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Justin Ghan, Ph.D. - Publications

Affiliations: 
2010 Mechanical Engineering University of California, Berkeley, Berkeley, CA, United States 
Area:
Control, Intelligent Systems, and Robotics (CIR), System identification; Design, Modeling and Analysis (DMA), Design for Manufacturability; Physical Electronics (PHY), Semiconductor Manufacturing
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6 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2011 Neureuther AR, Rubinstein J, Miller M, Yamazoe K, Chin E, Levy C, Wang L, Xu N, Spanos C, Qian K, Poolla K, Ghan J, Subramanian A, Liu TJK, Sun X, et al. Collaborative research on emerging technologies and design Proceedings of Spie - the International Society For Optical Engineering. 8081. DOI: 10.1117/12.899394  0.507
2011 Bubke K, Ruhm M, Aldana R, Niehoff M, Xie X, Ghan J, Adrichem Van P, Bald H, Luehrmann P, Roling S, Seltmann R. Simulation-based scanner tuning using FlexRay capability and scatterometry Proceedings of Spie - the International Society For Optical Engineering. 7973. DOI: 10.1117/12.890501  0.318
2011 Bekaert J, Van Look L, D'Havé K, Laenens B, Vandenberghe G, Van Adrichem P, Shao W, Ghan J, Schreel K, Neumann JT. Scanner matching for standard and freeform illumination shapes using FlexRay Proceedings of Spie - the International Society For Optical Engineering. 7973. DOI: 10.1117/12.881607  0.314
2009 Ghan J, Ma N, Mishra S, Spanos C, Poolla K, Rodriguez N, Capodieci L. Clustering and pattern matching for an automatic hotspot classification and detection system Proceedings of Spie - the International Society For Optical Engineering. 7275. DOI: 10.1117/12.814328  0.56
2009 Ghan J, Sezginer A. Algorithm for determining printability and colouring of a target layout for double patterning Proceedings of Spie - the International Society For Optical Engineering. 7275. DOI: 10.1117/12.814321  0.372
2008 Ma N, Ghan J, Mishra S, Spanos C, Poolla K, Rodriguez N, Capodieci L. Automatic hotspot classification using pattern-based clustering Proceedings of Spie - the International Society For Optical Engineering. 6925. DOI: 10.1117/12.772867  0.563
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