☰

Juntao Li, Ph.D. - Publications

Affiliations: 
2010 Nanoscale Science and Engineering-Nanoscale Science State University of New York, Albany, Albany, NY, United States 
Area:
Materials Science Engineering, Nanoscience, Nanotechnology
Tree Info Similar researchers PubMed Report error

9 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2017 Muthinti GR, Loubet N, Chao R, Peña AAdl, Li J, Guillorn MA, Yamashita T, Kanakasabapathy S, Gaudiello J, Cepler AJ, Sendelbach M, Emans S, Wolfling S, Ger A, Kandel D, et al. Materials characterization for process integration of multi-channel gate all around (GAA) devices Proceedings of Spie. 10145. DOI: 10.1117/12.2261377  0.309
2017 Li J, Bruley J, Conti R, Belyansky M, Metha S, Strane J, Tai L, Jiang L, Demarest J, Gaudiello J, Zhu Y, Grill A. Quantitative Electron Energy Loss Spectroscopy (EELS) Analysis of Flowable CVD Oxide for Shallow Trench Isolation of finFET Integration Microscopy and Microanalysis. 23: 1462-1463. DOI: 10.1017/S1431927617007978  0.37
2015 Jamison PC, Tsunoda T, Vo TA, Li J, Jagannathan H, Shinde SR, Paruchuri VK, Gall D. SiO₂ Free HfO₂ Gate Dielectrics by Physical Vapor Deposition Ieee Transactions On Electron Devices. DOI: 10.1109/Ted.2015.2454953  0.347
2014 Li J, Cheng K, Khakifirooz A, Wang J, Reznicek A, Madan A, Dons B, Loubet N, He H, Gaudiello J. Strain quantification analysis of epitaxial SiGe on SOI by nanobeam diffraction (NBD) Microscopy and Microanalysis. 20: 1070-1071. DOI: 10.1017/S1431927614007077  0.301
2010 Li J, Toth M, Dunn KA, Thiel BL. Interfacial mixing and internal structure of Pt-containing nanocomposites grown by room temperature electron beam induced deposition Journal of Applied Physics. 107. DOI: 10.1063/1.3428427  0.659
2009 Botman A, Hagen CW, Li J, Thiel BL, Dunn KA, Mulders JJL, Randolph S, Toth M. Electron postgrowth irradiation of platinum-containing nanostructures grown by electron-beam-induced deposition from Pt (P F3)4 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27: 2759-2763. DOI: 10.1116/1.3253551  0.656
2008 Brainard R, Hassanein E, Li J, Pathak P, Thiel B, Cerrina F, Moore R, Rodriguez M, Yakshinskiy B, Loginova E, Madey T, Matyi R, Malloy M, Rudack A, Naulleau P, et al. Photons, electrons, and acid yields in EUV photoresists: A progress report Proceedings of Spie - the International Society For Optical Engineering. 6923. DOI: 10.1117/12.773869  0.564
2008 Li J, Toth M, Tileli V, Dunn KA, Lobo CJ, Thiel BL. Evolution of the nanostructure of deposits grown by electron beam induced deposition Applied Physics Letters. 93. DOI: 10.1063/1.2959112  0.659
2007 Li J, Bresin M, Dunn K, Thiel B. Determination of Impurity Carbon sp2/sp3 Bond Ratio in Electron Beam Deposited Tungsten Nanostructures using Electron Energy Loss Spectroscopy Microscopy and Microanalysis. 13: 1472-1473. DOI: 10.1017/S1431927607078270  0.618
Show low-probability matches.