Kedar K. Patel, Ph.D. - Publications
Affiliations: | 2010 | Electrical Engineering & Computer Sciences | University of California, Berkeley, Berkeley, CA, United States |
Area:
Energy (ENE); Integrated Circuits (INC); Physical Electronics (PHY); Semiconductor manufacturing; Solid-State DevicesYear | Citation | Score | |||
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2010 | Patel K, Wallow T, Levinson HJ, Spanos CJ. Comparative study of line width roughness (LWR) in next-generation lithography (NGL) processes Proceedings of Spie - the International Society For Optical Engineering. 7640. DOI: 10.1117/12.848183 | 0.482 | |||
2010 | Patel K, Lahiri SN, Spanos CJ. Robust estimation of line width roughness parameters Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 28: C6H18-C6H33. DOI: 10.1116/1.3517718 | 0.488 | |||
2008 | Patel K, Liu TJK, Spanos C. Impact of gate line edge roughness on double-gate FinFET performance variability Proceedings of Spie - the International Society For Optical Engineering. 6925. DOI: 10.1117/12.773065 | 0.469 | |||
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