Year |
Citation |
Score |
2013 |
Yazawa K, Kendig D, Christofferson J, Shakouri A. A method for failure analysis for devices with simultaneous imaging of electron emission and near IR thermoreflectance Asme 2013 International Technical Conference and Exhibition On Packaging and Integration of Electronic and Photonic Microsystems, Interpack 2013. 2. DOI: 10.1115/IPACK2013-73104 |
0.6 |
|
2013 |
Vermeersch B, Bahk JH, Christofferson J, Shakouri A. Thermoreflectance imaging of sub 100 ns pulsed cooling in high-speed thermoelectric microcoolers Journal of Applied Physics. 113. DOI: 10.1063/1.4794166 |
0.564 |
|
2012 |
Yazawa K, Kendig D, Christofferson J, Marconnet A, Shakouri A. Fast transient and steady state thermal imaging of CMOS integrated circuit chips considering package thermal boundaries Intersociety Conference On Thermal and Thermomechanical Phenomena in Electronic Systems, Itherm. 1405-1411. DOI: 10.1109/ITHERM.2012.6231584 |
0.397 |
|
2011 |
Vermeersch B, Bank JH, Christofferson J, Shakouri A. Design and thermoreflectance imaging of high-speed SiGe superlattice microrefrigerators Materials Research Society Symposium Proceedings. 1329: 1-6. DOI: 10.1557/Opl.2011.1232 |
0.675 |
|
2011 |
Alavi S, Yazawa K, Alers G, Vermeersch B, Christofferson J, Shakouri A. Thermal imaging for reliability characterization of copper vias Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 17-20. DOI: 10.1109/STHERM.2011.5767172 |
0.43 |
|
2010 |
Christofferson J, Yazawa K, Shakouri A. Picosecond transient thermal imaging using a CCD based thermoreflectance system 2010 14th International Heat Transfer Conference, Ihtc 14. 4: 93-97. DOI: 10.1115/IHTC14-22969 |
0.587 |
|
2010 |
Vermeersch B, Christofferson J, Maize K, Shakouri A, De Mey G. Time and frequency domain CCD-based thermoreflectance techniques for high-resolution transient thermal imaging Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 228-234. DOI: 10.1109/STHERM.2010.5444287 |
0.368 |
|
2010 |
Park JH, Shin S, Christofferson J, Shakouri A, Kang SM. Experimental validation of the power blurring method Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 240-244. DOI: 10.1109/STHERM.2010.5444285 |
0.542 |
|
2010 |
Kendig D, Christofferson J, Alers GB, Shakouri A. Application of thermoreflectance imaging to identify defects in photovoltaic solar cells Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 245-248. DOI: 10.1109/STHERM.2010.5444282 |
0.514 |
|
2009 |
Michel H, Coppard R, Kendig D, Christofferson J, Maize K, Shakouri A. Transient Thermal Imaging of Si/SiGe superlattice and bulk Si microrefrigerators Mrs Proceedings. 1218. DOI: 10.1557/Proc-1218-Z02-01 |
0.671 |
|
2009 |
Ezzahri Y, Christofferson J, Maize K, Shakouri A. Short time transient behavior of SiGe-based microrefrigerators Materials Research Society Symposium Proceedings. 1166: 13-19. DOI: 10.1557/Proc-1166-N01-06 |
0.708 |
|
2009 |
Singh R, Nurnus J, Bian Z, Christofferson J, Shakouri A. Temperature profile inside microscale thermoelectric module acquired using near-infrared thermoreflectance Ieee Transactions On Components and Packaging Technologies. 32: 447-452. DOI: 10.1109/Tcapt.2008.2011886 |
0.769 |
|
2009 |
Christofferson J, Ezzahri Y, Maize K, Shakouri A. Transient thermal imaging of pulsed-operation superlattice micro-refrigerators Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 45-49. DOI: 10.1109/STHERM.2009.4810741 |
0.653 |
|
2009 |
Wang X, Ezzahri Y, Christofferson J, Shakouri A. Bias-dependent MOS transistor thermal resistance and non-uniform self-heating temperature Journal of Physics D: Applied Physics. 42. DOI: 10.1088/0022-3727/42/7/075101 |
0.66 |
|
2009 |
Ezzahri Y, Christofferson J, Zeng G, Shakouri A. Short time transient thermal behavior of solid-state microrefrigerators Journal of Applied Physics. 106. DOI: 10.1063/1.3266173 |
0.689 |
|
2008 |
Christofferson J, Maize K, Ezzahri Y, Shabani J, Wang X, Shakouri A. Microscale and nanoscale thermal characterization techniques Journal of Electronic Packaging, Transactions of the Asme. 130: 0411011-0411016. DOI: 10.1115/1.2993145 |
0.701 |
|
2008 |
Maize K, Christofferson J, Shakouri A. Transient thermal imaging using thermoreflectance Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 55-58. DOI: 10.1109/STHERM.2008.4509366 |
0.628 |
|
2008 |
Singh R, Christofferson J, Bian Z, Shakouri A, Nurnus J, Schubert A. Characterization of thin-film thermoelectric micro-modules using transient harman ZT measurement and near IR thermoreflectance Materials Research Society Symposium Proceedings. 1044: 421-426. |
0.472 |
|
2007 |
Farsiu S, Christofferson J, Eriksson B, Milanfar P, Friedlander B, Shakouri A, Nowak R. Statistical detection and imaging of objects hidden in turbid media using ballistic photons. Applied Optics. 46: 5805-22. PMID 17694130 DOI: 10.1364/Ao.46.005805 |
0.517 |
|
2007 |
Singh R, Christofferson J, Bian Z, Nurnus J, Schubert A, Shakouri A. Characterization of Thin-film Thermoelectric Micro-modules using Transient Harman ZT Measurement and Near-IR Thermoreflectance Mrs Proceedings. 1044. DOI: 10.1557/Proc-1044-U10-01 |
0.758 |
|
2007 |
Wang X, Ezzahri Y, Christofferson J, Zhang Y, Shakouri A, Shi L, Yu C, Wang ZL. Characterization of Heat Propagation along Single Tin Dioxide Nanobelt Using the Thermoreflectance Method Mrs Proceedings. 1022. DOI: 10.1557/Proc-1022-Ii05-05 |
0.679 |
|
2007 |
Ezzahri Y, Singh R, Christofferson J, Bian Z, Shakouri A. Optimization of Si/SiGe microrefrigerators for hybrid solid-state/liquid cooling 2007 Proceedings of the Asme Interpack Conference, Ipack 2007. 2: 265-275. DOI: 10.1115/IPACK2007-33878 |
0.696 |
|
2007 |
Wang X, Ezzahri Y, Christofferson J, Zhang Y, Shakouri A, Shi L, Yu C, Wang ZL. Characterization of heat propagation along single tin dioxide nanobelt using the thermoreflectance method Materials Research Society Symposium Proceedings. 1022: 38-43. |
0.476 |
|
2006 |
Zhang Y, Christofferson J, Shakouri A, Li D, Majumdar A, Wu Y, Fan R, Yang P. Characterization of heat transfer along a silicon nanowire using thermoreflectance technique Ieee Transactions On Nanotechnology. 5: 67-73. DOI: 10.1109/Tnano.2005.861769 |
0.689 |
|
2006 |
Zhang Y, Christofferson J, Shakouri A, Zeng G, Bowers JE, Croke ET. On-chip high speed localized cooling using superlattice microrefrigerators Ieee Transactions On Components and Packaging Technologies. 29: 395-401. DOI: 10.1109/Tcapt.2006.875884 |
0.607 |
|
2006 |
Singh R, Bian Z, Zeng G, Zide J, Christofferson J, Chou HF, Gossard A, Bowers J, Shakouri A. Transient Harman measurement of the cross-plane ZT of InGaAs/InGaAlAs superlattices with embedded ErAs nanoparticles Materials Research Society Symposium Proceedings. 886: 123-128. |
0.359 |
|
2005 |
Singh R, Bian Z, Zeng G, Zide J, Christofferson J, Chou H, Gossard A, Bowers J, Shakouri A. Transient Harman Measurement of the Cross-plane ZT of InGaAs/InGaAlAs Superlattices with Embedded ErAs Nanoparticles Mrs Proceedings. 886. DOI: 10.1557/Proc-0886-F04-04 |
0.715 |
|
2005 |
Kozodoy P, Strand TA, Akulova YA, Fish G, Schow C, Koh PC, Bian Z, Christofferson J, Shakouri A. Thermal effects in monolithically integrated tunable laser transmitters Ieee Transactions On Components and Packaging Technologies. 28: 651-657. DOI: 10.1109/Tcapt.2005.859736 |
0.716 |
|
2005 |
Vashaee D, Christofferson J, Zhang Y, Shakouri A, Zeng G, LaBounty C, Fan X, Piprek J, Bowers JE, Croke E. Modeling and optimization of single-element bulk SiGe thin-film coolers Microscale Thermophysical Engineering. 9: 99-118. DOI: 10.1080/10893950590913459 |
0.712 |
|
2005 |
Christofferson J, Shakouri A. Thermoreflectance based thermal microscope Review of Scientific Instruments. 76. DOI: 10.1063/1.1850632 |
0.586 |
|
2004 |
Christofferson J, Shakouri A. Thermal measurements of active semiconductor micro-structures acquired through the substrate using near IR thermoreflectance Microelectronics Journal. 35: 791-796. DOI: 10.1016/J.Mejo.2004.06.009 |
0.656 |
|
2004 |
Christofferson J, Shakouri A. Camera for thermal imaging of semiconductor devices based on thermoreflectance Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 20: 87-91. |
0.625 |
|
2004 |
Kozodoy P, Strand T, Akulova Y, Fish G, Schow C, Koh P, Bian Z, Christofferson J, Shakouri A. Thermal effects in monolithically integrated tunable laser transmitters Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 20: 177-183. |
0.439 |
|
2003 |
Zeng G, Fan X, LaBounty C, Croke E, Zhang Y, Christofferson J, Vashaee D, Shakouri A, Bowers JE. Cooling Power Density of SiGe/Si Superlattice Micro Refrigerators Mrs Proceedings. 793. DOI: 10.1557/Proc-793-S2.2 |
0.756 |
|
2003 |
Zeng G, Shakouri A, Croke E, Zhang Y, Christofferson J, Bowers JE. SiGeC Cantilever Micro Cooler Mrs Proceedings. 793. DOI: 10.1557/Proc-793-S11.3 |
0.627 |
|
2003 |
Zhang Y, Vashaee D, Christofferson J, Shakouri A, Zeng G, Labounty C, Piprek J, Croke E. 3D electrothermal simulation of heterostructure thin film micro-coolers American Society of Mechanical Engineers, Advanced Energy Systems Division (Publication) Aes. 43: 39-48. DOI: 10.1115/IMECE2003-42767 |
0.718 |
|
2003 |
Dilhaire S, Ezzahri Y, Grauby S, Claeys W, Christofferson J, Zhang Y, Shakouri A. Thermal and thermomechanical study of micro-refrigerators on a chip based on semiconductor heterostructures International Conference On Thermoelectrics, Ict, Proceedings. 2003: 519-523. DOI: 10.1109/ICT.2003.1287563 |
0.676 |
|
2003 |
Bian Z, Christofferson J, Shakouri A, Kozodoy P. High-power operation of electroabsorption modulators Applied Physics Letters. 83: 3605-3607. DOI: 10.1063/1.1623338 |
0.616 |
|
2003 |
Zeng G, Shakouri A, Croke E, Zhang Y, Christofferson J, Bowers JE. SiGeC cantilever micro cooler Materials Research Society Symposium - Proceedings. 793: 439-445. |
0.396 |
|
2003 |
Christofferson J, Shakouri A. Through the substrate, backside thermal measurements on active semiconductor devices using near IR thermoreflectance Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 271-275. |
0.665 |
|
2003 |
Zhang Y, Christofferson J, Shakouri A, Zeng G, Bowers JE, Croke E. High speed localized cooling using SiGe superlattice microrefrigerators Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 61-65. |
0.337 |
|
2003 |
Zeng G, Fan X, LaBounty C, Croke E, Zhang Y, Christofferson J, Vashaee D, Shakouri A, Bowers JE. Cooling power density of SiGe/Si superlattice micro refrigerators Materials Research Society Symposium - Proceedings. 793: 43-49. |
0.69 |
|
2003 |
Zhang Y, Christofferson J, Vashaee D, Nguyen P, Shakouri A, Zeng G, Labounty C, Okuno Y, Chiu YJ, Bowers JE. Thin film coolers for localized temperature control in optoelectronic integrated circuits Proceedings - Electronic Components and Technology Conference. 312-316. |
0.664 |
|
2003 |
Bian Z, Christofferson J, Shakouri A, Kozodoy P. High power operation of electroabsorption modulators Osa Trends in Optics and Photonics Series. 88: 562-566. |
0.499 |
|
2002 |
Zhang Y, Zeng G, Singh R, Christofferson J, Croke E, Bowers JE, Shakouri A. Measurement of Seebeck coefficient perpendicular to SiGe superlattice International Conference On Thermoelectrics, Ict, Proceedings. 2002: 329-332. DOI: 10.1109/ICT.2002.1190332 |
0.604 |
|
2002 |
Zeng G, Fan X, LaBounty C, Bowers JE, Croke E, Christofferson J, Vashaee D, Zhang Y, Shakouri A. High cooling power density of SiGe/Si superlattice microcoolers Materials Research Society Symposium - Proceedings. 691: 147-152. |
0.687 |
|
2001 |
Zeng G, Fan X, LaBounty C, Bowers JE, Croke E, Christofferson J, Vashaee D, Zhang Y, Shakouri A. High Cooling Power Density of SiGe/Si Superlattice Microcoolers Mrs Proceedings. 691. DOI: 10.1557/Proc-691-G6.6 |
0.754 |
|
2001 |
Christofferson J, Vashaee D, Shakouri A, Melese P. High resolution non-contact thermal characterization of semiconductor devices Proceedings of Spie - the International Society For Optical Engineering. 4275: 119-125. DOI: 10.1117/12.429354 |
0.735 |
|
2001 |
LaBounty C, Karim A, Fan X, Zeng G, Abraham P, Okuno Y, Bowers JE, Christofferson J, Vashaee D, Fitting A, Shakouri A, Croke E. Wafer-fused thin film cooler semiconductor laser structures International Conference On Thermoelectrics, Ict, Proceedings. 397-400. |
0.611 |
|
2001 |
Fan X, Zeng G, LaBounty C, Vashaee D, Christofferson J, Shakouri A, Bowers JE. Integrated cooling for Si-based microelectronics International Conference On Thermoelectrics, Ict, Proceedings. 405-408. |
0.594 |
|
2001 |
Christofferson J, Vashaee D, Shakouri A, Melese P, Croke ET. Thermoreflectance imaging of superlattice micro refrigerators Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 58-62. |
0.627 |
|
2001 |
Christofferson J, Vashaee D, Shakouri A, Melese P. Real time sub-micron thermal imaging using thermoreflectance American Society of Mechanical Engineers, Heat Transfer Division, (Publication) Htd. 369: 231-235. |
0.707 |
|
2000 |
Christofferson J, Vashaee D, Shakouri A, Fan X, Zeng G, Labounty C, Bowers JE, Croke ET. Thermal characterization of thin film superlattice micro refrigerators Ieee International Symposium On Compound Semiconductors, Proceedings. 49-54. |
0.659 |
|
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