| Year |
Citation |
Score |
| 2020 |
Kumar A, Baker JN, Bowes PC, Cabral MJ, Zhang S, Dickey EC, Irving DL, LeBeau JM. Atomic-resolution electron microscopy of nanoscale local structure in lead-based relaxor ferroelectrics. Nature Materials. PMID 32895506 DOI: 10.1038/S41563-020-0794-5 |
0.351 |
|
| 2020 |
Chen X, Hauwiller MR, Kumar A, Penn AN, LeBeau JM. Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-6. PMID 32778194 DOI: 10.1017/S1431927620024277 |
0.313 |
|
| 2020 |
Jo SS, Li Y, Singh A, Kumar A, Frisone S, LeBeau JM, Jaramillo R. Formation of large-area MoS2 thin films by oxygen-catalyzed sulfurization of Mo thin films Journal of Vacuum Science and Technology. 38: 13405. DOI: 10.1116/1.5132748 |
0.371 |
|
| 2020 |
Penn AN, Koohfar S, Kumah DP, LeBeau JM. On the redistribution of charge in La0.7Sr0.3CrO3/La0.7Sr0.3MnO3 multilayer thin films Aip Advances. 10: 045113. DOI: 10.1063/1.5140352 |
0.431 |
|
| 2020 |
Eldred TB, Abdelhamid M, Reynolds JG, El-Masry NA, LeBeau JM, Bedair SM. Observing relaxation in device quality InGaN templates by TEM techniques Applied Physics Letters. 116: 102104. DOI: 10.1063/1.5139269 |
0.329 |
|
| 2020 |
Penn A, Koohfar S, Kumah D, LeBeau J. A STEM-EELS Investigation of La0.7Sr0.3CrO3/La0.7Sr0.3MnO3 Multilayer Thin Films Microscopy and Microanalysis. 1-3. DOI: 10.1017/S1431927620017286 |
0.335 |
|
| 2019 |
Matveyev Y, Mikheev V, Negrov D, Zarubin S, Kumar A, Grimley ED, LeBeau JM, Gloskovskii A, Tsymbal EY, Zenkevich A. Polarization-dependent electric potential distribution across nanoscale ferroelectric HfZrO in functional memory capacitors. Nanoscale. PMID 31624822 DOI: 10.1039/C9Nr05904K |
0.339 |
|
| 2019 |
Li F, Cabral MJ, Xu B, Cheng Z, Dickey EC, LeBeau JM, Wang J, Luo J, Taylor S, Hackenberger W, Bellaiche L, Xu Z, Chen LQ, Shrout TR, Zhang S. Giant piezoelectricity of Sm-doped Pb(MgNb)O-PbTiO single crystals. Science (New York, N.Y.). 364: 264-268. PMID 31000659 DOI: 10.1126/Science.Aaw2781 |
0.304 |
|
| 2019 |
Trappen R, Grutter AJ, Huang C, Penn A, Mottaghi N, Yousefi S, Haertter A, Kumari S, LeBeau J, Kirby BJ, Holcomb MB. Effect of oxygen stoichiometry on the magnetization profiles and negative magnetization in LSMO thin films Journal of Applied Physics. 126: 105301. DOI: 10.1063/1.5111858 |
0.345 |
|
| 2019 |
Houston Dycus J, Washiyama S, Eldred TB, Guan Y, Kirste R, Mita S, Sitar Z, Collazo R, LeBeau JM. The role of transient surface morphology on composition control in AlGaN layers and wells Applied Physics Letters. 114: 031602. DOI: 10.1063/1.5063933 |
0.303 |
|
| 2019 |
Kelley KP, Runnerstrom EL, Sachet E, Shelton CT, Grimley ED, Klump A, LeBeau JM, Sitar Z, Suen JY, Padilla WJ, Maria J. Multiple Epsilon-Near-Zero Resonances in Multilayered Cadmium Oxide: Designing Metamaterial-Like Optical Properties in Monolithic Materials Acs Photonics. 6: 1139-1145. DOI: 10.1021/Acsphotonics.9B00367 |
0.343 |
|
| 2019 |
Penn AN, Trappen R, Mottaghi N, Huang C, Kumar A, Holcomb M, LeBeau JM. Explaining the Magnetic Properties of Oxygen Deficient LSMO Thin Films by iDPC Microscopy and Microanalysis. 25: 1748-1749. DOI: 10.1017/S1431927619009474 |
0.31 |
|
| 2018 |
Trappen R, Garcia-Castro AC, Tra VT, Huang CY, Ibarra-Hernandez W, Fitch J, Singh S, Zhou J, Cabrera G, Chu YH, LeBeau JM, Romero AH, Holcomb MB. Electrostatic potential and valence modulation in LaSrMnO thin films. Scientific Reports. 8: 14313. PMID 30254275 DOI: 10.1038/S41598-018-32701-X |
0.417 |
|
| 2018 |
Dycus JH, Mirrielees KJ, Grimley ED, Kirste R, Mita S, Sitar Z, Collazo R, Irving D, LeBeau JM. Structure of Ultra-thin Native Oxides on III-Nitride Surfaces. Acs Applied Materials & Interfaces. PMID 29558103 DOI: 10.1021/Acsami.8B00845 |
0.331 |
|
| 2018 |
Grimley ED, Wynn AP, Kelley KP, Sachet E, Dean JS, Freeman CL, Maria J, LeBeau JM. Complexities of atomic structure at CdO/MgO and CdO/Al 2O 3 interfaces Journal of Applied Physics. 124: 205302. DOI: 10.1063/1.5053752 |
0.371 |
|
| 2018 |
Penn AN, Kumar A, Trappen R, Cabrera G, Holcomb MB, LeBeau JM. Depth Dependence Investigation of Manganese Charge State in Oxygen-deficient LSMO Thin Films Microscopy and Microanalysis. 24: 1476-1477. DOI: 10.1017/S1431927618007869 |
0.314 |
|
| 2018 |
Grimley ED, Frisone S, Schenk T, Park MH, Fancher CM, Mikolajick T, Jones JL, Schroeder U, LeBeau JM. Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM Microscopy and Microanalysis. 24: 184-185. DOI: 10.1017/S1431927618001411 |
0.341 |
|
| 2018 |
Fengler FPG, Nigon R, Muralt P, Grimley ED, Sang X, Sessi V, Hentschel R, LeBeau JM, Mikolajick T, Schroeder U. Analysis of Performance Instabilities of Hafnia-Based Ferroelectrics Using Modulus Spectroscopy and Thermally Stimulated Depolarization Currents Advanced Electronic Materials. 4: 1700547. DOI: 10.1002/Aelm.201700547 |
0.352 |
|
| 2017 |
Xu W, Dycus JH, LeBeau JM. Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopy. Ultramicroscopy. 184: 100-108. PMID 28886487 DOI: 10.1016/J.Ultramic.2017.08.015 |
0.301 |
|
| 2017 |
Moghadam R, Xiao Z, Ahmadi-Majlan K, Grimley E, Bowden ME, Ong PV, Chambers SA, LeBeau J, Hong X, Sushko PV, Ngai J. An Ultrathin Single Crystalline Relaxor Ferroelectric Integrated on a High Mobility Semiconductor. Nano Letters. PMID 28876941 DOI: 10.1021/Acs.Nanolett.7B02947 |
0.357 |
|
| 2017 |
Dycus JH, Lebeau JM. A reliable approach to prepare brittle semiconducting materials for cross-sectional transmission electron microscopy. Journal of Microscopy. 268: 225-229. PMID 28686283 DOI: 10.1111/Jmi.12601 |
0.338 |
|
| 2017 |
Lim ZH, Ahmadi-Majlan K, Grimley ED, Du Y, Bowden M, Moghadam R, LeBeau JM, Chambers SA, Ngai JH. Structural and electrical properties of single crystalline SrZrO 3 epitaxially grown on Ge (001) Journal of Applied Physics. 122: 84102. DOI: 10.1063/1.5000142 |
0.382 |
|
| 2017 |
Park MH, Schenk T, Fancher CM, Grimley ED, Zhou C, Richter C, LeBeau JM, Jones JL, Mikolajick T, Schroeder U. A comprehensive study on the structural evolution of HfO2 thin films doped with various dopants Journal of Materials Chemistry C. 5: 4677-4690. DOI: 10.1039/C7Tc01200D |
0.376 |
|
| 2017 |
LeBeau JM, Cabral M, Dycus JH, Grimley E, Zhang S, Dickey E. Quantifying Local Structure of Complex Oxides Using Accurate and Precise Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 23: 1638-1639. DOI: 10.1017/S1431927617008856 |
0.326 |
|
| 2017 |
Fitch J, Trappen R, Huang C, Zhou J, Cabrera G, Dong S, Kumari S, Holcomb MB, LeBeau JM. Combined EELS and XAS Analysis of the Relationship between Depth Dependence and Valence in LSMO Thin Films Microscopy and Microanalysis. 23: 1600-1601. DOI: 10.1017/S1431927617008662 |
0.356 |
|
| 2017 |
Xu W, Bowes PC, Grimley ED, Irving DL, LeBeau JM. Utilizing High-temperature Atomic-resolution STEM and EELS to Determine Reconstructed Surface Structure of Complex Oxide Microscopy and Microanalysis. 23: 1596-1597. DOI: 10.1017/S1431927617008649 |
0.303 |
|
| 2017 |
Grimley ED, Wang T, Jalan B, LeBeau JM. Compositional Ordering and Polar Nano-Regions: Physical Effects of Sn Alloying in SrTiO3 Thin Films Microscopy and Microanalysis. 23: 1582-1583. DOI: 10.1017/S1431927617008571 |
0.622 |
|
| 2017 |
Findlay S, Chen Z, Weyland M, Sang X, Xu W, Dycus J, LeBeau J, Allen L. Absolute-Scale Comparison with Simulation for Quantitative Energy-Dispersive X-Ray Spectroscopy in Atomic-Resolution Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 23: 388-389. DOI: 10.1017/S1431927617002628 |
0.348 |
|
| 2017 |
Richter C, Schenk T, Park MH, Tscharntke FA, Grimley ED, LeBeau JM, Zhou C, Fancher CM, Jones JL, Mikolajick T, Schroeder U. Si Doped Hafnium Oxide—A “Fragile” Ferroelectric System Advanced Electronic Materials. 3: 1700131. DOI: 10.1002/Aelm.201700131 |
0.365 |
|
| 2016 |
Dycus JH, Xu W, Sang X, D'Alfonso AJ, Chen Z, Weyland M, Allen LJ, Findlay SD, LeBeau JM. Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy. Ultramicroscopy. 171: 1-7. PMID 27584051 DOI: 10.1016/J.Ultramic.2016.08.013 |
0.31 |
|
| 2016 |
Chen Z, Weyland M, Sang X, Xu W, Dycus JH, LeBeau JM, D'Alfonso AJ, Allen LJ, Findlay SD. Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy. Ultramicroscopy. 168: 7-16. PMID 27258645 DOI: 10.1016/J.Ultramic.2016.05.008 |
0.323 |
|
| 2016 |
Xu W, Dycus JH, Sang X, LeBeau JM. A numerical model for multiple detector energy dispersive X-ray spectroscopy in the transmission electron microscope. Ultramicroscopy. 164: 51-61. PMID 26948674 DOI: 10.1016/J.Ultramic.2016.02.004 |
0.305 |
|
| 2016 |
Sang X, LeBeau JM. Characterizing the response of a scintillator-based detector to single electrons. Ultramicroscopy. 161: 3-9. PMID 26624510 DOI: 10.1016/J.Ultramic.2015.11.008 |
0.335 |
|
| 2016 |
Lichtenwalner DJ, Dycus JH, Xu W, Lebeau JM, Hull B, Allen S, Palmour JW. Electrical properties and interface structure of SiC MOSFETs with barium interface passivation Materials Science Forum. 897: 163-166. DOI: 10.4028/Www.Scientific.Net/Msf.897.163 |
0.362 |
|
| 2016 |
Pham D, Dycus JH, LeBeau JM, Manga VR, Muralidharan K, Corral EL, Fahrenhotlz W. Processing Low-Oxide ZrB2 Ceramics with High Strength Using Boron Carbide and Spark Plasma Sintering Journal of the American Ceramic Society. 99: 2585-2592. DOI: 10.1111/Jace.14253 |
0.303 |
|
| 2016 |
Xu W, Bowes PC, Grimley ED, Irving DL, LeBeau JM. In-situ real-space imaging of single crystal surface reconstructions via electron microscopy Applied Physics Letters. 109: 201601. DOI: 10.1063/1.4967978 |
0.351 |
|
| 2016 |
Houston Dycus J, Xu W, Lichtenwalner DJ, Hull B, Palmour JW, LeBeau JM. Structure and chemistry of passivated SiC/SiO2 interfaces Applied Physics Letters. 108. DOI: 10.1063/1.4951677 |
0.352 |
|
| 2016 |
Spurgeon SR, Du Y, Droubay T, Devaraj A, Sang X, Longo P, Yan P, Kotula PG, Shutthanandan V, Bowden ME, Lebeau JM, Wang C, Sushko PV, Chambers SA. Competing Pathways for Nucleation of the Double Perovskite Structure in the Epitaxial Synthesis of La2MnNiO6 Chemistry of Materials. 28: 3814-3822. DOI: 10.1021/Acs.Chemmater.6B00829 |
0.304 |
|
| 2016 |
Grimley ED, Sachet E, Donovan BF, Hopkins PE, Maria J, LeBeau JM. Observing Misfit Dislocation Interactions Across Thin Film Oxide Heterostructures Microscopy and Microanalysis. 22: 1506-1507. DOI: 10.1017/S1431927616008370 |
0.346 |
|
| 2016 |
Oni AA, Broderick SR, Rajan K, LeBeau JM. Atom site preference and γ′/γ mismatch strain in [Formula presented] superalloys Intermetallics. 73: 72-78. DOI: 10.1016/J.Intermet.2016.03.006 |
0.331 |
|
| 2016 |
Eiteneer D, Pálsson GK, Nemšák S, Gray AX, Kaiser AM, Son J, LeBeau J, Conti G, Greer AA, Keqi A, Rattanachata A, Saw AY, Bostwick A, Rotenberg E, Gullikson EM, et al. Depth-Resolved Composition and Electronic Structure of Buried Layers and Interfaces in a LaNiO3/SrTiO3 Superlattice from Soft- and Hard- X-ray Standing-Wave Angle-Resolved Photoemission Journal of Electron Spectroscopy and Related Phenomena. 211: 70-81. DOI: 10.1016/J.Elspec.2016.04.008 |
0.654 |
|
| 2016 |
Grimley ED, Schenk T, Sang X, Pešić M, Schroeder U, Mikolajick T, LeBeau JM. Structural Changes Underlying Field-Cycling Phenomena in Ferroelectric HfO2 Thin Films Advanced Electronic Materials. 2. DOI: 10.1002/Aelm.201600173 |
0.365 |
|
| 2016 |
Haislmaier RC, Grimley ED, Biegalski MD, Lebeau JM, Trolier-Mckinstry S, Gopalan V, Engel-Herbert R. Unleashing Strain Induced Ferroelectricity in Complex Oxide Thin Films via Precise Stoichiometry Control Advanced Functional Materials. DOI: 10.1002/Adfm.201602767 |
0.372 |
|
| 2015 |
Huang CY, Zhou J, Tra VT, White R, Trappen R, N'Diaye AT, Spencer M, Frye C, Cabrera GB, Nguyen V, LeBeau JM, Chu YH, Holcomb MB. Imaging magnetic and ferroelectric domains and interfacial spins in magnetoelectric La0.7Sr0.3MnO3/PbZr0.2Ti0.8O3 heterostructures. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 27: 504003. PMID 26613406 DOI: 10.1088/0953-8984/27/50/504003 |
0.33 |
|
| 2015 |
Dycus JH, Harris JS, Sang X, Fancher CM, Findlay SD, Oni AA, Chan TE, Koch CC, Jones JL, Allen LJ, Irving DL, LeBeau JM. Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-7. PMID 26169835 DOI: 10.1017/S1431927615013732 |
0.38 |
|
| 2015 |
Eaton C, Moyer JA, Alipour HM, Grimley ED, Brahlek M, Lebeau JM, Engel-Herbert R. Growth of SrVO3 thin films by hybrid molecular beam epitaxy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 33. DOI: 10.1116/1.4927439 |
0.421 |
|
| 2015 |
Zhou J, Tra VT, Dong S, Trappen R, Marcus MA, Jenkins C, Frye C, Wolfe E, White R, Polisetty S, Lin JY, Lebeau JM, Chu YH, Holcomb MB. Thickness dependence of La0.7Sr0.3MnO3/PbZr0.2Ti0.8O3 magnetoelectric interfaces Applied Physics Letters. 107. DOI: 10.1063/1.4932517 |
0.352 |
|
| 2015 |
Sang X, Grimley ED, Schenk T, Schroeder U, Lebeau JM. On the structural origins of ferroelectricity in HfO2 thin films Applied Physics Letters. 106. DOI: 10.1063/1.4919135 |
0.432 |
|
| 2015 |
Sang X, Grimley ED, Niu C, Irving DL, Lebeau JM. Direct observation of charge mediated lattice distortions in complex oxide solid solutions Applied Physics Letters. 106. DOI: 10.1063/1.4908124 |
0.344 |
|
| 2015 |
Oni AA, Sang X, Raju SV, Dumpala S, Broderick S, Kumar A, Sinnott S, Saxena S, Rajan K, Lebeau JM. Large area strain analysis using scanning transmission electron microscopy across multiple images Applied Physics Letters. 106. DOI: 10.1063/1.4905368 |
0.317 |
|
| 2015 |
Dycus JH, Harris JS, Sang X, Fancher CM, Findlay SD, Oni AA, Chan TE, Koch CC, Jones JL, Allen LJ, Irving DL, LeBeau JM. Highly Accurate Real Space Nanometrology Using Revolving Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 21: 2245-2246. DOI: 10.1017/S1431927615012003 |
0.305 |
|
| 2015 |
Oni AA, Sang X, Kumar A, Sinnott SB, LeBeau JM. Direct Observation of Chemical Pressure in Intermetallic Alloys by Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 21: 1519-1520. DOI: 10.1017/S1431927615008375 |
0.301 |
|
| 2015 |
Sang X, LeBeau JM. Inconsistent Normalized Intensities for Quantitative STEM: Detector Scans and Single Electron Counting Microscopy and Microanalysis. 21: 1211-1212. DOI: 10.1017/S1431927615006844 |
0.313 |
|
| 2015 |
Xu W, Dycus JH, Sang X, Oni AA, LeBeau JM. Effect of Specimen Geometry on Quantitative EDS Analysis with Four-Quadrant Super-X Detectors Microscopy and Microanalysis. 21: 1091-1092. DOI: 10.1017/S1431927615006248 |
0.307 |
|
| 2015 |
Sang X, Grimley ED, Schenk T, Schroeder U, LeBeau JM. Origin of Ferroelectricity in Thin Film HfO2 Probed by Revolving STEM and PACBED Microscopy and Microanalysis. 21: 779-780. DOI: 10.1017/S1431927615004699 |
0.358 |
|
| 2015 |
Jones JL, LeBeau JM, Nikkel J, Oni AA, Dycus JH, Cozzan C, Lin F, Chernatynskiy A, Nino JC, Sinnott SB, Mhin S, Brennecka GL, Ihlefeld J. Thin Films: Combined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin Films (Adv. Mater. Interfaces 10/2015) Advanced Materials Interfaces. 2. DOI: 10.1002/Admi.201570048 |
0.364 |
|
| 2015 |
Jones JL, LeBeau JM, Nikkel J, Oni AA, Dycus JH, Cozzan C, Lin FY, Chernatynskiy A, Nino JC, Sinnott SB, Mhin S, Brennecka GL, Ihlefeld J. Combined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin Films Advanced Materials Interfaces. 2. DOI: 10.1002/Admi.201500181 |
0.409 |
|
| 2014 |
Sang X, LeBeau JM. Revolving scanning transmission electron microscopy: correcting sample drift distortion without prior knowledge. Ultramicroscopy. 138: 28-35. PMID 24444498 DOI: 10.1016/J.Ultramic.2013.12.004 |
0.348 |
|
| 2014 |
Lomenzo PD, Zhao P, Takmeel Q, Moghaddam S, Nishida T, Nelson M, Fancher CM, Grimley ED, Sang X, Lebeau JM, Jones JL. Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 32. DOI: 10.1116/1.4873323 |
0.394 |
|
| 2014 |
Paisley EA, Gaddy BE, Lebeau JM, Shelton CT, Biegalski MD, Christen HM, Losego MD, Mita S, Collazo R, Sitar Z, Irving DL, Maria JP. Smooth cubic commensurate oxides on gallium nitride Journal of Applied Physics. 115. DOI: 10.1063/1.4861172 |
0.384 |
|
| 2014 |
Burch MJ, Li J, Garten L, Sang X, Lebeau J, Trolier-Mckinstry S, Maria JP, Dickey EC. Investigation of local a-site chemistry in barium strontium titanate using aberration corrected STEM, EELS and EDS Microscopy and Microanalysis. 20: 1992-1993. DOI: 10.1017/S1431927614011696 |
0.386 |
|
| 2014 |
Dumpala S, Oni AA, Padalkar S, Broderick SR, Lebeau JM, Rajan K. Correlative imaging of stacking faults using atom probe tomography (APT) and scanning transmission electron microscopy (STEM) Microscopy and Microanalysis. 20: 996-997. DOI: 10.1017/S1431927614006709 |
0.332 |
|
| 2014 |
Sang X, Grimley ED, Niu C, Irving DL, Lebeau JM. Putting a new spin on scanning transmission electron microscopy Microscopy and Microanalysis. 20: 140-141. DOI: 10.1017/S1431927614002426 |
0.346 |
|
| 2014 |
Mily EJ, Oni A, Lebeau JM, Liu Y, Brown-Shaklee HJ, Ihlefeld JF, Maria JP. The role of terminal oxide structure and properties in nanothermite reactions Thin Solid Films. 562: 405-410. DOI: 10.1016/J.Tsf.2014.05.005 |
0.331 |
|
| 2014 |
Oni AA, Hook D, Maria JP, Lebeau JM. Phase coexistence in Ti6Sn5 intermetallics Intermetallics. 51: 48-52. DOI: 10.1016/J.Intermet.2014.03.002 |
0.329 |
|
| 2013 |
Houston Dycus J, White RM, Pierce JM, Venkatasubramanian R, LeBeau JM. Atomic scale structure and chemistry of Bi2Te3/GaAs interfaces grown by metallorganic van der Waals epitaxy Applied Physics Letters. 102. DOI: 10.1063/1.4793518 |
0.416 |
|
| 2013 |
Alipour HM, White RM, Eaton C, Moyer JA, Engel-Herbret R, LeBeau JM. Atomic Structure and Chemistry of Defects in non-stoichiometric SrVO3 Thin Films Microscopy and Microanalysis. 19: 1206-1207. DOI: 10.1017/S1431927613008027 |
0.365 |
|
| 2012 |
Chan TTE, Venkatasubramanian R, LeBeau JM, Thomas P, Stuart J, Koch CC. Nanocomposite Bi(Sb)Te(Se) materials by cryogenic mechanical alloying and optimized high pressure hot-pressing Materials Research Society Symposium Proceedings. 1456: 13-18. DOI: 10.1557/Opl.2012.1369 |
0.308 |
|
| 2012 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Quantitative STEM: Experimental methods and applications Journal of Physics: Conference Series. 371. DOI: 10.1088/1742-6596/371/1/012053 |
0.474 |
|
| 2012 |
Ruben G, Cosgriff EC, D'Alfonso AJ, Findlay SD, LeBeau JM, Allen LJ. Interface location by depth sectioning using a low-angle annular dark field detector Ultramicroscopy. 113: 131-138. DOI: 10.1016/J.Ultramic.2011.11.002 |
0.349 |
|
| 2011 |
Forbes BD, D'Alfonso AJ, Findlay SD, Van Dyck D, Lebeau JM, Stemmer S, Allen LJ. Thermal diffuse scattering in transmission electron microscopy. Ultramicroscopy. 111: 1670-80. PMID 22088442 DOI: 10.1016/J.Ultramic.2011.09.017 |
0.495 |
|
| 2011 |
LeBeau JM, Findlay SD, D'Alfonso AJ, Allen LJ, Stemmer S. Counting atoms with quantitative scanning transmission electron microscopy Acta Crystallographica Section A. 67: 105-105. DOI: 10.1107/S010876731109742X |
0.526 |
|
| 2011 |
Allen LJ, D'Alfonso AJ, Forbes BD, Lugg NR, Martin AV, Findlay SD, LeBeau JM, Stemmer S. Modelling thermal scattering and solving structures using Z-contrast imaging Acta Crystallographica Section A. 67: 155-156. DOI: 10.1107/S0108767311096176 |
0.47 |
|
| 2011 |
Gray AX, Janotti A, Son J, Lebeau JM, Ueda S, Yamashita Y, Kobayashi K, Kaiser AM, Sutarto R, Wadati H, Sawatzky GA, Van De Walle CG, Stemmer S, Fadley CS. Insulating state of ultrathin epitaxial LaNiO3 thin films detected by hard x-ray photoemission Physical Review B - Condensed Matter and Materials Physics. 84. DOI: 10.1103/Physrevb.84.075104 |
0.67 |
|
| 2011 |
Xie J, Mita S, Hussey L, Rice A, Tweedie J, Lebeau J, Collazo R, Sitar Z. On the strain in n-type GaN Applied Physics Letters. 99. DOI: 10.1063/1.3647772 |
0.317 |
|
| 2011 |
Hwang Y, Chobpattana V, Zhang JY, Lebeau JM, Engel-Herbert R, Stemmer S. Al-doped HfO2/In0.53Ga0.47 As metal-oxide-semiconductor capacitors Applied Physics Letters. 98. DOI: 10.1063/1.3575569 |
0.669 |
|
| 2011 |
Lebeau JM, D'Alfonso AJ, Wright NJ, Allen LJ, Stemmer S. Determining ferroelectric polarity at the nanoscale Applied Physics Letters. 98. DOI: 10.1063/1.3549300 |
0.544 |
|
| 2011 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Erratum: Standardless atom counting in scanning transmission electron microscopy (Nano Letters (2010) 10 (4405) Nano Letters. 11. DOI: 10.1021/Nl1042215 |
0.527 |
|
| 2011 |
LeBeau J, D'Alfonso A, Allen L, Stemmer S. Determination of Thin-Film Ferroelectric Polarity at the Nanoscale Microscopy and Microanalysis. 17: 1366-1367. DOI: 10.1017/S1431927611007707 |
0.528 |
|
| 2011 |
Zhang J, LeBeau J, D'Alfonso A, Allen L, Stemmer S. Exploring the Strain Sensitivity of Image Contrast in Quantitative STEM of SrTiO3 Microscopy and Microanalysis. 17: 1310-1311. DOI: 10.1017/S1431927611007422 |
0.487 |
|
| 2010 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Standardless atom counting in scanning transmission electron microscopy. Nano Letters. 10: 4405-8. PMID 20945926 DOI: 10.1021/Nl102025S |
0.545 |
|
| 2010 |
Lebeau JM, Findlay SD, Allen LJ, Stemmer S. Position averaged convergent beam electron diffraction: theory and applications. Ultramicroscopy. 110: 118-25. PMID 19939565 DOI: 10.1016/J.Ultramic.2009.10.001 |
0.54 |
|
| 2010 |
Son J, Lebeau JM, Allen SJ, Stemmer S. Conductivity enhancement of ultrathin LaNiO3 films in superlattices Applied Physics Letters. 97. DOI: 10.1063/1.3511738 |
0.637 |
|
| 2010 |
Son J, Moetakef P, Lebeau JM, Ouellette D, Balents L, Allen SJ, Stemmer S. Low-dimensional Mott material: Transport in ultrathin epitaxial LaNiO 3 films Applied Physics Letters. 96. DOI: 10.1063/1.3309713 |
0.767 |
|
| 2010 |
Stemmer S, LeBeau J, Findlay S, D'Alfonso A, Allen L. Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces Microscopy and Microanalysis. 16: 1472-1473. DOI: 10.1017/S1431927610061684 |
0.491 |
|
| 2010 |
Buehl TE, Lebeau JM, Stemmer S, Scarpulla MA, Palmstrøm CJ, Gossard AC. Growth of embedded ErAs nanorods on (4 1 1)A and (4 1 1)B GaAs by molecular beam epitaxy Journal of Crystal Growth. 312: 2089-2092. DOI: 10.1016/J.Jcrysgro.2010.04.031 |
0.501 |
|
| 2009 |
Bougeard D, Sircar N, Ahlers S, Lang V, Abstreiter G, Trampert A, Lebeau JM, Stemmer S, Saxey DW, Cerezo A. Ge(1-x) Mn(x) clusters: central structural and magnetic building blocks of nanoscale wire-like self-assembly in a magnetic semiconductor. Nano Letters. 9: 3743-8. PMID 19751066 DOI: 10.1021/Nl901928F |
0.468 |
|
| 2009 |
Engel-Herbert R, Hwang Y, LeBeau JM, Zheng Y, Stemmer S. Chemical beam deposition of high-k gate dielectrics on III-V semiconductors: TiO2 on In0.53Ga0.47As Materials Research Society Symposium Proceedings. 1155: 111-117. DOI: 10.1557/Proc-1155-C13-02 |
0.675 |
|
| 2009 |
Lebeau JM, D'Alfonso AJ, Findlay SD, Stemmer S, Allen LJ. Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images Physical Review B - Condensed Matter and Materials Physics. 80. DOI: 10.1103/Physrevb.80.174106 |
0.54 |
|
| 2009 |
Lebeau JM, Findlay SD, Wang X, Jacobson AJ, Allen LJ, Stemmer S. High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment Physical Review B - Condensed Matter and Materials Physics. 79. DOI: 10.1103/Physrevb.79.214110 |
0.538 |
|
| 2009 |
Lebeau JM, Engel-Herbert R, Jalan B, Cagnon J, Moetakef P, Stemmer S, Stephenson GB. Stoichiometry optimization of homoepitaxial oxide thin films using x-ray diffraction Applied Physics Letters. 95. DOI: 10.1063/1.3243696 |
0.776 |
|
| 2009 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Position averaged convergent beam electron diffraction Microscopy and Microanalysis. 15: 494-495. DOI: 10.1017/S1431927609096743 |
0.489 |
|
| 2009 |
Lebeau JM, Findlay SD, Wang X, Jacobson AJ, Allen LJ, Stemmer S. Quantitative HAADF Imaging of Crystals Containing Heavy Elements: A Comparison with Theory Microscopy and Microanalysis. 15: 466-467. DOI: 10.1017/S143192760909521X |
0.459 |
|
| 2009 |
Stemmer S, LeBeau JM, Cagnon J, Hwang Y, Engel-Herbert R. Applications of advanced transmission electron microscopy techniques in gate stack scaling Digest of Technical Papers - Symposium On Vlsi Technology. 198-199. |
0.477 |
|
| 2008 |
Lebeau JM, Stemmer S. Experimental quantification of annular dark-field images in scanning transmission electron microscopy. Ultramicroscopy. 108: 1653-8. PMID 18707809 DOI: 10.1016/J.Ultramic.2008.07.001 |
0.529 |
|
| 2008 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Quantitative atomic resolution scanning transmission electron microscopy. Physical Review Letters. 100: 206101. PMID 18518557 DOI: 10.1103/Physrevlett.100.206101 |
0.53 |
|
| 2008 |
Delabie A, Brunco DP, Conard T, Favia P, Bender H, Franquet A, Sioncke S, Vandervorst W, Van Elshocht S, Heyns M, Meuris M, Kim E, McIntyre PC, Saraswat KC, Lebeau JM, et al. Atomic layer deposition of hafnium oxide on ge and gaas substrates: Precursors and surface preparation Journal of the Electrochemical Society. 155. DOI: 10.1149/1.2979144 |
0.526 |
|
| 2008 |
Boesch DS, Son J, LeBeau JM, Cagnon J, Stemmer S. Thickness dependence of the dielectric properties of epitaxial SrTiO 3 films on (001)Pt/SrTiO3 Applied Physics Express. 1: 0916021-0916023. DOI: 10.1143/Apex.1.091602 |
0.671 |
|
| 2008 |
Stemmer S, LeBeau JM, Findlay SD, Allen LJ. Image contrast in atomic resolution high-angle annular dark-field images Acta Crystallographica Section A. 64: 65-65. DOI: 10.1107/S0108767308097924 |
0.502 |
|
| 2008 |
LeBeau JM, Hu QO, Palmstrøm CJ, Stemmer S. Atomic structure of postgrowth annealed epitaxial Fe/(001)GaAs interfaces Applied Physics Letters. 93. DOI: 10.1063/1.2990622 |
0.559 |
|
| 2008 |
Scarpulla MA, Zide JMO, LeBeau JM, Van De Walle CG, Gossard AC, Delaney KT. Near-infrared absorption and semimetal-semiconductor transition in 2 nm ErAs nanoparticles embedded in GaAs and AlAs Applied Physics Letters. 92. DOI: 10.1063/1.2908213 |
0.307 |
|
| 2008 |
LeBeau JM, Jur JS, Lichtenwalner DJ, Craft HS, Maria JP, Kingon AI, Klenov DO, Cagnon J, Stemmer S. High temperature stability of Hf-based gate dielectric stacks with rare-earth oxide layers for threshold voltage control Applied Physics Letters. 92. DOI: 10.1063/1.2901036 |
0.513 |
|
| 2008 |
LeBeau JM, Jur JS, Lichtenwalner DJ, Kingon AI, Klenov DO, Stemmer S. Thermal stability of Hf-based gate dielectric stacks with rare-earth oxide capping layers Microscopy and Microanalysis. 14: 418-419. DOI: 10.1017/S1431927608084109 |
0.473 |
|
| 2008 |
LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Quantitative HAADF-STEM and EELS Microscopy and Microanalysis. 14: 1352-1353. DOI: 10.1017/S1431927608082263 |
0.464 |
|
| 2008 |
Allen LJ, D'Alfonso AJ, Bosman M, Findlay SD, Oxley MP, Keast VJ, LeBeau JM, Stemmer S. Simulation of atomic resolution images in STEM Microscopy and Microanalysis. 14: 922-923. DOI: 10.1017/S1431927608082019 |
0.502 |
|
| 2007 |
Klenov DO, Zide JMO, Lebeau JM, Gossard AC, Stemmer S. Ordering of ErAs nanoparticles embedded in epitaxial InGaAs layers Applied Physics Letters. 90. DOI: 10.1063/1.2715174 |
0.477 |
|
| 2007 |
Klenov D, LeBeau J, Zide J, Gossard A, Stemmer S. Combination of TEM and STEM to Investigate the Self-Assembly of Epitaxial Nanocomposites Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607077252 |
0.455 |
|
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