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Lequn Liu, Ph.D. - Publications

Affiliations: 
2002 University of Illinois, Urbana-Champaign, Urbana-Champaign, IL 
Area:
scanning tunneling microscopy, nanofabrication, nanoelectronics, and IC chip reliability
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5 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2004 Yu J, Liu L, Lyding JW. A Scanning Tunneling Microscopy Study: Si/SiO 2 Interface Roughness Induced by Chemical Etching Mrs Proceedings. 838: 44-49. DOI: 10.1557/Proc-838-O4.9  0.345
2002 Liu L, Yu J, Viernes NOL, Moore JS, Lyding JW. Adsorption of cobalt phthalocyanine on Si(1 0 0)2 × 1 and Si(1 0 0)2 × 1:H surfaces studied by scanning tunneling microscopy and spectroscopy Surface Science. 516: 118-126. DOI: 10.1016/S0039-6028(02)01958-1  0.591
2001 Liu L, Yu J, Lyding JW. Scanning tunneling microscopy observation of single dangling bonds on the Si(100)2×1:H surface Mrs Proceedings. 705: 187-192. DOI: 10.1557/Proc-705-Y6.6  0.544
2001 Liu L, Yu J, Lyding JW. Depth Dependence of Dopant Induced Features on The Si(100)2x1:H Surface and Its Application for Three Dimensional Dopant Profiling Mrs Proceedings. 699: 207-211. DOI: 10.1557/Proc-699-R4.5  0.565
2001 Liu L, Yu J, Lyding JW. Atom-resolved three-dimensional mapping of boron dopants in Si(100) by scanning tunneling microscopy Applied Physics Letters. 78: 386-388. DOI: 10.1063/1.1339260  0.593
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