| Year |
Citation |
Score |
| 2012 |
DeFauw M, Nair VN, Yang Y. Cost-effectiveness analysis in health policy decision making: Direct methods for progressive multi-state processes Iie Transactions On Healthcare Systems Engineering. 2: 112-130. DOI: 10.1080/19488300.2012.680004 |
0.576 |
|
| 2012 |
Bingham D, Nair VN. Noise variable settings in robust design experiments Technometrics. 54: 388-397. DOI: 10.1080/00401706.2012.694787 |
0.333 |
|
| 2011 |
Dillard AJ, Ubel PA, Smith DM, Zikmund-Fisher BJ, Nair V, Derry HA, Zhang A, Pitsch RK, Alford SH, McClure JB, Fagerlin A. The distinct role of comparative risk perceptions in a breast cancer prevention program. Annals of Behavioral Medicine : a Publication of the Society of Behavioral Medicine. 42: 262-8. PMID 21698518 DOI: 10.1007/S12160-011-9287-8 |
0.368 |
|
| 2008 |
Nair V, Strecher V, Fagerlin A, Ubel P, Resnicow K, Murphy S, Little R, Chakraborty B, Zhang A. Screening experiments and the use of fractional factorial designs in behavioral intervention research. American Journal of Public Health. 98: 1354-9. PMID 18556602 DOI: 10.2105/Ajph.2007.127563 |
0.404 |
|
| 2008 |
Lawrence E, Liu C, Bingham D, Nair VN. Bayesian inference for multivariate ordinal data using parameter expansion Technometrics. 50: 182-191. DOI: 10.1198/004017008000000064 |
0.613 |
|
| 2007 |
Somboonsavatdee A, Nair VN, Sen A. Graphical estimators from probability plots with right-censored data Technometrics. 49: 420-429. DOI: 10.1198/004017007000000344 |
0.716 |
|
| 2007 |
Denby L, Landwehr JM, Mallows CL, Meloche J, Tuck J, Xi B, Michailidis G, Nair VN. Statistical aspects of the analysis of data networks Technometrics. 49: 318-334. DOI: 10.1198/004017007000000290 |
0.553 |
|
| 2006 |
Lawrence E, Michailidis G, Nair VN. Comment: Monitoring networked applications with incremental quantile estimation Statistical Science. 21: 479-482. DOI: 10.1214/088342306000000600 |
0.556 |
|
| 2006 |
Xi B, Michailidis G, Nair VN. Estimating network loss rates using active tomography Journal of the American Statistical Association. 101: 1430-1448. DOI: 10.1198/016214506000000366 |
0.546 |
|
| 2006 |
Mease D, Nair VN. Extreme (X-) testing with binary data and applications to reliability demonstration Technometrics. 48: 399-410. DOI: 10.1198/004017006000000138 |
0.688 |
|
| 2006 |
Lawrence E, Michailidis G, Nair VN. Network delay tomography using flexicast experiments Journal of the Royal Statistical Society. Series B: Statistical Methodology. 68: 785-813. DOI: 10.1111/J.1467-9868.2006.00567.X |
0.59 |
|
| 2004 |
Mease D, Nair VN, Sudjianto A. Selective assembly in manufacturing: Statistical issues and optimal binning strategies Technometrics. 46: 165-175. DOI: 10.1198/004017004000000185 |
0.695 |
|
| 2002 |
Jiang W, Wu H, Tsung F, Nair VN, Tsui KL. Proportional integral derivative charts for process monitoring Technometrics. 44: 205-214. DOI: 10.1198/004017002188618392 |
0.35 |
|
| 2002 |
Nair VN, Taam W, Ye KQ. Analysis of functional responses from robust design studies Journal of Quality Technology. 34: 355-371. DOI: 10.1080/00224065.2002.11980169 |
0.333 |
|
| 2001 |
Brenneman WA, Nair VN. Methods for identifying dispersion effects in unreplicated factorial experiments: A critical analysis and proposed strategies Technometrics. 43: 388-405. DOI: 10.1198/00401700152672483 |
0.745 |
|
| 2001 |
Nair VN, Tang B, Xu LA. Bayesian inference for some mixture problems in quality and reliability Journal of Quality Technology. 33: 16-28. DOI: 10.1080/00224065.2001.11980044 |
0.41 |
|
| 1998 |
Ehrlich WK, Nair VN, Alam MS, Chen WH, Engel M. Software reliability assessment using accelerated testing methods Journal of the Royal Statistical Society. Series C: Applied Statistics. 47: 15-30. DOI: 10.1111/1467-9876.00095 |
0.343 |
|
| 1997 |
Friedman DJ, Hansen MH, Nair VN, James DA. Model-free estimation of defect clustering in integrated circuit fabrication Ieee Transactions On Semiconductor Manufacturing. 10: 344-359. DOI: 10.1109/66.618208 |
0.354 |
|
| 1990 |
Nair VN. [A Critical Look at Accumulation Analysis and Related Methods]: Discussion Technometrics. 32: 151. DOI: 10.2307/1268857 |
0.321 |
|
| 1990 |
Hamada M, Wu CFJ, Haberman SJ, Hirotsu C, Koch GG, Tangen C, Tudor G, Stokes ME, Nair VN, Yanagisawa Y, Disney J, Bendell A. A critical look at accumulation analysis and related methods Technometrics. 32: 119-162. DOI: 10.2307/1268853 |
0.359 |
|
| 1988 |
Kalbfleisch JD, Lawless JF, Nair VN, Robinson JA. Estimation of reliability in field-performance studies Technometrics. 30: 365-388. DOI: 10.2307/1269797 |
0.373 |
|
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