Year |
Citation |
Score |
2017 |
Muthinti GR, Loubet N, Chao R, Peña AAdl, Li J, Guillorn MA, Yamashita T, Kanakasabapathy S, Gaudiello J, Cepler AJ, Sendelbach M, Emans S, Wolfling S, Ger A, Kandel D, et al. Materials characterization for process integration of multi-channel gate all around (GAA) devices Proceedings of Spie. 10145. DOI: 10.1117/12.2261377 |
0.309 |
|
2017 |
Li J, Bruley J, Conti R, Belyansky M, Metha S, Strane J, Tai L, Jiang L, Demarest J, Gaudiello J, Zhu Y, Grill A. Quantitative Electron Energy Loss Spectroscopy (EELS) Analysis of Flowable CVD Oxide for Shallow Trench Isolation of finFET Integration Microscopy and Microanalysis. 23: 1462-1463. DOI: 10.1017/S1431927617007978 |
0.37 |
|
2015 |
Jamison PC, Tsunoda T, Vo TA, Li J, Jagannathan H, Shinde SR, Paruchuri VK, Gall D. SiO₂ Free HfO₂ Gate Dielectrics by Physical Vapor Deposition Ieee Transactions On Electron Devices. DOI: 10.1109/Ted.2015.2454953 |
0.347 |
|
2014 |
Li J, Cheng K, Khakifirooz A, Wang J, Reznicek A, Madan A, Dons B, Loubet N, He H, Gaudiello J. Strain quantification analysis of epitaxial SiGe on SOI by nanobeam diffraction (NBD) Microscopy and Microanalysis. 20: 1070-1071. DOI: 10.1017/S1431927614007077 |
0.301 |
|
2010 |
Li J, Toth M, Dunn KA, Thiel BL. Interfacial mixing and internal structure of Pt-containing nanocomposites grown by room temperature electron beam induced deposition Journal of Applied Physics. 107. DOI: 10.1063/1.3428427 |
0.659 |
|
2009 |
Botman A, Hagen CW, Li J, Thiel BL, Dunn KA, Mulders JJL, Randolph S, Toth M. Electron postgrowth irradiation of platinum-containing nanostructures grown by electron-beam-induced deposition from Pt (P F3)4 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27: 2759-2763. DOI: 10.1116/1.3253551 |
0.656 |
|
2008 |
Brainard R, Hassanein E, Li J, Pathak P, Thiel B, Cerrina F, Moore R, Rodriguez M, Yakshinskiy B, Loginova E, Madey T, Matyi R, Malloy M, Rudack A, Naulleau P, et al. Photons, electrons, and acid yields in EUV photoresists: A progress report Proceedings of Spie - the International Society For Optical Engineering. 6923. DOI: 10.1117/12.773869 |
0.564 |
|
2008 |
Li J, Toth M, Tileli V, Dunn KA, Lobo CJ, Thiel BL. Evolution of the nanostructure of deposits grown by electron beam induced deposition Applied Physics Letters. 93. DOI: 10.1063/1.2959112 |
0.659 |
|
2007 |
Li J, Bresin M, Dunn K, Thiel B. Determination of Impurity Carbon sp2/sp3 Bond Ratio in Electron Beam Deposited Tungsten Nanostructures using Electron Energy Loss Spectroscopy Microscopy and Microanalysis. 13: 1472-1473. DOI: 10.1017/S1431927607078270 |
0.618 |
|
Show low-probability matches. |