Year |
Citation |
Score |
2017 |
Lee S, Youn K, Jeong WS, Ho CT, Jun M. Protective Effects of Red Ginseng Oil against Aβ25-35-Induced Neuronal Apoptosis and Inflammation in PC12 Cells. International Journal of Molecular Sciences. 18. PMID 29065557 DOI: 10.3390/ijms18102218 |
0.378 |
|
2017 |
Youn K, Yu Y, Lee J, Jeong WS, Ho CT, Jun M. Polymethoxyflavones: Novel β-Secretase (BACE1) Inhibitors from Citrus Peels. Nutrients. 9. PMID 28869548 DOI: 10.3390/nu9090973 |
0.327 |
|
2017 |
Ho C, Tsai D, Lu C, Kim SY, Mungan S, Yang S, Zhang Y, He J. Device Process and Circuit Application Interaction for Harsh Electronics: Hf–In–Zn–O Thin Film Transistors as an Example Ieee Electron Device Letters. 38: 1039-1042. DOI: 10.1109/Led.2017.2720186 |
0.398 |
|
2016 |
Youn K, Park JH, Lee J, Jeong WS, Ho CT, Jun M. The Identification of Biochanin A as a Potent and Selective β-Site App-Cleaving Enzyme 1 (Bace1) Inhibitor. Nutrients. 8. PMID 27754406 DOI: 10.3390/Nu8100637 |
0.345 |
|
2016 |
Youn K, Lee S, Jeong WS, Ho CT, Jun M. Protective Role of Corilagin on Aβ25-35-Induced Neurotoxicity: Suppression of NF-κB Signaling Pathway. Journal of Medicinal Food. PMID 27654707 DOI: 10.1089/Jmf.2016.3714 |
0.38 |
|
2016 |
Ho CH, Kim SY, Panagopoulos GD, Roy K. Statistical TDDB Degradation in Memory Circuits: Bit-Cells to Arrays Ieee Transactions On Electron Devices. DOI: 10.1109/Ted.2016.2557279 |
0.71 |
|
2016 |
Mungan ES, Lu C, Ho CH, Roy K. Effects of deposition process on poly-Si microscale energy harvesting systems: A simulation study Ieee Transactions On Electron Devices. 63: 1650-1657. DOI: 10.1109/Ted.2016.2535275 |
0.51 |
|
2015 |
Wang Y, Tsai ML, Chiou LY, Pan MH, Ho CT. Antitumor activity of garcinol in human prostate cancer cells and xenograft mice. Journal of Agricultural and Food Chemistry. PMID 26442822 DOI: 10.1021/Acs.Jafc.5B03851 |
0.535 |
|
2015 |
Panagopoulos G, Ho C, Kim SY, Roy K. Physics-Based Compact Modeling of Successive Breakdown in Ultrathin Oxides Ieee Transactions On Nanotechnology. 14: 7-9. DOI: 10.1109/Tnano.2014.2366379 |
0.71 |
|
2015 |
Ho CH, Jenkins KA, Ainspan H, Ray E, Linder BP, Song P. Performance Degradation Analysis and Hot-Carrier Injection Impact on the Lifetime Prediction of LC Voltage Control Oscillator Ieee Transactions On Electron Devices. DOI: 10.1109/Ted.2015.2436905 |
0.39 |
|
2015 |
Ho C, Kim SY, Roy K. Ultra-thin dielectric breakdown in devices and circuits: A brief review Microelectronics Reliability. 55: 308-317. DOI: 10.1016/J.Microrel.2014.10.019 |
0.568 |
|
2014 |
Hassan MK, Ho CH, Roy K. Stochastic modeling of positive bias temperature instability in high-metal gate nMOSFETs Ieee Transactions On Electron Devices. 61: 2243-2249. DOI: 10.1109/Ted.2014.2321064 |
0.586 |
|
2014 |
Kim SY, Ho C, Roy K. Statistical SBD Modeling and Characterization and Its Impact on SRAM Cells Ieee Transactions On Electron Devices. 61: 54-59. DOI: 10.1109/Ted.2013.2292060 |
0.607 |
|
2014 |
Ho CH, Hassan MK, Kim SY, Roy K. Analysis of stability degradation of SRAMs using a physics-based PBTI model Ieee Electron Device Letters. 35: 951-953. DOI: 10.1109/Led.2014.2340373 |
0.543 |
|
2014 |
Ho C, Lu C, Roy K. An Enhanced Voltage Programming Pixel Circuit for Compensating GB-Induced Variations in Poly-Si TFTs for AMOLED Displays Ieee\/Osa Journal of Display Technology. 10: 345-351. DOI: 10.1109/Jdt.2014.2301020 |
0.533 |
|
2014 |
Retamal JRD, Kang C, Ho C, Ke J, Chang W, He J. Effect of ultraviolet illumination on metal oxide resistive memory Applied Physics Letters. 105: 253111. DOI: 10.1063/1.4904396 |
0.316 |
|
2013 |
Ho C, Panagopoulos G, Roy K. A Self-Consistent Electrothermal Model for Analyzing NBTI Effect in p-Type Poly-Si Thin-Film Transistors Ieee Transactions On Electron Devices. 60: 288-294. DOI: 10.1109/Ted.2012.2228657 |
0.701 |
|
2012 |
Ho C, Panagopoulos G, Roy K. A Physical Model for Grain-Boundary-Induced Threshold Voltage Variation in Polysilicon Thin-Film Transistors Ieee Transactions On Electron Devices. 59: 2396-2402. DOI: 10.1109/Ted.2012.2205387 |
0.711 |
|
2011 |
Chiang Y, Chang W, Ho C, Chen C, Ho C, Lin S, Wu T, He J. Single-ZnO-Nanowire Memory Ieee Transactions On Electron Devices. 58: 1735-1740. DOI: 10.1109/Ted.2011.2121914 |
0.322 |
|
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