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Sule Ozev, Ph.D. - Publications

Affiliations: 
2002 University of California, San Diego, La Jolla, CA 
 2008- Electrical, Computer and Energy Engineering Arizona State University, Tempe, AZ, United States 
Area:
Electronics and Electrical Engineering
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106 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Chang D, Kitchen JN, Kiaei S, Ozev S. In-Field Recovery of RF Circuits from Wearout Based Performance Degradation Ieee Transactions On Emerging Topics in Computing. 8: 442-452. DOI: 10.1109/Tetc.2017.2737320  0.394
2020 Erol OE, Ozev S. A Reconfigurable 0.1–10 MHz DT Passive Dynamic Zoom ADC for Cellular Receivers Ieee Transactions On Circuits and Systems. 67: 2216-2228. DOI: 10.1109/Tcsi.2020.2975890  0.344
2020 Bhat G, Gao H, Mandal SK, Ogras UY, Ozev S. Determining Mechanical Stress Testing Parameters for FHE Designs with Low Computational Overhead Ieee Design & Test of Computers. 37: 35-41. DOI: 10.1109/Mdat.2020.2968263  0.374
2019 Li Y, Yilmaz E, Sarson P, Ozev S. Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements Acm Transactions On Design Automation of Electronic Systems. 24: 45. DOI: 10.1145/3308566  0.538
2019 Erol OE, Ozev S. Knowledge- and Simulation-Based Synthesis of Area-Efficient Passive Loop Filter Incremental Zoom-ADC for Built-In Self-Test Applications Acm Transactions On Design Automation of Electronic Systems. 24: 3. DOI: 10.1145/3266227  0.406
2019 Jeong JW, Kitchen J, Ozev S. On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration Ieee Design & Test of Computers. 36: 117-125. DOI: 10.1109/Mdat.2019.2899054  0.416
2019 Badawi D, Ayhan T, Ozev S, Yang C, Orailoglu A, Çetin AE. Detecting Gas Vapor Leaks Using Uncalibrated Sensors Ieee Access. 7: 155701-155710. DOI: 10.1109/Access.2019.2949740  0.559
2019 Shafiee M, Ozev S. Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas Journal of Electronic Testing. 35: 335-347. DOI: 10.1007/S10836-019-05799-8  0.369
2018 Shafiee M, Beohar N, Bakliwal P, Roy S, Mandal D, Bakkaloglu B, Ozev S. A Disturbance-Free Built-In Self-Test and Diagnosis Technique for DC-DC Converters Acm Transactions On Design Automation of Electronic Systems. 23: 1-22. DOI: 10.1145/3152157  0.364
2018 Beohar N, Malladi VNK, Mandal D, Ozev S, Bakkaloglu B. Online Built-In Self-Test of High Switching Frequency DC–DC Converters Using Model Reference Based System Identification Techniques Ieee Transactions On Circuits and Systems I: Regular Papers. 65: 818-831. DOI: 10.1109/Tcsi.2017.2739479  0.361
2017 Jeong JW, Natarajan V, Sen S, Mak T, Kitchen J, Ozev S. A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources Acm Transactions On Design Automation of Electronic Systems. 23: 2. DOI: 10.1145/3084689  0.427
2017 Suresh CKH, Ozev S, Sinanoglu O. Adaptive Reduction of the Frequency Search Space for Multi- $V_{\mathrm{ dd}}$ Digital Circuits Using Variation Sensitive Ring Oscillators Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 36: 1043-1053. DOI: 10.1109/Tcad.2016.2613925  0.648
2017 Ozel MK, Cheperak M, Dar T, Kiaei S, Bakkaloglu B, Ozev S. An Electrical-Stimulus-Only BIST IC for Capacitive MEMS Accelerometer Sensitivity Characterization Ieee Sensors Journal. 17: 695-708. DOI: 10.1109/Jsen.2016.2636861  0.439
2016 Venkatasubramanian R, Elio R, Ozev S. Process independent design methodology for the active RC and single-inverter-based rail clamp Acm Transactions On Design Automation of Electronic Systems. 21. DOI: 10.1145/2851490  0.351
2016 Suresh CKH, Sinanoglu O, Ozev S. Adapting to varying distribution of unknown response bits Acm Transactions On Design Automation of Electronic Systems. 21. DOI: 10.1145/2835489  0.685
2016 Jeong JW, Kitchen J, Ozev S. Process independent gain measurement with low overhead via BIST/DUT co-design Proceedings of the Ieee Vlsi Test Symposium. 2016. DOI: 10.1109/VTS.2016.7477284  0.377
2016 Jeong JW, Nassery A, Kitchen JN, Ozev S. Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. DOI: 10.1109/Tvlsi.2015.2506547  0.433
2016 Venkatasubramanian R, Oertle K, Ozev S. A comparator-based rail clamp Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 24: 1493-1502. DOI: 10.1109/Tvlsi.2015.2446460  0.378
2016 Chang D, Kitchen JN, Bakkaloglu B, Kiaei S, Ozev S. Monitor-Based In-Field Wearout Mitigation for CMOS LC Oscillators Ieee Transactions On Device and Materials Reliability. 16: 183-193. DOI: 10.1109/Tdmr.2016.2557624  0.393
2016 Karabacak F, Ogras UY, Ozev S. Detection of malicious hardware components in mobile platforms Proceedings - International Symposium On Quality Electronic Design, Isqed. 2016: 179-184. DOI: 10.1109/ISQED.2016.7479197  0.329
2015 Suresh CKH, Ozev S, Sinanoglu O. Adaptive generation of unique IDs for digital chips through analog excitation Acm Transactions On Design Automation of Electronic Systems. 20. DOI: 10.1145/2732408  0.652
2015 Chang D, Kitchen JN, Bakkaloglu B, Kiaei S, Ozev S. Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. DOI: 10.1109/Tvlsi.2015.2428221  0.404
2015 Jeong JW, Kitchen J, Ozev S. A self-compensating built-in self-test solution for RF phased array mismatch Proceedings - International Test Conference. 2015. DOI: 10.1109/TEST.2015.7342414  0.3
2015 Yilmaz E, Ozev S. Adaptive-learning-based importance sampling for analog circuit DPPM estimation Ieee Design and Test. 32: 36-43. DOI: 10.1109/Mdat.2014.2361719  0.362
2015 Jeong JW, Kitchen J, Ozev S. Robust amplitude measurement for RF BIST applications Proceedings - 2015 20th Ieee European Test Symposium, Ets 2014. DOI: 10.1109/ETS.2015.7138762  0.351
2014 Jeong JW, Ozev S, Sen S, Natarajan V, Slamani M. Built-in self-test and characterization of polar transmitter parameters in the loop-back mode Proceedings -Design, Automation and Test in Europe, Date. DOI: 10.7873/DATE2014.382  0.333
2014 Chang D, Ozev S, Sinanoglu O, Karri R. Approximating the age of RF/analog circuits through re-characterization and statistical estimation Proceedings -Design, Automation and Test in Europe, Date. DOI: 10.7873/DATE2014.048  0.647
2014 Jeong JW, Ozev S, Taenzler F, Chao HC. Development and empirical verification of an accuracy model for the power down leakage tests Proceedings of the Ieee Vlsi Test Symposium. DOI: 10.1109/VTS.2014.6818786  0.381
2014 Nassery A, Byregowda S, Ozev S, Verhelst M, Slamani M. Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. DOI: 10.1109/Tvlsi.2014.2308317  0.404
2014 Yilmaz E, Nassery A, Ozev S. Built-In EVM measurement with negligible hardware overhead Ieee Design and Test. 31: 75-82. DOI: 10.1109/Mdat.2013.2265164  0.419
2013 Yilmaz E, Ozev S, Butler KM. Per-device adaptive test for analog/RF circuits using entropy-based process monitoring Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 21: 1116-1128. DOI: 10.1109/Tvlsi.2012.2205027  0.542
2013 Nassery A, Jeong JW, Ozev S. Zero-overhead self test and calibration of RF transceivers Proceedings - International Test Conference. DOI: 10.1109/TEST.2013.6651921  0.349
2013 Yilmaz E, Ozev S, Butler KM. Efficient process shift detection and test realignment Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 32: 1934-1942. DOI: 10.1109/Tcad.2013.2276614  0.525
2013 Suresh CKH, Yilmaz E, Ozev S, Sinanoglu O. Adaptive reduction of the frequency search space for multi-vdd digital circuits Proceedings -Design, Automation and Test in Europe, Date. 292-295.  0.446
2013 Deng L, Kundur V, Naga NSJ, Ozel MK, Yilmaz E, Ozev S, Bakkaloglu B, Kiaei S, Pratab D, Dar T. Electrical calibration of spring-mass MEMS capacitive accelerometers Proceedings -Design, Automation and Test in Europe, Date. 571-574.  0.305
2012 Nassery A, Byregowda S, Ozev S, Verhelst M, Slamani M. Built-in-self test of transmitter I/Q mismatch using self-mixing envelope detector Proceedings of the Ieee Vlsi Test Symposium. 56-61. DOI: 10.1109/VTS.2012.6231080  0.317
2012 Nassery A, Erol OE, Ozev S, Verhelst M. Test aignal development and analysis for OFDM systems RF front-end parameter extraction Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 958-967. DOI: 10.1109/Tcad.2012.2183370  0.495
2012 Yilmaz E, Ozev S. Test application for analog/RF circuits with low computational burden Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 968-979. DOI: 10.1109/Tcad.2011.2181846  0.582
2012 Yilmaz E, Ozev S, Sinanoglu O, Maxwell P. Adaptive testing: Conquering process variations Proceedings - 2012 17th Ieee European Test Symposium, Ets 2012. DOI: 10.1109/ETS.2012.6233045  0.658
2012 Suresh CKH, Sinanoglu O, Ozev S. Adaptive testing of chips with varying distributions of unknown response bits Proceedings - 2012 17th Ieee European Test Symposium, Ets 2012. DOI: 10.1109/ETS.2012.6233023  0.659
2012 Yilmaz E, Ozev S. Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information Proceedings - 2012 17th Ieee European Test Symposium, Ets 2012. DOI: 10.1109/ETS.2012.6233010  0.471
2012 Nassery A, Ozev S. An analytical technique for characterization of transceiver IQ imbalances in the loop-back mode Proceedings -Design, Automation and Test in Europe, Date. 1084-1089.  0.358
2011 Yilmaz E, Ozev S, Butler KM. Adaptive multidimensional outlier analysis for analog and mixed signal circuits Proceedings - International Test Conference. DOI: 10.1109/TEST.2011.6139178  0.435
2011 Erdogan ES, Ozev S. A multi-site test solution for quadrature modulation RF transceivers Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 30: 1421-1425. DOI: 10.1109/Tcad.2011.2144594  0.464
2011 Venkatasubramanian R, Chang D, Ozev S. Analysis and mitigation of electromigration in RF Circuits: An LNA case study Proceedings - 16th Ieee European Test Symposium, Ets 2011. 215. DOI: 10.1109/ETS.2011.50  0.301
2011 Nassery A, Ozev S, Verhelst M, Slamani M. Extraction of EVM from transmitter system parameters Proceedings - 16th Ieee European Test Symposium, Ets 2011. 75-80. DOI: 10.1109/ETS.2011.46  0.415
2011 Subrahmaniyan Radhakrishnan G, Ozev S. Adaptive modeling of analog/RF circuits for efficient fault response evaluation Journal of Electronic Testing: Theory and Applications (Jetta). 27: 465-476. DOI: 10.1007/S10836-011-5221-Z  0.414
2010 Acar E, Ozev S. Low cost MIMO testing for RF integrated circuits Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 18: 1348-1356. DOI: 10.1109/Tvlsi.2009.2024018  0.571
2010 Erdogan ES, Ozev S. Detailed characterization of transceiver parameters through loop-back-based BiST Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 18: 901-911. DOI: 10.1109/Tvlsi.2009.2017542  0.438
2010 Yilmaz E, Ozev S, Butler KM. Adaptive test flow for mixed-signal/RF circuits using learned information from device under test Proceedings - International Test Conference. DOI: 10.1109/TEST.2010.5699271  0.438
2009 Erdogan ES, Ozev S. A packet based 2x-site test solution for GSM transceivers with limited tester resources Proceedings of the Ieee Vlsi Test Symposium. 303-308. DOI: 10.1109/VTS.2009.44  0.362
2009 Bahukudumbi S, Ozev S, Chakrabarty K, Iyengar V. Wafer-level defect screening for big-D/small-A mixed-signal SoCs Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 17: 587-592. DOI: 10.1109/Tvlsi.2008.2006075  0.452
2009 Acar E, Ozev S. Low-cost characterization and calibration of RF integrated circuits through I-Q data analysis Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 28: 993-1005. DOI: 10.1109/Tcad.2009.2020718  0.528
2009 Yilmaz E, Ozev S. Defect-based test optimization for analog/RF circuits for near-zero DPPM applications Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 313-318. DOI: 10.1109/ICCD.2009.5413139  0.433
2009 Yilmaz E, Ozev S. Adaptive test elimination for analog/RF circuits Proceedings - Design Automation Conference. 720-725.  0.488
2008 Liu F, Ozev S, Nikolov PK. Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling Acm Transactions On Design Automation of Electronic Systems. 13. DOI: 10.1145/1344418.1344429  0.483
2008 Erdogan ES, Ozev S. Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers Proceedings of the Ieee Vlsi Test Symposium. 209-214. DOI: 10.1109/VTS.2008.39  0.427
2008 Acar E, Ozev S, Srinivasan G, Taenzler F. Optimized EVM testing for IEEE 802.11a/n RF ICs Proceedings - International Test Conference. DOI: 10.1109/TEST.2008.4700602  0.412
2008 Fang L, Acar E, Ozev S. Test yield estimation for analog/RF circuits over multiple correlated measurements Proceedings - International Test Conference. DOI: 10.1109/TEST.2007.4437643  0.407
2008 Acar E, Ozev S. Low cost characterization of RF transceivers through IQ data analysis Proceedings - International Test Conference. DOI: 10.1109/TEST.2007.4437641  0.454
2008 Acar E, Ozev S. Defect-oriented testing of RF circuits Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 27: 920-931. DOI: 10.1109/Tcad.2008.917578  0.563
2008 Erdogan ES, Ozev S, Cauvet P. Diagnosis of assembly failures for system-in-package RF tuners Proceedings - Ieee International Symposium On Circuits and Systems. 2286-2289. DOI: 10.1109/ISCAS.2008.4541910  0.347
2008 Yilmaz E, Ozev S. Dynamic test scheduling for analog circuits for improved test quality 26th Ieee International Conference On Computer Design 2008, Iccd. 227-233. DOI: 10.1109/ICCD.2008.4751866  0.444
2007 Romanescu BF, Bauer ME, Ozev S, Sorin DJ. VariaSim: simulating circuits and systems in the presence of process variability Acm Sigarch Computer Architecture News. 35: 45-48. DOI: 10.1145/1360464.1360465  0.362
2007 Bower FA, Sorin DJ, Ozev S. Online diagnosis of hard faults in microprocessors Acm Transactions On Architecture and Code Optimization. 4: 8. DOI: 10.1145/1250727.1250728  0.313
2007 Acar E, Ozev S, Redmond KB. A low-cost RF MIMO test method using a single measurement set-up Proceedings of the Ieee Vlsi Test Symposium. 3-8. DOI: 10.1109/VTS.2007.6  0.471
2007 Acar E, Ozev S. Go/No-Go testing of VCO modulation RF transceivers through the delayed-RF setup Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 15: 37-46. DOI: 10.1109/Tvlsi.2007.891082  0.569
2007 Erdogan ES, Ozev S. A robust, self-tuning CMOS circuit for built-in go/no-go testing of synthesizer phase noise Proceedings - International Test Conference. DOI: 10.1109/TEST.2006.297696  0.359
2007 Liu F, Ozev S. Statistical test development for analog circuits under high process variations Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 26: 1465-1477. DOI: 10.1109/Tcad.2007.891373  0.554
2007 Acar E, Ozev S. Digital calibration of RF transceivers for I-Q imbalances and nonlinearity 2007 Ieee International Conference On Computer Design, Iccd 2007. 512-517. DOI: 10.1109/ICCD.2007.4601946  0.332
2007 Erdogan ES, Ozev S. An ADC-BiST scheme using sequential code analysis Proceedings -Design, Automation and Test in Europe, Date. 713-718. DOI: 10.1109/DATE.2007.364679  0.375
2006 Su F, Ozev S, Chakrabarty K. Concurrent testing of digital microfluidics-based biochips Acm Transactions On Design Automation of Electronic Systems. 11: 442-464. DOI: 10.1145/1142155.1142164  0.521
2006 Sehgal A, Ozev S. Test infrastructure design for mixed-signal SOCs with wrapped analog cores Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 14: 292-304. DOI: 10.1109/Tvlsi.2006.871758  0.559
2006 Liu F, Ozev S, Brooke M. Identifying the source of BW failures in high-frequency linear analog circuits based on S-parameter measurements Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 25: 2594-2605. DOI: 10.1109/Tcad.2006.871619  0.431
2006 Acar E, Ozev S. Efficient testing of RF MIMO transceivers used in WLAN applications Ieee International Conference On Computer Design, Iccd 2006. 432-437. DOI: 10.1109/ICCD.2006.4380852  0.476
2006 Acar E, Ozev S, Redmond KB. Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 210-216. DOI: 10.1109/ICCAD.2006.320138  0.44
2005 Acar E, Ozev S. Diagnosis of the failing component in RF receivers through adaptive full-path measurements Proceedings of the Ieee Vlsi Test Symposium. 374-379. DOI: 10.1109/VTS.2005.42  0.387
2005 Acar E, Ozev S. Defect-based RF testing using a new catastrophic fault model Proceedings - International Test Conference. 2005: 421-429. DOI: 10.1109/TEST.2005.1584001  0.402
2005 Bower FA, Ozev S, Sorin DJ. Autonomic microprocessor execution via self-repairing arrays Ieee Transactions On Dependable and Secure Computing. 2: 297-310. DOI: 10.1109/Tdsc.2005.44  0.343
2005 Su F, Ozev S, Chakrabarty K. Ensuring the operational health of droplet-based microelectrofluidic biosensor systems Ieee Sensors Journal. 5: 763-772. DOI: 10.1109/Jsen.2005.848127  0.377
2005 Sehgal A, Ozev S, Chakrabarty K. A flexible design methodology for analog test wrappers in mixed-signal SOCs Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 2005: 137-142. DOI: 10.1109/ICCD.2005.8  0.479
2005 Liu F, Ozev S. Fast hierarchical process variability analysis and parametric test development for analog/RF circuits Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 2005: 161-168. DOI: 10.1109/ICCD.2005.54  0.49
2005 Acar E, Ozev S. Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 2005: 73-79. DOI: 10.1109/ICCAD.2005.1560043  0.46
2005 Carter JR, Ozev S, Sorin DJ. Circuit-level modeling for concurrent testing of operational defects due to gate oxide breakdown Proceedings -Design, Automation and Test in Europe, Date '05. 300-305. DOI: 10.1109/DATE.2005.94  0.337
2005 Sehgal A, Liu F, Ozev S, Chakrabarty K. Test planning for mixed-signal SOCs with wrapped analog cores Proceedings -Design, Automation and Test in Europe, Date '05. 50-55. DOI: 10.1109/DATE.2005.303  0.462
2005 Liu F, Flomenberg JJ, Yasaratne DV, Ozev S. Hierarchical variance analysis for analog circuits based on graph modelling and correlation loop tracing Proceedings -Design, Automation and Test in Europe, Date '05. 126-131. DOI: 10.1109/DATE.2005.175  0.359
2004 Ozev S, Olgaard C. Wafer-level RF test and DfT for VCO modulating transceiver architecures Proceedings of the Ieee Vlsi Test Symposium. 217-222. DOI: 10.1109/VTEST.2004.1299246  0.403
2004 Ozev S, Orailoglu A. Design of concurrent test hardware for linear analog circuits with constrained hardware overhead Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 12: 756-765. DOI: 10.1109/Tvlsi.2004.827597  0.627
2004 Ozev S, Bayraktaroglu I, Orailoglu A. Seamless Test of Digital Components in Mixed-Signal Paths Ieee Design and Test of Computers. 21: 44-55. DOI: 10.1109/Mdt.2004.1261849  0.781
2004 Ozev S, Orailoglu A. End-to-end testability analysis and DfT insertion for mixed-signal paths Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 72-77. DOI: 10.1109/ICCD.2004.1347902  0.585
2004 Su F, Ozev S, Chakrabarty K. Test planning and test resource optimization for droplet-based microfluidic systems Proceedings - Ninth Ieee European Test Symposium, Ets 2004. 72-77. DOI: 10.1007/S10836-005-1256-3  0.447
2004 Acar E, Ozev S. Delayed-RF based test development for FM transceivers using signature Analysis Proceedings - International Test Conference. 783-792.  0.442
2004 Su F, Ozev S, Chakrabarty K. Concurrent testing of droplet-based microfluidic systems for multiplexed biomedical assays Proceedings - International Test Conference. 883-892.  0.42
2003 Ozev S, Orailoglu A. Automated system-level test development for mixed-signal circuits Analog Integrated Circuits and Signal Processing. 35: 169-178. DOI: 10.1023/A:1024130616851  0.708
2003 Ozev S, Orailoglu A. Statistical tolerance analysis for assured analog test coverage Journal of Electronic Testing: Theory and Applications (Jetta). 19: 173-182. DOI: 10.1023/A:1022893724851  0.7
2003 Sehgal A, Ozev S, Chakrabarty K. TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers. 95-99.  0.463
2003 Su F, Ozev S, Chakrabarty K. Testing of Droplet-Based Microelectrofluidic Systems Ieee International Test Conference (Tc). 1192-1200.  0.349
2002 Ozev S, Orailoglu A. Boosting the accuracy of analog test coverage computation through statistical tolerance analysis Proceedings of the Ieee Vlsi Test Symposium. 2002: 213-219. DOI: 10.1109/VTS.2002.1011141  0.673
2002 Ozev S, Olgaard CV, Orailoglu A. Multilevel testability analysis and solutions for integrated bluetooth transceivers Ieee Design and Test of Computers. 19: 82-91. DOI: 10.1109/Mdt.2002.1033796  0.589
2002 Ozev S, Orailoglu A. An integrated tool for analog test generation and fault simulation Proceedings - International Symposium On Quality Electronic Design, Isqed. 2002: 267-272. DOI: 10.1109/ISQED.2002.996748  0.653
2002 Ozev S, Orailoglu A. Cost-effective concurrent test hardware design for linear analog circuits Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 258-264.  0.603
2002 Ozev S, Orailoglu A, Haggag H. Automated test development and test time reduction for RF subsystems Proceedings - Ieee International Symposium On Circuits and Systems. 1.  0.66
2001 Ozev S, Orailoglu A. System-level test synthesis for mixed-signal designs Ieee Transactions On Circuits and Systems Ii: Analog and Digital Signal Processing. 48: 588-599. DOI: 10.1109/82.943329  0.675
2001 Ozev S, Olgaard C, Orailoglu A. Testability implications in low-cost integrated radio transceivers: A Bluetooth case study Ieee International Test Conference (Tc). 965-974.  0.561
2000 Ozev S, Orailoglu A. Path-based test composition for mixed-signal SOC's 2000 Southwest Symposium On Mixed-Signal Design, Ssmsd 2000. 153-158. DOI: 10.1109/SSMSD.2000.836464  0.672
2000 Ozev S, Bayraktaroglu I, Orailogiu A. Test synthesis for mixed-signal SOC paths Proceedings -Design, Automation and Test in Europe, Date. 128-133. DOI: 10.1109/DATE.2000.840028  0.769
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