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Suk J. Bae, Ph.D. - Publications

Affiliations: 
2003 Georgia Institute of Technology, Atlanta, GA 
Area:
Industrial Engineering
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43 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Yuan T, Bae SJ, Kuo Y. Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits Ieee Transactions On Reliability. 69: 510-521. DOI: 10.1109/Tr.2019.2943925  0.366
2020 Dong W, Liu S, Bae SJ, Liu Y. A multi-stage imperfect maintenance strategy for multi-state systems with variable user demands Computers & Industrial Engineering. 145: 106508. DOI: 10.1016/J.Cie.2020.106508  0.35
2020 Lin C, Cabrera J, Yang F, Ling MHA, Tsui K, Bae S. Battery state of health modeling and remaining useful life prediction through time series model Applied Energy. 275: 115338. DOI: 10.1016/J.Apenergy.2020.115338  0.432
2020 Kim S, Kwon D, Bae SJ. A drop-impact reliability assessment of mobile display modules using a statistical modeling approach Journal of Mechanical Science and Technology. 1-11. DOI: 10.1007/S12206-020-2204-Y  0.384
2019 Lim H, Kim YS, Bae SJ, Sung S. Partial accelerated degradation test plans for Wiener degradation processes Quality Technology and Quantitative Management. 16: 67-81. DOI: 10.1080/16843703.2017.1368968  0.356
2019 Yuan T, Wu X, Bae SJ, Zhu X. Reliability assessment of a continuous-state fuel cell stack system with multiple degrading components Reliability Engineering & System Safety. 189: 157-164. DOI: 10.1016/J.Ress.2019.04.021  0.361
2019 Kim SJ, Mun BM, Bae SJ. A cost-driven reliability demonstration plan based on accelerated degradation tests Reliability Engineering & System Safety. 183: 226-239. DOI: 10.1016/J.Ress.2018.11.017  0.436
2018 Mun BM, Choi YJ, Ji YM, Lee YJ, Lee KW, Na HJ, Yang JS, Bae SJ. Modeling and Analysis of Accelerated Degradation Testing Data for a Solid State Drive (SSD) Journal of Automated Reasoning. 18: 33-39. DOI: 10.33162/Jar.2018.03.18.1.33  0.357
2018 Wang P, Tang Y, Bae SJ, Xu A. Bayesian Approach for Two-Phase Degradation Data Based on Change-Point Wiener Process With Measurement Errors Ieee Transactions On Reliability. 67: 688-700. DOI: 10.1109/Tr.2017.2785978  0.495
2018 Wang P, Tang Y, Bae SJ, He Y. Bayesian analysis of two-phase degradation data based on change-point Wiener process Reliability Engineering & System Safety. 170: 244-256. DOI: 10.1016/J.Ress.2017.09.027  0.458
2018 Yang F, Wang D, Zhao Y, Tsui K, Bae SJ. A study of the relationship between coulombic efficiency and capacity degradation of commercial lithium-ion batteries Energy. 145: 486-495. DOI: 10.1016/J.Energy.2017.12.144  0.308
2017 Mun BM, Lee C, Kim N, Choi C, Kim Z, Bae SJ. Functional Reliability Estimation of Pin Pullers Based on a Probit Model Journal of the Korea Institute of Military Science and Technology. 20: 225-230. DOI: 10.9766/Kimst.2017.20.2.225  0.362
2016 Sung S, Kim H, Kim YS, Bae S, Kim J, Kim J. Development of Priority Calculation Models for Enacting and Revising the Korea Defense Standards and Specifications Journal of the Korean Society For Quality Management. 44: 109-120. DOI: 10.7469/Jksqm.2016.44.1.109  0.343
2016 Yuan T, Bae SJ, Zhu X. A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns Reliability Engineering and System Safety. 155: 55-63. DOI: 10.1016/J.Ress.2016.04.019  0.401
2016 Bae SJ, Yuan T, Kim S. Bayesian degradation modeling for reliability prediction of organic light-emitting diodes Journal of Computational Science. 17: 117-125. DOI: 10.1016/J.Jocs.2016.08.006  0.464
2016 Bae SJ, Do G, Kvam P. On data depth and the application of nonparametric multivariate statistical process control charts Applied Stochastic Models in Business and Industry. 32: 660-676. DOI: 10.1002/Asmb.2186  0.6
2015 Kim SJ, Yuan T, Bae SJ. A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides Ieee Transactions On Reliability. DOI: 10.1109/Tr.2015.2456183  0.369
2015 Haghighi F, Bae SJ. Reliability Estimation from Linear Degradation and Failure Time Data With Competing Risks Under a Step-Stress Accelerated Degradation Test Ieee Transactions On Reliability. 64: 960-971. DOI: 10.1109/Tr.2015.2430451  0.454
2015 Bae SJ, Yuan T, Ning S, Kuo W. A Bayesian approach to modeling two-phase degradation using change-point regression Reliability Engineering and System Safety. 134: 66-74. DOI: 10.1016/J.Ress.2014.10.009  0.419
2015 Bae SJ, Kvam PH. Discussion of 'stochastic modelling and analysis of degradation for highly reliable products' Applied Stochastic Models in Business and Industry. 31: 33-34. DOI: 10.1002/Asmb.2078  0.633
2014 Kim M, Bae SJ. Drop fragility of the display of a smart mobile phone: Weakest link failure or cumulative shock failure? Iie Transactions (Institute of Industrial Engineers). 46: 1079-1092. DOI: 10.1080/0740817X.2014.882039  0.366
2014 Bae SJ, Kim S, Lee J, Song I, Kim N, Seo Y, Kim KB, Lee N, Park J. Degradation pattern prediction of a polymer electrolyte membrane fuel cell stack with series reliability structure via durability data of single cells Applied Energy. 131: 48-55. DOI: 10.1016/J.Apenergy.2014.05.064  0.358
2014 Lee BJ, Kang CW, Kim SJ, Bae SJ. Optimal replacement strategy for stochastic deteriorating system with random wear limit under periodic inspections International Journal of Advanced Manufacturing Technology. 71: 219-231. DOI: 10.1007/S00170-013-5396-9  0.37
2013 Mun BM, Bae SJ, Kvam PH. A superposed log-linear failure intensity model for repairable artillery systems Journal of Quality Technology. 45: 100-115. DOI: 10.1080/00224065.2013.11917917  0.641
2013 Kim SJ, Bae SJ. Cost-effective degradation test plan for a nonlinear random-coefficients model Reliability Engineering and System Safety. 110: 68-79. DOI: 10.1016/J.Ress.2012.09.010  0.384
2013 Bae SJ, Mun BM, Kim KY. Change-point detection in failure intensity: A case study with repairable artillery systems Computers and Industrial Engineering. 64: 11-18. DOI: 10.1016/J.Cie.2012.09.010  0.352
2013 Yeom DH, Bae SJ. A constraint-based maximum entropy sampling method for kriging models in fuel cell applications Quality and Reliability Engineering International. 29: 819-828. DOI: 10.1002/Qre.1433  0.316
2012 Yamamoto H, Ke J, Bae SJ. Applied Statistics and Reliability Analysis Quality Technology and Quantitative Management. 9: 229-230. DOI: 10.1080/16843703.2012.11673288  0.336
2012 Bae SJ, Kim S, Park JI, Park CW, Lee J, Song I, Lee N, Kim K, Park J. Lifetime prediction of a polymer electrolyte membrane fuel cell via an accelerated startup–shutdown cycle test International Journal of Hydrogen Energy. 37: 9775-9781. DOI: 10.1016/J.Ijhydene.2012.03.104  0.386
2012 Park JI, Kim N, Bae SJ. A genetic-based iterative quantile regression algorithm for analyzing fatigue curves Quality and Reliability Engineering International. 28: 897-909. DOI: 10.1002/Qre.1280  0.342
2011 Yuan T, Ramadan SZ, Bae SJ. Yield prediction for integrated circuits manufacturing through hierarchical bayesian modeling of spatial defects Ieee Transactions On Reliability. 60: 729-741. DOI: 10.1109/Tr.2011.2161698  0.403
2010 Park JI, Bae SJ. Direct prediction methods on lifetime distribution of organic light-emitting diodes from accelerated degradation tests Ieee Transactions On Reliability. 59: 74-90. DOI: 10.1109/Tr.2010.2040761  0.44
2010 Bae SJ, Kim S, Park JI, Lee J, Cho H, Park J. Lifetime prediction through accelerated degradation testing of membrane electrode assemblies in direct methanol fuel cells International Journal of Hydrogen Energy. 35: 9166-9176. DOI: 10.1016/J.Ijhydene.2010.06.045  0.374
2010 Yuan T, Bae SJ, Park JI. Bayesian spatial defect pattern recognition in semiconductor fabrication using support vector clustering International Journal of Advanced Manufacturing Technology. 51: 671-683. DOI: 10.1007/S00170-010-2647-X  0.316
2009 Bae SJ, Kim S, Um S, Park J, Lee J, Cho H. A prediction model of degradation rate for membrane electrode assemblies in direct methanol fuel cells International Journal of Hydrogen Energy. 34: 5749-5758. DOI: 10.1016/J.Ijhydene.2009.04.071  0.424
2008 Bae SJ, Kim SJ, Kim MS, Lee BJ, Kang CW. Degradation analysis of nano-contamination in plasma display panels Ieee Transactions On Reliability. 57: 222-229. DOI: 10.1109/Tr.2008.917823  0.457
2007 Tan F, Jiang Z, Bae SJ. Generalized linear mixed models for reliability analysis of multi-copy repairable systems Ieee Transactions On Reliability. 56: 106-114. DOI: 10.1109/Tr.2006.884596  0.434
2007 Bae SJ, Hwang JY, Kuo W. Yield prediction via spatial modeling of clustered defect counts across a wafer map Iie Transactions (Institute of Industrial Engineers). 39: 1073-1083. DOI: 10.1080/07408170701275335  0.349
2007 Bae SJ, Kuo W, Kvam PH. Degradation models and implied lifetime distributions Reliability Engineering and System Safety. 92: 601-608. DOI: 10.1016/J.Ress.2006.02.002  0.644
2007 Tan FR, Jiang ZB, Kuo W, Bae SJ. Nonlinear mixed-effects models for repairable systems reliability Journal of Shanghai Jiaotong University (Science). 12: 283-288.  0.302
2006 Bae SJ, Tsui K. Analysis of Dynamic Robust Design Experiment with Explicit & Hidden Noise Variables Quality Technology and Quantitative Management. 3: 55-75. DOI: 10.1080/16843703.2006.11673100  0.382
2006 Bae SJ, Kvam PH. A change-point analysis for modeling incomplete burn-in for light displays Iie Transactions (Institute of Industrial Engineers). 38: 489-498. DOI: 10.1080/074081791009068  0.648
2004 Bae SJ, Kvam PH. A nonlinear random-coefficients model for degradation testing Technometrics. 46: 460-469. DOI: 10.1198/004017004000000464  0.667
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