Lingpeng Guan, Ph.D. - Publications

Affiliations: 
2006 Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong 
Area:
Electronics and Electrical Engineering

8 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2016 Ma X, Guan L, Xuan J, Wang H, Yuan Z, Wu M, Liu R, Zhu C, Wei C, Zhao F, Du L, Zhang L. Effect of polymorphisms in the CAMKMT gene on growth traits in Ujumqin sheep. Animal Genetics. PMID 27435482 DOI: 10.1111/age.12455  0.341
2010 Tian B, Wu Y, Huang H, Guan L, Sin JKO, Kang B. A New 20 V-Rated Buried-Oxide Trench-Gate Bipolar-Mode JFET FOR DC/DC Converters Ieee Transactions On Electron Devices. 57: 3531-3535. DOI: 10.1109/Ted.2010.2076090  0.4
2009 Sun J, Jiang FXC, Guan L, Xiong Z, Yan G, Sin JKO. A New Isolation Technology for Automotive Power-Integrated-Circuit Applications Ieee Transactions On Electron Devices. 56: 2144-2149. DOI: 10.1109/Ted.2009.2026089  0.504
2008 Ng JCW, Sin JKO, Guan L. A Novel Planar Power MOSFET With Laterally Uniform Body and Ion-Implanted JFET Region Ieee Electron Device Letters. 29: 375-377. DOI: 10.1109/Led.2008.917818  0.383
2007 Guan L, Sin JKO. Transient Characterization of the Planar DMOS With a Metal/Poly-Si Replacement Gate Ieee Transactions On Electron Devices. 54: 1789-1792. DOI: 10.1109/Ted.2007.899426  0.393
2006 Guan L, Sin JKO, Liu H, Xiong Z. A fully integrated SOI RF MEMS technology for system-on-a-chip applications Ieee Transactions On Electron Devices. 53: 167-172. DOI: 10.1109/Ted.2005.860638  0.534
2006 Guan L, Sin JKO. A 30 V Self-Aligned Metal/Poly-Si Replacement Gate Planar DMOS for DC/DC Converters Ieee Electron Device Letters. 27: 920-922. DOI: 10.1109/Led.2006.884719  0.395
2005 Guan L, Sin JKO, Xiong Z, Liu H. A novel SOI lateral-power MOSFET with a self-aligned drift region Ieee Electron Device Letters. 26: 264-266. DOI: 10.1109/Led.2005.844717  0.509
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