, Thomson NH, Hansma PK, Wendman MA, Gurley G, Elings V. Short cantilevers for atomic force microscopy Review of Scientific Instruments. 67: 3583-3590. DOI: 10.1063/1.1147177 |
0.315 |
|
1995 |
Manalis S, Babcock K, Massie J, Elings V, Dugas M. Submicron studies of recording media using thin-film magnetic scanning probes Applied Physics Letters. 2585. DOI: 10.1063/1.113509 |
0.31 |
|
1994 |
Hansma PK, Drake B, Grigg D, Prater CB, Yashar F, Gurley G, Elings V, Feinstein S, Lal R. A new, optical-lever based atomic force microscope Journal of Applied Physics. 76: 796-799. DOI: 10.1063/1.357751 |
0.402 |
|
1994 |
Hansma PK, Cleveland JP, Radmacher M, Walters DA, Hillner PE, Bezanilla M, Fritz M, Vie D, Hansma HG, Prater CB, Massie J, Fukunaga L, Gurley J, Elings V. Tapping mode atomic force microscopy in liquids Applied Physics Letters. 64: 1738-1740. DOI: 10.1063/1.111795 |
0.371 |
|
1993 |
Bennett JM, Elings V, Kjoller K. Recent developments in profiling optical surfaces. Applied Optics. 32: 3442-7. PMID 20829963 DOI: 10.1364/Ao.32.003442 |
0.345 |
|
1993 |
Hansma HG, Sinsheimer RL, Groppe J, Bruice TC, Elings V, Gurley G, Bezanilla M, Mastrangelo IA, Hough PV, Hansma PK. Recent advances in atomic force microscopy of DNA. Scanning. 15: 296-9. PMID 8269178 DOI: 10.1002/Sca.4950150509 |
0.318 |
|
1993 |
Giles R, Cleveland JP, Manne S, Hansma PK, Drake B, Maivald P, Boles C, Gurley J, Elings V. Noncontact force microscopy in liquids Applied Physics Letters. 63: 617-618. DOI: 10.1063/1.109967 |
0.377 |
|
1992 |
Hansma HG, Vesenka J, Siegerist C, Kelderman G, Morrett H, Sinsheimer RL, Elings V, Bustamante C, Hansma PK. Reproducible imaging and dissection of plasmid DNA under liquid with the atomic force microscope. Science (New York, N.Y.). 256: 1180-4. PMID 1589799 DOI: 10.1126/Science.256.5060.1180 |
0.365 |
|
1992 |
Sarid D, Pax P, Elings V, Bocek D. Laser Diode Delivers Atomically-Resolved Images Optics and Photonics News. 3: 35_1. DOI: 10.1364/Opn.3.12.0035_1 |
0.317 |
|
1992 |
Sarid D, Pax P, Yi L, Howells S, Gallagher M, Chen T, Elings V, Bocek D. Improved atomic force microscope using a laser diode interferometer Review of Scientific Instruments. 63: 3905-3908. DOI: 10.1063/1.1143289 |
0.356 |
|
1991 |
Manne S, Hansma PK, Massie J, Elings VB, Gewirth AA. Atomic-resolution electrochemistry with the atomic force microscope: copper deposition on gold. Science (New York, N.Y.). 251: 183-6. PMID 17836948 DOI: 10.1126/Science.251.4990.183 |
0.321 |
|
1991 |
Sarid D, Elings V. Review of scanning force microscopy Journal of Vacuum Science & Technology B. 9: 431-437. DOI: 10.1116/1.585585 |
0.364 |
|
1991 |
Maivald P, Butt HJ, Gould SAC, Prater CB, Drake B, Gurley JA, Elings VB, Hansma PK. Using force modulation to image surface elasticities with the atomic force microscope Nanotechnology. 2: 103-106. DOI: 10.1088/0957-4484/2/2/004 |
0.398 |
|
1990 |
Weisenhorn AL, Mac Dougall JE, Gould SA, Cox SD, Wise WS, Massie J, Maivald P, Elings VB, Stucky GD, Hansma PK. Imaging and manipulating molecules on a zeolite surface with an atomic force microscope. Science (New York, N.Y.). 247: 1330-3. PMID 17843797 DOI: 10.1126/Science.247.4948.1330 |
0.365 |
|
1990 |
Gould SAC, Massie J, Northern BD, Stoeckenius W, Albrecht TR, Drake B, Longmire M, Mukergee B, Quate CF, Prater CB, Elings V, Peterson CM, Weisenhorn AL, Manne S, Hansma HG, et al. From atoms to integrated circuit chips, blood cells, and bacteria with the atomic force microscope Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 369-373. DOI: 10.1116/1.576398 |
0.387 |
|
1989 |
Alexander S, Hellemans L, Marti O, Schneir J, Elings V, Hansma PK, Longmire M, Gurley J. An atomic-resolution atomic-force microscope implemented using an optical lever Journal of Applied Physics. 65: 164-167. DOI: 10.1063/1.342563 |
0.378 |
|
1988 |
Marti O, Elings V, Haugan M, Bracker CE, Schneir J, Drake B, Gould SAC, Gurley J, Hellemans L, Shaw K, Weisenhorn AL, Zasadzinski J, Hansma PK. Scanning probe microscopy of biological samples and other surfaces Journal of Microscopy. 152: 803-809. PMID 3255000 DOI: 10.1111/J.1365-2818.1988.Tb01452.X |
0.398 |
|
1988 |
Hansma PK, Elings VB, Marti O, Bracker CE. Scanning tunneling microscopy and atomic force microscopy: application to biology and technology. Science (New York, N.Y.). 242: 209-16. PMID 3051380 DOI: 10.1126/Science.3051380 |
0.401 |
|
1988 |
Schneir J, Marti O, Remmers G, Gläser D, Sonnenfeld R, Drake B, Hansma PK, Elings V. Scanning tunneling microscopy and atomic force microscopy of the liquid–solid interface Journal of Vacuum Science and Technology. 6: 283-286. DOI: 10.1116/1.575426 |
0.41 |
|
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