| Year |
Citation |
Score |
| 2020 |
Wang H, Guo X, Tan SX, Zhang C, Tang H, Yuan Y. Leakage-Aware Predictive Thermal Management for Multicore Systems Using Echo State Network Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 39: 1400-1413. DOI: 10.1109/Tcad.2019.2915316 |
0.506 |
|
| 2019 |
Wang H, Tang D, Zhang M, Tan SX, Zhang C, Tang H, Yuan Y. GDP: A Greedy Based Dynamic Power Budgeting Method for Multi/Many-Core Systems in Dark Silicon Ieee Transactions On Computers. 68: 526-541. DOI: 10.1109/Tc.2018.2875986 |
0.509 |
|
| 2018 |
Wang S, Kim T, Sun Z, Tan SX, Tahoori MB. Recovery-Aware Proactive TSV Repair for Electromigration Lifetime Enhancement in 3-D ICs Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 26: 531-543. DOI: 10.1109/Tvlsi.2017.2775586 |
0.546 |
|
| 2018 |
Peng S, Zhou H, Kim T, Chen H, Tan SX. Physics-Based Compact TDDB Models for Low- $k$ BEOL Copper Interconnects With Time-Varying Voltage Stressing Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 26: 239-248. DOI: 10.1109/Tvlsi.2017.2764880 |
0.579 |
|
| 2018 |
Wang H, Wan J, Tan SX, Zhang C, Tang H, Yuan Y, Huang K, Zhang Z. A Fast Leakage-Aware Full-Chip Transient Thermal Estimation Method Ieee Transactions On Computers. 67: 617-630. DOI: 10.1109/Tc.2017.2778066 |
0.514 |
|
| 2018 |
Kim T, Tan SX, Cook C, Sun Z. Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy Integration. 63: 31-40. DOI: 10.1016/J.Vlsi.2018.05.002 |
0.472 |
|
| 2018 |
Tan SX, Amrouch H, Kim T, Sun Z, Cook C, Henkel J. Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited) Integration. 60: 132-152. DOI: 10.1016/J.Vlsi.2017.08.009 |
0.592 |
|
| 2018 |
Kim T, Liu Z, Tan SX. Dynamic reliability management based on resource-based EM modeling for multi-core microprocessors Microelectronics Journal. 74: 106-115. DOI: 10.1016/J.Mejo.2018.01.024 |
0.627 |
|
| 2017 |
Kim T, Sun Z, Chen H, Wang H, Tan SX. Energy and Lifetime Optimizations for Dark Silicon Manycore Microprocessor Considering Both Hard and Soft Errors Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 25: 2561-2574. DOI: 10.1109/Tvlsi.2017.2707401 |
0.591 |
|
| 2017 |
Chen H, Tan SX, Peng J, Kim T, Chen J. Analytical Modeling of Electromigration Failure for VLSI Interconnect Tree Considering Temperature and Segment Length Effects Ieee Transactions On Device and Materials Reliability. 17: 653-666. DOI: 10.1109/Tdmr.2017.2746660 |
0.593 |
|
| 2017 |
Huang X, Sukharev V, Kim T, Tan SX. Dynamic electromigration modeling for transient stress evolution and recovery under time-dependent current and temperature stressing Integration. 58: 518-527. DOI: 10.1016/J.Vlsi.2016.10.007 |
0.6 |
|
| 2016 |
Zhao Y, Kim T, Shin H, Tan SX, Li X, Chen H, Wang H. Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection Acm Transactions On Design Automation of Electronic Systems. 21: 1-21. DOI: 10.1145/2875422 |
0.566 |
|
| 2016 |
He K, Tan S. Corrections to “GPU-Accelerated Parallel Sparse LU Factorization Method for Fast Circuit Analysis” Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. DOI: 10.1109/Tvlsi.2015.2507135 |
0.326 |
|
| 2016 |
Chen H, Tan SX, Huang X, Kim T, Sukharev V. Analytical Modeling and Characterization of Electromigration Effects for Multibranch Interconnect Trees Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 35: 1811-1824. DOI: 10.1109/Tcad.2016.2523898 |
0.55 |
|
| 2015 |
Phua YW, Nguyen A, Roden D, Elsworth B, Deng N, Nikolic I, Yang J, Mcfarland A, Russell R, Kaplan W, Cowley M, Nair R, Zotenko E, O'Toole S, Tan SX, et al. MicroRNA profiling of the pubertal mouse mammary gland identifies miR-184 as a candidate breast tumour suppressor gene. Breast Cancer Research : Bcr. 17: 83. PMID 26070602 DOI: 10.1186/S13058-015-0593-0 |
0.302 |
|
| 2013 |
Wang H, Tan SX, Li D, Gupta A, Yuan Y. Composable thermal modeling and simulation for architecture-level thermal designs of multicore microprocessors Acm Transactions On Design Automation of Electronic Systems. 18: 1-27. DOI: 10.1145/2442087.2442099 |
0.582 |
|
| 2012 |
Yan B, Tan SX, Zhou L, Chen J, Shen R. Decentralized and Passive Model Order Reduction of Linear Networks With Massive Ports Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 20: 865-877. DOI: 10.1109/Tvlsi.2011.2126612 |
0.405 |
|
| 2010 |
Li D, Tan SX, Pacheco EH, Tirumala M. Parameterized architecture-level dynamic thermal models for multicore microprocessors Acm Transactions On Design Automation of Electronic Systems. 15: 1-22. DOI: 10.1145/1698759.1698766 |
0.549 |
|
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